CN109642926B - 安全逻辑的自测试 - Google Patents

安全逻辑的自测试 Download PDF

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Publication number
CN109642926B
CN109642926B CN201780053277.2A CN201780053277A CN109642926B CN 109642926 B CN109642926 B CN 109642926B CN 201780053277 A CN201780053277 A CN 201780053277A CN 109642926 B CN109642926 B CN 109642926B
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China
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bit value
output
logic
signal
test
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Chinese (zh)
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CN109642926A (zh
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S·兰加查理
S·贾兰
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Texas Instruments Inc
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Texas Instruments Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31901—Analysis of tester Performance; Tester characterization
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31724—Test controller, e.g. BIST state machine
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Road Signs Or Road Markings (AREA)
CN201780053277.2A 2016-09-01 2017-08-31 安全逻辑的自测试 Active CN109642926B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/255,044 2016-09-01
US15/255,044 US9964597B2 (en) 2016-09-01 2016-09-01 Self test for safety logic
PCT/US2017/049720 WO2018045227A1 (en) 2016-09-01 2017-08-31 Self test for safety logic

Publications (2)

Publication Number Publication Date
CN109642926A CN109642926A (zh) 2019-04-16
CN109642926B true CN109642926B (zh) 2021-06-08

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ID=61242285

Family Applications (1)

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CN201780053277.2A Active CN109642926B (zh) 2016-09-01 2017-08-31 安全逻辑的自测试

Country Status (6)

Country Link
US (3) US9964597B2 (https=)
EP (2) EP3507611B1 (https=)
JP (2) JP7070862B2 (https=)
KR (2) KR102423050B1 (https=)
CN (1) CN109642926B (https=)
WO (1) WO2018045227A1 (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3428665B1 (en) * 2017-07-11 2020-03-25 Nxp B.V. Fault detection in registers
DE102017123615B4 (de) * 2017-10-11 2022-11-24 Bachmann Gmbh Konfigurierbares Sicherheitsmodul zur Erfassung digitaler oder analoger Eingangs- oder Ausgangssignale
US10985765B2 (en) 2018-08-07 2021-04-20 Samsung Electronics Co., Ltd. Apparatus including safety logic
US10977109B2 (en) 2018-08-07 2021-04-13 Samsung Electronics Co., Ltd. Apparatus including safety logic
KR102701850B1 (ko) * 2019-09-25 2024-09-02 삼성전자주식회사 안전 로직을 포함하는 장치
US10831628B2 (en) * 2018-12-12 2020-11-10 Intel Corporation Hardware lockstep checking within a fault detection interval in a system on chip
US10866280B2 (en) 2019-04-01 2020-12-15 Texas Instruments Incorporated Scan chain self-testing of lockstep cores on reset
US11181560B2 (en) * 2019-05-15 2021-11-23 Infineon Technologies Ag Detecting failure using multiple monitoring modules
US11550684B2 (en) 2021-04-19 2023-01-10 Nxp B.V. Testing of lockstep architecture in system-on-chips
US12164000B2 (en) * 2021-08-30 2024-12-10 Stmicroelectronics S.R.L. On-chip checker for on-chip safety area
CN114721348B (zh) * 2022-03-16 2025-05-27 徐州威卡电子控制技术有限公司 一种针对功能安全控制器的自动化测试系统
CN115410502B (zh) * 2022-08-29 2025-08-26 集创北方(珠海)科技有限公司 显示装置及其检测电路和检测方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3976940A (en) * 1975-02-25 1976-08-24 Fairchild Camera And Instrument Corporation Testing circuit
US4271515A (en) * 1979-03-23 1981-06-02 John Fluke Mfg. Co., Inc. Universal analog and digital tester
US4635259A (en) * 1983-08-01 1987-01-06 Fairchild Semiconductor Corporation Method and apparatus for monitoring response signals during automated testing of electronic circuits
US4637020A (en) * 1983-08-01 1987-01-13 Fairchild Semiconductor Corporation Method and apparatus for monitoring automated testing of electronic circuits
US4658400A (en) * 1984-06-07 1987-04-14 Trilogy Computer Development Partners, Ltd. WSI tester
CN103855682A (zh) * 2013-03-25 2014-06-11 刘圣平 防故障失效的控制电路芯片及安全漏电保护器
CN105453360A (zh) * 2013-07-31 2016-03-30 德克萨斯仪器股份有限公司 用于控制通过通信电缆传输电力的方法和系统

