KR101609960B1 - 광전 변환기, 광전 변환 어레이 및 촬상 장치 - Google Patents

광전 변환기, 광전 변환 어레이 및 촬상 장치 Download PDF

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KR101609960B1
KR101609960B1 KR1020147011779A KR20147011779A KR101609960B1 KR 101609960 B1 KR101609960 B1 KR 101609960B1 KR 1020147011779 A KR1020147011779 A KR 1020147011779A KR 20147011779 A KR20147011779 A KR 20147011779A KR 101609960 B1 KR101609960 B1 KR 101609960B1
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South Korea
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semiconductor region
field effect
effect transistor
potential
gate
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Korean (ko)
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KR20140070652A (ko
Inventor
유타카 하야시
도시타카 오타
야스시 나가무네
히로후미 와타나베
다카아키 네고로
가즈나리 기미노
Original Assignee
내셔날 인스티튜트 오브 어드밴스드 인더스트리얼 사이언스 앤드 테크놀로지
가부시키가이샤 리코
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/197Bipolar transistor image sensors
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/103Integrated devices the at least one element covered by H10F30/00 having potential barriers, e.g. integrated devices comprising photodiodes or phototransistors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/18Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/186Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors having arrangements for blooming suppression
    • H10F39/1865Overflow drain structures
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/803Pixels having integrated switching, control, storage or amplification elements

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)
KR1020147011779A 2011-10-06 2012-10-05 광전 변환기, 광전 변환 어레이 및 촬상 장치 Expired - Fee Related KR101609960B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2011-222020 2011-10-06
JP2011222020A JP5907500B2 (ja) 2011-10-06 2011-10-06 光電変換装置、光電変換アレイおよび撮像装置
PCT/JP2012/076557 WO2013051734A1 (en) 2011-10-06 2012-10-05 Photoelectric converter, photoelectric converter array and imaging device

Publications (2)

Publication Number Publication Date
KR20140070652A KR20140070652A (ko) 2014-06-10
KR101609960B1 true KR101609960B1 (ko) 2016-04-06

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KR1020147011779A Expired - Fee Related KR101609960B1 (ko) 2011-10-06 2012-10-05 광전 변환기, 광전 변환 어레이 및 촬상 장치

Country Status (8)

Country Link
US (1) US9337234B2 (enExample)
EP (1) EP2764687A4 (enExample)
JP (1) JP5907500B2 (enExample)
KR (1) KR101609960B1 (enExample)
CN (1) CN103975581B (enExample)
BR (1) BR112014008399A2 (enExample)
IN (1) IN2014CN03275A (enExample)
WO (1) WO2013051734A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9197220B2 (en) * 2011-10-31 2015-11-24 National Institute Of Advanced Industrial Science And Technology Method for resetting photoelectric conversion device, and photoelectric conversion device
JP6387743B2 (ja) 2013-12-16 2018-09-12 株式会社リコー 半導体装置および半導体装置の製造方法
JP6281297B2 (ja) 2014-01-27 2018-02-21 株式会社リコー フォトトランジスタ、及び半導体装置
JP6354221B2 (ja) 2014-03-12 2018-07-11 株式会社リコー 撮像装置及び電子機器
JP2016025261A (ja) 2014-07-23 2016-02-08 株式会社リコー 撮像装置、撮像装置の制御方法、画素構造
JP6057477B2 (ja) * 2014-10-15 2017-01-11 学校法人加計学園 岡山理科大学 非接触給電装置
JP2016092178A (ja) 2014-11-04 2016-05-23 株式会社リコー 固体撮像素子
JP2016092348A (ja) 2014-11-11 2016-05-23 株式会社リコー 半導体デバイス及びその製造方法、撮像装置
US10497818B2 (en) 2016-07-29 2019-12-03 Canon Kabushiki Kaisha Photodetection device and photodetection system
US9915561B1 (en) * 2016-08-24 2018-03-13 International Business Machines Corporation Self-clocked low noise photoreceiver (SCLNP)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009141419A (ja) * 2007-12-03 2009-06-25 Panasonic Corp 固体撮像素子

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6014231A (ja) 1983-07-06 1985-01-24 Ricoh Co Ltd 原稿像読取装置
JPS60259917A (ja) * 1984-06-06 1985-12-23 Fujitsu Ten Ltd 受光回路
JP2501208B2 (ja) * 1987-01-16 1996-05-29 キヤノン株式会社 光電変換装置
US4866293A (en) 1986-12-09 1989-09-12 Canon Kabushiki Kaisha Photoelectric converting apparatus to prevent the outflow of excess carriers
JPH01288181A (ja) 1988-05-16 1989-11-20 Seiko Instr Inc 半導体イメージセンサ装置
TW421962B (en) * 1997-09-29 2001-02-11 Canon Kk Image sensing device using mos type image sensing elements
JP3590723B2 (ja) * 1998-07-17 2004-11-17 シャープ株式会社 フォトトランジスタチップ
US6856351B1 (en) * 1999-09-16 2005-02-15 Xerox Corporation Device and method for reducing lag and blooming in amorphous silicon sensor arrays
AU2001293062A1 (en) * 2000-09-25 2002-04-08 Foveon, Inc. Active pixel sensor with noise cancellation
JP5584982B2 (ja) * 2009-02-09 2014-09-10 ソニー株式会社 固体撮像素子およびカメラシステム
JP5363237B2 (ja) * 2009-08-10 2013-12-11 ローム株式会社 光電変換回路及びそれに用いる光電変換素子
JP5721994B2 (ja) * 2009-11-27 2015-05-20 株式会社ジャパンディスプレイ 放射線撮像装置
JP5403369B2 (ja) * 2010-03-31 2014-01-29 ソニー株式会社 固体撮像素子および駆動方法、並びに電子機器

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009141419A (ja) * 2007-12-03 2009-06-25 Panasonic Corp 固体撮像素子

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Publication number Publication date
EP2764687A4 (en) 2015-10-21
CN103975581B (zh) 2017-09-08
BR112014008399A2 (pt) 2017-09-19
KR20140070652A (ko) 2014-06-10
IN2014CN03275A (enExample) 2015-07-03
EP2764687A1 (en) 2014-08-13
JP5907500B2 (ja) 2016-04-26
US20140239158A1 (en) 2014-08-28
US9337234B2 (en) 2016-05-10
JP2013085030A (ja) 2013-05-09
WO2013051734A1 (en) 2013-04-11
CN103975581A (zh) 2014-08-06

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