KR20020079451A - 기판을 평탄화하는 방법, 자기 헤드 및 그 제조 방법 - Google Patents
기판을 평탄화하는 방법, 자기 헤드 및 그 제조 방법 Download PDFInfo
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- KR20020079451A KR20020079451A KR1020020018280A KR20020018280A KR20020079451A KR 20020079451 A KR20020079451 A KR 20020079451A KR 1020020018280 A KR1020020018280 A KR 1020020018280A KR 20020018280 A KR20020018280 A KR 20020018280A KR 20020079451 A KR20020079451 A KR 20020079451A
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- thin film
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- magnetic
- glass
- glass thin
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- 239000000758 substrate Substances 0.000 title claims abstract description 230
- 238000000034 method Methods 0.000 title claims description 38
- 238000004519 manufacturing process Methods 0.000 title claims description 22
- 239000010409 thin film Substances 0.000 claims abstract description 219
- 239000011521 glass Substances 0.000 claims abstract description 143
- 229910052751 metal Inorganic materials 0.000 claims description 74
- 239000002184 metal Substances 0.000 claims description 74
- 238000010438 heat treatment Methods 0.000 claims description 37
- 239000010408 film Substances 0.000 claims description 35
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 21
- 239000011651 chromium Substances 0.000 claims description 21
- 229910052804 chromium Inorganic materials 0.000 claims description 20
- 229910000423 chromium oxide Inorganic materials 0.000 claims description 9
- WGLPBDUCMAPZCE-UHFFFAOYSA-N Trioxochromium Chemical compound O=[Cr](=O)=O WGLPBDUCMAPZCE-UHFFFAOYSA-N 0.000 claims description 8
- 230000008602 contraction Effects 0.000 claims description 5
- 238000005520 cutting process Methods 0.000 claims description 4
- 238000000151 deposition Methods 0.000 claims description 4
- 230000003746 surface roughness Effects 0.000 description 28
- 238000001723 curing Methods 0.000 description 17
- 238000002844 melting Methods 0.000 description 13
- 238000004804 winding Methods 0.000 description 12
- 239000000463 material Substances 0.000 description 11
- 230000008018 melting Effects 0.000 description 11
- 238000005259 measurement Methods 0.000 description 8
- 238000000926 separation method Methods 0.000 description 7
- 229940035427 chromium oxide Drugs 0.000 description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 239000005388 borosilicate glass Substances 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- 238000009792 diffusion process Methods 0.000 description 5
- 239000010931 gold Substances 0.000 description 5
- 210000003128 head Anatomy 0.000 description 5
- 229910010413 TiO 2 Inorganic materials 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 238000000227 grinding Methods 0.000 description 4
- 238000005304 joining Methods 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 238000002425 crystallisation Methods 0.000 description 3
- 230000008025 crystallization Effects 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 229910052719 titanium Inorganic materials 0.000 description 3
- 239000010936 titanium Substances 0.000 description 3
- 229910021364 Al-Si alloy Inorganic materials 0.000 description 2
- 239000006061 abrasive grain Substances 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 239000000696 magnetic material Substances 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 229910000676 Si alloy Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 229910001308 Zinc ferrite Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 1
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- AOWKSNWVBZGMTJ-UHFFFAOYSA-N calcium titanate Chemical compound [Ca+2].[O-][Ti]([O-])=O AOWKSNWVBZGMTJ-UHFFFAOYSA-N 0.000 description 1
- 229940090961 chromium dioxide Drugs 0.000 description 1
- IAQWMWUKBQPOIY-UHFFFAOYSA-N chromium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Cr+4] IAQWMWUKBQPOIY-UHFFFAOYSA-N 0.000 description 1
- AYTAKQFHWFYBMA-UHFFFAOYSA-N chromium(IV) oxide Inorganic materials O=[Cr]=O AYTAKQFHWFYBMA-UHFFFAOYSA-N 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000013007 heat curing Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 210000001331 nose Anatomy 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 235000019353 potassium silicate Nutrition 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 230000008929 regeneration Effects 0.000 description 1
- 238000011069 regeneration method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
- MTPVUVINMAGMJL-UHFFFAOYSA-N trimethyl(1,1,2,2,2-pentafluoroethyl)silane Chemical compound C[Si](C)(C)C(F)(F)C(F)(F)F MTPVUVINMAGMJL-UHFFFAOYSA-N 0.000 description 1
- 238000005019 vapor deposition process Methods 0.000 description 1
- WGEATSXPYVGFCC-UHFFFAOYSA-N zinc ferrite Chemical compound O=[Zn].O=[Fe]O[Fe]=O WGEATSXPYVGFCC-UHFFFAOYSA-N 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/187—Structure or manufacture of the surface of the head in physical contact with, or immediately adjacent to the recording medium; Pole pieces; Gap features
- G11B5/1871—Shaping or contouring of the transducing or guiding surface
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/1272—Assembling or shaping of elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/17—Construction or disposition of windings
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/187—Structure or manufacture of the surface of the head in physical contact with, or immediately adjacent to the recording medium; Pole pieces; Gap features
- G11B5/23—Gap features
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/187—Structure or manufacture of the surface of the head in physical contact with, or immediately adjacent to the recording medium; Pole pieces; Gap features
- G11B5/23—Gap features
- G11B5/232—Manufacture of gap
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/187—Structure or manufacture of the surface of the head in physical contact with, or immediately adjacent to the recording medium; Pole pieces; Gap features
- G11B5/23—Gap features
- G11B5/235—Selection of material for gap filler
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/31—Structure or manufacture of heads, e.g. inductive using thin films
- G11B5/3103—Structure or manufacture of integrated heads or heads mechanically assembled and electrically connected to a support or housing
- G11B5/3106—Structure or manufacture of integrated heads or heads mechanically assembled and electrically connected to a support or housing where the integrated or assembled structure comprises means for conditioning against physical detrimental influence, e.g. wear, contamination
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/31—Structure or manufacture of heads, e.g. inductive using thin films
- G11B5/3176—Structure of heads comprising at least in the transducing gap regions two magnetic thin films disposed respectively at both sides of the gaps
- G11B5/3179—Structure of heads comprising at least in the transducing gap regions two magnetic thin films disposed respectively at both sides of the gaps the films being mainly disposed in parallel planes
- G11B5/3186—Structure of heads comprising at least in the transducing gap regions two magnetic thin films disposed respectively at both sides of the gaps the films being mainly disposed in parallel planes parallel to the gap plane, e.g. "vertical head structure"
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Magnetic Heads (AREA)
Abstract
Description
기판의 평탄화 | 재생 출력(㎶, 10㎒) | 최적 재생 전류(㎃pp) |
실행 | 945 | 21.9 |
실행되지 않음 | 598 | 35.8 |
Claims (19)
- 기판을 평탄화하는 방법에 있어서,기판의 표면 상에 유리 박막을 사전증착하는(predepositing) 단계,상기 유리 박막이 미리결정된 점성(viscosity)으로 연화(soft)될 때까지 상기 기판 상에서 열처리를 실행하는 단계, 및상기 유리 박막이 경화될 때까지 상기 열처리 후에 상기 기판을 양생(cure)하는 단계를 포함하는, 기판 평탄화 방법.
- 제 1항에 있어서,상기 유리 박막은 103Pa·s 내지 106.76Pa·s 범위의 점성으로 연화되는, 기판 평탄화 방법.
- 제 2항에 있어서,상기 유리 박막은 104.4Pa·s 내지 106.76Pa·s 범위의 점성으로 연화되는, 기판 평탄화 방법.
- 제 1항에 있어서,상기 유리 박막은 1000nm 이하의 두께를 갖는, 기판 평탄화 방법.
- 제 1항에 있어서,상기 기판과 상기 유리 박막 사이에 증착된 크롬 또는 크롬 산화물로 이루어진 하지막(underlying film)을 더 포함하는, 기판 평탄화 방법.
- 제 5항에 있어서,상기 하지막은 20nm 이하의 두께를 갖는, 기판 평탄화 방법.
- 자기 코어 절반체들(magnetic core halves)의 쌍을 포함하는 자기 헤드로서, 상기 절반체들 각각은 비자성 기판 및 상기 비자성 기판의 표면 상에 증착된 금속 자성 박막을 포함하고, 상기 절반체들의 쌍은, 한 금속 자성 박막이 다른 금속 자성 박막과 접하고(abut) 접하여진 표면 사이에 자기 갭(magnetic gap)이 형성되도록, 서로 일체로 결합되고, 상기 금속 자성 박막들이 증착되는 상기 비자성 기판들의 각 표면들이 상기 자기 갭과 평행하지 않으며,상기 비자성 기판은 상기 금속 자성 막이 증착되는 표면 상에 증착된 유리 박막을 갖는, 자기 헤드.
- 제 7항에 있어서,상기 유리 박막이 열적 수축에 의해 인장(stretch)됨으로써, 상기 금속 자성 박막이 증착되는 상기 비자성 기판의 표면을 평탄화하는, 자기 헤드.
- 제 8항에 있어서,상기 유리 박막은 103Pa·s 내지 106.76Pa·s 범위의 점성으로 연화되는, 자기 헤드.
- 제 8항에 있어서,상기 유리 박막은 104.4Pa·s 내지 106.76Pa·s 범위의 점성으로 연화되는, 자기 헤드.
- 제 7항에 있어서,상기 유리 박막은 1000nm 이하의 두께를 갖는, 자기 헤드.
- 제 7항에 있어서,상기 비자성 기판과 상기 유리 박막 간에 증착된 크롬 또는 크롬 산화물로 이루어진 하지막을 더 포함하는, 자기 헤드.
- 제 12항에 있어서,상기 하지막은 20nm 이하의 두께를 갖는, 자기 헤드.
- 자기 헤드를 제조하는 방법에 있어서,미리결정된 간격으로 복수의 홈들(grooves)이 그 위에 형성된 비자성 기판의 표면 상에 유리 박막을 사전증착하고, 상기 유리 박막이 미리결정된 점성으로 연화될 때까지 상기 비자성 기판 상에 열처리를 실행하고, 상기 비자성 기판의 표면을 평탄화하도록 상기 유리 박막이 경화될 때까지 상기 열처리 후에 상기 비자성 기판을 양생하는 단계,상기 비자성 기판 상에 금속 자성 박막을 증착하는 단계,상기 금속 자성 박막이 증착되는 상기 비자성 기판을 덮기 위해 유리층을 형성하고, 한쌍의 자기 코어 절반체 블록들(magnetic core half blocks)을 생성하도록 평탄화가 행해진 상기 유리층의 표면에 형성된 오목부(recess) 내에 박막 코일을 증착하는 단계,자기 코어 블록을 생성하도록 상기 각각의 금속 자성 박막들의 단면들이 비자성 박막을 통해 서로 마주하도록 대향하여 위치시키고 상기 쌍의 자기 코어 절반체 블록들을 결합시키는 단계, 및상기 자기 코어 블록을 개별 자기 헤드들로 절단하는 단계를 포함하는, 자기 헤드 제조 방법.
- 제 14항에 있어서,상기 유리 박막은 103Pa·s 내지 106.76Pa·s 범위의 점성으로 연화되는, 자기 헤드 제조 방법.
- 제 14항에 있어서,상기 유리 박막은 104.4Pa·s 내지 106.76Pa·s 범위의 점성으로 연화되는, 자기 헤드 제조 방법.
- 제 14항에 있어서,상기 유리 박막은 1000nm 이하의 두께를 갖는, 자기 헤드 제조 방법.
- 제 14항에 있어서,상기 비자성 기판과 상기 유리 박막 사이에 증착된 크롬 또는 크롬 산화물로 이루어진 하지막을 더 포함하는, 자기 헤드 제조 방법.
- 제 18항에 있어서,상기 하지막은 20nm 이하의 두께를 갖는, 자기 헤드 제조 방법.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2001-00105007 | 2001-04-03 | ||
JP2001105007 | 2001-04-03 |
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KR20020079451A true KR20020079451A (ko) | 2002-10-19 |
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KR1020020018280A KR20020079451A (ko) | 2001-04-03 | 2002-04-03 | 기판을 평탄화하는 방법, 자기 헤드 및 그 제조 방법 |
Country Status (2)
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US (1) | US6995951B2 (ko) |
KR (1) | KR20020079451A (ko) |
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US7925568B2 (en) * | 2002-04-10 | 2011-04-12 | Volt Information Sciences, Inc. | Computer system and method for producing analytical data related to the project bid and requisition process |
JP2004334945A (ja) * | 2003-05-02 | 2004-11-25 | Fuji Photo Film Co Ltd | 複合型磁気ヘッド及びその製造方法 |
JP2005025890A (ja) * | 2003-07-04 | 2005-01-27 | Fujitsu Ltd | 磁気ヘッド用磁性膜 |
FR2877484A1 (fr) * | 2004-11-04 | 2006-05-05 | Commissariat Energie Atomique | Dispositif d'enregistrement et/ou de lecture a tetes magnetiques multiples a entrefers azimutes |
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---|---|---|---|---|
JPS59142716A (ja) * | 1983-02-04 | 1984-08-16 | Hitachi Ltd | 磁気ヘツドおよびその製造方法 |
JPS59207415A (ja) * | 1983-05-11 | 1984-11-24 | Hitachi Ltd | 複合型磁気ヘツドおよびその製造方法 |
DE3681806D1 (de) * | 1985-03-13 | 1991-11-14 | Matsushita Electric Ind Co Ltd | Magnetkopf. |
JPH1040511A (ja) * | 1996-07-25 | 1998-02-13 | Sony Corp | 磁気ヘッド |
JP3487152B2 (ja) * | 1997-12-25 | 2004-01-13 | ソニー株式会社 | 磁気ヘッド及びその製造方法 |
JP2001006109A (ja) * | 1999-06-23 | 2001-01-12 | Sony Corp | 磁気ヘッド用非磁性基板及び磁気ヘッド |
-
2002
- 2002-03-27 US US10/107,224 patent/US6995951B2/en not_active Expired - Fee Related
- 2002-04-03 KR KR1020020018280A patent/KR20020079451A/ko not_active Application Discontinuation
Also Published As
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US20020187565A1 (en) | 2002-12-12 |
US6995951B2 (en) | 2006-02-07 |
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