KR101354106B1 - 가스 입구 부재를 구비한 cvd 반응기 - Google Patents
가스 입구 부재를 구비한 cvd 반응기 Download PDFInfo
- Publication number
- KR101354106B1 KR101354106B1 KR1020087015426A KR20087015426A KR101354106B1 KR 101354106 B1 KR101354106 B1 KR 101354106B1 KR 1020087015426 A KR1020087015426 A KR 1020087015426A KR 20087015426 A KR20087015426 A KR 20087015426A KR 101354106 B1 KR101354106 B1 KR 101354106B1
- Authority
- KR
- South Korea
- Prior art keywords
- gas
- inlet member
- gas inlet
- substrate
- depositing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 238000000034 method Methods 0.000 claims abstract description 50
- 239000000758 substrate Substances 0.000 claims abstract description 29
- 238000000151 deposition Methods 0.000 claims abstract description 15
- 239000002826 coolant Substances 0.000 claims description 4
- 229910000831 Steel Inorganic materials 0.000 claims 1
- 239000012530 fluid Substances 0.000 claims 1
- 239000010959 steel Substances 0.000 claims 1
- 239000007789 gas Substances 0.000 description 84
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 4
- 239000012159 carrier gas Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 239000012809 cooling fluid Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 150000004678 hydrides Chemical class 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45502—Flow conditions in reaction chamber
- C23C16/45508—Radial flow
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45574—Nozzles for more than one gas
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45587—Mechanical means for changing the gas flow
- C23C16/45591—Fixed means, e.g. wings, baffles
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102005056320.1 | 2005-11-25 | ||
| DE102005056320A DE102005056320A1 (de) | 2005-11-25 | 2005-11-25 | CVD-Reaktor mit einem Gaseinlassorgan |
| PCT/EP2006/068716 WO2007060161A1 (de) | 2005-11-25 | 2006-11-21 | Cvd-reaktor mit einem gaseinlassorgan |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20080075205A KR20080075205A (ko) | 2008-08-14 |
| KR101354106B1 true KR101354106B1 (ko) | 2014-01-24 |
Family
ID=37681372
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020087015426A Active KR101354106B1 (ko) | 2005-11-25 | 2006-11-21 | 가스 입구 부재를 구비한 cvd 반응기 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US8152924B2 (https=) |
| EP (1) | EP1954853B1 (https=) |
| JP (1) | JP5148501B2 (https=) |
| KR (1) | KR101354106B1 (https=) |
| AT (1) | ATE531833T1 (https=) |
| DE (1) | DE102005056320A1 (https=) |
| TW (1) | TWI414624B (https=) |
| WO (1) | WO2007060161A1 (https=) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101802254B (zh) | 2007-10-11 | 2013-11-27 | 瓦伦斯处理设备公司 | 化学气相沉积反应器 |
| DE102008055582A1 (de) | 2008-12-23 | 2010-06-24 | Aixtron Ag | MOCVD-Reaktor mit zylindrischem Gaseinlassorgan |
| JP5324347B2 (ja) * | 2009-07-15 | 2013-10-23 | 大陽日酸イー・エム・シー株式会社 | 気相成長装置 |
| DE102009043960A1 (de) | 2009-09-08 | 2011-03-10 | Aixtron Ag | CVD-Reaktor |
| JP5409413B2 (ja) * | 2010-01-26 | 2014-02-05 | 日本パイオニクス株式会社 | Iii族窒化物半導体の気相成長装置 |
| DE202011103798U1 (de) * | 2011-07-28 | 2012-10-29 | Michael Harro Liese | Schnellverschluss für Reaktoren und Konvertoren |
| DE102011053498A1 (de) | 2011-09-12 | 2013-03-14 | Aixtron Se | Verfahren und Vorrichtung zur Ermittlung der Verformung eines Substrates |
| DE102011055061A1 (de) * | 2011-11-04 | 2013-05-08 | Aixtron Se | CVD-Reaktor bzw. Substrathalter für einen CVD-Reaktor |
| DE102011056538A1 (de) | 2011-12-16 | 2013-06-20 | Aixtron Se | Verfahren zum Entfernen unerwünschter Rückstände aus einem MOCVD-Reaktor sowie zugehörige Vorrichtung |
| TWI565825B (zh) * | 2012-06-07 | 2017-01-11 | 索泰克公司 | 沉積系統之氣體注入組件及相關使用方法 |
| US9388494B2 (en) | 2012-06-25 | 2016-07-12 | Novellus Systems, Inc. | Suppression of parasitic deposition in a substrate processing system by suppressing precursor flow and plasma outside of substrate region |
| US20150345046A1 (en) * | 2012-12-27 | 2015-12-03 | Showa Denko K.K. | Film-forming device |
| US20160194753A1 (en) * | 2012-12-27 | 2016-07-07 | Showa Denko K.K. | SiC-FILM FORMATION DEVICE AND METHOD FOR PRODUCING SiC FILM |
| US9399228B2 (en) * | 2013-02-06 | 2016-07-26 | Novellus Systems, Inc. | Method and apparatus for purging and plasma suppression in a process chamber |
| TWI654333B (zh) | 2013-12-18 | 2019-03-21 | 美商蘭姆研究公司 | 具有均勻性折流板之半導體基板處理設備 |
| KR102372893B1 (ko) * | 2014-12-04 | 2022-03-10 | 삼성전자주식회사 | 발광 소자 제조용 화학 기상 증착 장치 |
| DE102015101343A1 (de) | 2015-01-29 | 2016-08-18 | Aixtron Se | CVD-Reaktor mit dreidimensional strukturierter Prozesskammerdecke |
| DE102015101462A1 (de) * | 2015-02-02 | 2016-08-04 | Aixtron Se | Verfahren und Vorrichtung zum Abscheiden einer III-V-Halbleiterschicht |
| US9758868B1 (en) | 2016-03-10 | 2017-09-12 | Lam Research Corporation | Plasma suppression behind a showerhead through the use of increased pressure |
| TWI624561B (zh) * | 2016-08-12 | 2018-05-21 | 漢民科技股份有限公司 | 用於半導體製程之氣體噴射器及成膜裝置 |
| TWI649446B (zh) * | 2017-03-15 | 2019-02-01 | 漢民科技股份有限公司 | 應用於半導體設備之可拆卸式噴氣裝置 |
| TWI633585B (zh) * | 2017-03-31 | 2018-08-21 | 漢民科技股份有限公司 | 用於半導體製程之氣體噴射器與頂板之組合及成膜裝置 |
| KR102369676B1 (ko) | 2017-04-10 | 2022-03-04 | 삼성디스플레이 주식회사 | 표시 장치의 제조장치 및 표시 장치의 제조방법 |
| KR102935543B1 (ko) | 2019-07-17 | 2026-03-05 | 램 리써치 코포레이션 | 기판 프로세싱을 위한 산화 프로파일의 변조 |
| DE102019131794A1 (de) * | 2019-11-25 | 2021-05-27 | Aixtron Se | Wandgekühltes Gaseinlassorgan für einen CVD-Reaktor |
| DE102021103245A1 (de) * | 2021-02-11 | 2022-08-11 | Aixtron Se | CVD-Reaktor mit einem in einer Vorlaufzone ansteigenden Prozesskammerboden |
| TR2022000837A2 (tr) * | 2022-01-24 | 2023-08-21 | Tobb Ekonomi Ve Teknoloji Ueniversitesi | Bi̇r reaktör |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5819684A (en) * | 1987-06-24 | 1998-10-13 | Hawkins; Mark R. | Gas injection system for reaction chambers in CVD systems |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1913676A1 (de) * | 1969-03-18 | 1970-09-24 | Siemens Ag | Verfahren zum Abscheiden von Schichten aus halbleitendem bzw. isolierendem Material aus einem stroemenden Reaktionsgas auf erhitzte Halbleiterkristalle bzw. zum Dotieren solcher Kristalle aus einem stroemenden dotierenden Gas |
| US3783822A (en) * | 1972-05-10 | 1974-01-08 | J Wollam | Apparatus for use in deposition of films from a vapor phase |
| JPS5046273A (https=) * | 1973-08-30 | 1975-04-24 | ||
| JPS51140889A (en) * | 1975-05-30 | 1976-12-04 | Hitachi Ltd | A vapor phase growth apparatus |
| US4421786A (en) * | 1981-01-23 | 1983-12-20 | Western Electric Co. | Chemical vapor deposition reactor for silicon epitaxial processes |
| JPS6119119A (ja) * | 1984-07-06 | 1986-01-28 | Nec Corp | 気相成長装置 |
| JPS62131523A (ja) * | 1985-12-03 | 1987-06-13 | Hitachi Electronics Eng Co Ltd | Cvd薄膜形成装置 |
| US4976996A (en) * | 1987-02-17 | 1990-12-11 | Lam Research Corporation | Chemical vapor deposition reactor and method of use thereof |
| US5244694A (en) * | 1987-06-24 | 1993-09-14 | Advanced Semiconductor Materials America, Inc. | Apparatus for improving the reactant gas flow in a reaction chamber |
| JPH06310438A (ja) * | 1993-04-22 | 1994-11-04 | Mitsubishi Electric Corp | 化合物半導体気相成長用基板ホルダおよび化合物半導体気相成長装置 |
| JP3414475B2 (ja) * | 1994-02-25 | 2003-06-09 | スタンレー電気株式会社 | 結晶成長装置 |
| JP3042335B2 (ja) * | 1994-10-25 | 2000-05-15 | 信越半導体株式会社 | 気相成長方法及びその装置 |
