KR200471343Y1 - Vertical manipulator - Google Patents

Abstract

The present invention has a main block having an incision region at one end of the lower end; A test block disposed at one end of the main block so as to be elevated, and having a protrusion formed in the cutout region, the test block including a probe contacting the panel test terminal; A lift unit disposed between the main block and the test block and forming a lift path through which the test block is lifted to be substantially close to an installation position of the probe; And an elastic part elastically supporting the test block in the cutout area.

Description

Vertical Manipulator {VERTICAL MANIPULATOR}

The present invention relates to a vertical type manipulator, and more particularly, to a vertical type manipulator capable of stably performing an electrical test of the panel.

In general, a display panel such as a liquid crystal display (TFT-LCD) generally has a large-sized and high-resolution display due to the achievement of mass production technology and research and development, so that it can be used not only for a notebook computer but also for a large-sized monitor, LCD, PDP, It has been developed as an application product, gradually replacing existing CRT (Cathode Ray Tube) products, and its proportion in the display industry is gradually increasing.

In such a display panel, a liquid crystal material is injected between two substrates so that the two substrates are opposed to each other with two electrodes formed thereon, and then an electric field is generated by applying a voltage to the two electrodes An apparatus for displaying an image by changing the transmittance of light by moving liquid crystal molecules, comprising: a liquid crystal panel in which liquid crystals are injected between two substrates; a backlight disposed under the liquid crystal panel and used as a light source; And a driving unit for driving the liquid crystal panel.

Here, the driver may display an image by applying an electrical signal to a pixel region of a display panel which is defined by intersecting a plurality of gate lines and a data line. In the same way as the semiconductor chip, The driving unit includes a driving integrated circuit (IC) for applying an electrical signal to each wiring of the display panel. The driving IC includes a driving IC (COG), a tape carrier package (TCP), a chip on film, and a chip on film according to a method of packaging the liquid crystal panel on a liquid crystal panel.

The chip on glass (COG) is a technique for mounting a driver IC on an array substrate of a display panel. The driver IC is mounted on the tape carrier package (TCP) and the chip on film (COF) The film with the built-in driving IC can be bent to the back surface of the display panel, resulting in a compact structure.

The inspection apparatus for inspecting the defective display panel may include an inspection system having various measuring instruments installed therein and a probe block electrically connecting the inspection system and the display panel, A probe assembly having a probe directly contacting a plurality of electrode pads connected to the driving IC, and a controller connected to the probe assembly and the inspection system to apply an electrical signal to the driving IC through the electrode pad, And a chip glass on which the same driving IC as that of the driving IC of the display panel is mounted so as to be capable of performing a test on the gate lines and the data lines on the display panel, It is checked whether there is a defect.

Normally, when testing such an electrical signal, the probe is physically connected to the test terminal of the panel.

At this time, when the probe block on which the probe is installed is upwardly or misaligned, normal electrical test and test results can not be obtained.

A prior art related to the present invention is Korean Patent Laid-Open No. 10-2008-0070133 (Published on July 30, 2008), and the prior art describes a description of a probe block for a display panel inspection.

It is an object of the present invention to provide a vertical manipulator for preventing misalignment of a test block and performing a stable electrical test when the test block is guided vertically so as to be elastically contacted to an electrical test position of the panel .

Another object of the present invention is to construct a test block so that the ascending / descending path of the test block is close to or coincident with the probe position of the test block, and the elastic support position of the test block is arranged so as to be spaced apart from the ascending / A vertical manipulator capable of providing a resilient force to the probe position to prevent lifting of the test block and maintaining a contact force between the probe and the panel test terminal at a constant level.

In a preferred embodiment, the present invention is a main block having a cutting area at one end of the lower end; A test block disposed at one end of the main block so as to be elevated, and having a protrusion formed in the cutout region, the test block including a probe contacting the panel test terminal; A lift unit disposed between the main block and the test block and forming a lift path through which the test block is lifted to be substantially close to an installation position of the probe; And an elastic part elastically supporting the test block in the cutout area.

The main block may include a first main block having a guide hole for guiding a lifting path of the lifting unit on one end side thereof, and a second main block formed at the other end of the first main block, and a lower surface of the main block being formed of a lower surface of the first main block. And a second main block positioned downwardly.

The cutout region is preferably formed of a lower surface of the first main block and a lower surface of the second main block.

