|
US3976940A
(en)
*
|
1975-02-25 |
1976-08-24 |
Fairchild Camera And Instrument Corporation |
Testing circuit
|
|
US3988670A
(en)
*
|
1975-04-15 |
1976-10-26 |
The United States Of America As Represented By The Secretary Of The Navy |
Automatic testing of digital logic systems
|
|
US4271515A
(en)
*
|
1979-03-23 |
1981-06-02 |
John Fluke Mfg. Co., Inc. |
Universal analog and digital tester
|
|
US4635259A
(en)
*
|
1983-08-01 |
1987-01-06 |
Fairchild Semiconductor Corporation |
Method and apparatus for monitoring response signals during automated testing of electronic circuits
|
|
US4637020A
(en)
*
|
1983-08-01 |
1987-01-13 |
Fairchild Semiconductor Corporation |
Method and apparatus for monitoring automated testing of electronic circuits
|
|
US4554661A
(en)
*
|
1983-10-31 |
1985-11-19 |
Burroughs Corporation |
Generalized fault reporting system
|
|
US4620302A
(en)
*
|
1984-01-06 |
1986-10-28 |
Burroughs Corporation |
Programmable digital signal testing system
|
|
US4658400A
(en)
*
|
1984-06-07 |
1987-04-14 |
Trilogy Computer Development Partners, Ltd. |
WSI tester
|
|
NL8900549A
(nl)
*
|
1989-03-07 |
1990-10-01 |
Philips Nv |
Vergelijkschakeling bevattende een maskeermechanisme voor transiente verschillen, vergelijkschakelingssysteem, en verwerkingsinrichting bevattende zulke vergelijkschakelingen.
|
|
US5425035A
(en)
*
|
1992-09-11 |
1995-06-13 |
Motorola, Inc. |
Enhanced data analyzer for use in bist circuitry
|
|
US5732209A
(en)
*
|
1995-11-29 |
1998-03-24 |
Exponential Technology, Inc. |
Self-testing multi-processor die with internal compare points
|
|
JPH09288150A
(ja)
*
|
1996-04-24 |
1997-11-04 |
Hitachi Ltd |
誤り検出方法,論理回路およびフォールトトレラントシステム
|
|
US6081484A
(en)
*
|
1997-10-14 |
2000-06-27 |
Schlumberger Technologies, Inc. |
Measuring signals in a tester system
|
|
KR19990047439A
(ko)
*
|
1997-12-04 |
1999-07-05 |
윤종용 |
혼합 디바이스에서 효율적으로 디지탈 블록을 테스트하기 위한인터페이스 회로
|
|
US6363129B1
(en)
*
|
1998-11-09 |
2002-03-26 |
Broadcom Corporation |
Timing recovery system for a multi-pair gigabit transceiver
|
|
US6282682B1
(en)
*
|
1999-02-05 |
2001-08-28 |
Teradyne, Inc. |
Automatic test equipment using sigma delta modulation to create reference levels
|
|
US7350108B1
(en)
*
|
1999-09-10 |
2008-03-25 |
International Business Machines Corporation |
Test system for integrated circuits
|
|
US6985547B2
(en)
*
|
1999-09-27 |
2006-01-10 |
The Board Of Governors For Higher Education, State Of Rhode Island And Providence Plantations |
System and method of digital system performance enhancement
|
|
US6732203B2
(en)
|
2000-01-31 |
2004-05-04 |
Intel Corporation |
Selectively multiplexing memory coupling global bus data bits to narrower functional unit coupling local bus
|
|
JP3537087B2
(ja)
*
|
2000-09-29 |
2004-06-14 |
Necエレクトロニクス株式会社 |
半導体装置及び半導体装置の検査方法
|
|
JP4863547B2
(ja)
*
|
2000-12-27 |
2012-01-25 |
ルネサスエレクトロニクス株式会社 |
Bist回路内蔵半導体集積回路装置
|
|
US20020194565A1
(en)
*
|
2001-06-18 |
2002-12-19 |
Karim Arabi |
Simultaneous built-in self-testing of multiple identical blocks of integrated circuitry
|
|
WO2003025595A2
(en)
*
|
2001-09-20 |
2003-03-27 |
Koninklijke Philips Electronics N.V. |
Electronic device
|
|
JP2003098225A
(ja)
*
|
2001-09-25 |
2003-04-03 |
Toshiba Corp |
半導体集積回路
|
|
US7308621B2
(en)
*
|
2002-04-30 |
2007-12-11 |
International Business Machines Corporation |
Testing of ECC memories
|
|
JP4136451B2
(ja)
*
|
2002-05-22 |
2008-08-20 |
富士通株式会社 |
Bist回路
|
|
KR100518573B1
(ko)
*
|
2003-05-15 |