| US6093252A (en) * | 1995-08-03 | 2000-07-25 | Asm America, Inc. | Process chamber with inner support |
| JPH09246192A (ja) * | 1996-03-05 | 1997-09-19 | Nissin Electric Co Ltd | 薄膜気相成長装置 |
| WO1999045167A1 (en) * | 1998-03-06 | 1999-09-10 | Asm America, Inc. | Method of depositing silicon with high step coverage |
| EP1125321B1 (en) * | 1999-06-19 | 2007-08-15 | ASM Genitech Korea Ltd. | Chemical deposition reactor and method of forming a thin film using the same |
| DE60003850T2 (de) * | 1999-12-22 | 2004-03-11 | Aixtron Ag | Cvd reaktor und prozesskammer dafür |
| DE10064944A1 (de) * | 2000-09-22 | 2002-04-11 | Aixtron Ag | Verfahren zum Abscheiden von insbesondere kristallinen Schichten, Gaseinlassorgan sowie Vorrichtung zur Durchführung des Verfahrens |
| DE10064941A1 (de) * | 2000-09-22 | 2002-04-11 | Aixtron Ag | Gaseinlassorgan |
| AU2001283944A1 (en) * | 2000-09-22 | 2002-04-02 | Aixtron Ag | Gas inlet mechanism for cvd-method and device |
| DE10057134A1 (de) * | 2000-11-17 | 2002-05-23 | Aixtron Ag | Verfahren zum Abscheiden von insbesondere kristallinen Schichten sowie Vorrichtung zur Durchführung des Verfahrens |
| DE10064942A1 (de) * | 2000-12-23 | 2002-07-04 | Aixtron Ag | Verfahren zum Abscheiden insbesondere kristalliner Schichten |
| US6915964B2 (en) * | 2001-04-24 | 2005-07-12 | Innovative Technology, Inc. | System and process for solid-state deposition and consolidation of high velocity powder particles using thermal plastic deformation |
| DE10133914A1 (de) * | 2001-07-12 | 2003-01-23 | Aixtron Ag | Prozesskammer mit abschnittsweise unterschiedlich drehangetriebenem Boden und Schichtabscheideverfahren in einer derartigen Prozesskammer |
| US6849306B2 (en) * | 2001-08-23 | 2005-02-01 | Konica Corporation | Plasma treatment method at atmospheric pressure |
| DE10153463A1 (de) | 2001-10-30 | 2003-05-15 | Aixtron Ag | Verfahren und Vorrichtung zum Abscheiden insbesondere kristalliner Schichten auf insbesondere kristallinen Substraten |
| DE10247921A1 (de) * | 2002-10-10 | 2004-04-22 | Aixtron Ag | Hydrid VPE Reaktor |
| JP2004200225A (ja) * | 2002-12-16 | 2004-07-15 | Sharp Corp | 気相成長装置 |
| JP2005072314A (ja) * | 2003-08-26 | 2005-03-17 | Sharp Corp | 気相成長装置および気相成長方法 |
| JP4542860B2 (ja) * | 2004-10-04 | 2010-09-15 | 大陽日酸株式会社 | 気相成長装置 |
| JP4542859B2 (ja) * | 2004-10-04 | 2010-09-15 | 大陽日酸株式会社 | 気相成長装置 |
| JP4598568B2 (ja) * | 2005-03-09 | 2010-12-15 | 大陽日酸株式会社 | 気相成長装置 |
-
2005
- 2005-11-25 DE DE102005056320A patent/DE102005056320A1/de not_active Withdrawn
-
2006
- 2006-11-11 US US12/094,972 patent/US8152924B2/en active Active
- 2006-11-21 WO PCT/EP2006/068716 patent/WO2007060161A1/de not_active Ceased
- 2006-11-21 AT AT06830064T patent/ATE531833T1/de active
- 2006-11-21 JP JP2008541731A patent/JP5148501B2/ja active Active
- 2006-11-21 EP EP06830064A patent/EP1954853B1/de active Active
- 2006-11-21 KR KR1020087015426A patent/KR101354106B1/ko active Active
- 2006-11-24 TW TW095143509A patent/TWI414624B/zh active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5819684A (en) * | 1987-06-24 | 1998-10-13 | Hawkins; Mark R. | Gas injection system for reaction chambers in CVD systems |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1954853A1 (de) | 2008-08-13 |
| ATE531833T1 (de) | 2011-11-15 |
| US20080308040A1 (en) | 2008-12-18 |
| DE102005056320A1 (de) | 2007-06-06 |
| WO2007060161A1 (de) | 2007-05-31 |
| JP2009517541A (ja) | 2009-04-30 |
| US8152924B2 (en) | 2012-04-10 |
| KR20080075205A (ko) | 2008-08-14 |
| EP1954853B1 (de) | 2011-11-02 |
| TW200728497A (en) | 2007-08-01 |
| JP5148501B2 (ja) | 2013-02-20 |
| TWI414624B (zh) | 2013-11-11 |
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