The test block includes a lift block having one end side of the first main block and the protrusion, and a probe block detachably installed at a lower end of the lift block and having the probe.

Preferably, the elevating block includes a first elevating block disposed at one end side of the first main block, and a second elevating block formed at the other end of the first elevating block and forming the protruding portion.

The lifting unit is provided on the other end surface of the first lifting block, it is preferable to include a guide member for lifting along the guide hole to form the lifting path.

The guide member includes a first guide member provided on the other end surface of the first lifting block, and a second guide member provided on the side of the first guide member and fitted into the guide hole to move up and down.

The width of the first guide member is preferably formed to be wider than the width of the first guide member.

Preferably, the elastic unit includes a plurality of elastic members interposed between the lower surface of the first main block and the second lifting block.

At the lower end of the elevating block, an auxiliary elevating block in which the probe block is installed is further provided, and the second elevating block has a plurality of through holes penetrating up and down.

The auxiliary elevating block is formed with a plurality of seating grooves that coincide with the plurality of through holes.

An upper end of each of the pair of elastic members is fixed to a lower surface of the first main block.

A lower end of each of the pair of elastic members may be elastically supported in each of the seating grooves through each of the through holes.

One end of the first elevating block is formed with an incision groove along the top and bottom, and one end of the auxiliary elevating block is formed with an installation hole in the same position as the incision groove.

One end of the installation hole is supported by the cutting groove, and the other end is preferably provided with a coupling member coupled to the probe block through the installation hole.

Preferably, the installation position of the probe and the elastic portion are on both sides of the elevating path, and the clearance between the installation position of the probe and the elevating path is narrower than the gap between the elastic portion and the elevating path. Do.

It is preferable that a part of the installation position of the probe and the position of the lifting path are the same as each other.

The present invention has an effect of preventing a test block from being misaligned when guiding the test block along the vertical direction so as to elastically contact the electrical test position of the panel, thereby performing a stable electrical test.

In addition, the present invention is configured so that the lifting path of the test block is close to or coincident with the prop position of the test block, and the elastic support position of the test block is arranged to be spaced apart from the lifting path in a direction opposite to the probe position, The elastic force is provided to the probe position, thereby preventing lifting of the test block and maintaining a constant contact force between the probe and the panel test terminal.

1 is a perspective view showing a vertical manipulator of the present invention.
2 is a side view showing a vertical manipulator of the present invention.
3 is an exploded perspective view showing a vertical manipulator of the present invention.
4 is a cross-sectional view showing a vertical manipulator according to the present invention.

Hereinafter, a vertical manipulator of the present invention will be described with reference to the accompanying drawings.

1 is a perspective view showing a vertical manipulator of the present invention, Figure 2 is a side view showing a vertical manipulator of the present invention, Figure 3 is an exploded perspective view showing a vertical manipulator of the present invention, Figure 4 is in accordance with the present invention A cross section showing a vertical manipulator.

1 to 4, the vertical manipulator of the present invention is largely composed of a main block 100, a test block 200, a lifting unit 300, and an elastic unit 400.

The main block 100 includes a first main block 110 and a second main block 120.

One end side surface of the first main block 110 is formed with a guide hole 111 having a predetermined depth and width along the top and bottom. The guide holes 111 may be formed in a single piece, or may be formed in plurality in parallel with each other.

The second main block 120 is formed at the other end of the first main block 110.

Here, the bottom surface of the first main block 110 and the bottom surface of the second main block 120 are formed stepped.

The lower surface of the second main block 120 is disposed to be positioned at a lower position than the lower surface of the first main block 110.

As described above, the step formed between the lower surfaces of the first and second main blocks 110 and 120 forms a stepped region of the '-' shape. Here, the stepped area is an incision area.

The test block 200 is disposed to be movable up and down along one side of the main block 100.

The test block 200 includes a lifting block 210 and a probe block 220.

The elevating block 210 includes a first elevating block 211 and a second elevating block 212.

The first elevating block 211 is disposed on one end side of the first main block 110, the second elevating block 212 is connected to the lower end of the first elevating block 211 is located in the cutting area It is formed to be.

Therefore, the lifting block 210 is formed in a 'b' shape as a whole.

The probe block 220 illustrated in FIG. 2 is installed to be detachable from the lower end of the elevating block 210.

