KR102493803B1 - 안전 로직을 위한 자체 테스트 - Google Patents

안전 로직을 위한 자체 테스트 Download PDF

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KR102493803B1
KR102493803B1 KR1020227024435A KR20227024435A KR102493803B1 KR 102493803 B1 KR102493803 B1 KR 102493803B1 KR 1020227024435 A KR1020227024435 A KR 1020227024435A KR 20227024435 A KR20227024435 A KR 20227024435A KR 102493803 B1 KR102493803 B1 KR 102493803B1
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output
comparator
input
coupled
logic
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KR20220104293A (ko
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순데라잔 른가차리
사케트 자란
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텍사스 인스트루먼츠 인코포레이티드
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31901—Analysis of tester Performance; Tester characterization
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31724—Test controller, e.g. BIST state machine
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Road Signs Or Road Markings (AREA)
KR1020227024435A 2016-09-01 2017-08-31 안전 로직을 위한 자체 테스트 Active KR102493803B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US15/255,044 US9964597B2 (en) 2016-09-01 2016-09-01 Self test for safety logic
US15/255,044 2016-09-01
PCT/US2017/049720 WO2018045227A1 (en) 2016-09-01 2017-08-31 Self test for safety logic
KR1020197005786A KR102423050B1 (ko) 2016-09-01 2017-08-31 안전 로직을 위한 자체 테스트

Related Parent Applications (1)

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KR1020197005786A Division KR102423050B1 (ko) 2016-09-01 2017-08-31 안전 로직을 위한 자체 테스트

Publications (2)

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KR20220104293A KR20220104293A (ko) 2022-07-26
KR102493803B1 true KR102493803B1 (ko) 2023-02-06

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KR1020227024435A Active KR102493803B1 (ko) 2016-09-01 2017-08-31 안전 로직을 위한 자체 테스트
KR1020197005786A Active KR102423050B1 (ko) 2016-09-01 2017-08-31 안전 로직을 위한 자체 테스트

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Country Link
US (3) US9964597B2 (enExample)
EP (2) EP4113137B1 (enExample)
JP (2) JP7070862B2 (enExample)
KR (2) KR102493803B1 (enExample)
CN (1) CN109642926B (enExample)
WO (1) WO2018045227A1 (enExample)

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EP3428665B1 (en) * 2017-07-11 2020-03-25 Nxp B.V. Fault detection in registers
DE102017123615B4 (de) * 2017-10-11 2022-11-24 Bachmann Gmbh Konfigurierbares Sicherheitsmodul zur Erfassung digitaler oder analoger Eingangs- oder Ausgangssignale
KR102701850B1 (ko) * 2019-09-25 2024-09-02 삼성전자주식회사 안전 로직을 포함하는 장치
US10985765B2 (en) 2018-08-07 2021-04-20 Samsung Electronics Co., Ltd. Apparatus including safety logic
US10977109B2 (en) 2018-08-07 2021-04-13 Samsung Electronics Co., Ltd. Apparatus including safety logic
US10831628B2 (en) 2018-12-12 2020-11-10 Intel Corporation Hardware lockstep checking within a fault detection interval in a system on chip
US10866280B2 (en) 2019-04-01 2020-12-15 Texas Instruments Incorporated Scan chain self-testing of lockstep cores on reset
US11181560B2 (en) * 2019-05-15 2021-11-23 Infineon Technologies Ag Detecting failure using multiple monitoring modules
US11474151B2 (en) * 2020-12-30 2022-10-18 Texas Instruments Incorporated Lockstep comparators and related methods
US11550684B2 (en) 2021-04-19 2023-01-10 Nxp B.V. Testing of lockstep architecture in system-on-chips
US12164000B2 (en) * 2021-08-30 2024-12-10 Stmicroelectronics S.R.L. On-chip checker for on-chip safety area
CN114721348B (zh) * 2022-03-16 2025-05-27 徐州威卡电子控制技术有限公司 一种针对功能安全控制器的自动化测试系统
CN115410502B (zh) * 2022-08-29 2025-08-26 集创北方(珠海)科技有限公司 显示装置及其检测电路和检测方法
CN119597553A (zh) * 2024-11-14 2025-03-11 北京地平线信息技术有限公司 功能安全测试电路、方法、神经网络处理器及存储介质

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US20060078076A1 (en) 1999-09-27 2006-04-13 The Board Of Governors For Higher Education, State Of Rhode Island And Providence Plantations System and method of digital system performance enhancement
US20030056134A1 (en) 2000-01-31 2003-03-20 Ruban Kanapathippillai Method and apparatus for power reduction in a digital signal processor integrated circuit
JP2002196047A (ja) 2000-12-27 2002-07-10 Nec Corp Ｂｉｓｔ回路内蔵半導体集積回路装置およびテスト方法
JP2008267999A (ja) 2007-04-20 2008-11-06 Hitachi Ltd 制御中に自己診断できるプログラム可能な制御装置
US20100237890A1 (en) 2009-03-18 2010-09-23 Infineon Technologies Ag System that measures characteristics of output signal
US20120169361A1 (en) 2010-12-30 2012-07-05 Taiwan Semiconductor Manufacturing Co., Ltd. Built in self test for transceiver
US20140232422A1 (en) 2011-01-20 2014-08-21 Texas Instruments Incorporated Built-in self-test methods, circuits and apparatus for concurrent test of rf modules with a dynamically configurable test structure
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JP2016080364A (ja) 2014-10-09 2016-05-16 株式会社日立超エル・エス・アイ・システムズ 半導体装置

Also Published As

Publication number Publication date
KR20190042590A (ko) 2019-04-24
KR20220104293A (ko) 2022-07-26
WO2018045227A1 (en) 2018-03-08
JP2019529887A (ja) 2019-10-17
US10935602B2 (en) 2021-03-02
EP3507611B1 (en) 2022-07-27
JP7070862B2 (ja) 2022-05-18
US9964597B2 (en) 2018-05-08
EP4113137A1 (en) 2023-01-04
EP4113137B1 (en) 2026-07-08
US11320488B2 (en) 2022-05-03
US20180059180A1 (en) 2018-03-01
EP3507611A4 (en) 2019-09-11
EP3507611A1 (en) 2019-07-10
JP2022097548A (ja) 2022-06-30
CN109642926B (zh) 2021-06-08
KR102423050B1 (ko) 2022-07-21
US20180252771A1 (en) 2018-09-06
CN109642926A (zh) 2019-04-16
US20210148976A1 (en) 2021-05-20
JP7392958B2 (ja) 2023-12-06

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