KR20080070675A - Cmp를 위한 마찰 감소 보조재 - Google Patents
Cmp를 위한 마찰 감소 보조재 Download PDFInfo
- Publication number
- KR20080070675A KR20080070675A KR1020087012131A KR20087012131A KR20080070675A KR 20080070675 A KR20080070675 A KR 20080070675A KR 1020087012131 A KR1020087012131 A KR 1020087012131A KR 20087012131 A KR20087012131 A KR 20087012131A KR 20080070675 A KR20080070675 A KR 20080070675A
- Authority
- KR
- South Korea
- Prior art keywords
- polishing
- substrate
- abrasive
- polishing system
- water
- Prior art date
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B29/00—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/0056—Control means for lapping machines or devices taking regard of the pH-value of lapping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/287,039 US20070117497A1 (en) | 2005-11-22 | 2005-11-22 | Friction reducing aid for CMP |
US11/287,039 | 2005-11-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20080070675A true KR20080070675A (ko) | 2008-07-30 |
Family
ID=38054171
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020087012131A KR20080070675A (ko) | 2005-11-22 | 2006-10-24 | Cmp를 위한 마찰 감소 보조재 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20070117497A1 (ja) |
JP (1) | JP2009516928A (ja) |
KR (1) | KR20080070675A (ja) |
CN (1) | CN101313388A (ja) |
TW (1) | TWI311091B (ja) |
WO (1) | WO2007149113A2 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180004019A (ko) * | 2016-07-01 | 2018-01-10 | 버슘머트리얼즈 유에스, 엘엘씨 | 배리어 화학적 기계적 평탄화용 첨가제 |
KR20210103587A (ko) * | 2019-10-03 | 2021-08-23 | 닛산 가가쿠 가부시키가이샤 | 양이온을 포함하는 레이저마크 주변의 융기를 해소하기 위한 연마용 조성물 |
Families Citing this family (17)
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WO2007103578A1 (en) * | 2006-03-09 | 2007-09-13 | Cabot Microelectronics Corporation | Method of polishing a tungsten carbide surface |
US9228257B2 (en) * | 2011-05-24 | 2016-01-05 | Rohm And Haas Company | Quality multi-spectral zinc sulfide |
JP6329909B2 (ja) * | 2011-12-28 | 2018-05-23 | インテグリス・インコーポレーテッド | 窒化チタンを選択的にエッチングするための組成物および方法 |
CN102775916B (zh) * | 2012-07-16 | 2015-01-07 | 芜湖海森材料科技有限公司 | 一种提高蓝宝石表面质量的抛光组合物 |
US9259818B2 (en) * | 2012-11-06 | 2016-02-16 | Sinmat, Inc. | Smooth diamond surfaces and CMP method for forming |
JP6007094B2 (ja) * | 2012-12-18 | 2016-10-12 | 花王株式会社 | サファイア板用研磨液組成物 |
JP6622963B2 (ja) * | 2013-01-04 | 2019-12-18 | 株式会社フジミインコーポレーテッド | 合金材料の研磨方法及び合金材料の製造方法 |
WO2014132641A1 (ja) * | 2013-02-28 | 2014-09-04 | 株式会社フジミインコーポレーテッド | コバルト除去のための研磨スラリー |
US9633831B2 (en) * | 2013-08-26 | 2017-04-25 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing composition for polishing a sapphire surface and methods of using same |
CN103589344B (zh) * | 2013-11-14 | 2015-06-10 | 上海新安纳电子科技有限公司 | 一种氧化铝抛光液的制备方法 |
JPWO2016043089A1 (ja) * | 2014-09-16 | 2017-08-10 | 山口精研工業株式会社 | サファイア基板用研磨剤組成物 |
KR102447178B1 (ko) | 2015-09-01 | 2022-09-26 | 삼성전자주식회사 | 반도체 장치의 제조 방법 |
JP6974336B2 (ja) * | 2016-02-16 | 2021-12-01 | シーエムシー マテリアルズ,インコーポレイティド | Iii−v族材料の研磨方法 |
DE102017110198A1 (de) * | 2017-05-11 | 2018-11-15 | Walter Maschinenbau Gmbh | Schleif- und/oder Erodiermaschine sowie Verfahren zur Vermessung und/oder Referenzierung der Maschine |
