KR101488993B1 - 연마 장치 및 연마 방법 - Google Patents

연마 장치 및 연마 방법 Download PDF

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Publication number
KR101488993B1
KR101488993B1 KR20080061705A KR20080061705A KR101488993B1 KR 101488993 B1 KR101488993 B1 KR 101488993B1 KR 20080061705 A KR20080061705 A KR 20080061705A KR 20080061705 A KR20080061705 A KR 20080061705A KR 101488993 B1 KR101488993 B1 KR 101488993B1
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South Korea
Prior art keywords
polishing
polishing head
tape
workpiece
wafer
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KR20080061705A
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English (en)
Korean (ko)
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KR20090004590A (ko
Inventor
다마미 다까하시
마사야 세끼
히로아끼 구사
겐야 이또오
Original Assignee
가부시키가이샤 에바라 세이사꾸쇼
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B21/00—Machines or devices using grinding or polishing belts; Accessories therefor
    • B24B21/002—Machines or devices using grinding or polishing belts; Accessories therefor for grinding edges or bevels
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
    • B24B9/02—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
    • B24B9/06—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B21/00—Machines or devices using grinding or polishing belts; Accessories therefor
    • B24B21/16—Machines or devices using grinding or polishing belts; Accessories therefor for grinding other surfaces of particular shape
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
    • B24B9/02—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
    • B24B9/06—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
    • B24B9/065—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of thin, brittle parts, e.g. semiconductors, wafers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68792—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the construction of the shaft

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Robotics (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
KR20080061705A 2007-06-29 2008-06-27 연마 장치 및 연마 방법 Active KR101488993B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2007-00171959 2007-06-29
JP2007171959 2007-06-29

Publications (2)

Publication Number Publication Date
KR20090004590A KR20090004590A (ko) 2009-01-12
KR101488993B1 true KR101488993B1 (ko) 2015-02-02

Family

ID=39816648

Family Applications (1)

Application Number Title Priority Date Filing Date
KR20080061705A Active KR101488993B1 (ko) 2007-06-29 2008-06-27 연마 장치 및 연마 방법

Country Status (7)

Country Link
US (1) US7976361B2 (enExample)
EP (1) EP2008769B1 (enExample)
JP (2) JP5188285B2 (enExample)
KR (1) KR101488993B1 (enExample)
CN (1) CN101332580B (enExample)
DE (1) DE602008005211D1 (enExample)
TW (1) TWI436852B (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110081839A1 (en) * 2009-10-06 2011-04-07 Apple Inc. Method and apparatus for polishing a curved edge
US8892238B2 (en) * 2009-10-06 2014-11-18 Edward T. Sweet Edge break details and processing
CN101934489B (zh) * 2010-07-30 2012-10-03 溧阳市四方不锈钢制品有限公司 管坯焊缝打磨机
JP5649417B2 (ja) * 2010-11-26 2015-01-07 株式会社荏原製作所 固定砥粒を有する研磨テープを用いた基板の研磨方法
US8540551B2 (en) * 2010-12-15 2013-09-24 Corning Incorporated Glass edge finish system, belt assembly, and method for using same
CN102233536A (zh) * 2011-05-10 2011-11-09 淄博隆嘉工贸有限公司 陶瓷手模自动抛光机
TWI663025B (zh) * 2012-09-24 2019-06-21 日商荏原製作所股份有限公司 Grinding method and grinding device
US9931726B2 (en) * 2013-01-31 2018-04-03 Taiwan Semiconductor Manufacturing Company, Ltd. Wafer edge trimming tool using abrasive tape
JP6071611B2 (ja) * 2013-02-13 2017-02-01 Ｍｉｐｏｘ株式会社 オリエンテーションフラット等切り欠き部を有する、結晶材料から成るウエハの周縁を、研磨テープを使用して研磨することにより円形ウエハを製造する方法
JP2015000451A (ja) * 2013-06-17 2015-01-05 ワイエイシイ株式会社 基板表面加工装置
JP6113624B2 (ja) * 2013-10-11 2017-04-12 株式会社荏原製作所 基板処理装置および基板処理方法
CN105196140B (zh) * 2015-10-20 2017-05-31 慈溪市华表机械有限公司 一种外圆超精机
EP3335832B1 (en) * 2016-12-15 2021-02-03 Ebara Corporation Polishing apparatus and pressing pad for pressing polishing tool
JP6920849B2 (ja) * 2017-03-27 2021-08-18 株式会社荏原製作所 基板処理方法および装置
JP6974067B2 (ja) * 2017-08-17 2021-12-01 株式会社荏原製作所 基板を研磨する方法および装置
JP7129166B2 (ja) * 2018-01-11 2022-09-01 株式会社荏原製作所 基板処理装置及び制御方法
JP7226711B2 (ja) * 2019-02-28 2023-02-21 範多機械株式会社 斫り装置
CN110405587B (zh) * 2019-07-29 2024-12-24 周口市超越科技电子有限公司 一种马达电枢自动抛光机
CN111745504B (zh) * 2020-05-20 2022-06-21 深圳市裕展精密科技有限公司 打磨机构、打磨装置及打磨方法
CN111941201B (zh) * 2020-08-21 2021-12-07 许昌学院 一种用于法布里-珀罗干涉仪镜板的高精度制造装置
CN114619338B (zh) * 2022-03-28 2024-11-15 南通市睿联环保设备有限公司 一种扫地车液压杆生产装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07164301A (ja) * 1993-12-13 1995-06-27 Nippon Micro Kooteingu Kk 研磨装置
WO2006112532A1 (en) 2005-04-19 2006-10-26 Ebara Corporation Substrate processing apparatus
JP2006303112A (ja) 2005-04-19 2006-11-02 Ebara Corp 半導体ウエハ周縁研磨装置及び方法
WO2007070353A2 (en) 2005-12-09 2007-06-21 Applied Materials, Inc. Methods and apparatus for processing a substrate

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JP3081140B2 (ja) 1995-09-21 2000-08-28 日本ミクロコーティング株式会社 研磨テープによる研磨装置
NO306765B1 (no) * 1998-04-03 1999-12-20 Grobi As Anordning for kantrunding av hull i et arbeidsstykke
US6685539B1 (en) * 1999-08-24 2004-02-03 Ricoh Company, Ltd. Processing tool, method of producing tool, processing method and processing apparatus
US6629875B2 (en) * 2000-01-28 2003-10-07 Accretech Usa, Inc. Machine for grinding-polishing of a water edge
JP4156200B2 (ja) * 2001-01-09 2008-09-24 株式会社荏原製作所 研磨装置及び研磨方法
JP2003220546A (ja) * 2002-01-24 2003-08-05 Soken Kogyo Kk ベルト式研磨装置
JP4090247B2 (ja) * 2002-02-12 2008-05-28 株式会社荏原製作所 基板処理装置
JP4125148B2 (ja) * 2003-02-03 2008-07-30 株式会社荏原製作所 基板処理装置
US7682225B2 (en) * 2004-02-25 2010-03-23 Ebara Corporation Polishing apparatus and substrate processing apparatus
JP5026957B2 (ja) * 2004-10-15 2012-09-19 株式会社東芝 研磨装置及び研磨方法
JP2006142388A (ja) * 2004-11-16 2006-06-08 Nihon Micro Coating Co Ltd 研磨テープ及び方法
TWI393199B (zh) * 2005-04-19 2013-04-11 Ebara Corp 基板處理裝置
US7993485B2 (en) * 2005-12-09 2011-08-09 Applied Materials, Inc. Methods and apparatus for processing a substrate
US20070238393A1 (en) * 2006-03-30 2007-10-11 Shin Ho S Methods and apparatus for polishing an edge of a substrate
JP2008036783A (ja) * 2006-08-08 2008-02-21 Sony Corp 研磨方法および研磨装置
JP2008284684A (ja) * 2007-05-21 2008-11-27 Applied Materials Inc 研磨アームを使用して基板の縁部を研磨する方法及び装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07164301A (ja) * 1993-12-13 1995-06-27 Nippon Micro Kooteingu Kk 研磨装置
WO2006112532A1 (en) 2005-04-19 2006-10-26 Ebara Corporation Substrate processing apparatus
JP2006303112A (ja) 2005-04-19 2006-11-02 Ebara Corp 半導体ウエハ周縁研磨装置及び方法
WO2007070353A2 (en) 2005-12-09 2007-06-21 Applied Materials, Inc. Methods and apparatus for processing a substrate

Also Published As

Publication number Publication date
EP2008769B1 (en) 2011-03-02
JP2009028892A (ja) 2009-02-12
CN101332580B (zh) 2012-05-09
KR20090004590A (ko) 2009-01-12
US20090004952A1 (en) 2009-01-01
JP2013075358A (ja) 2013-04-25
US7976361B2 (en) 2011-07-12
DE602008005211D1 (de) 2011-04-14
JP5525590B2 (ja) 2014-06-18
TW200932423A (en) 2009-08-01
TWI436852B (zh) 2014-05-11
JP5188285B2 (ja) 2013-04-24
CN101332580A (zh) 2008-12-31
EP2008769A1 (en) 2008-12-31

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