CN103185726B - 照明装置、照明方法以及检查装置 - Google Patents

照明装置、照明方法以及检查装置 Download PDF

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Publication number
CN103185726B
CN103185726B CN201210578830.3A CN201210578830A CN103185726B CN 103185726 B CN103185726 B CN 103185726B CN 201210578830 A CN201210578830 A CN 201210578830A CN 103185726 B CN103185726 B CN 103185726B
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CN
China
Prior art keywords
lighting
unit
light
light quantity
lighting unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201210578830.3A
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English (en)
Chinese (zh)
Other versions
CN103185726A (zh
Inventor
林义典
井筒纪
关胜利
若叶博之
小野洋子
权藤隆德
泷泽明彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Mechatronics Corp
Original Assignee
Shibaura Engineering Works Co Ltd
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Filing date
Publication date
Application filed by Shibaura Engineering Works Co Ltd filed Critical Shibaura Engineering Works Co Ltd
Publication of CN103185726A publication Critical patent/CN103185726A/zh
Application granted granted Critical
Publication of CN103185726B publication Critical patent/CN103185726B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B41/00Circuit arrangements or apparatus for igniting or operating discharge lamps
    • H05B41/14Circuit arrangements
    • H05B41/36Controlling
    • H05B41/38Controlling the intensity of light
    • H05B41/39Controlling the intensity of light continuously
    • H05B41/392Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor
    • H05B41/3921Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor with possibility of light intensity variations
    • H05B41/3927Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor with possibility of light intensity variations by pulse width modulation
    • H05B41/3928Controlling the intensity of light continuously using semiconductor devices, e.g. thyristor with possibility of light intensity variations by pulse width modulation for high-pressure lamps, e.g. high-intensity discharge lamps, high-pressure mercury or sodium lamps
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B47/00Circuit arrangements for operating light sources in general, i.e. where the type of light source is not relevant
    • H05B47/10Controlling the light source
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02BCLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B20/00Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02BCLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B20/00Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
    • Y02B20/40Control techniques providing energy savings, e.g. smart controller or presence detection

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201210578830.3A 2011-12-31 2012-12-27 照明装置、照明方法以及检查装置 Expired - Fee Related CN103185726B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2011-290496 2011-12-31
JP2011290496 2011-12-31
JP2012026008A JP2013152206A (ja) 2011-12-31 2012-02-09 照明装置、照明方法及び検査装置
JP2012-026008 2012-02-09

Publications (2)

Publication Number Publication Date
CN103185726A CN103185726A (zh) 2013-07-03
CN103185726B true CN103185726B (zh) 2015-04-08

Family

ID=48677008

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201210578830.3A Expired - Fee Related CN103185726B (zh) 2011-12-31 2012-12-27 照明装置、照明方法以及检查装置

Country Status (5)

Country Link
US (1) US20130169795A1 (enExample)
JP (1) JP2013152206A (enExample)
KR (1) KR20130079140A (enExample)
CN (1) CN103185726B (enExample)
TW (1) TW201329437A (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6547270B2 (ja) * 2014-10-10 2019-07-24 株式会社リコー 光源装置及びこの光源装置を有する画像投影装置
JP6961394B2 (ja) * 2017-05-31 2021-11-05 株式会社キーエンス 画像検査装置、画像検査方法、画像検査装置の設定方法、画像検査プログラム、画像装置の設定検査プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器
EP3657926B1 (en) * 2017-07-18 2025-12-24 Fuji Corporation Component-mounting machine and method for adjusting illumination light amount thereof
JP2020085587A (ja) * 2018-11-21 2020-06-04 日本電気硝子株式会社 ガラス板の製造方法、及びガラス板の製造装置
CN110261395A (zh) * 2019-06-28 2019-09-20 苏州精濑光电有限公司 一种检测装置
CN110243832A (zh) * 2019-06-29 2019-09-17 苏州精濑光电有限公司 一种检测装置
CN110865033A (zh) * 2019-11-29 2020-03-06 成都天鹰锐视科技有限公司 一种基于通光量自适应调控的成像探测装置及其控制方法
CN114994071A (zh) * 2021-03-01 2022-09-02 镭亚电子(苏州)有限公司 导光板检测方法和导光板检测治具

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1509068A (zh) * 2002-12-16 2004-06-30 ���ǵ�����ʽ���� 图像处理系统及方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6345541A (ja) * 1986-08-13 1988-02-26 Hitachi Ltd 検査方法および装置
JPH01245137A (ja) * 1988-03-28 1989-09-29 Hitachi Electron Eng Co Ltd ガラスディスク表面検査装置におけるレーザビーム投光方式
JP2001141662A (ja) * 1999-11-18 2001-05-25 Central Glass Co Ltd 透明板状体の欠点検出方法および検出装置
JP2009222611A (ja) * 2008-03-18 2009-10-01 Hitachi High-Technologies Corp 検査装置及び検査方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1509068A (zh) * 2002-12-16 2004-06-30 ���ǵ�����ʽ���� 图像处理系统及方法

Also Published As

Publication number Publication date
CN103185726A (zh) 2013-07-03
KR20130079140A (ko) 2013-07-10
JP2013152206A (ja) 2013-08-08
US20130169795A1 (en) 2013-07-04
TW201329437A (zh) 2013-07-16

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