KR102174493B1 - 프로브 크리너 - Google Patents

프로브 크리너 Download PDF

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Publication number
KR102174493B1
KR102174493B1 KR1020190047769A KR20190047769A KR102174493B1 KR 102174493 B1 KR102174493 B1 KR 102174493B1 KR 1020190047769 A KR1020190047769 A KR 1020190047769A KR 20190047769 A KR20190047769 A KR 20190047769A KR 102174493 B1 KR102174493 B1 KR 102174493B1
Authority
KR
South Korea
Prior art keywords
probe
main body
support member
cleaning
cleaner
Prior art date
Application number
KR1020190047769A
Other languages
English (en)
Korean (ko)
Other versions
KR20200124442A (ko
Inventor
이채윤
Original Assignee
리노공업주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 리노공업주식회사 filed Critical 리노공업주식회사
Priority to KR1020190047769A priority Critical patent/KR102174493B1/ko
Priority to TW109109707A priority patent/TWI736192B/zh
Priority to PCT/KR2020/005255 priority patent/WO2020218803A1/fr
Publication of KR20200124442A publication Critical patent/KR20200124442A/ko
Application granted granted Critical
Publication of KR102174493B1 publication Critical patent/KR102174493B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
KR1020190047769A 2019-04-24 2019-04-24 프로브 크리너 KR102174493B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020190047769A KR102174493B1 (ko) 2019-04-24 2019-04-24 프로브 크리너
TW109109707A TWI736192B (zh) 2019-04-24 2020-03-24 探針清潔物
PCT/KR2020/005255 WO2020218803A1 (fr) 2019-04-24 2020-04-21 Nettoyeur de sonde

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020190047769A KR102174493B1 (ko) 2019-04-24 2019-04-24 프로브 크리너

Publications (2)

Publication Number Publication Date
KR20200124442A KR20200124442A (ko) 2020-11-03
KR102174493B1 true KR102174493B1 (ko) 2020-11-05

Family

ID=72941077

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020190047769A KR102174493B1 (ko) 2019-04-24 2019-04-24 프로브 크리너

Country Status (3)

Country Link
KR (1) KR102174493B1 (fr)
TW (1) TWI736192B (fr)
WO (1) WO2020218803A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112462104B (zh) * 2020-11-28 2022-03-04 法特迪精密科技（苏州）有限公司 测试探针清洁方法
CN112462109B (zh) * 2020-11-28 2022-04-19 法特迪精密科技（苏州）有限公司 一种测试探针清洁装置及其夹持构件和测试基座
CN114252658B (zh) * 2021-11-29 2023-04-25 歌尔股份有限公司 测试装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006153673A (ja) 2004-11-29 2006-06-15 Apic Yamada Corp 半導体テスト装置のクリーニング部材、半導体製造装置および半導体テストシステム
JP2009156696A (ja) 2007-12-26 2009-07-16 Yamaha Motor Co Ltd Ｉｃハンドラ、及びｉｃハンドラの検査ソケットクリーニング方法
WO2017051759A1 (fr) * 2015-09-25 2017-03-30 株式会社巴川製紙所 Outil de nettoyage de connecteur

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR960002285B1 (ko) * 1992-09-16 1996-02-14 금성일렉트론주식회사 반도체 테스트장비용 하이-픽스보드의 소켓 클리닝장치
KR200152552Y1 (ko) * 1996-12-20 1999-07-15 구본준 프로브 카드 세정장치
KR100596630B1 (ko) * 2004-03-22 2006-07-04 주식회사 디스텍 반도체 칩의 테스트 소켓 클리닝 방법 및 그 클린칩
KR100715459B1 (ko) * 2005-09-12 2007-05-07 학교법인 포항공과대학교 반도체 패키지용 테스트 핸들러의 캐리어 모듈
TWI322720B (en) * 2007-04-25 2010-04-01 Advanced Semiconductor Eng Mechanism and method for automatic cleaning test interface of ic test socket
KR101178660B1 (ko) * 2008-07-18 2012-08-30 니혼덴산리드가부시키가이샤 핀 선단부의 클리닝 기구를 가지는 기판 검사 장치
JP2013120074A (ja) * 2011-12-06 2013-06-17 Elpida Memory Inc 半導体製造装置、及び半導体装置の製造方法
JP6055806B2 (ja) * 2014-10-10 2016-12-27 株式会社片岡製作所 充放電検査装置のプローブ清掃装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006153673A (ja) 2004-11-29 2006-06-15 Apic Yamada Corp 半導体テスト装置のクリーニング部材、半導体製造装置および半導体テストシステム
JP2009156696A (ja) 2007-12-26 2009-07-16 Yamaha Motor Co Ltd Ｉｃハンドラ、及びｉｃハンドラの検査ソケットクリーニング方法
WO2017051759A1 (fr) * 2015-09-25 2017-03-30 株式会社巴川製紙所 Outil de nettoyage de connecteur

Also Published As

Publication number Publication date
WO2020218803A1 (fr) 2020-10-29
TWI736192B (zh) 2021-08-11
KR20200124442A (ko) 2020-11-03
TW202039106A (zh) 2020-11-01

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