KR101074660B1 - 전기적 검사를 위한 프로브 유닛, 전기적 검사장치 및 점등 검사장치 - Google Patents

전기적 검사를 위한 프로브 유닛, 전기적 검사장치 및 점등 검사장치 Download PDF

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Publication number
KR101074660B1
KR101074660B1 KR1020090082936A KR20090082936A KR101074660B1 KR 101074660 B1 KR101074660 B1 KR 101074660B1 KR 1020090082936 A KR1020090082936 A KR 1020090082936A KR 20090082936 A KR20090082936 A KR 20090082936A KR 101074660 B1 KR101074660 B1 KR 101074660B1
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KR
South Korea
Prior art keywords
probe
base member
support base
suspension mechanism
inspection
Prior art date
Application number
KR1020090082936A
Other languages
English (en)
Korean (ko)
Other versions
KR20100052401A (ko
Inventor
토모아키 쿠가
Original Assignee
가부시키가이샤 니혼 마이크로닉스
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 가부시키가이샤 니혼 마이크로닉스 filed Critical 가부시키가이샤 니혼 마이크로닉스
Publication of KR20100052401A publication Critical patent/KR20100052401A/ko
Application granted granted Critical
Publication of KR101074660B1 publication Critical patent/KR101074660B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Liquid Crystal (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
KR1020090082936A 2008-11-10 2009-09-03 전기적 검사를 위한 프로브 유닛, 전기적 검사장치 및 점등 검사장치 KR101074660B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2008287580A JP5156970B2 (ja) 2008-11-10 2008-11-10 電気的検査のためのプローブユニット、電気的検査装置および点灯検査装置
JPJP-P-2008-287580 2008-11-10

Publications (2)

Publication Number Publication Date
KR20100052401A KR20100052401A (ko) 2010-05-19
KR101074660B1 true KR101074660B1 (ko) 2011-10-19

Family

ID=42277762

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020090082936A KR101074660B1 (ko) 2008-11-10 2009-09-03 전기적 검사를 위한 프로브 유닛, 전기적 검사장치 및 점등 검사장치

Country Status (3)

Country Link
JP (1) JP5156970B2 (zh)
KR (1) KR101074660B1 (zh)
TW (1) TWI396848B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI614548B (zh) * 2013-10-28 2018-02-11 高雄晶傑達光電科技股份有限公司 點燈測試裝置
JP6184301B2 (ja) * 2013-11-14 2017-08-23 株式会社日本マイクロニクス 検査装置
CN106597706B (zh) * 2016-12-23 2023-03-03 苏州凌云视界智能设备有限责任公司 液晶屏自动点灯治具
CN108535900A (zh) * 2018-06-13 2018-09-14 广东速美达自动化股份有限公司 一种检测夹治具

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100611608B1 (ko) * 2005-11-15 2006-08-11 주식회사 코디에스 평판형 디스플레이 검사 방법 및 평판형 디스플레이 검사용유닛
KR100653746B1 (ko) 2005-06-30 2006-12-06 (주)큐엠씨 디스플레이 패널의 검사 장비
JP2007322158A (ja) 2006-05-30 2007-12-13 Micronics Japan Co Ltd プローブユニット及び検査装置
JP2008267873A (ja) * 2007-04-17 2008-11-06 Micronics Japan Co Ltd プローブユニット及び検査装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002148280A (ja) * 2000-11-08 2002-05-22 Soushiyou Tec:Kk 検査用プローブブロックの並列搭載ユニット
TWI231964B (en) * 2003-03-10 2005-05-01 Phicom Corp LCD panel auto gripping apparatus and method for use in a panel carrier for an automatic probe unit
KR100776177B1 (ko) * 2004-12-17 2007-11-16 주식회사 디이엔티 평판 표시패널 검사장치용 워크 테이블
KR100650273B1 (ko) * 2005-06-03 2006-11-27 주식회사 파이컴 액정표시패널 검사 장비
KR100733276B1 (ko) * 2005-07-29 2007-06-28 주식회사 파이컴 디스플레이 패널의 검사 장비와 이를 이용한 디스플레이패널 검사 방법
KR101147120B1 (ko) * 2005-08-30 2012-05-25 엘지디스플레이 주식회사 Ｌｃｄ 검사 장비 및 ｌｃｄ 검사 방법
JP2008028103A (ja) * 2006-07-20 2008-02-07 Fujifilm Corp ウエハプローバ

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100653746B1 (ko) 2005-06-30 2006-12-06 (주)큐엠씨 디스플레이 패널의 검사 장비
KR100611608B1 (ko) * 2005-11-15 2006-08-11 주식회사 코디에스 평판형 디스플레이 검사 방법 및 평판형 디스플레이 검사용유닛
JP2007322158A (ja) 2006-05-30 2007-12-13 Micronics Japan Co Ltd プローブユニット及び検査装置
JP2008267873A (ja) * 2007-04-17 2008-11-06 Micronics Japan Co Ltd プローブユニット及び検査装置

Also Published As

Publication number Publication date
TW201018919A (en) 2010-05-16
JP2010112919A (ja) 2010-05-20
KR20100052401A (ko) 2010-05-19
JP5156970B2 (ja) 2013-03-06
TWI396848B (zh) 2013-05-21

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