KR20100131490A - 프로그래밍 가능한 이득 트랜스 임피던스 증폭기 과부하 복구 회로 - Google Patents

프로그래밍 가능한 이득 트랜스 임피던스 증폭기 과부하 복구 회로 Download PDF

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Publication number
KR20100131490A
KR20100131490A KR1020107023169A KR20107023169A KR20100131490A KR 20100131490 A KR20100131490 A KR 20100131490A KR 1020107023169 A KR1020107023169 A KR 1020107023169A KR 20107023169 A KR20107023169 A KR 20107023169A KR 20100131490 A KR20100131490 A KR 20100131490A
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KR
South Korea
Prior art keywords
stage amplifier
output
amplifier
value
inverting input
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KR1020107023169A
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English (en)
Korean (ko)
Inventor
브랜든 맥큐리
브라이언 조한센
Original Assignee
일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드
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Publication of KR20100131490A publication Critical patent/KR20100131490A/ko
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/64—Testing of capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
KR1020107023169A 2008-03-31 2009-03-13 프로그래밍 가능한 이득 트랜스 임피던스 증폭기 과부하 복구 회로 Ceased KR20100131490A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/059,752 US8054085B2 (en) 2008-03-31 2008-03-31 Programmable gain trans-impedance amplifier overload recovery circuit
US12/059,752 2008-03-31

Publications (1)

Publication Number Publication Date
KR20100131490A true KR20100131490A (ko) 2010-12-15

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KR1020107023169A Ceased KR20100131490A (ko) 2008-03-31 2009-03-13 프로그래밍 가능한 이득 트랜스 임피던스 증폭기 과부하 복구 회로

Country Status (6)

Country Link
US (2) US8054085B2 (enExample)
JP (1) JP5498478B2 (enExample)
KR (1) KR20100131490A (enExample)
CN (1) CN101981459B (enExample)
TW (1) TWI439706B (enExample)
WO (1) WO2009123845A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10972063B2 (en) 2018-10-17 2021-04-06 Analog Devices Global Unlimited Company Amplifier systems for measuring a wide range of current

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8040124B2 (en) * 2009-02-18 2011-10-18 Advanced Ion Beam Technology, Inc. Method and apparatus for monitoring leakage current of a faraday cup
TWI510130B (zh) 2010-09-20 2015-11-21 Novatek Microelectronics Corp 短路偵測電路、發光二極體驅動晶片、發光二極體裝置及短路偵測方法
US9086439B2 (en) * 2011-02-25 2015-07-21 Maxim Integrated Products, Inc. Circuits, devices and methods having pipelined capacitance sensing
DE112013002394T5 (de) * 2012-05-10 2015-02-26 That Corp. Verstärker mit programmierbarer Verstärkung
CN103852614A (zh) * 2012-11-29 2014-06-11 山东电力集团公司济宁供电公司 一种检测母线漏电流的电路
US8841971B1 (en) 2012-12-17 2014-09-23 Google Inc. Short circuit current protection in an amplifier
CA2906480C (en) * 2013-03-15 2022-07-26 Ilium Technology, Inc. Apparatus and method for measuring electrical properties of matter
US9625517B2 (en) 2013-08-09 2017-04-18 Huawei Technologies Co., Ltd. Leakage current detection method and apparatus for detecting leakage of current from a board-mounted component
CN104345201A (zh) * 2013-08-09 2015-02-11 华为技术有限公司 漏电流检测方法和装置
JP6417137B2 (ja) * 2014-07-14 2018-10-31 株式会社ヒューモラボラトリー コンデンサの絶縁抵抗測定装置
WO2017069776A1 (en) 2015-10-23 2017-04-27 Hewlett Packard Enterprise Development Noise-canceling transimpedance amplifier (tia) systems
US10291207B2 (en) 2016-07-07 2019-05-14 Analog Devices, Inc. Wide range programmable resistor for discrete logarithmic control, and tuning circuit for variable gain active filter using same
US10466296B2 (en) 2017-01-09 2019-11-05 Analog Devices Global Devices and methods for smart sensor application
WO2018167450A1 (en) * 2017-03-16 2018-09-20 Isotopx Ltd An amplifier
CN112294187B (zh) * 2019-07-31 2024-03-15 苏州市春菊电器有限公司 一种吸尘器的尘杯灰尘量检测装置及其检测方法
CN116699463B (zh) * 2023-07-28 2024-02-06 珠海禅光科技有限公司 Mlcc电容器漏电流测量方法、装置、控制装置和介质

