KR101189666B1 - unit for probing flat panel display - Google Patents

Abstract

The present invention relates to a probe unit for inspecting a display panel for applying an electrical signal of a tester to a display panel, the main body having a bottom surface having an inclined surface and a horizontal surface; A probe sheet including a fixed end portion inclinedly mounted on an inclined surface of the bottom surface and a free end portion spaced apart from a horizontal surface of the bottom surface and extending from the fixed end portion at the same slope as the inclined surface; And a sheet support member installed on a horizontal surface of the bottom surface in a second direction orthogonal to a first direction, which is a longitudinal direction of the probe sheet, to elastically support a portion of the free end portion of the probe sheet to reduce bending of the free end portion. do.

Description

Probe unit for flat panel display {unit for probing flat panel display}

The present invention relates to a probe unit for inspecting flat panel display.

TFT-LCD (Thin Film Transistor Liquid Crystal Display) is a kind of flat panel display. A plurality of thin film transistors (TFTs) and pixel electrodes are arranged to form a lower plate having a predetermined size, and a color filter and a common electrode to express colors. It has a liquid crystal that is filled in the space between the upper plate and the lower plate formed sequentially.

In the TFT-LCD, an inspection process is used to determine whether there is a defect by applying an electrical test signal to a circuit pattern using a probe device.

Probe devices for determining whether a flat panel display is defective include a needle type, a blade type, and the like, and the conventional probe device arranges the probes manually by hand, thereby increasing assembly time and manufacturing cost. In addition, since the width between the probes must be kept constant, it is difficult to implement fine pitch. In addition, the deformation of the probe is easily generated by the pressure at the contact of the probe and the flat panel display, there is a problem that the repeatability of the test is lowered due to the deformation.

Disclosure of Invention An object of the present invention is to provide a probe for inspecting a flat panel display which can improve the contact between the electrode pad of the display panel and the bumps of the probe sheet.

An object of the present invention is to provide a flat panel display probe device that can increase the inspection repeat reliability by minimizing damage and deformation of the probe sheet.

The objects of the present invention are not limited thereto, and other objects not mentioned can be clearly understood by those skilled in the art from the following description.

Probe unit for inspecting the display panel of the present invention for achieving the above object is a main body having a bottom surface formed with an inclined surface and a horizontal surface; A probe sheet including a fixed end portion inclined to the inclined surface of the bottom surface and a free end portion spaced from the horizontal surface of the bottom surface and extending from the fixed end portion at the same inclination as the inclined surface; And a second direction orthogonal to a first direction, which is a longitudinal direction of the probe sheet, on a horizontal surface of the bottom surface, and elastically supports a portion of the free end portion of the probe sheet to relieve bending of the free end portion. It includes a seat support member for pressure supplement during the probing load.

According to an embodiment of the present invention, the probe sheet may include a pattern sheet having first bumps in contact with connection terminals of a display panel; And a base plate attached to the pattern sheet to support the pattern sheet.

According to one embodiment of the invention, the first bumps of the pattern sheet are provided at an end overlapping with the base plate at a position away from the position supported by the sheet support member.

According to an embodiment of the present invention, the pattern sheet has alignment marks, and further includes an extension portion formed to protrude from an end of the base plate, wherein the pattern sheet includes alignment marks formed on the extension portion; It is made of a transparent or translucent material to enable the alignment of the alignment marks formed on the display panel.

According to an embodiment of the present invention, the sheet support member has a columnar shape having elastic force.

According to an embodiment of the present invention, the sheet support member is any one of a cross section of a circle, a triangle, a square.

According to one embodiment of the invention, the sheet support member is mounted in a mounting groove formed in the horizontal surface of the bottom surface.

According to one embodiment of the invention, the sheet support member is attached to one side of the free end of the probe sheet facing the bottom surface.

According to an embodiment of the present invention, the flat panel display probe unit for inspection

A driving film of a chip on film (COF) type connected to the pattern sheet of the probe sheet and having a tab IC; It further includes a pressure cover that is bolted to the main body to press the connection portion of the drive film and the pattern sheet.

According to an embodiment of the present invention, the pressure cover further includes an elastic pad for stably pressing the connection portion of the driving film and the pattern sheet.

According to the present invention, there is a special effect that can improve the contact between the connection terminal of the display panel and the bump of the probe sheet.

