KR102187839B1 - 테스트핸들러 - Google Patents
테스트핸들러 Download PDFInfo
- Publication number
- KR102187839B1 KR102187839B1 KR1020140168691A KR20140168691A KR102187839B1 KR 102187839 B1 KR102187839 B1 KR 102187839B1 KR 1020140168691 A KR1020140168691 A KR 1020140168691A KR 20140168691 A KR20140168691 A KR 20140168691A KR 102187839 B1 KR102187839 B1 KR 102187839B1
- Authority
- KR
- South Korea
- Prior art keywords
- plate
- match plate
- rail
- pin
- pressure plate
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/44—Modifications of instruments for temperature compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140168691A KR102187839B1 (ko) | 2014-11-28 | 2014-11-28 | 테스트핸들러 |
CN202010190958.7A CN111375570B (zh) | 2014-11-28 | 2015-11-20 | 测试分选机 |
PCT/KR2015/012565 WO2016085206A1 (fr) | 2014-11-28 | 2015-11-20 | Gestionnaire de test |
CN201580060399.5A CN107003350B (zh) | 2014-11-28 | 2015-11-20 | 测试分选机 |
TW104139313A TWI589896B (zh) | 2014-11-28 | 2015-11-26 | Test sorter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140168691A KR102187839B1 (ko) | 2014-11-28 | 2014-11-28 | 테스트핸들러 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20160064722A KR20160064722A (ko) | 2016-06-08 |
KR102187839B1 true KR102187839B1 (ko) | 2020-12-08 |
Family
ID=56074673
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020140168691A KR102187839B1 (ko) | 2014-11-28 | 2014-11-28 | 테스트핸들러 |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR102187839B1 (fr) |
CN (2) | CN107003350B (fr) |
TW (1) | TWI589896B (fr) |
WO (1) | WO2016085206A1 (fr) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180082754A (ko) * | 2017-01-11 | 2018-07-19 | (주)테크윙 | 테스트핸들러용 가압장치 |
KR102461321B1 (ko) * | 2017-08-18 | 2022-11-02 | (주)테크윙 | 전자부품 테스트용 핸들러 |
CN115808605B (zh) * | 2022-12-09 | 2023-07-04 | 苏师大半导体材料与设备研究院(邳州)有限公司 | 一种半导体材料制备用质量检测装置 |
CN115792309B (zh) * | 2023-01-10 | 2023-04-11 | 法特迪精密科技(苏州)有限公司 | 便于两种封装芯片切换测试的高温老化测试插座上盖结构 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100434790B1 (ko) | 1997-05-20 | 2004-06-07 | 동경 엘렉트론 주식회사 | 처리 장치 |
KR100709114B1 (ko) * | 2006-01-23 | 2007-04-18 | (주)테크윙 | 테스트핸들러 |
CN104001680A (zh) | 2013-06-18 | 2014-08-27 | 泰克元有限公司 | 测试分选机 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR940003390Y1 (ko) * | 1991-12-06 | 1994-05-23 | 삼성전관 주식회사 | 마스크프레임 지지체 |
KR100243049B1 (ko) * | 1997-04-04 | 2000-03-02 | 윤종용 | 반도체 디바이스 테스트용 핸들러 시스템의 픽 앤 플레이스 및 이를 사용하여 반도체 디바이스를 프리사이징하는 방법 |
EP0997741A3 (fr) * | 1998-10-31 | 2001-04-04 | Mirae Corporation | Dispositif de support pour un manipulateur de modules de circuits intégrés |
KR100392229B1 (ko) * | 2001-01-09 | 2003-07-22 | 미래산업 주식회사 | 반도체 소자 테스트 핸들러의 인덱스헤드 |
KR100771474B1 (ko) * | 2006-02-24 | 2007-10-30 | (주)테크윙 | 테스트핸들러용 테스트트레이 |
CN2899976Y (zh) * | 2006-05-15 | 2007-05-16 | 常州市天宁天达电子设备有限公司 | 薄膜电容器测试分选机的电刷升降装置 |
KR101104413B1 (ko) * | 2009-09-25 | 2012-01-16 | 세크론 주식회사 | 반도체 소자 테스트용 접속 장치 및 이를 포함하는 테스트 핸들러 |
KR101559419B1 (ko) * | 2011-12-27 | 2015-10-13 | (주)테크윙 | 테스트핸들러 |
KR101658078B1 (ko) * | 2012-01-03 | 2016-09-21 | (주)테크윙 | 테스트핸들러 |
KR101811646B1 (ko) * | 2012-05-17 | 2017-12-26 | (주)테크윙 | 테스트핸들러용 픽앤플레이스장치 |
KR102037925B1 (ko) * | 2013-05-02 | 2019-10-29 | 세메스 주식회사 | 테스트 핸들러의 접속 장치 |
-
2014
- 2014-11-28 KR KR1020140168691A patent/KR102187839B1/ko active IP Right Grant
-
2015
- 2015-11-20 WO PCT/KR2015/012565 patent/WO2016085206A1/fr active Application Filing
- 2015-11-20 CN CN201580060399.5A patent/CN107003350B/zh active Active
- 2015-11-20 CN CN202010190958.7A patent/CN111375570B/zh active Active
- 2015-11-26 TW TW104139313A patent/TWI589896B/zh active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100434790B1 (ko) | 1997-05-20 | 2004-06-07 | 동경 엘렉트론 주식회사 | 처리 장치 |
KR100709114B1 (ko) * | 2006-01-23 | 2007-04-18 | (주)테크윙 | 테스트핸들러 |
CN104001680A (zh) | 2013-06-18 | 2014-08-27 | 泰克元有限公司 | 测试分选机 |
Also Published As
Publication number | Publication date |
---|---|
CN111375570B (zh) | 2022-05-24 |
WO2016085206A1 (fr) | 2016-06-02 |
KR20160064722A (ko) | 2016-06-08 |
TWI589896B (zh) | 2017-07-01 |
CN111375570A (zh) | 2020-07-07 |
CN107003350B (zh) | 2020-04-10 |
CN107003350A (zh) | 2017-08-01 |
TW201619624A (zh) | 2016-06-01 |
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