KR20070013314A - 직류 시험 장치 - Google Patents

직류 시험 장치 Download PDF

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Publication number
KR20070013314A
KR20070013314A KR1020067024664A KR20067024664A KR20070013314A KR 20070013314 A KR20070013314 A KR 20070013314A KR 1020067024664 A KR1020067024664 A KR 1020067024664A KR 20067024664 A KR20067024664 A KR 20067024664A KR 20070013314 A KR20070013314 A KR 20070013314A
Authority
KR
South Korea
Prior art keywords
current
current detection
resistor
voltage
amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020067024664A
Other languages
English (en)
Korean (ko)
Inventor
히로노리 타나카
Original Assignee
주식회사 아도반테스토
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 아도반테스토 filed Critical 주식회사 아도반테스토
Publication of KR20070013314A publication Critical patent/KR20070013314A/ko
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/32—Compensating for temperature change

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
KR1020067024664A 2004-04-28 2005-04-26 직류 시험 장치 Withdrawn KR20070013314A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004133955A JP2005315729A (ja) 2004-04-28 2004-04-28 直流試験装置
JPJP-P-2004-00133955 2004-04-28

Publications (1)

Publication Number Publication Date
KR20070013314A true KR20070013314A (ko) 2007-01-30

Family

ID=35241802

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020067024664A Withdrawn KR20070013314A (ko) 2004-04-28 2005-04-26 직류 시험 장치

Country Status (6)

Country Link
US (1) US20070103174A1 (https=)
JP (1) JP2005315729A (https=)
KR (1) KR20070013314A (https=)
CN (1) CN1947025A (https=)
DE (1) DE112005000986T5 (https=)
WO (1) WO2005106513A1 (https=)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI474710B (zh) * 2007-10-18 2015-02-21 Ind Tech Res Inst 行動通訊設備於離線使用數位內容之收費方法及其系統
JP2010054314A (ja) * 2008-08-28 2010-03-11 Yokogawa Electric Corp 半導体試験装置
EP2169412A1 (en) * 2008-09-25 2010-03-31 Ilumab AB Electrical current measurement arrangement
CN101923124B (zh) * 2009-06-17 2012-06-20 上海华虹Nec电子有限公司 确定em测试结构中加速因子的方法
US8779777B2 (en) * 2010-06-04 2014-07-15 Linear Technology Corporation Dynamic compensation of aging drift in current sense resistor
CN101957402A (zh) * 2010-08-31 2011-01-26 上海华岭集成电路技术股份有限公司 瞬时电流的测试系统与方法
JP5720259B2 (ja) * 2011-01-18 2015-05-20 トヨタ自動車株式会社 電流検出回路
JP5467539B2 (ja) * 2012-02-10 2014-04-09 横河電機株式会社 電極の評価装置および評価方法
JP6738236B2 (ja) * 2016-08-12 2020-08-12 東京エレクトロン株式会社 デバイス検査回路、デバイス検査装置及びプローブカード
CN111638480B (zh) * 2020-06-09 2022-10-11 广东省计量科学研究院（华南国家计量测试中心） 一种基于温度补偿的电流传感器校准系统及方法
JP7468266B2 (ja) * 2020-09-16 2024-04-16 オムロン株式会社 電圧検出装置
DE102021214606A1 (de) 2021-12-16 2023-06-22 Vitesco Technologies GmbH Stromerfassungssystem
CN114878033B (zh) * 2022-03-29 2023-12-22 深圳国微感知技术有限公司 一种矩阵式压力分布测量系统及方法
CN114924109B (zh) * 2022-07-20 2022-11-29 深圳市英特瑞半导体科技有限公司 低功耗芯片电流的测试方法、电路及其装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3430130A (en) * 1966-05-20 1969-02-25 Carl A Schneider Conductivity measuring circuit utilizing conductivity cell as input resistance of an operational amplifier
US4000643A (en) * 1976-03-29 1977-01-04 Honeywell Inc. Apparatus for producing a compensating voltage
US4438411A (en) * 1981-07-20 1984-03-20 Ford Aerospace & Communications Corporation Temperature compensating method and apparatus for thermally stabilizing amplifier devices
JPS5939105A (ja) * 1982-08-27 1984-03-03 Fujitsu Ltd 制御電圧発生回路
FR2659177B1 (fr) * 1990-03-01 1992-09-04 Merlin Gerin Capteur de courant pour un declencheur electronique d'un disjoncteur electrique.
JP3218106B2 (ja) * 1992-12-28 2001-10-15 日本電波工業株式会社 水晶発振器の温度補償回路
JPH09178782A (ja) * 1995-12-25 1997-07-11 Advantest Corp 電流検出回路及びその回路を用いた直流試験装置
US20030025488A1 (en) * 1996-12-26 2003-02-06 Emc Technology, Inc. Power sensing RF termination apparatus including temperature compensation means
JPH10283044A (ja) * 1997-04-04 1998-10-23 Asia Electron Inc 定電流電源装置
JP2000258472A (ja) * 1999-03-10 2000-09-22 Mitsubishi Electric Corp 電流検出装置
US6688119B2 (en) * 2000-12-22 2004-02-10 General Electric Company Methods and apparatus for increasing appliance measuring system accuracy
US6700365B2 (en) * 2001-12-10 2004-03-02 Intersil Americas Inc. Programmable current-sensing circuit providing discrete step temperature compensation for DC-DC converter

Also Published As

Publication number Publication date
WO2005106513A1 (ja) 2005-11-10
JP2005315729A (ja) 2005-11-10
DE112005000986T5 (de) 2007-03-29
US20070103174A1 (en) 2007-05-10
CN1947025A (zh) 2007-04-11

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Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20061124

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid