KR101555405B1 - 세라믹 기판 및 그 제조방법 - Google Patents
세라믹 기판 및 그 제조방법 Download PDFInfo
- Publication number
- KR101555405B1 KR101555405B1 KR1020120033148A KR20120033148A KR101555405B1 KR 101555405 B1 KR101555405 B1 KR 101555405B1 KR 1020120033148 A KR1020120033148 A KR 1020120033148A KR 20120033148 A KR20120033148 A KR 20120033148A KR 101555405 B1 KR101555405 B1 KR 101555405B1
- Authority
- KR
- South Korea
- Prior art keywords
- ceramic substrate
- substrate
- green sheet
- vias
- ceramic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0286—Programmable, customizable or modifiable circuits
- H05K1/0287—Programmable, customizable or modifiable circuits having an universal lay-out, e.g. pad or land grid patterns or mesh patterns
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/115—Via connections; Lands around holes or via connections
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
- H05K3/429—Plated through-holes specially for multilayer circuits, e.g. having connections to inner circuit layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09372—Pads and lands
- H05K2201/0949—Pad close to a hole, not surrounding the hole
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/095—Conductive through-holes or vias
- H05K2201/09609—Via grid, i.e. two-dimensional array of vias or holes in a single plane
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09654—Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
- H05K2201/0979—Redundant conductors or connections, i.e. more than one current path between two points
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0044—Mechanical working of the substrate, e.g. drilling or punching
- H05K3/005—Punching of holes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4038—Through-connections; Vertical interconnect access [VIA] connections
- H05K3/4053—Through-connections; Vertical interconnect access [VIA] connections by thick-film techniques
- H05K3/4061—Through-connections; Vertical interconnect access [VIA] connections by thick-film techniques for via connections in inorganic insulating substrates
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2011-082161 | 2011-04-01 | ||
| JP2011082161A JP5670806B2 (ja) | 2011-04-01 | 2011-04-01 | セラミック基板及びその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20120112222A KR20120112222A (ko) | 2012-10-11 |
| KR101555405B1 true KR101555405B1 (ko) | 2015-09-23 |
Family
ID=46925759
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020120033148A Active KR101555405B1 (ko) | 2011-04-01 | 2012-03-30 | 세라믹 기판 및 그 제조방법 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9049786B2 (https=) |
| JP (1) | JP5670806B2 (https=) |
| KR (1) | KR101555405B1 (https=) |
| CN (1) | CN102740590B (https=) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5777997B2 (ja) * | 2011-03-07 | 2015-09-16 | 日本特殊陶業株式会社 | 電子部品検査装置用配線基板およびその製造方法 |
| JP5798435B2 (ja) | 2011-03-07 | 2015-10-21 | 日本特殊陶業株式会社 | 電子部品検査装置用配線基板およびその製造方法 |
| WO2019078364A1 (ja) * | 2017-10-20 | 2019-04-25 | 株式会社フェローテックセラミックス | セラミックス、プローブ案内部品、プローブカードおよびパッケージ検査用ソケット |
| KR101961101B1 (ko) * | 2017-12-07 | 2019-03-22 | (주)티에스이 | 무프레임 구조를 갖는 테스트용 러버 소켓 및 그의 제작 방법 |
| JP2020030127A (ja) * | 2018-08-23 | 2020-02-27 | 日本特殊陶業株式会社 | 電気検査用基板およびその製造方法 |
| JP7102525B2 (ja) * | 2018-11-29 | 2022-07-19 | コステックシス カンパニー リミテッド | 入出力回路が内蔵された電力増幅器用パッケージの製造方法 |
| CN115291340A (zh) * | 2022-07-13 | 2022-11-04 | 广州奥鑫通讯设备有限公司 | 一种用于光纤陀螺仪的光器件及其制备方法 |
| CN115307617A (zh) * | 2022-07-13 | 2022-11-08 | 广州奥鑫通讯设备有限公司 | 一种用于光纤陀螺仪的光器件及其制备方法 |
| CN116278242A (zh) * | 2023-03-20 | 2023-06-23 | 瓷金科技(深圳)有限公司 | 多层陶瓷管壳及其生坯以及两者的制备方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002257858A (ja) | 2001-02-28 | 2002-09-11 | Ibiden Co Ltd | プローブカード |
| US20060086703A1 (en) | 2004-08-18 | 2006-04-27 | Ling Liu | System and method for singulating a substrate |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1065345A (ja) * | 1996-08-20 | 1998-03-06 | Hitachi Ltd | 多層セラミック基板とその製造方法及びパターン検査装置 |
| JP2003060358A (ja) * | 2001-08-10 | 2003-02-28 | Ngk Spark Plug Co Ltd | セラミック配線基板の製造方法 |
| JP2009074823A (ja) | 2007-09-19 | 2009-04-09 | Ngk Spark Plug Co Ltd | 電子部品検査装置用配線基板およびその製造方法 |
| JP4542587B2 (ja) | 2008-02-04 | 2010-09-15 | 日本特殊陶業株式会社 | 電子部品検査装置用配線基板 |
| JP5449719B2 (ja) * | 2008-08-11 | 2014-03-19 | 日本特殊陶業株式会社 | 配線基板、ic電気特性検査用配線基板、及び配線基板の製造方法 |
-
2011
- 2011-04-01 JP JP2011082161A patent/JP5670806B2/ja active Active
-
2012
- 2012-03-30 KR KR1020120033148A patent/KR101555405B1/ko active Active
- 2012-03-30 US US13/436,005 patent/US9049786B2/en active Active
- 2012-04-01 CN CN201210094793.9A patent/CN102740590B/zh not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002257858A (ja) | 2001-02-28 | 2002-09-11 | Ibiden Co Ltd | プローブカード |
| US20060086703A1 (en) | 2004-08-18 | 2006-04-27 | Ling Liu | System and method for singulating a substrate |
Also Published As
| Publication number | Publication date |
|---|---|
| US20120247821A1 (en) | 2012-10-04 |
| US9049786B2 (en) | 2015-06-02 |
| CN102740590A (zh) | 2012-10-17 |
| KR20120112222A (ko) | 2012-10-11 |
| JP2012215527A (ja) | 2012-11-08 |
| JP5670806B2 (ja) | 2015-02-18 |
| CN102740590B (zh) | 2015-10-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101555405B1 (ko) | 세라믹 기판 및 그 제조방법 | |
| JP7008369B2 (ja) | 多層セラミック基板及びその製造方法 | |
| KR101004843B1 (ko) | 세라믹 다층 회로 기판 및 그의 제조 방법 | |
| TWI538591B (zh) | Method for manufacturing multilayer ceramic heat dissipation circuit substrate and its product | |
| CN105493268B (zh) | 安装基板用衬底、多层陶瓷基板、安装基板、芯片模块和安装基板用衬底的制造方法 | |
| JP5445985B2 (ja) | プローブカード及びその製造方法 | |
| US9170274B2 (en) | Wiring board for electronic parts inspecting device and its manufacturing method | |
| JP4939630B2 (ja) | 電子部品検査用配線基板およびその製造方法 | |
| JP6687100B1 (ja) | 半導体素子テストのための多層セラミック基板およびその製造方法 | |
| KR20140086375A (ko) | 글라스 기반 프로브 카드용 스페이스 트랜스포머의 제조방법 및 이에 의해 제조된 글라스 기반 프로브 카드용 스페이스 트랜스포머 | |
| TW201508279A (zh) | 用於探針卡之板件、製造該板件之方法,及探針卡 | |
| CN110612452B (zh) | 用于电子器件的测试设备的探针卡多层结构的制造方法 | |
| JP5236371B2 (ja) | セラミック部品の製造方法 | |
| US8981237B2 (en) | Wiring board for electronic parts inspecting device and its manufacturing method | |
| JP2010258189A (ja) | 電子部品搭載用基板の製造方法および電子部品搭載用母基板の製造方法 | |
| JP5690678B2 (ja) | 電子部品検査装置用配線基板およびその製造方法 | |
| KR20120092915A (ko) | 프로브 카드용 세라믹 기판 제조 방법 | |
| JP7698600B2 (ja) | 多数個取りセラミック基板、及びその製造方法 | |
| JP3894841B2 (ja) | 多数個取り配線基板 | |
| JP4774063B2 (ja) | 電子部品検査用配線基板およびその製造方法 | |
| JP4587596B2 (ja) | 多数個取り配線基板、電子装置の製造方法 | |
| JP2014143280A (ja) | セラミック多層基板 | |
| JP2014143279A (ja) | セラミック多層基板 | |
| JPS6354239B2 (https=) | ||
| JP2000188356A (ja) | 配線基板及びその製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| FPAY | Annual fee payment |
Payment date: 20180903 Year of fee payment: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| FPAY | Annual fee payment |
Payment date: 20190903 Year of fee payment: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |