KR20000006076A - 반도체시험장치용바이어스전원회로 - Google Patents

반도체시험장치용바이어스전원회로 Download PDF

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Publication number
KR20000006076A
KR20000006076A KR1019990021521A KR19990021521A KR20000006076A KR 20000006076 A KR20000006076 A KR 20000006076A KR 1019990021521 A KR1019990021521 A KR 1019990021521A KR 19990021521 A KR19990021521 A KR 19990021521A KR 20000006076 A KR20000006076 A KR 20000006076A
Authority
KR
South Korea
Prior art keywords
current
power supply
test
current amplifier
amplifier
Prior art date
Application number
KR1019990021521A
Other languages
English (en)
Korean (ko)
Inventor
나가타다카히로
Original Assignee
나까무라 쇼오
안도덴키 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 나까무라 쇼오, 안도덴키 가부시키가이샤 filed Critical 나까무라 쇼오
Publication of KR20000006076A publication Critical patent/KR20000006076A/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
KR1019990021521A 1998-06-24 1999-06-10 반도체시험장치용바이어스전원회로 KR20000006076A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP177878 1998-06-24
JP17787898A JP3436138B2 (ja) 1998-06-24 1998-06-24 半導体試験装置用バイアス電源回路

Publications (1)

Publication Number Publication Date
KR20000006076A true KR20000006076A (ko) 2000-01-25

Family

ID=16038646

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019990021521A KR20000006076A (ko) 1998-06-24 1999-06-10 반도체시험장치용바이어스전원회로

Country Status (2)

Country Link
JP (1) JP3436138B2 (ja)
KR (1) KR20000006076A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102180582B1 (ko) 2020-05-29 2020-11-18 (주)에이블리 반도체검사장비에서의 전류 인식 시스템 및 방법

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102180582B1 (ko) 2020-05-29 2020-11-18 (주)에이블리 반도체검사장비에서의 전류 인식 시스템 및 방법

Also Published As

Publication number Publication date
JP2000009791A (ja) 2000-01-14
JP3436138B2 (ja) 2003-08-11

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E902 Notification of reason for refusal
E601 Decision to refuse application