KR20040092446A - 향상된 배쓰 분석 - Google Patents
향상된 배쓰 분석 Download PDFInfo
- Publication number
- KR20040092446A KR20040092446A KR1020040027594A KR20040027594A KR20040092446A KR 20040092446 A KR20040092446 A KR 20040092446A KR 1020040027594 A KR1020040027594 A KR 1020040027594A KR 20040027594 A KR20040027594 A KR 20040027594A KR 20040092446 A KR20040092446 A KR 20040092446A
- Authority
- KR
- South Korea
- Prior art keywords
- brightener
- bath
- amount
- working electrode
- plating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/42—Measuring deposition or liberation of materials from an electrolyte; Coulometry, i.e. measuring coulomb-equivalent of material in an electrolyte
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/02—Constructional features of telephone sets
- H04M1/0202—Portable telephone sets, e.g. cordless phones, mobile phones or bar type handsets
- H04M1/026—Details of the structure or mounting of specific components
- H04M1/0264—Details of the structure or mounting of specific components for a camera module assembly
-
- A—HUMAN NECESSITIES
- A45—HAND OR TRAVELLING ARTICLES
- A45C—PURSES; LUGGAGE; HAND CARRIED BAGS
- A45C13/00—Details; Accessories
- A45C13/30—Straps; Bands
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/51—Housings
Landscapes
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Signal Processing (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- Molecular Biology (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Multimedia (AREA)
- Electroplating And Plating Baths Therefor (AREA)
- Electroplating Methods And Accessories (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US46529703P | 2003-04-25 | 2003-04-25 | |
| US60/465,297 | 2003-04-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20040092446A true KR20040092446A (ko) | 2004-11-03 |
Family
ID=32962777
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020040027594A Withdrawn KR20040092446A (ko) | 2003-04-25 | 2004-04-21 | 향상된 배쓰 분석 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7384535B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP1471347A1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP2004323971A (cg-RX-API-DMAC7.html) |
| KR (1) | KR20040092446A (cg-RX-API-DMAC7.html) |
| CN (1) | CN1550579A (cg-RX-API-DMAC7.html) |
| TW (1) | TW200506360A (cg-RX-API-DMAC7.html) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006068046A1 (ja) * | 2004-12-24 | 2006-06-29 | Nippon Mining & Metals Co., Ltd. | 電気スズおよびスズ合金めっき液 |
| CN100529750C (zh) * | 2006-01-17 | 2009-08-19 | 欧恩吉亚洲股份有限公司 | 电镀铜加速剂浓度分析方法及其沉积电解液 |
| JP4862508B2 (ja) * | 2006-06-12 | 2012-01-25 | 日立電線株式会社 | 導体パターン形成方法 |
| JP4932370B2 (ja) * | 2006-07-28 | 2012-05-16 | 日本マクダーミッド株式会社 | 電解めっき方法、プリント配線板及び半導体ウェハー |
| DE102008056470B3 (de) * | 2008-11-05 | 2010-04-22 | Atotech Deutschland Gmbh | Verfahren zum Untersuchen einer Metallschicht und Verfahren zur analytischen Kontrolle eines zum Abscheiden der Metallschicht dienenden Abscheideelektrolyten |
| US8992691B2 (en) | 2011-04-05 | 2015-03-31 | International Business Machines Corporation | Partial solution replacement in recyclable persulfuric acid cleaning systems |
| JP6170938B2 (ja) * | 2011-12-12 | 2017-07-26 | ノベラス・システムズ・インコーポレーテッドNovellus Systems Incorporated | 電気めっき溶液内のレベラー濃度の監視 |
| US9689083B2 (en) | 2013-06-14 | 2017-06-27 | Lam Research Corporation | TSV bath evaluation using field versus feature contrast |
| EP2937686B1 (en) | 2014-04-22 | 2017-03-08 | Rohm and Haas Electronic Materials LLC | Electroplating bath analysis |
| US9575032B2 (en) | 2014-08-07 | 2017-02-21 | Hong Kong Applied Science and Technology Research Institute Company Limited | Method of analyzing at least two inhibitors simultaneously in a plating bath |
| US10094038B2 (en) | 2015-04-13 | 2018-10-09 | Lam Research Corporation | Monitoring electrolytes during electroplating |
| CN112986369B (zh) * | 2021-02-05 | 2022-05-17 | 深圳日山科技有限公司 | 测量电镀液中光亮剂浓度的方法 |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4038161A (en) * | 1976-03-05 | 1977-07-26 | R. O. Hull & Company, Inc. | Acid copper plating and additive composition therefor |
| US4132605A (en) * | 1976-12-27 | 1979-01-02 | Rockwell International Corporation | Method for evaluating the quality of electroplating baths |