The probe block 220 includes a probe 221 that is physically connected to a test terminal of a panel (not shown) to acquire an electrical signal.

The probe 221 may be formed to protrude from the lower end of one end side of the probe block 220.

In addition, an auxiliary lifting block 230 may be further installed at a lower end of the lifting block 210.

Here, one end of the first elevating block 211 is formed with a cutting groove 211a along the top and bottom.

One end of the auxiliary lifting block 230 is provided with an installation hole 231 is the same position as the cutting groove 211a.

One end of the installation hole 231 is supported by the cutting groove 211a, and the other end of the installation hole 231 is provided with a coupling member 240 coupled to the probe block 220.

Therefore, the probe block 220 may be detachable from the lifting block 210 depending on whether the coupling member 240 is coupled.

The lifting unit according to the present invention serves to guide the test block 200 to be lifted up and down.

The guide hole 111 formed on one side of the first main block 110 forms a lifting path of the test block 200.

The elevating unit is installed on the other end surface of the first elevating block 211, and is composed of a guide member 300 which is elevated along the guide hole 211a to form the elevating path.

The guide member 300 includes a first guide member 310 and a second guide member 320.

The first guide member 310 is formed on the other end surface of the first lifting block 211, the second guide member 320 is protruded to the first guide member 310 is fitted into the guide hole (211a) to lift Possibly arranged.

Here, the width of the first guide member 310 is formed wider than the width of the first guide member 310.

The second guide member 320 may be inserted into the guide hole 211 a to form a lifting path, and the outer surface of the first guide member 210 may be in close contact with a peripheral area of the guide hole 211 a. Can be.

Therefore, when the test block 200 is elevated along the guide hole 211a, the first guide member 210 may prevent misalignment such as being twisted left and right or back and forth.

The guide member 300 formed as described above is disposed to be close to the installation position of the probe 221 of the probe block 200.

The elastic part 400 according to the present invention is interposed between the lower surface of the first main block 110 and the second lifting block 212 so that the test block 200 is lifted and burned in the main block 100. Sexual ascension

In addition, the elastic part 400 also serves to absorb shock generated when the probe 221 of the test block 200 is in contact with the test terminal of the panel.

The elastic part 400 is composed of a plurality of elastic members 410 such as elastic springs.

The second lifting block 212 is formed with a plurality of through holes 212a penetrating up and down.

In addition, a plurality of seating grooves 231 corresponding to positions of the through holes 212a are formed at the other end of the auxiliary lifting block 230 installed at the bottom of the lifting block 210.

Upper ends of each of the plurality of elastic members 410 are fixedly installed on a lower surface of the second lifting block 212.

Lower ends of each of the plurality of elastic members 410 pass through the respective through holes 212a and are supported by the corresponding mounting grooves 231.

Accordingly, the main block 100 and the test block 200 may be in a state in which the main block 100 and the test block 200 are elastically supported by the elastic unit 400.

Here, the installation position of the probe 221 and the elastic portion 400 is on both sides of the lifting path.

In addition, the clearance between the installation position of the probe 221 and the lifting path is formed to be narrower than the clearance between the elastic portion 400 and the lifting path.

Next, the operation of the vertical manipulator configured as described above will be described.

<Test initial state>

1 and 2, the elastic members 410 elastically supporting the test block 200 and the main block 100 form a relaxed state.

Here, a predetermined gap G is formed between the lower surface of the first main block 110 and the upper surface of the second lifting block 212.

At this time, the position of the lifting path of the test block 200 is formed at a position forming a play close to the installation position of the probe 221, the installation position of the elastic portion 400 is located behind the position of the lifting path.

Therefore, the elastic part 400 is always maintained between the first main block 110 and the second lifting block 212 to maintain a constant elasticity, and the clearance between the lifting path and the installation position of the probe 221 is While in close proximity, the elevating block 210 may achieve a state supported by the guide member 300.

<Test status>

In the above state, when the main block 100 is lowered to bring the probe 221 of the probe block 220 into contact with the test terminal of the panel, the probe 221 of the test block 200 contacts the test terminal. , The repulsive force generated by the upward acting so that the test block 200 flows upward.

That is, the guide member 300 installed in the first lifting block 211 flows upward in the state of being fitted into the guide groove 111 formed in the first main block 110.

At this time, since the position where the repulsive force is generated is close to the lifting path, the moment due to the repulsive force can be substantially reduced.