According to the present invention, the bumps of the probe sheet are in contact with the connection terminals by the restoring force of the sheet support member and the restoring force of the base plate, rather than the artificial structure, so that the first bumps are not applied to the bumps and the connection terminals. And damage and deformation of the connection terminal can be prevented.

According to the present invention, inspection repeatability can be improved, bump arrangement freedom is high, and high density integrated circuit inspection is possible.

According to the present invention, it is easy to align the alignment marks of the pattern sheet with the alignment marks formed on the display panel.

 According to the present invention, since the structure of the entire unit is simple, the productivity can be expected to be increased by increasing the efficiency of the work as well as the simplicity and speed of the work.

1 is a configuration diagram schematically showing the configuration of a flat panel display inspection apparatus according to the present invention.
2 is a perspective view illustrating a probe assembly for a flat panel display inspector according to an exemplary embodiment of the present invention.
3 is an exploded perspective view of the probe unit shown in FIG. 2.
4 is a cross-sectional view of the probe unit.
FIG. 5 is an enlarged view of a portion A shown in FIG. 4.
6 is an enlarged view illustrating main parts of a bump of a probe sheet to be in contact with an electrode pad of a display panel.
7 is a view showing a modification of the probe unit according to an embodiment of the present invention.
8A to 8C are views illustrating various modifications of the sheet support member.
8D is a view showing another example of the mounting groove in which the seat support member is mounted.

Hereinafter, a probe unit according to a preferred embodiment of the present invention will be described in detail with reference to the accompanying drawings. In the drawings, the same reference numerals are used to designate the same or similar components throughout the drawings. In the following description of the present invention, a detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear.

(Example)

1 is a configuration diagram schematically showing the configuration of a flat panel display inspection apparatus according to the present invention.

As shown in FIG. 1, the flat panel display panel inspecting apparatus 10 of the present invention includes a flat panel display panel D from a tester 2 and a tester 2 which generate a predetermined signal for testing the flat panel display panel D. FIG. Interface unit (3) having a source / gate printed circuit board (3a) for separately transmitting a signal to the source, the source / gate printed circuit board (3a) of the interface unit (3) and a flexible circuit film of the probe assembly (100) Receive a predetermined signal from the interface unit 3 through the fastening connector 7 and the flexible circuit film 119 for directly connecting the 119 to contact the connection terminal P of the flat panel display panel D to provide an electrical signal. It includes a probe assembly 100 having a pattern sheet (shown in Figure 2) for applying a.

2 is a perspective view illustrating a probe assembly for a flat panel display inspector according to an exemplary embodiment of the present invention.

Referring to FIG. 2, the probe assembly 100 includes a probe unit 200 and a manipulator 110 supporting the probe unit 200. The manipulator 110 has an arm 112 fixed to a base plate (not shown), and a head 114 and a bottom surface of the head 114 fastened to each other by fixing bolts at the tip of the arm 112. And a fixing plate 116 detachably installed and a linear guide 118 installed between the head 114 and the arm 112.

3 is an exploded perspective view of the probe unit shown in FIG. 2. 4 is a cross-sectional view of the probe unit. FIG. 5 is an enlarged view of a portion A shown in FIG. 4.

3 to 5, the probe unit 200 includes a main body 300, a sheet support member 400, a probe sheet 500, a driving film 600, and a pressure cover 700.

(Main body)

The main body 300 is fixed to the manipulator 110 by bolts. The main body 300 has a hexahedral shape including a front surface 302, a rear surface 303, an upper surface 304, a bottom surface 305, and both side surfaces 309. The bottom surface 305 of the main body 200 has an inclined surface 305a and a horizontal surface 305b. A part (fixed end portion) of the probe sheet 500 is attached to the inclined surface 305a, and the probe sheet 500 is inclined at the same inclination as the inclined surface. The probe sheet 500 is fixed by adhesive or double-sided tape. The mounting groove 310 is formed in the second direction perpendicular to the longitudinal direction (first direction) of the probe sheet 500 on the horizontal surface 305b of the bottom surface 305. The seat support member 400 is installed in the mounting groove 310 so as to protrude from the horizontal surface 305b, and the bottom end of the seat support member 400 comes into contact with a part of the free end portion of the probe sheet 500.