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58102173A (ja) 1981-12-14 1983-06-17 Fujitsu Ltd コンデンサの漏洩電流測定回路
US4862070A (en) * 1987-10-30 1989-08-29 Teradyne, Inc. Apparatus for testing input pin leakage current of a device under test
JPH01172765A (ja) 1987-12-28 1989-07-07 Advantest Corp 容量性物質の漏れ電流測定装置
US4931721A (en) * 1988-12-22 1990-06-05 E. I. Du Pont De Nemours And Company Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors
US5003486A (en) * 1989-02-24 1991-03-26 Nero Technologies Ltd. Programmable safety electrical socket controller
JP2841345B2 (ja) 1990-03-05 1998-12-24 マルコン電子株式会社 コンデンサの直流電圧印加試験回路
EP0468424B1 (de) * 1990-07-24 1995-07-12 i f m electronic gmbh Elektronisches Schaltgerät mit Anwesenheitsindikator
US5402329A (en) * 1992-12-09 1995-03-28 Ernest H. Wittenbreder, Jr. Zero voltage switching pulse width modulated power converters
JPH0777548A (ja) 1993-09-08 1995-03-20 Ckd Corp コンデンサの特性検査装置用治具
JP3457412B2 (ja) * 1995-01-11 2003-10-20 株式会社シバソク 超低雑音プログラマブル直流電源
JPH09113545A (ja) * 1995-10-16 1997-05-02 Murata Mfg Co Ltd 電流測定装置
US5842579A (en) * 1995-11-16 1998-12-01 Electro Scientific Industries, Inc. Electrical circuit component handler
US5677634A (en) * 1995-11-16 1997-10-14 Electro Scientific Industries, Inc. Apparatus for stress testing capacitive components
JP3673589B2 (ja) 1996-03-05 2005-07-20 ローム株式会社 コンデンサのリーク電流の測定方法およびその装置
JP3663251B2 (ja) 1996-03-07 2005-06-22 ローム株式会社 コンデンサのリーク電流の測定方法
JP3233037B2 (ja) 1996-08-26 2001-11-26 株式会社村田製作所 絶縁抵抗測定装置
US6011403A (en) * 1997-10-31 2000-01-04 Credence Systems Corporation Circuit arrangement for measuring leakage current utilizing a differential integrating capacitor
US6008630A (en) * 1998-07-02 1999-12-28 Compact Computer Corporation Soft-switched built-in active snubber circuit
DE19842470A1 (de) * 1998-09-16 2000-03-23 Siemens Ag Fehlerstrom-Schutzeinrichtung mit Überlastschutz
MY121524A (en) * 1999-09-22 2006-01-28 Murata Manufacturing Co Insulation resistance measuring apparatus for capacitive electronic parts
JP2002311074A (ja) 2001-04-09 2002-10-23 Matsushita Electric Ind Co Ltd コンデンサの漏れ電流測定方法
US6897731B2 (en) * 2003-10-24 2005-05-24 Texas Instruments Incorporated Method and circuit for overload recovery of an amplifier
JP4310695B2 (ja) * 2004-03-30 2009-08-12 アイシン精機株式会社 静電容量変化検出装置
JP2007129533A (ja) * 2005-11-04 2007-05-24 New Japan Radio Co Ltd トランスインピーダンスアンプ
US7663382B2 (en) * 2006-01-27 2010-02-16 Rudolph Technologies, Inc. High-speed capacitor leakage measurement systems and methods
US7940058B2 (en) * 2007-05-24 2011-05-10 Electro Scientific Industries, Inc. Capacitive measurements with fast recovery current return

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10972063B2 (en) 2018-10-17 2021-04-06 Analog Devices Global Unlimited Company Amplifier systems for measuring a wide range of current

Also Published As

Publication number Publication date
WO2009123845A9 (en) 2010-11-04
JP5498478B2 (ja) 2014-05-21
US20090243636A1 (en) 2009-10-01
WO2009123845A1 (en) 2009-10-08
US8686739B2 (en) 2014-04-01
US20120049857A1 (en) 2012-03-01
CN101981459B (zh) 2013-07-24
TWI439706B (zh) 2014-06-01
CN101981459A (zh) 2011-02-23
TW200949268A (en) 2009-12-01
US8054085B2 (en) 2011-11-08
JP2011516859A (ja) 2011-05-26

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