2005-10-04 |
삼성전자주식회사 |
신호 검출 회로 및 신호 검출 방법
|
|
US7134061B2
(en)
*
|
2003-09-08 |
2006-11-07 |
Texas Instruments Incorporated |
At-speed ATPG testing and apparatus for SoC designs having multiple clock domain using a VLCT test platform
|
|
US20050066226A1
(en)
*
|
2003-09-23 |
2005-03-24 |
Adams R. Dean |
Redundant memory self-test
|
|
US7213186B2
(en)
*
|
2004-01-12 |
2007-05-01 |
Taiwan Semiconductor Manufacturing Company |
Memory built-in self test circuit with full error mapping capability
|
|
DE112005000403T5
(de)
*
|
2004-02-19 |
2007-02-08 |
Advantest Corp. |
Versatzeinstellverfahren, Versatzeinstellgerät und Testgerät
|
|
US8255700B2
(en)
*
|
2004-06-29 |
2012-08-28 |
Qualcomm Incorporated |
Lockstep mechanism to ensure security in hardware at power-up
|
|
US7574633B2
(en)
*
|
2006-07-12 |
2009-08-11 |
Advantest Corporation |
Test apparatus, adjustment method and recording medium
|
|
US7797599B2
(en)
*
|
2006-09-27 |
2010-09-14 |
Verigy (Singapore) Pte. Ltd. |
Diagnostic information capture from logic devices with built-in self test
|
|
US20080077836A1
(en)
*
|
2006-09-27 |
2008-03-27 |
Khoche A Jay |
Diagnostic Information Capture from Memory Devices with Built-in Self Test
|
|
DE102007008168A1
(de)
*
|
2007-02-19 |
2008-08-28 |
Siemens Ag |
Schaltungsvorrichtung und entsprechendes Verfahren zum Ansteuern einer Last
|
|
JP2008267999A
(ja)
*
|
2007-04-20 |
2008-11-06 |
Hitachi Ltd |
制御中に自己診断できるプログラム可能な制御装置
|
|
JP5014907B2
(ja)
*
|
2007-07-17 |
2012-08-29 |
ルネサスエレクトロニクス株式会社 |
半導体記憶装置及びそのテスト方法
|
|
US8466700B2
(en)
*
|
2009-03-18 |
2013-06-18 |
Infineon Technologies Ag |
System that measures characteristics of output signal
|
|
CN101901176B
(zh)
*
|
2010-07-22 |
2012-01-11 |
北京交大资产经营有限公司 |
冗余时钟系统
|
|
US8972821B2
(en)
|
2010-12-23 |
2015-03-03 |
Texas Instruments Incorporated |
Encode and multiplex, register, and decode and error correction circuitry
|
|
US8536888B2
(en)
|
2010-12-30 |
2013-09-17 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
Built in self test for transceiver
|
|
US8694276B2
(en)
|
2011-01-20 |
2014-04-08 |
Texas Instruments Incorporated |
Built-in self-test methods, circuits and apparatus for concurrent test of RF modules with a dynamically configurable test structure
|
|
US20130019130A1
(en)
*
|
2011-07-15 |
2013-01-17 |
Synopsys Inc. |
Testing electronic memories based on fault and test algorithm periodicity
|
|
JP5727358B2
(ja)
*
|
2011-12-22 |
2015-06-03 |
ルネサスエレクトロニクス株式会社 |
半導体装置
|
|
US9052802B2
(en)
|
2012-03-02 |
2015-06-09 |
Realtek Semiconductor Corp. |
Multimedia interaction system and related computer program product capable of filtering multimedia interaction commands
|
|
US9418037B2
(en)
*
|
2012-07-11 |
2016-08-16 |
Infineon Technologies Ag |
SPI interface and method for serial communication via an SPI interface having an SPI protocol handler for evaluating signal transitions of SPI signals
|
|
CN103855682B
(zh)
*
|
2013-03-25 |
2017-05-10 |
刘圣平 |
防故障失效的控制电路芯片及安全漏电保护器
|
|
US10411504B2
(en)
*
|
2013-07-31 |
2019-09-10 |
Texas Instruments Incorporated |
System and method for controlling power delivered to a powered device through a communication cable
|
|
JP6373154B2
(ja)
*
|
2014-10-09 |
2018-08-15 |
株式会社日立超エル・エス・アイ・システムズ |
半導体装置
|
|
US9921295B2
(en)
*
|
2014-12-30 |
2018-03-20 |
Texas Instruments Incorporated |
Multiple chirp generation in a radar system
|
|
CN105895619B
(zh)
*
|
2015-01-23 |
2021-06-25 |
恩智浦美国有限公司 |
用于监测集成电路上金属退化的电路
|