KR20060131795A - 게이트 전극 구조의 트리밍을 제어하는 방법 - Google Patents

게이트 전극 구조의 트리밍을 제어하는 방법 Download PDF

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Publication number
KR20060131795A
KR20060131795A KR1020067013196A KR20067013196A KR20060131795A KR 20060131795 A KR20060131795 A KR 20060131795A KR 1020067013196 A KR1020067013196 A KR 1020067013196A KR 20067013196 A KR20067013196 A KR 20067013196A KR 20060131795 A KR20060131795 A KR 20060131795A
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KR
South Korea
Prior art keywords
gate electrode
electrode structure
layer
dimension
trim
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020067013196A
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English (en)
Korean (ko)
Inventor
홍유 유
리 첸
Original Assignee
동경 엘렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 동경 엘렉트론 주식회사 filed Critical 동경 엘렉트론 주식회사
Publication of KR20060131795A publication Critical patent/KR20060131795A/ko
Withdrawn legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/28008—Making conductor-insulator-semiconductor electrodes
    • H01L21/28017—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon
    • H01L21/28026—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor
    • H01L21/28123—Lithography-related aspects, e.g. sub-lithography lengths; Isolation-related aspects, e.g. to solve problems arising at the crossing with the side of the device isolation; Planarisation aspects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Drying Of Semiconductors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
KR1020067013196A 2004-03-31 2005-02-11 게이트 전극 구조의 트리밍을 제어하는 방법 Withdrawn KR20060131795A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/812,952 US20050221513A1 (en) 2004-03-31 2004-03-31 Method of controlling trimming of a gate electrode structure
US10/812,952 2004-03-31

Publications (1)

Publication Number Publication Date
KR20060131795A true KR20060131795A (ko) 2006-12-20

Family

ID=34960978

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020067013196A Withdrawn KR20060131795A (ko) 2004-03-31 2005-02-11 게이트 전극 구조의 트리밍을 제어하는 방법

Country Status (5)

Country Link
US (2) US20050221513A1 (enExample)
JP (1) JP2007531309A (enExample)
KR (1) KR20060131795A (enExample)
CN (1) CN1938841A (enExample)
WO (1) WO2005104218A1 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101388389B1 (ko) * 2006-02-10 2014-04-22 인터몰레큘러 인코퍼레이티드 재료, 단위 프로세스 및 프로세스 시퀀스를 조합적으로 변경하는 방법 및 장치
JP2008124399A (ja) * 2006-11-15 2008-05-29 Toshiba Corp 半導体装置の製造方法
JP5229711B2 (ja) * 2006-12-25 2013-07-03 国立大学法人名古屋大学 パターン形成方法、および半導体装置の製造方法
JP4421618B2 (ja) * 2007-01-17 2010-02-24 東京エレクトロン株式会社 フィン型電界効果トランジスタの製造方法
US7674350B2 (en) * 2007-01-22 2010-03-09 Infineon Technologies Ag Feature dimension control in a manufacturing process
US20080248412A1 (en) * 2007-04-09 2008-10-09 John Douglas Stuber Supervisory etch cd control
JP5374039B2 (ja) * 2007-12-27 2013-12-25 東京エレクトロン株式会社 基板処理方法、基板処理装置及び記憶媒体
US8012811B2 (en) * 2008-01-03 2011-09-06 International Business Machines Corporation Methods of forming features in integrated circuits
US8168542B2 (en) * 2008-01-03 2012-05-01 International Business Machines Corporation Methods of forming tubular objects
JP2009289974A (ja) * 2008-05-29 2009-12-10 Toshiba Corp 半導体装置の製造方法
CN101593685B (zh) * 2008-05-29 2011-05-04 中芯国际集成电路制造(北京)有限公司 栅极形成方法
CN102194675B (zh) * 2010-03-11 2013-06-12 中芯国际集成电路制造(上海)有限公司 制作半导体器件栅极的方法
KR101145334B1 (ko) * 2010-05-31 2012-05-14 에스케이하이닉스 주식회사 반도체 장치 제조방법
CN102339772B (zh) * 2010-07-16 2014-01-15 中芯国际集成电路制造(上海)有限公司 检测通孔缺陷的方法
US20120083127A1 (en) * 2010-09-30 2012-04-05 Tokyo Electron Limited Method for forming a pattern and a semiconductor device manufacturing method
US8748199B2 (en) * 2011-04-22 2014-06-10 GlobalFoundries, Inc. In-situ measurement of feature dimensions
WO2013085290A1 (ko) * 2011-12-07 2013-06-13 주식회사 테스 반도체소자 제조방법
US9059038B2 (en) * 2012-07-18 2015-06-16 Tokyo Electron Limited System for in-situ film stack measurement during etching and etch control method
WO2015031163A1 (en) * 2013-08-27 2015-03-05 Tokyo Electron Limited Method for laterally trimming a hardmask
US10497575B2 (en) * 2017-05-03 2019-12-03 Tokyo Electron Limited Method for increasing trench CD in EUV patterning without increasing single line opens or roughness
US10727143B2 (en) * 2018-07-24 2020-07-28 Lam Research Corporation Method for controlling core critical dimension variation using flash trim sequence
CN110687144B (zh) * 2019-10-28 2022-07-22 长江存储科技有限责任公司 一种ped样品及其制备方法
WO2022159765A1 (en) * 2021-01-25 2022-07-28 Lam Research Corporation Selective silicon trim by thermal etching

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0313683A1 (en) * 1987-10-30 1989-05-03 International Business Machines Corporation Method for fabricating a semiconductor integrated circuit structure having a submicrometer length device element
US5943550A (en) * 1996-03-29 1999-08-24 Advanced Micro Devices, Inc. Method of processing a semiconductor wafer for controlling drive current
US6087238A (en) * 1997-12-17 2000-07-11 Advanced Micro Devices, Inc. Semiconductor device having reduced-width polysilicon gate and non-oxidizing barrier layer and method of manufacture thereof
JP2000299367A (ja) * 1999-04-15 2000-10-24 Tokyo Electron Ltd 処理装置及び被処理体の搬送方法
US6245581B1 (en) * 2000-04-19 2001-06-12 Advanced Micro Devices, Inc. Method and apparatus for control of critical dimension using feedback etch control
US6461878B1 (en) * 2000-07-12 2002-10-08 Advanced Micro Devices, Inc. Feedback control of strip time to reduce post strip critical dimension variation in a transistor gate electrode
US6518106B2 (en) * 2001-05-26 2003-02-11 Motorola, Inc. Semiconductor device and a method therefor
JP3708031B2 (ja) * 2001-06-29 2005-10-19 株式会社日立製作所 プラズマ処理装置および処理方法
US6841584B2 (en) * 2002-03-18 2005-01-11 University Of Southern California Reinforced phenolic foam

Also Published As

Publication number Publication date
CN1938841A (zh) 2007-03-28
WO2005104218A1 (en) 2005-11-03
JP2007531309A (ja) 2007-11-01
US20050221513A1 (en) 2005-10-06
US20070111338A1 (en) 2007-05-17

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PA0105 International application

Patent event date: 20060630

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid