KR102423050B1 - 안전 로직을 위한 자체 테스트 - Google Patents

안전 로직을 위한 자체 테스트 Download PDF

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KR102423050B1
KR102423050B1 KR1020197005786A KR20197005786A KR102423050B1 KR 102423050 B1 KR102423050 B1 KR 102423050B1 KR 1020197005786 A KR1020197005786 A KR 1020197005786A KR 20197005786 A KR20197005786 A KR 20197005786A KR 102423050 B1 KR102423050 B1 KR 102423050B1
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output
bit value
logic
test
signal
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KR20190042590A (ko
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순데라잔 른가차리
사케트 자란
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텍사스 인스트루먼츠 인코포레이티드
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Priority to KR1020227024435A priority Critical patent/KR102493803B1/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31901—Analysis of tester Performance; Tester characterization
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31724—Test controller, e.g. BIST state machine
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Road Signs Or Road Markings (AREA)
KR1020197005786A 2016-09-01 2017-08-31 안전 로직을 위한 자체 테스트 Active KR102423050B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020227024435A KR102493803B1 (ko) 2016-09-01 2017-08-31 안전 로직을 위한 자체 테스트

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/255,044 2016-09-01
US15/255,044 US9964597B2 (en) 2016-09-01 2016-09-01 Self test for safety logic
PCT/US2017/049720 WO2018045227A1 (en) 2016-09-01 2017-08-31 Self test for safety logic

Related Child Applications (1)

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KR1020227024435A Division KR102493803B1 (ko) 2016-09-01 2017-08-31 안전 로직을 위한 자체 테스트

Publications (2)

Publication Number Publication Date
KR20190042590A KR20190042590A (ko) 2019-04-24
KR102423050B1 true KR102423050B1 (ko) 2022-07-21

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KR1020197005786A Active KR102423050B1 (ko) 2016-09-01 2017-08-31 안전 로직을 위한 자체 테스트
KR1020227024435A Active KR102493803B1 (ko) 2016-09-01 2017-08-31 안전 로직을 위한 자체 테스트

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Country Link
US (3) US9964597B2 (https=)
EP (2) EP3507611B1 (https=)
JP (2) JP7070862B2 (https=)
KR (2) KR102423050B1 (https=)
CN (1) CN109642926B (https=)
WO (1) WO2018045227A1 (https=)

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US10985765B2 (en) 2018-08-07 2021-04-20 Samsung Electronics Co., Ltd. Apparatus including safety logic
US10977109B2 (en) 2018-08-07 2021-04-13 Samsung Electronics Co., Ltd. Apparatus including safety logic
KR102701850B1 (ko) * 2019-09-25 2024-09-02 삼성전자주식회사 안전 로직을 포함하는 장치
US10831628B2 (en) * 2018-12-12 2020-11-10 Intel Corporation Hardware lockstep checking within a fault detection interval in a system on chip
US10866280B2 (en) 2019-04-01 2020-12-15 Texas Instruments Incorporated Scan chain self-testing of lockstep cores on reset
US11181560B2 (en) * 2019-05-15 2021-11-23 Infineon Technologies Ag Detecting failure using multiple monitoring modules
US11550684B2 (en) 2021-04-19 2023-01-10 Nxp B.V. Testing of lockstep architecture in system-on-chips
US12164000B2 (en) * 2021-08-30 2024-12-10 Stmicroelectronics S.R.L. On-chip checker for on-chip safety area
CN114721348B (zh) * 2022-03-16 2025-05-27 徐州威卡电子控制技术有限公司 一种针对功能安全控制器的自动化测试系统
CN115410502B (zh) * 2022-08-29 2025-08-26 集创北方(珠海)科技有限公司 显示装置及其检测电路和检测方法

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JP2008267999A (ja) 2007-04-20 2008-11-06 Hitachi Ltd 制御中に自己診断できるプログラム可能な制御装置
US20150143181A1 (en) 2010-12-23 2015-05-21 Texas Instruments Incorporated Dual endianess and other configuration safety in lock step dual-core system, and other circuits, processes and systems
US20120169361A1 (en) 2010-12-30 2012-07-05 Taiwan Semiconductor Manufacturing Co., Ltd. Built in self test for transceiver
US20140232422A1 (en) 2011-01-20 2014-08-21 Texas Instruments Incorporated Built-in self-test methods, circuits and apparatus for concurrent test of rf modules with a dynamically configurable test structure
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Also Published As

Publication number Publication date
JP2019529887A (ja) 2019-10-17
EP3507611A1 (en) 2019-07-10
EP4113137A1 (en) 2023-01-04
US9964597B2 (en) 2018-05-08
CN109642926A (zh) 2019-04-16
EP3507611A4 (en) 2019-09-11
KR102493803B1 (ko) 2023-02-06
KR20220104293A (ko) 2022-07-26
US10935602B2 (en) 2021-03-02
US20180059180A1 (en) 2018-03-01
KR20190042590A (ko) 2019-04-24
JP2022097548A (ja) 2022-06-30
JP7392958B2 (ja) 2023-12-06
WO2018045227A1 (en) 2018-03-08
US20180252771A1 (en) 2018-09-06
US11320488B2 (en) 2022-05-03
CN109642926B (zh) 2021-06-08
EP3507611B1 (en) 2022-07-27
US20210148976A1 (en) 2021-05-20
JP7070862B2 (ja) 2022-05-18

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