KR102553580B1 - 노이즈-성형 연속 근사 adc 오버샘플링 - Google Patents

노이즈-성형 연속 근사 adc 오버샘플링 Download PDF

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KR102553580B1
KR102553580B1 KR1020177017828A KR20177017828A KR102553580B1 KR 102553580 B1 KR102553580 B1 KR 102553580B1 KR 1020177017828 A KR1020177017828 A KR 1020177017828A KR 20177017828 A KR20177017828 A KR 20177017828A KR 102553580 B1 KR102553580 B1 KR 102553580B1
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output
successive approximation
residual
digital
input signal
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KR20170091678A (ko
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마이클 테런스 더스턴
케빈 타운센드
더글러스 로버트 시츠
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애틀랜틱 이너셜 시스템스 리미티드
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/20—Increasing resolution using an n bit system to obtain n + m bits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0656—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal
    • H03M1/0658—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal by calculating a running average of a number of subsequent samples
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/80—Simultaneous conversion using weighted impedances
    • H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
    • H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/462—Details of the control circuitry, e.g. of the successive approximation register
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
    • H03M2201/2291—

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Analogue/Digital Conversion (AREA)
KR1020177017828A 2014-12-03 2015-12-03 노이즈-성형 연속 근사 adc 오버샘플링 Active KR102553580B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1421481.1A GB2532972B (en) 2014-12-03 2014-12-03 Successive approximation ADC
GB1421481.1 2014-12-03
PCT/GB2015/053708 WO2016087869A1 (en) 2014-12-03 2015-12-03 Oversampling noise-shaping successive approximation adc

Publications (2)

Publication Number Publication Date
KR20170091678A KR20170091678A (ko) 2017-08-09
KR102553580B1 true KR102553580B1 (ko) 2023-07-11

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US (1) US10135454B2 (enExample)
EP (1) EP3228011A1 (enExample)
JP (1) JP7043259B2 (enExample)
KR (1) KR102553580B1 (enExample)
GB (1) GB2532972B (enExample)
WO (1) WO2016087869A1 (enExample)

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CN106323263B (zh) * 2016-08-24 2019-04-16 南京理工大学 硅微陀螺机电结合带通sigma-delta闭环检测电路
US9698805B1 (en) 2016-09-09 2017-07-04 Analog Devices, Inc. Electrical noise reduction in an analog-to-digital converter
US9774345B1 (en) * 2016-09-20 2017-09-26 Kabushiki Kaisha Toshiba Successive approximation register analog-to-digital converter
TWI650956B (zh) * 2017-12-12 2019-02-11 瑞昱半導體股份有限公司 連續漸近暫存器式量化器與連續時間三角積分調變器
CN108631778B (zh) * 2018-05-10 2022-01-14 上海华虹宏力半导体制造有限公司 逐次逼近模数转换器及转换方法
WO2020195754A1 (ja) * 2019-03-28 2020-10-01 パナソニックＩｐマネジメント株式会社 アナログデジタルコンバータ、センサ処理回路、及びセンサシステム
KR102298843B1 (ko) * 2019-11-29 2021-09-07 주식회사 이엘티 아크 검출 알고리즘에 따른 아크 검출 장치
US11387837B1 (en) * 2020-12-30 2022-07-12 Texas Instruments Incorporated Successive approximation register analog to digital converter
CN114173072B (zh) * 2021-10-28 2025-04-08 淮北矿业股份有限公司 模拟监视器数字化系统
US11990917B2 (en) * 2022-06-07 2024-05-21 Invensense, Inc. Incremental analog to digital converter incorporating noise shaping and residual error quantization
CN115833835B (zh) * 2022-11-18 2025-08-05 上海国微芯芯半导体有限公司 一种逐次逼近型模数转换器、过采样方法及装置
CN119543949B (zh) * 2024-11-08 2025-11-25 中山大学 一种多输入比较器的循环逐次逼近模数转换器及量化方法

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JP2013542411A (ja) 2010-09-14 2013-11-21 エスアイ−ウェアー システムズ インコーポレーテッド Ｍｅｍｓ慣性センサ用インタフェース

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NL8402766A (nl) * 1984-09-11 1986-04-01 Philips Nv Analoog naar digitaal omzetschakeling.
US4862168A (en) * 1987-03-19 1989-08-29 Beard Terry D Audio digital/analog encoding and decoding
JPH01155120A (ja) * 1987-12-11 1989-06-19 Hitachi Ltd ガスタービン燃焼器の尾筒
JPH1155120A (ja) * 1997-07-29 1999-02-26 Nec Kyushu Ltd Ａｄ変換器及びこれを内蔵したマイクロコンピュータ
WO2004076340A1 (en) 2003-02-28 2004-09-10 Bae Systems Plc An accelerometer
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US7956787B2 (en) * 2008-12-19 2011-06-07 Silicon Laboratories Inc. SAR analog-to-digital converter having differing bit modes of operation
JP2010268139A (ja) * 2009-05-13 2010-11-25 Renesas Electronics Corp Ａ／ｄ変換装置
JP5526672B2 (ja) * 2009-09-16 2014-06-18 富士通株式会社 Ａｄ変換器
JP5447011B2 (ja) * 2010-03-05 2014-03-19 富士通株式会社 Ａ／ｄ変換装置およびａ／ｄ変換方法
WO2013015672A1 (en) * 2011-07-28 2013-01-31 Mimos Berhad Low power high resolution analogue to digital converter and method thereof
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JP2013542411A (ja) 2010-09-14 2013-11-21 エスアイ−ウェアー システムズ インコーポレーテッド Ｍｅｍｓ慣性センサ用インタフェース

Non-Patent Citations (1)

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Title
An error-feedback noise-shaping SAR ADC in 90nm CMOS (Analog integrated circuits and signal processing, 28 October 2014)*

Also Published As

Publication number Publication date
US20170346497A1 (en) 2017-11-30
GB2532972A (en) 2016-06-08
JP7043259B2 (ja) 2022-03-29
GB201421481D0 (en) 2015-01-14
JP2018501711A (ja) 2018-01-18
GB2532972B (en) 2021-03-10
WO2016087869A1 (en) 2016-06-09
KR20170091678A (ko) 2017-08-09
EP3228011A1 (en) 2017-10-11
US10135454B2 (en) 2018-11-20

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