| US4666567A (en) * | 1981-07-31 | 1987-05-19 | The Boeing Company | Automated alternating polarity pulse electrolytic processing of electrically conductive substances |
| US4917777A (en) * | 1986-04-24 | 1990-04-17 | Shipley Company Inc. | Method for analyzing additive concentration |
| US4917774A (en) * | 1986-04-24 | 1990-04-17 | Shipley Company Inc. | Method for analyzing additive concentration |
| US5004525A (en) * | 1988-08-23 | 1991-04-02 | Shipley Company Inc. | Copper electroplating composition |
| DE59700942D1 (de) | 1990-03-19 | 2000-02-10 | Atotech Deutschland Gmbh | Wässriges, saures Bad zur galvanischen Abscheidung von glänzenden und rissfreien Kupferüberzügen und Verwendung dieses Bades |
| US5223118A (en) * | 1991-03-08 | 1993-06-29 | Shipley Company Inc. | Method for analyzing organic additives in an electroplating bath |
| US5192403A (en) * | 1991-05-16 | 1993-03-09 | International Business Machines Corporation | Cyclic voltammetric method for the measurement of concentrations of subcomponents of plating solution additive mixtures |
| US5252196A (en) * | 1991-12-05 | 1993-10-12 | Shipley Company Inc. | Copper electroplating solutions and processes |
| US5298129A (en) | 1992-11-13 | 1994-03-29 | Hughes Aircraft Company | Method of selectively monitoring trace constituents in plating baths |
| US5972192A (en) * | 1997-07-23 | 1999-10-26 | Advanced Micro Devices, Inc. | Pulse electroplating copper or copper alloys |
| US6365033B1 (en) * | 1999-05-03 | 2002-04-02 | Semitoof, Inc. | Methods for controlling and/or measuring additive concentration in an electroplating bath |
| JP2002506531A (ja) | 1998-05-01 | 2002-02-26 | セミトウール・インコーポレーテツド | 電気メッキ浴中の添加物の測定法 |
| US6471845B1 (en) * | 1998-12-15 | 2002-10-29 | International Business Machines Corporation | Method of controlling chemical bath composition in a manufacturing environment |
| DE19911447C2 (de) | 1999-03-08 | 2001-10-11 | Atotech Deutschland Gmbh | Verfahren zum analytischen Ermitteln der Konzentration von Zusatzstoffen in galvanischen Metallabscheidebädern |
| US6280602B1 (en) * | 1999-10-20 | 2001-08-28 | Advanced Technology Materials, Inc. | Method and apparatus for determination of additives in metal plating baths |
| US6508924B1 (en) * | 2000-05-31 | 2003-01-21 | Shipley Company L.L.C. | Control of breakdown products in electroplating baths |
| DE60113214T2 (de) * | 2000-11-02 | 2006-06-08 | Shipley Co., L.L.C., Marlborough | Plattierungsbadanalyse |
| US6592747B2 (en) * | 2001-06-18 | 2003-07-15 | International Business Machines Corporation | Method of controlling additives in copper plating baths |
| US6936157B2 (en) * | 2001-08-09 | 2005-08-30 | Advanced Technology Materials, Inc. | Interference correction of additives concentration measurements in metal electroplating solutions |
| US6572753B2 (en) * | 2001-10-01 | 2003-06-03 | Eci Technology, Inc. | Method for analysis of three organic additives in an acid copper plating bath |
| US6709568B2 (en) * | 2002-06-13 | 2004-03-23 | Advanced Technology Materials, Inc. | Method for determining concentrations of additives in acid copper electrochemical deposition baths |
| US6808611B2 (en) * | 2002-06-27 | 2004-10-26 | Applied Materials, Inc. | Methods in electroanalytical techniques to analyze organic components in plating baths |
| US6673226B1 (en) * | 2002-12-20 | 2004-01-06 | Eci Technology | Voltammetric measurement of halide ion concentration |
| JP2004325441A (ja) * | 2003-04-25 | 2004-11-18 | Rohm & Haas Electronic Materials Llc | 分析方法 |
-
2004
- 2004-03-29 JP JP2004095009A patent/JP2004323971A/ja active Pending
- 2004-04-16 EP EP20040252226 patent/EP1471347A1/en not_active Withdrawn
- 2004-04-21 KR KR1020040027594A patent/KR20040092446A/ko not_active Withdrawn
- 2004-04-22 TW TW093111194A patent/TW200506360A/zh unknown
- 2004-04-23 CN CNA2004100346947A patent/CN1550579A/zh active Pending
- 2004-04-24 US US10/831,726 patent/US7384535B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN1550579A (zh) | 2004-12-01 |
| JP2004323971A (ja) | 2004-11-18 |
| TW200506360A (en) | 2005-02-16 |
| US20050016856A1 (en) | 2005-01-27 |
| EP1471347A1 (en) | 2004-10-27 |
| US7384535B2 (en) | 2008-06-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20040421 |
|
| PG1501 | Laying open of application | ||
| PC1203 | Withdrawal of no request for examination | ||
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |