KR101761308B1 - 처리 변동과 공급 변조를 위한 정밀한 바이어스 추적 - Google Patents
처리 변동과 공급 변조를 위한 정밀한 바이어스 추적 Download PDFInfo
- Publication number
- KR101761308B1 KR101761308B1 KR1020137016702A KR20137016702A KR101761308B1 KR 101761308 B1 KR101761308 B1 KR 101761308B1 KR 1020137016702 A KR1020137016702 A KR 1020137016702A KR 20137016702 A KR20137016702 A KR 20137016702A KR 101761308 B1 KR101761308 B1 KR 101761308B1
- Authority
- KR
- South Korea
- Prior art keywords
- transistor
- voltage
- source
- node
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/04—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
- H03F3/16—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only with field-effect devices
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/262—Current mirrors using field-effect transistors only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/189—High-frequency amplifiers, e.g. radio frequency amplifiers
- H03F3/19—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only
- H03F3/193—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only with field-effect devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
- H03F3/24—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers of transmitter output stages
- H03F3/245—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers of transmitter output stages with semiconductor devices only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/555—A voltage generating circuit being realised for biasing different circuit elements
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45294—Indexing scheme relating to differential amplifiers the AAC comprising biasing means to stabilise itself
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45301—Indexing scheme relating to differential amplifiers there are multiple cascaded folded or not folded common gate stages of a cascode dif amp
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45304—Indexing scheme relating to differential amplifiers the common gate stage of a BIFET cascode dif amp being implemented fully by FETs
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45311—Indexing scheme relating to differential amplifiers the common gate stage of a cascode dif amp being implemented by multiple transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45352—Indexing scheme relating to differential amplifiers the AAC comprising a combination of a plurality of transistors, e.g. Darlington coupled transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45544—Indexing scheme relating to differential amplifiers the IC comprising one or more capacitors, e.g. coupling capacitors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45554—Indexing scheme relating to differential amplifiers the IC comprising one or more coils
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Amplifiers (AREA)
- Control Of Electrical Variables (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201061426740P | 2010-12-23 | 2010-12-23 | |
| US61/426,740 | 2010-12-23 | ||
| PCT/IB2011/003331 WO2012085685A2 (en) | 2010-12-23 | 2011-12-20 | Accurate bias tracking for process variation and supply modulation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20130130764A KR20130130764A (ko) | 2013-12-02 |
| KR101761308B1 true KR101761308B1 (ko) | 2017-07-25 |
Family
ID=45812810
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020137016702A Expired - Fee Related KR101761308B1 (ko) | 2010-12-23 | 2011-12-20 | 처리 변동과 공급 변조를 위한 정밀한 바이어스 추적 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8514023B2 (enExample) |
| EP (1) | EP2656163A2 (enExample) |
| JP (1) | JP5907514B2 (enExample) |
| KR (1) | KR101761308B1 (enExample) |
| CN (1) | CN103270465B (enExample) |
| WO (1) | WO2012085685A2 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8791759B2 (en) * | 2011-03-22 | 2014-07-29 | The United States Of America As Represented By The Secretary Of The Army | Bipolar stacked transistor architecture |
| US9148140B1 (en) * | 2012-09-27 | 2015-09-29 | Maxim Integrated Systems, Inc. | Integrated circuit with precision current source |
| US9774324B2 (en) * | 2014-12-05 | 2017-09-26 | Intel Corporation | Biasing scheme for high voltage circuits using low voltage devices |
| US9806678B2 (en) * | 2015-06-29 | 2017-10-31 | Eridan Communications, Inc. | Bootstrap class-D wideband RF power amplifier |
| US20180061984A1 (en) * | 2016-08-29 | 2018-03-01 | Macom Technology Solutions Holdings, Inc. | Self-biasing and self-sequencing of depletion-mode transistors |
| US10128835B2 (en) * | 2017-02-20 | 2018-11-13 | Stmicroelectronics International N.V. | Aging tolerant I/O driver |
| JP6630303B2 (ja) * | 2017-02-24 | 2020-01-15 | 株式会社東芝 | 高周波半導体増幅回路 |
| US9948252B1 (en) * | 2017-04-06 | 2018-04-17 | Psemi Corporation | Device stack with novel gate capacitor topology |
| US10250999B1 (en) * | 2017-09-18 | 2019-04-02 | Infineon Technologies Ag | PVT compensated resistive biasing architecture for a capacitive sensor |
| US10224922B1 (en) * | 2018-04-04 | 2019-03-05 | Stmicroelectronics International N.V. | Biasing cascode transistor of an output buffer circuit for operation over a wide range of supply voltages |
| US10404265B1 (en) * | 2018-08-30 | 2019-09-03 | Xilinx, Inc. | Current-mode feedback source follower with enhanced linearity |
| WO2021025197A1 (ko) * | 2019-08-06 | 2021-02-11 | 엘지전자 주식회사 | 롤-슬라이드 이동 단말기 |
| US11262782B2 (en) * | 2020-04-29 | 2022-03-01 | Analog Devices, Inc. | Current mirror arrangements with semi-cascoding |
| CN113268103A (zh) * | 2021-04-27 | 2021-08-17 | 上海萍生微电子科技有限公司 | 一种电流镜电路及其射频模块 |
| US11971736B2 (en) * | 2022-02-16 | 2024-04-30 | Sandisk Technologies Llc | Current mirror circuits |
| CN116996028B (zh) * | 2023-08-10 | 2024-10-15 | 无锡华睿芯微电子科技有限公司 | 单电源供电、脉冲控制的开关功率放大器及放大器芯片 |
| CN116915187B (zh) * | 2023-09-14 | 2023-12-15 | 宜确半导体(苏州)有限公司 | 一种射频功率放大器的功率控制电路及射频功率放大器 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040046609A1 (en) | 2002-09-11 | 2004-03-11 | Jie Xu | Active current bias network for compensating hot-carrier injection induced bias drift |
| JP2008236339A (ja) | 2007-03-20 | 2008-10-02 | Toshiba Corp | 半導体集積回路 |
| US20100316172A1 (en) | 2009-06-16 | 2010-12-16 | California Institute Of Technology | Incompressible rf receiver |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5644208A (en) * | 1979-09-19 | 1981-04-23 | Toshiba Corp | Amplifier |
| JPS58108808A (ja) * | 1981-12-23 | 1983-06-29 | Toshiba Corp | プツシユプル増幅器 |
| JPH073646B2 (ja) * | 1989-08-03 | 1995-01-18 | ローム株式会社 | 定電流回路 |
| JPH07175536A (ja) * | 1993-12-17 | 1995-07-14 | Toshiba Corp | カレントミラー回路 |
| US6064267A (en) * | 1998-10-05 | 2000-05-16 | Globespan, Inc. | Current mirror utilizing amplifier to match operating voltages of input and output transconductance devices |
| US7304539B2 (en) * | 2003-10-16 | 2007-12-04 | Renesas Technology Corporation | High frequency power amplifier circuit and electronic component for high frequency power amplifier |
| JP4575818B2 (ja) * | 2005-03-24 | 2010-11-04 | Okiセミコンダクタ株式会社 | 増幅回路用バイアス回路 |
| US8093952B2 (en) * | 2006-12-29 | 2012-01-10 | Broadcom Corporation | Method and system for precise current matching in deep sub-micron technology |
| US8786359B2 (en) * | 2007-12-12 | 2014-07-22 | Sandisk Technologies Inc. | Current mirror device and method |
| US8035443B2 (en) * | 2008-06-20 | 2011-10-11 | Qualcomm, Incorporated | Amplifier with gain expansion stage |
| US8203383B2 (en) * | 2008-11-24 | 2012-06-19 | Texas Instruments Incorporated | Reducing the effect of bulk leakage currents |
-
2011
- 2011-12-20 KR KR1020137016702A patent/KR101761308B1/ko not_active Expired - Fee Related
- 2011-12-20 JP JP2013545532A patent/JP5907514B2/ja not_active Expired - Fee Related
- 2011-12-20 CN CN201180062253.6A patent/CN103270465B/zh not_active Expired - Fee Related
- 2011-12-20 EP EP11824285.8A patent/EP2656163A2/en not_active Withdrawn
- 2011-12-20 US US13/332,190 patent/US8514023B2/en active Active
- 2011-12-20 WO PCT/IB2011/003331 patent/WO2012085685A2/en not_active Ceased
-
2013
- 2013-07-17 US US13/944,608 patent/US8878612B2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040046609A1 (en) | 2002-09-11 | 2004-03-11 | Jie Xu | Active current bias network for compensating hot-carrier injection induced bias drift |
| JP2008236339A (ja) | 2007-03-20 | 2008-10-02 | Toshiba Corp | 半導体集積回路 |
| US20100316172A1 (en) | 2009-06-16 | 2010-12-16 | California Institute Of Technology | Incompressible rf receiver |
Also Published As
| Publication number | Publication date |
|---|---|
| US8878612B2 (en) | 2014-11-04 |
| WO2012085685A2 (en) | 2012-06-28 |
| CN103270465A (zh) | 2013-08-28 |
| JP5907514B2 (ja) | 2016-04-26 |
| JP2014502119A (ja) | 2014-01-23 |
| KR20130130764A (ko) | 2013-12-02 |
| WO2012085685A8 (en) | 2013-06-27 |
| US8514023B2 (en) | 2013-08-20 |
| US20130300506A1 (en) | 2013-11-14 |
| US20120161876A1 (en) | 2012-06-28 |
| WO2012085685A3 (en) | 2013-05-10 |
| EP2656163A2 (en) | 2013-10-30 |
| CN103270465B (zh) | 2016-07-20 |
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Legal Events
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| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
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| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
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| A201 | Request for examination | ||
| A302 | Request for accelerated examination | ||
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
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| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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| PA0201 | Request for examination |
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| PA0302 | Request for accelerated examination |
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St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
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| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
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| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
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| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U12-oth-PR1002 Fee payment year number: 1 |
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| PG1601 | Publication of registration |
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St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20200720 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
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