KR20040089561A - 기판 처리장치 - Google Patents
기판 처리장치 Download PDFInfo
- Publication number
- KR20040089561A KR20040089561A KR1020040024825A KR20040024825A KR20040089561A KR 20040089561 A KR20040089561 A KR 20040089561A KR 1020040024825 A KR1020040024825 A KR 1020040024825A KR 20040024825 A KR20040024825 A KR 20040024825A KR 20040089561 A KR20040089561 A KR 20040089561A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- supply
- processing apparatus
- conveying
- nozzles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3202—Mechanical details, e.g. rollers or belts
Landscapes
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Spray Control Apparatus (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2003-00108949 | 2003-04-14 | ||
| JP2003108949A JP3995044B2 (ja) | 2003-04-14 | 2003-04-14 | 基板処理装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20040089561A true KR20040089561A (ko) | 2004-10-21 |
Family
ID=33470263
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020040024825A Withdrawn KR20040089561A (ko) | 2003-04-14 | 2004-04-12 | 기판 처리장치 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP3995044B2 (https=) |
| KR (1) | KR20040089561A (https=) |
| TW (1) | TW200428486A (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4849914B2 (ja) * | 2006-03-13 | 2012-01-11 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法、コンピュータ読取可能な記憶媒体 |
| JP4824723B2 (ja) * | 2008-06-17 | 2011-11-30 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
| JP5303231B2 (ja) * | 2008-09-30 | 2013-10-02 | 東京応化工業株式会社 | 塗布装置 |
| CN108015024B (zh) * | 2017-12-01 | 2021-03-05 | 浙江德尔威工程机械设备有限公司 | 一种玻璃清洗装置 |
-
2003
- 2003-04-14 JP JP2003108949A patent/JP3995044B2/ja not_active Expired - Fee Related
-
2004
- 2004-04-12 KR KR1020040024825A patent/KR20040089561A/ko not_active Withdrawn
- 2004-04-13 TW TW093110254A patent/TW200428486A/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| TWI335616B (https=) | 2011-01-01 |
| TW200428486A (en) | 2004-12-16 |
| JP2004313872A (ja) | 2004-11-11 |
| JP3995044B2 (ja) | 2007-10-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |