KR102168151B1 - 위상 시프트 마스크 및 그의 제조방법 - Google Patents
위상 시프트 마스크 및 그의 제조방법 Download PDFInfo
- Publication number
- KR102168151B1 KR102168151B1 KR1020157015967A KR20157015967A KR102168151B1 KR 102168151 B1 KR102168151 B1 KR 102168151B1 KR 1020157015967 A KR1020157015967 A KR 1020157015967A KR 20157015967 A KR20157015967 A KR 20157015967A KR 102168151 B1 KR102168151 B1 KR 102168151B1
- Authority
- KR
- South Korea
- Prior art keywords
- phase shift
- line
- layer
- light
- transmittance
- Prior art date
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0676—Oxynitrides
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/26—Phase shift masks [PSM]; PSM blanks; Preparation thereof
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012285845 | 2012-12-27 | ||
JPJP-P-2012-285845 | 2012-12-27 | ||
PCT/JP2013/084059 WO2014103867A1 (ja) | 2012-12-27 | 2013-12-19 | 位相シフトマスクおよびその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20150102004A KR20150102004A (ko) | 2015-09-04 |
KR102168151B1 true KR102168151B1 (ko) | 2020-10-20 |
Family
ID=51020954
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020157015967A KR102168151B1 (ko) | 2012-12-27 | 2013-12-19 | 위상 시프트 마스크 및 그의 제조방법 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5982013B2 (zh) |
KR (1) | KR102168151B1 (zh) |
CN (1) | CN104737072B (zh) |
TW (1) | TWI592738B (zh) |
WO (1) | WO2014103867A1 (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6767735B2 (ja) * | 2015-06-30 | 2020-10-14 | Hoya株式会社 | フォトマスク、フォトマスクの設計方法、フォトマスクブランク、および表示装置の製造方法 |
JP6259508B1 (ja) * | 2016-12-28 | 2018-01-10 | 株式会社エスケーエレクトロニクス | ハーフトーンマスク、フォトマスクブランクス及びハーフトーンマスクの製造方法 |
JP7176843B2 (ja) * | 2017-01-18 | 2022-11-22 | Hoya株式会社 | 表示装置製造用の位相シフトマスクブランク、表示装置製造用の位相シフトマスクの製造方法、並びに表示装置の製造方法 |
JP6840807B2 (ja) * | 2019-09-10 | 2021-03-10 | Hoya株式会社 | フォトマスクの設計方法および製造方法、並びに表示装置の製造方法 |
KR20210099922A (ko) | 2020-02-05 | 2021-08-13 | 정현서 | 바이오헬스 기술을 이용한 스마트 글래스 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012230379A (ja) * | 2011-04-22 | 2012-11-22 | S&S Tech Corp | ブランクマスク及びフォトマスク |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5674647A (en) * | 1992-11-21 | 1997-10-07 | Ulvac Coating Corporation | Phase shift mask and manufacturing method thereof and exposure method using phase shift mask |
JP3064769B2 (ja) * | 1992-11-21 | 2000-07-12 | アルバック成膜株式会社 | 位相シフトマスクおよびその製造方法ならびにその位相シフトマスクを用いた露光方法 |
JPH0798493A (ja) * | 1993-09-28 | 1995-04-11 | Toppan Printing Co Ltd | 位相シフトマスク及びその製造方法 |
JP2591469B2 (ja) * | 1994-04-22 | 1997-03-19 | 日本電気株式会社 | 位相シフトマスクの製造方法 |
KR100800301B1 (ko) * | 2005-07-05 | 2008-02-01 | 주식회사 에스앤에스텍 | 그레이톤 블랭크마스크 및 포토마스크 제조방법 |
KR100886802B1 (ko) * | 2006-03-30 | 2009-03-04 | 주식회사 에스앤에스텍 | 블랭크마스크, 이를 이용한 투과 제어 슬릿 마스크 및 그제조방법 |
JP5588633B2 (ja) * | 2009-06-30 | 2014-09-10 | アルバック成膜株式会社 | 位相シフトマスクの製造方法、フラットパネルディスプレイの製造方法及び位相シフトマスク |
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2013
- 2013-12-19 CN CN201380054682.8A patent/CN104737072B/zh active Active
- 2013-12-19 WO PCT/JP2013/084059 patent/WO2014103867A1/ja active Application Filing
- 2013-12-19 JP JP2014554374A patent/JP5982013B2/ja not_active Expired - Fee Related
- 2013-12-19 KR KR1020157015967A patent/KR102168151B1/ko active IP Right Grant
- 2013-12-24 TW TW102148021A patent/TWI592738B/zh active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012230379A (ja) * | 2011-04-22 | 2012-11-22 | S&S Tech Corp | ブランクマスク及びフォトマスク |
Also Published As
Publication number | Publication date |
---|---|
KR20150102004A (ko) | 2015-09-04 |
WO2014103867A1 (ja) | 2014-07-03 |
TW201435476A (zh) | 2014-09-16 |
CN104737072B (zh) | 2020-01-07 |
JP5982013B2 (ja) | 2016-08-31 |
JPWO2014103867A1 (ja) | 2017-01-12 |
CN104737072A (zh) | 2015-06-24 |
TWI592738B (zh) | 2017-07-21 |
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