(Sheet support member)

The sheet supporting member 400 elastically supports a part of the free end portion 504 of the probe sheet 500 to connect the first bump 522 of the pattern sheet 520 and the connection terminal P of the flat panel display panel D. FIG. The contact pressure of) is equalized and the bending of the free end part is alleviated. The sheet support member 400 has a long cylindrical shape having a circular cross section. Sheet support member 400 is preferably made of a material having an elastic force, such as rubber, silicone, plastic. The sheet support member 400 is mounted to the mounting groove 310 formed on the horizontal surface 305b of the bottom surface 305 of the main body 300 with an adhesive or the like.

(Probe sheet)

The probe sheet 500 has a structure in which the base plate 510 and the pattern sheet 520 overlap two layers. The base plate 510 and the pattern sheet 520 are attached to each other by an adhesive. The probe sheet 500 has a fixed end portion 502 fixed to the inclined surface 305a of the main body 300 and a free spaced apart from the horizontal surface 305b of the main body 300 and having the same inclination angle as the inclined surface 305a. It is divided into the end portion 504.

The base plate 510 is a material having an elastic force and serves to support the pattern sheet 520 as a whole. The base plate 510 is preferably made of a metal plate having excellent flatness, such as stainless steel material. One end of the base plate 510 is attached to the inclined surface 305a of the main body by an adhesive.

The pattern sheet 520 has an extension 506 (shown in FIGS. 4 and 5) protruding from one end of the base plate 510. The pattern sheet 520 is an insulating film made of a translucent material, and includes a first bump 522 contacting the connection terminals P of the display panel D, a driving film 600 provided with a tab IC 610, and the like. Have second bumps 524 in contact. The first bumps 522 are positioned at the end overlapping with the base plate 510 at a position deviating from the position supported by the sheet supporting member 400. Reference numerals 5 and 6 denote an elastic deformation section, which is a distance from the contact position of the sheet support member 400 and the probe sheet 500 to the end of the free end portion 504 of the probe sheet 5000. Yes.

The mark 526 for alignment is formed in the extension part 506 (the tip which protrudes from the base plate) of the pattern sheet 520. Since the pattern sheet 520 is translucent (or transparent), it is easy to align the alignment marks 526 of the pattern sheet 520 and the alignment marks (not shown) formed on the display panel D. FIG.

6 is a view illustrating a state in which first bumps of a pattern sheet are in contact with connection terminals of a flat panel display panel.

As illustrated in FIG. 6, the probe unit 200 overdrives the display panel D so that the first bumps 522 of the pattern sheet 520 contact the connection terminal P of the flat panel display panel D. FIG. When the probe sheet 500 is bent in contact with the display panel D, the probe sheet 500 compresses the sheet supporting member 400, thereby reducing its inclination angle. The first bumps 522 are in contact with the connection terminals P while the probe sheet 500 is elastically deformed with the elastic deformation section X of the free end portion 504 almost horizontal.

The probe sheet 500 may obtain contact pressure between the first bumps 522 and the connection terminals P by the restoring force of the sheet support member 400 and the restoring force of the base plate 510, and the first bump 522. And the connection terminals P can be reliably electrically connected. In particular, the first bumps 522 contacted by the connection terminals are not pressed by the artificial structure, but are naturally contacted with the connection terminals P by the restoring force of the sheet support member 400 and the restoring force of the base plate 510. Therefore, damage (peeling, crushing) of the first bumps and the connection terminal can be prevented by applying excessive force to the first bumps 522 and the connection terminals P.

For reference, when the probe sheet 500 is viewed as a whole, the free end portion 504 may be elastically deformed, but the elastic deformation from the position supported by the sheet support member 400 may be the largest.

(Driving film)

The driving film 600 is formed of a film of a Chip On Film (COF) type having a tab IC 610. The driving film 600 is positioned on the inclined surface 305a of the main body 300 to be connected to the pattern sheet 520. The driving film 600 and the pattern sheet 520 are connected by a tape or the like.

(Pressure cover)

The pressure cover 700 is bolted to the inclined surface 205a of the main body 300 to press the connection portion of the driving film 600 and the pattern sheet 520. An elastic pad 710 for stably pressing the connection portion of the driving film 600 and the pattern sheet 520 is installed on the inner surface of the pressure cover 700.

7 is a view showing a modification of the probe unit according to an embodiment of the present invention.

As shown in FIG. 7, the probe unit 200a has substantially the same configuration and function as the probe unit 200 described above, but the positions of the driving film 600 and the pressure cover 700a are changed. This change is because connection patterns with the tap ICs of the driving film 600 and the second bumps of the pattern sheet are provided on the bottom surface.