Family Cites Families (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3988670A (en) * 1975-04-15 1976-10-26 The United States Of America As Represented By The Secretary Of The Navy Automatic testing of digital logic systems
US4554661A (en) * 1983-10-31 1985-11-19 Burroughs Corporation Generalized fault reporting system
US4620302A (en) * 1984-01-06 1986-10-28 Burroughs Corporation Programmable digital signal testing system
NL8900549A (nl) * 1989-03-07 1990-10-01 Philips Nv Vergelijkschakeling bevattende een maskeermechanisme voor transiente verschillen, vergelijkschakelingssysteem, en verwerkingsinrichting bevattende zulke vergelijkschakelingen.
US5425035A (en) * 1992-09-11 1995-06-13 Motorola, Inc. Enhanced data analyzer for use in bist circuitry
US5732209A (en) * 1995-11-29 1998-03-24 Exponential Technology, Inc. Self-testing multi-processor die with internal compare points
JPH09288150A (ja) * 1996-04-24 1997-11-04 Hitachi Ltd 誤り検出方法，論理回路およびフォールトトレラントシステム
US6081484A (en) * 1997-10-14 2000-06-27 Schlumberger Technologies, Inc. Measuring signals in a tester system
KR19990047439A (ko) * 1997-12-04 1999-07-05 윤종용 혼합 디바이스에서 효율적으로 디지탈 블록을 테스트하기 위한인터페이스 회로
US6363129B1 (en) * 1998-11-09 2002-03-26 Broadcom Corporation Timing recovery system for a multi-pair gigabit transceiver
US6282682B1 (en) * 1999-02-05 2001-08-28 Teradyne, Inc. Automatic test equipment using sigma delta modulation to create reference levels
US7350108B1 (en) * 1999-09-10 2008-03-25 International Business Machines Corporation Test system for integrated circuits
US6985547B2 (en) * 1999-09-27 2006-01-10 The Board Of Governors For Higher Education, State Of Rhode Island And Providence Plantations System and method of digital system performance enhancement
US6732203B2 (en) 2000-01-31 2004-05-04 Intel Corporation Selectively multiplexing memory coupling global bus data bits to narrower functional unit coupling local bus
JP3537087B2 (ja) * 2000-09-29 2004-06-14 Ｎｅｃエレクトロニクス株式会社 半導体装置及び半導体装置の検査方法
JP4863547B2 (ja) 2000-12-27 2012-01-25 ルネサスエレクトロニクス株式会社 Ｂｉｓｔ回路内蔵半導体集積回路装置
US20020194565A1 (en) * 2001-06-18 2002-12-19 Karim Arabi Simultaneous built-in self-testing of multiple identical blocks of integrated circuitry
CN100342241C (zh) * 2001-09-20 2007-10-10 Nxp股份有限公司 电子装置
JP2003098225A (ja) * 2001-09-25 2003-04-03 Toshiba Corp 半導体集積回路
US7308621B2 (en) * 2002-04-30 2007-12-11 International Business Machines Corporation Testing of ECC memories
JP4136451B2 (ja) * 2002-05-22 2008-08-20 富士通株式会社 Ｂｉｓｔ回路
KR100518573B1 (ko) * 2003-05-15 2005-10-04 삼성전자주식회사 신호 검출 회로 및 신호 검출 방법
US7134061B2 (en) * 2003-09-08 2006-11-07 Texas Instruments Incorporated At-speed ATPG testing and apparatus for SoC designs having multiple clock domain using a VLCT test platform
US20050066226A1 (en) * 2003-09-23 2005-03-24 Adams R. Dean Redundant memory self-test
US7213186B2 (en) 2004-01-12 2007-05-01 Taiwan Semiconductor Manufacturing Company Memory built-in self test circuit with full error mapping capability
JP4644188B2 (ja) 2004-02-19 2011-03-02 株式会社アドバンテスト スキュー調整方法、スキュー調整装置および試験装置
US8255700B2 (en) * 2004-06-29 2012-08-28 Qualcomm Incorporated Lockstep mechanism to ensure security in hardware at power-up
US7574633B2 (en) * 2006-07-12 2009-08-11 Advantest Corporation Test apparatus, adjustment method and recording medium
US20080077836A1 (en) * 2006-09-27 2008-03-27 Khoche A Jay Diagnostic Information Capture from Memory Devices with Built-in Self Test
US7797599B2 (en) * 2006-09-27 2010-09-14 Verigy (Singapore) Pte. Ltd. Diagnostic information capture from logic devices with built-in self test
DE102007008168A1 (de) * 2007-02-19 2008-08-28 Siemens Ag Schaltungsvorrichtung und entsprechendes Verfahren zum Ansteuern einer Last
JP2008267999A (ja) 2007-04-20 2008-11-06 Hitachi Ltd 制御中に自己診断できるプログラム可能な制御装置
JP5014907B2 (ja) * 2007-07-17 2012-08-29 ルネサスエレクトロニクス株式会社 半導体記憶装置及びそのテスト方法
US8466700B2 (en) * 2009-03-18 2013-06-18 Infineon Technologies Ag System that measures characteristics of output signal
CN101901176B (zh) * 2010-07-22 2012-01-11 北京交大资产经营有限公司 冗余时钟系统
US8972821B2 (en) 2010-12-23 2015-03-03 Texas Instruments Incorporated Encode and multiplex, register, and decode and error correction circuitry
US8536888B2 (en) 2010-12-30 2013-09-17 Taiwan Semiconductor Manufacturing Co., Ltd. Built in self test for transceiver
US8694276B2 (en) 2011-01-20 2014-04-08 Texas Instruments Incorporated Built-in self-test methods, circuits and apparatus for concurrent test of RF modules with a dynamically configurable test structure
US20130019130A1 (en) * 2011-07-15 2013-01-17 Synopsys Inc. Testing electronic memories based on fault and test algorithm periodicity
JP5727358B2 (ja) 2011-12-22 2015-06-03 ルネサスエレクトロニクス株式会社 半導体装置
US9052802B2 (en) 2012-03-02 2015-06-09 Realtek Semiconductor Corp. Multimedia interaction system and related computer program product capable of filtering multimedia interaction commands
US9418037B2 (en) * 2012-07-11 2016-08-16 Infineon Technologies Ag SPI interface and method for serial communication via an SPI interface having an SPI protocol handler for evaluating signal transitions of SPI signals
JP6373154B2 (ja) 2014-10-09 2018-08-15 株式会社日立超エル・エス・アイ・システムズ 半導体装置
US9921295B2 (en) * 2014-12-30 2018-03-20 Texas Instruments Incorporated Multiple chirp generation in a radar system
CN105895619B (zh) * 2015-01-23 2021-06-25 恩智浦美国有限公司 用于监测集成电路上金属退化的电路

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3976940A (en) * 1975-02-25 1976-08-24 Fairchild Camera And Instrument Corporation Testing circuit
US4271515A (en) * 1979-03-23 1981-06-02 John Fluke Mfg. Co., Inc. Universal analog and digital tester
US4635259A (en) * 1983-08-01 1987-01-06 Fairchild Semiconductor Corporation Method and apparatus for monitoring response signals during automated testing of electronic circuits
US4637020A (en) * 1983-08-01 1987-01-13 Fairchild Semiconductor Corporation Method and apparatus for monitoring automated testing of electronic circuits
US4658400A (en) * 1984-06-07 1987-04-14 Trilogy Computer Development Partners, Ltd. WSI tester
CN103855682A (zh) * 2013-03-25 2014-06-11 刘圣平 防故障失效的控制电路芯片及安全漏电保护器
CN105453360A (zh) * 2013-07-31 2016-03-30 德克萨斯仪器股份有限公司 用于控制通过通信电缆传输电力的方法和系统

Also Published As

Publication number Publication date
JP2019529887A (ja) 2019-10-17
EP3507611A1 (en) 2019-07-10
EP4113137A1 (en) 2023-01-04
US9964597B2 (en) 2018-05-08
CN109642926A (zh) 2019-04-16
EP3507611A4 (en) 2019-09-11
KR102493803B1 (ko) 2023-02-06
KR20220104293A (ko) 2022-07-26
US10935602B2 (en) 2021-03-02
US20180059180A1 (en) 2018-03-01
KR20190042590A (ko) 2019-04-24
KR102423050B1 (ko) 2022-07-21
JP2022097548A (ja) 2022-06-30
JP7392958B2 (ja) 2023-12-06
WO2018045227A1 (en) 2018-03-08
US20180252771A1 (en) 2018-09-06
US11320488B2 (en) 2022-05-03
EP3507611B1 (en) 2022-07-27
US20210148976A1 (en) 2021-05-20
JP7070862B2 (ja) 2022-05-18

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