TW201329437A - 照明裝置、照明方法及檢查裝置 - Google Patents
照明裝置、照明方法及檢查裝置 Download PDFInfo
- Publication number
- TW201329437A TW201329437A TW101144468A TW101144468A TW201329437A TW 201329437 A TW201329437 A TW 201329437A TW 101144468 A TW101144468 A TW 101144468A TW 101144468 A TW101144468 A TW 101144468A TW 201329437 A TW201329437 A TW 201329437A
- Authority
- TW
- Taiwan
- Prior art keywords
- illumination
- light
- amount
- unit
- illumination unit
- Prior art date
Links
- 238000005286 illumination Methods 0.000 title claims abstract description 231
- 238000007689 inspection Methods 0.000 title claims description 44
- 238000000034 method Methods 0.000 title claims description 7
- 230000004044 response Effects 0.000 claims abstract description 3
- 230000001678 irradiating effect Effects 0.000 claims 1
- 239000004973 liquid crystal related substance Substances 0.000 description 10
- 230000003287 optical effect Effects 0.000 description 10
- 239000000853 adhesive Substances 0.000 description 9
- 230000001070 adhesive effect Effects 0.000 description 9
- 239000006059 cover glass Substances 0.000 description 8
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 7
- 230000007547 defect Effects 0.000 description 6
- 230000004043 responsiveness Effects 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 5
- 239000011347 resin Substances 0.000 description 5
- 229920005989 resin Polymers 0.000 description 5
- 230000008859 change Effects 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 238000003705 background correction Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229910001507 metal halide Inorganic materials 0.000 description 1
- 150000005309 metal halides Chemical class 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B41/00—Circuit arrangements or apparatus for igniting or operating discharge lamps
- H05B41/14—Circuit arrangements
- H05B41/36—Controlling
- H05B41/38—Controlling the intensity of light
- H05B41/39—Controlling the intensity of light continuously
- H05B41/392—Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor
- H05B41/3921—Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor with possibility of light intensity variations
- H05B41/3927—Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor with possibility of light intensity variations by pulse width modulation
- H05B41/3928—Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor with possibility of light intensity variations by pulse width modulation for high-pressure lamps, e.g. high-intensity discharge lamps, high-pressure mercury or sodium lamps
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B47/00—Circuit arrangements for operating light sources in general, i.e. where the type of light source is not relevant
- H05B47/10—Controlling the light source
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
- Y02B20/40—Control techniques providing energy savings, e.g. smart controller or presence detection
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011290496 | 2011-12-31 | ||
| JP2012026008A JP2013152206A (ja) | 2011-12-31 | 2012-02-09 | 照明装置、照明方法及び検査装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201329437A true TW201329437A (zh) | 2013-07-16 |
Family
ID=48677008
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101144468A TW201329437A (zh) | 2011-12-31 | 2012-11-28 | 照明裝置、照明方法及檢查裝置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20130169795A1 (enExample) |
| JP (1) | JP2013152206A (enExample) |
| KR (1) | KR20130079140A (enExample) |
| CN (1) | CN103185726B (enExample) |
| TW (1) | TW201329437A (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6547270B2 (ja) * | 2014-10-10 | 2019-07-24 | 株式会社リコー | 光源装置及びこの光源装置を有する画像投影装置 |
| JP6961394B2 (ja) * | 2017-05-31 | 2021-11-05 | 株式会社キーエンス | 画像検査装置、画像検査方法、画像検査装置の設定方法、画像検査プログラム、画像装置の設定検査プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器 |
| EP3657926B1 (en) * | 2017-07-18 | 2025-12-24 | Fuji Corporation | Component-mounting machine and method for adjusting illumination light amount thereof |
| JP2020085587A (ja) * | 2018-11-21 | 2020-06-04 | 日本電気硝子株式会社 | ガラス板の製造方法、及びガラス板の製造装置 |
| CN110261395A (zh) * | 2019-06-28 | 2019-09-20 | 苏州精濑光电有限公司 | 一种检测装置 |
| CN110243832A (zh) * | 2019-06-29 | 2019-09-17 | 苏州精濑光电有限公司 | 一种检测装置 |
| CN110865033A (zh) * | 2019-11-29 | 2020-03-06 | 成都天鹰锐视科技有限公司 | 一种基于通光量自适应调控的成像探测装置及其控制方法 |
| CN114994071A (zh) * | 2021-03-01 | 2022-09-02 | 镭亚电子(苏州)有限公司 | 导光板检测方法和导光板检测治具 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6345541A (ja) * | 1986-08-13 | 1988-02-26 | Hitachi Ltd | 検査方法および装置 |
| JPH01245137A (ja) * | 1988-03-28 | 1989-09-29 | Hitachi Electron Eng Co Ltd | ガラスディスク表面検査装置におけるレーザビーム投光方式 |
| JP2001141662A (ja) * | 1999-11-18 | 2001-05-25 | Central Glass Co Ltd | 透明板状体の欠点検出方法および検出装置 |
| KR100471084B1 (ko) * | 2002-12-16 | 2005-03-10 | 삼성전자주식회사 | 영상처리시스템 및 영상처리방법 |
| JP2009222611A (ja) * | 2008-03-18 | 2009-10-01 | Hitachi High-Technologies Corp | 検査装置及び検査方法 |
-
2012
- 2012-02-09 JP JP2012026008A patent/JP2013152206A/ja not_active Withdrawn
- 2012-11-12 KR KR1020120127264A patent/KR20130079140A/ko not_active Ceased
- 2012-11-28 TW TW101144468A patent/TW201329437A/zh unknown
- 2012-12-27 CN CN201210578830.3A patent/CN103185726B/zh not_active Expired - Fee Related
- 2012-12-28 US US13/729,434 patent/US20130169795A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| CN103185726A (zh) | 2013-07-03 |
| KR20130079140A (ko) | 2013-07-10 |
| JP2013152206A (ja) | 2013-08-08 |
| CN103185726B (zh) | 2015-04-08 |
| US20130169795A1 (en) | 2013-07-04 |
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