8A to 8C are views showing various modifications of the sheet support member, and FIG. 8D is a view showing another example of a mounting groove in which the sheet support member is mounted.

As shown in Figures 8a to 8c, the sheet support member has a column shape having an elastic force, the sheet support member 400a of the rectangular cross-sectional structure, the sheet support member 400b of the triangular cross-sectional structure, the sheet support of the hemispherical cross-sectional structure Like the member 400c, it may have various cross-sectional structures. In particular, the sheet support member 400a having a rectangular cross-sectional structure supports the probe sheet 500 in surface contact. The sheet support member 400c having the hemispherical cross-sectional structure shown in FIG. 8C may be attached to the upper surface of the base plate 510 of the probe sheet 500 without being attached to the main body 300.

As shown in FIG. 8D, the mounting groove in which the sheet support member is mounted may be changed to a V-shaped groove, and may be attached and fixed to a flat bottom surface as shown in FIG. 8A.

The foregoing description is merely illustrative of the technical idea of the present invention, and various changes and modifications may be made by those skilled in the art without departing from the essential characteristics of the present invention. Therefore, the embodiments disclosed in the present invention are intended to illustrate rather than limit the scope of the present invention, and the scope of the technical idea of the present invention is not limited by these embodiments. The protection scope of the present invention should be interpreted by the following claims, and all technical ideas within the equivalent scope should be interpreted as being included in the scope of the present invention.

200: probe unit
300: main body
400: sheet support member
500: Probe Sheet
600: driving film
700 pressurized cover

Claims (10)

In the probe unit for inspecting the display panel:
A main body having a bottom surface having an inclined surface and a horizontal surface formed thereon;
A probe sheet including a fixed end portion inclined to the inclined surface of the bottom surface and a free end portion spaced from the horizontal surface of the bottom surface and extending from the fixed end portion at the same inclination as the inclined surface; And
It is installed in a second direction orthogonal to a first direction, which is a longitudinal direction of the probe sheet, on a horizontal surface of the bottom surface, and elastically supports a part of the free end portion of the probe sheet to alleviate the bending of the free end portion and probing. It includes a sheet support member for compensating pressure during the load;
The probe sheet is
A pattern sheet having first bumps in contact with connection terminals of the display panel; And
A base plate attached to the pattern sheet to support the pattern sheet,
The pattern sheet further includes an extension portion having alignment marks and protruding from an end of the base plate,
And the pattern sheet is made of a translucent or transparent material to align the alignment marks formed on the extension portion and the alignment marks formed on the display panel. In the probe unit for inspecting the display panel:
A main body having a bottom surface having an inclined surface and a horizontal surface formed thereon; And
A probe sheet including a fixed end portion inclined to the inclined surface of the bottom surface and a free end portion spaced from the horizontal surface of the bottom surface and extending at the same inclination as the inclined surface from the fixed end portion;
The probe sheet is
A pattern sheet having first bumps in contact with connection terminals of the display panel; And
A base plate attached to the pattern sheet to support the pattern sheet,
The pattern sheet further includes an extension portion having alignment marks and protruding from an end of the base plate,
And the pattern sheet is made of a translucent or transparent material to align the alignment marks formed on the extension portion and the alignment marks formed on the display panel. The method of claim 1,
And the first bumps of the pattern sheet are provided at an end overlapping with the base plate at a position deviating from a position supported by the sheet support member. delete The method of claim 1,
The sheet support member is a flat panel display probe unit, characterized in that the columnar shape having an elastic force. The method of claim 5, wherein
The sheet support member is a probe unit for flat panel display, characterized in that the cross section is any one of a circle, a triangle, a square. The method of claim 1,
And the sheet support member is mounted to a mounting groove formed on a horizontal surface of the bottom surface. The method of claim 1,
And the sheet support member is attached to one side of the free end of the probe sheet. The method of claim 1,
The probe unit for inspecting the flat panel display
A driving film of a chip on film (COF) type connected to the pattern sheet of the probe sheet and having a tab IC;
And a pressurized cover bolted to the main body to press the connecting portion of the driving film and the pattern sheet. The method of claim 9,
The pressure cover further includes a probe unit for flat panel display inspection, characterized in that it further comprises an elastic pad for stably pressing the connecting portion of the drive film and the pattern sheet.

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