Therefore, the lifting block 210 is upwardly raised while the misalignment state such as the end of the probe block 220 is lifted upward.

In addition, the elastic members 410 positioned behind the lifting path are compressed by the lifting block 210 that is lifted between the second lifting block 212 and the first main block 110. .

Here, since the elastic members 410 are disposed at a position that forms a clearance longer than the clearance between the elevating path and the installation position of the probe 221, the elastic support force upward of the first main block 110 is generated and maintained. To form a state.

Therefore, even if the lifting path is twisted back and forth to cause the probe block 220 to be lifted upward, the elastic support force may be forced to return to the position where the probe block 220 is not lifted.

Thus, the embodiment according to the present invention can prevent the misalignment of the test block when the test block is guided along the up and down to elastically contact the electrical test position of the panel can perform a stable electrical test.

In addition, an embodiment according to the present invention is to configure the lifting path of the test block to be close to or coincident with the prop position of the test block, so that the elastic support position of the test block is spaced apart from the lifting path along the direction opposite to the probe position The arrangement may provide an elastic force to the probe position to prevent lifting of the test block and maintain a constant contact force between the probe and the panel test terminal.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the present invention is not limited to the disclosed exemplary embodiments, It will be understood that the invention may be embodied in other specific forms without departing from the spirit or essential characteristics of the invention. It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive.

100: main block 110: first main block
120: second main block 200: test block
210: lifting block 211: first lifting block
211a: Incision groove 212: Second lifting block
212a: through hole 220: probe block
221: probe 230: auxiliary lifting block
231: mounting groove 232: mounting hole
300: guide member 310: first guide member
320: second guide member 400: elastic portion
410: elastic spring

Claims (10)

A main block having an incision region at one lower end thereof;
A test block disposed on one end of the main block so as to be lifted and lowered, a protrusion formed in the cutout region, the test block including a probe contacting the panel test terminal;
An elevating unit disposed between the main block and the test block and forming an elevating path through which the test block is elevated so as to be close to an installation position of the probe; And
An elastic part elastically supporting the test block in the cutout area,
The main block,
A first main block having a guide hole for guiding a lifting path of the lifting part on one end side thereof;
A second main block formed at the other end of the first main block, the lower main surface being positioned to be stepped downward with the lower surface of the first main block,
And the cutout area is formed by a lower surface of the first main block and a lower surface of the second main block.
delete The method of claim 1,
The test block,
A lifting block having one end side of the first main block and the protrusion;
Removably installed at the lower end of the lifting block, having a probe block having the probe,
The lifting block,
A first lifting block disposed on one end side of the first main block;
And a second lifting block formed at the other end of the first lifting block and forming the protrusion.
The method of claim 3, wherein
The elevating unit includes:
And a guide member installed on the other end surface of the first lifting block, the guide member being lifted along the guide hole to form the lifting path.
5. The method of claim 4,
The guide member
A first guide member installed on the other end surface of the first lifting block,
It is provided on the side of the first guide member, and provided with a second guide member which is inserted into the guide hole and lifted,
And a width of the first guide member is wider than that of the first guide member.
5. The method of claim 4,
The elastic portion
And a plurality of elastic members interposed between the lower surface of the first main block and the second lifting block.
The method according to claim 6,
At the lower end of the elevating block, an auxiliary elevating block in which the probe block is installed is further installed,
The second lifting block is formed with a plurality of through holes penetrating up and down,
In the auxiliary lifting block, a plurality of seating grooves are formed in the same position as the plurality of through holes,
An upper end of each of the pair of elastic members is fixed to a lower surface of the first main block,
And a lower end of each of the pair of elastic members is elastically supported in each of the seating grooves through each of the through holes.
8. The method of claim 7,
One end of the first lifting block is formed with a cutting groove along the top and bottom,
One end of the auxiliary lifting block is formed with an installation hole that matches the position of the cutting groove,
And a coupling member having one end supported by the cutting groove and the other end passing through the installation hole and coupled to the probe block.
The method of claim 1,
The probe and the elastic part are installed on both sides of the lifting path as a boundary, and the clearance between the installation position of the probe and the lifting path is narrower than the gap between the elastic part and the lifting path. Vertical Manipulator.
The method of claim 1,
The installation position of the probe and the position of the lifting path is part of the vertical manipulator, characterized in that the same.

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