US11161751B2 (en) | 2017-11-15 | 2021-11-02 | Saint-Gobain Ceramics & Plastics, Inc. | Composition for conducting material removal operations and method for forming same |
CN110358454A (zh) * | 2019-07-20 | 2019-10-22 | 大连理工大学 | 一种通用化学机械抛光液 |
US11879094B2 (en) | 2022-06-03 | 2024-01-23 | Halliburton Energy Services, Inc. | Enhancing friction reduction and protection of wellbore equipment during hydraulic fracturing |
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DE2710997C3 (de) * | 1977-03-14 | 1980-08-14 | Dr. Karl Thomae Gmbh, 7950 Biberach | 4-Alkoxy carbonylamino-phenyläthanolamine, deren Herstellung und deren Verwendung als Arzneimittel |
JPH0228112A (ja) * | 1988-04-21 | 1990-01-30 | Kaken Pharmaceut Co Ltd | 点眼用眼圧調整剤 |
US5352277A (en) * | 1988-12-12 | 1994-10-04 | E. I. Du Pont De Nemours & Company | Final polishing composition |
DE3902753A1 (de) * | 1989-01-31 | 1990-08-02 | Henkel Kgaa | Verfahren zur hydrothermalen herstellung von kaliumsilikatloesungen mit hohem si0(pfeil abwaerts)2(pfeil abwaerts):k(pfeil abwaerts)2(pfeil abwaerts)0-molverhaeltnis |
DE3938789A1 (de) * | 1989-11-23 | 1991-05-29 | Henkel Kgaa | Verfahren zur hydrothermalen herstellung von kaliumsilikatloesungen |
DE19643592A1 (de) * | 1996-10-22 | 1998-04-23 | Bayer Ag | Verfahren zur Herstellung von alpha-Alkoxy-alpha-trifluormethyl-arylessigsäureestern und -arylessigsäuren |
SG54606A1 (en) * | 1996-12-05 | 1998-11-16 | Fujimi Inc | Polishing composition |
WO1998048453A1 (en) * | 1997-04-23 | 1998-10-29 | Advanced Chemical Systems International, Inc. | Planarization compositions for cmp of interlayer dielectrics |
TW593331B (en) * | 1997-07-25 | 2004-06-21 | Inspire Pharmaceuticals Inc | Method for large-scale production of di(uridine 5')-tetraphosphate and salts thereof |
US6051605A (en) * | 1997-08-08 | 2000-04-18 | Warner-Lambert Company | Method of treating psychosis and schizophrenia |
JPH11140427A (ja) * | 1997-11-13 | 1999-05-25 | Kobe Steel Ltd | 研磨液および研磨方法 |
CO5070714A1 (es) * | 1998-03-06 | 2001-08-28 | Nalco Chemical Co | Proceso para la preparacion de silice coloidal estable |
US6217416B1 (en) * | 1998-06-26 | 2001-04-17 | Cabot Microelectronics Corporation | Chemical mechanical polishing slurry useful for copper/tantalum substrates |
US6276996B1 (en) * | 1998-11-10 | 2001-08-21 | Micron Technology, Inc. | Copper chemical-mechanical polishing process using a fixed abrasive polishing pad and a copper layer chemical-mechanical polishing solution specifically adapted for chemical-mechanical polishing with a fixed abrasive pad |
JP3941284B2 (ja) * | 1999-04-13 | 2007-07-04 | 株式会社日立製作所 | 研磨方法 |
CA2393466C (en) * | 1999-12-21 | 2010-01-19 | Gpi Nil Holdings, Inc. | Hydantoin derivative compounds, pharmaceutical compositions, and methods of using same |
US6551935B1 (en) * | 2000-08-31 | 2003-04-22 | Micron Technology, Inc. | Slurry for use in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods |
US6602117B1 (en) * | 2000-08-30 | 2003-08-05 | Micron Technology, Inc. | Slurry for use with fixed-abrasive polishing pads in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods |
US6709316B1 (en) * | 2000-10-27 | 2004-03-23 | Applied Materials, Inc. | Method and apparatus for two-step barrier layer polishing |
US20030032078A1 (en) * | 2001-01-23 | 2003-02-13 | Board Of Regents, The University Of Texas System | Methods and compositions for the treatment of macular and retinal degenerations |
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US6800218B2 (en) * | 2001-08-23 | 2004-10-05 | Advanced Technology Materials, Inc. | Abrasive free formulations for chemical mechanical polishing of copper and associated materials and method of using same |
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US6685755B2 (en) * | 2001-11-21 | 2004-02-03 | Saint-Gobain Abrasives Technology Company | Porous abrasive tool and method for making the same |
US6827639B2 (en) * | 2002-03-27 | 2004-12-07 | Catalysts & Chemicals Industries Co., Ltd. | Polishing particles and a polishing agent |
US6913517B2 (en) * | 2002-05-23 | 2005-07-05 | Cabot Microelectronics Corporation | Microporous polishing pads |
JP2004128112A (ja) * | 2002-10-01 | 2004-04-22 | Renesas Technology Corp | 半導体装置の製造方法 |
AU2004222279B2 (en) * | 2003-03-14 | 2010-01-21 | University Of Washington | Retinoid replacements and opsin agonists and methods for the use thereof |
JP2005007520A (ja) * | 2003-06-19 | 2005-01-13 | Nihon Micro Coating Co Ltd | 研磨パッド及びその製造方法並びに研磨方法 |
US7485241B2 (en) * | 2003-09-11 | 2009-02-03 | Cabot Microelectronics Corporation | Chemical-mechanical polishing composition and method for using the same |
US20050136670A1 (en) * | 2003-12-19 | 2005-06-23 | Ameen Joseph G. | Compositions and methods for controlled polishing of copper |
US7566808B2 (en) * | 2004-02-17 | 2009-07-28 | President And Fellows Of Harvard College | Management of ophthalmologic disorders, including macular degeneration |
US20060252107A1 (en) * | 2005-02-22 | 2006-11-09 | Acucela, Inc. | Compositions and methods for diagnosing and treating retinal diseases |
US20070039926A1 (en) * | 2005-08-17 | 2007-02-22 | Cabot Microelectronics Corporation | Abrasive-free polishing system |
-
2005
- 2005-11-22 US US11/287,039 patent/US20070117497A1/en not_active Abandoned
-
2006
- 2006-10-24 WO PCT/US2006/041420 patent/WO2007149113A2/en active Application Filing
- 2006-10-24 CN CNA2006800437962A patent/CN101313388A/zh active Pending
- 2006-10-24 KR KR1020087012131A patent/KR20080070675A/ko not_active Application Discontinuation
- 2006-10-24 JP JP2008542318A patent/JP2009516928A/ja active Pending
- 2006-11-08 TW TW095141357A patent/TWI311091B/zh not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180004019A (ko) * | 2016-07-01 | 2018-01-10 | 버슘머트리얼즈 유에스, 엘엘씨 | 배리어 화학적 기계적 평탄화용 첨가제 |
KR20210103587A (ko) * | 2019-10-03 | 2021-08-23 | 닛산 가가쿠 가부시키가이샤 | 양이온을 포함하는 레이저마크 주변의 융기를 해소하기 위한 연마용 조성물 |
Also Published As
Publication number | Publication date |
---|---|
TW200734117A (en) | 2007-09-16 |
WO2007149113A3 (en) | 2008-04-10 |
TWI311091B (en) | 2009-06-21 |
WO2007149113A2 (en) | 2007-12-27 |
CN101313388A (zh) | 2008-11-26 |
JP2009516928A (ja) | 2009-04-23 |
WO2007149113A9 (en) | 2008-02-28 |
US20070117497A1 (en) | 2007-05-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |