KR100978699B1 - 전기적 피드백 검출 시스템 및 멀티 포인트 테스팅 장치 - Google Patents
전기적 피드백 검출 시스템 및 멀티 포인트 테스팅 장치 Download PDFInfo
- Publication number
- KR100978699B1 KR100978699B1 KR1020047010609A KR20047010609A KR100978699B1 KR 100978699 B1 KR100978699 B1 KR 100978699B1 KR 1020047010609 A KR1020047010609 A KR 1020047010609A KR 20047010609 A KR20047010609 A KR 20047010609A KR 100978699 B1 KR100978699 B1 KR 100978699B1
- Authority
- KR
- South Korea
- Prior art keywords
- electrical
- test sample
- detection system
- point probe
- feedback detection
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/06—Probe tip arrays
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
- G01Q10/06—Circuits or algorithms therefor
- G01Q10/065—Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/30—Scanning potential microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Analytical Chemistry (AREA)
- Nanotechnology (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
Rx |
Vr |
어떤 전기 접촉도 없는 상황에서의 Vr의 상대적 변화 |
10Ω |
9.99 ㎶ |
1,100,000 |
10㏀ |
9.99 ㎷ |
1,100 |
1㏁ |
909 ㎷ |
11 |
100㏁ |
9.09 V |
1.1 |
Claims (6)
- 재료 테스트 샘플 표면에 대한 멀티 포인트 프로브의 전기적 접촉을 검출하기 위한 전기적 피드백 검출 시스템으로서,a. 멀티 포인트 프로브의 제1 다수의 전극들에 접속된 전기 발생기 수단;b. 상기 멀티 포인트 프로브의 상기 제1 다수의 전극들을 접속하는 제2 다수의 스위치 저항 검출 소자들;c. 상기 제2 다수의 스위치 저항 검출 소자들을 흐르는 전기 신호로부터 측정 신호를 검출하기 위해 전압 폴로워(voltage follower)의 출력에 접속된 증폭기 수단; 및d. 상기 재료 테스트 샘플 표면과 상기 전기 발생기 수단 사이에 전기적 접속부를 포함하고,상기 전기 발생기 수단은,e. 2개의 차동 입력, 하나의 출력 및 하나의 기준 입력을 제공하는 정밀 증폭기;f. 내부 포트와 외부 포트를 제공하는 정밀 저항 소자 - 상기 내부 포트는 상기 정밀 증폭기의 상기 출력에 접속됨 -; 및g. 입력과 출력을 제공하는 상기 전압 폴로어 - 상기 입력은 상기 정밀 저항 소자의 상기 외부 포트에 접속되고, 상기 출력은 상기 정밀 증폭기의 상기 기준 입력에 접속됨 -을 포함하는 차동 전압 전류 변환기인, 전기적 피드백 검출 시스템.
- 삭제
- 삭제
- 삭제
- 제1항에 있어서,상기 멀티 포인트 프로브는,a. 제1 표면을 갖는 지지체; 및b. 제1 다수의 도전성 프로브 아암들 - 상기 도전성 프로브 아암들의 각각은 상기 지지체의 상기 제1 표면과 동일 평면상에 배치된 기부 단부(proximal end)와 말단 단부(distal end)를 갖고, 상기 도전성 프로브 아암들은 그들의 상기 기부 단부들에서 상기 지지체에 접속되고 상기 말단 단부들이 상기 지지체로부터 자유로이 연장됨 -을 포함하는, 전기적 피드백 검출 시스템.
- 테스트 샘플의 특정 위치에 대한 전기적 특성을 테스트하기 위한 멀티 포인트 테스팅 장치로서,a. 제1항에 따른 전기적 피드백 검출 시스템;b. 상기 테스트 샘플을 수용하고 지지하기 위한 수단; 및c. 상기 테스트 샘플에 대한 테스트 위치에서 멀티 포인트 프로브를 제어되게 배치하고 측정하기 위한 제어기 - 상기 제어기는 상기 전기적 피드백 검출 시스템으로부터 검출기 신호가 제공됨 -를 포함하는 멀티 포인트 테스팅 장치.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DKPA200200020 | 2002-01-07 | ||
DKPA200200020 | 2002-01-07 | ||
PCT/DK2003/000006 WO2003058260A1 (en) | 2002-01-07 | 2003-01-07 | Electrical feedback detection system for multi-point probes |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040085146A KR20040085146A (ko) | 2004-10-07 |
KR100978699B1 true KR100978699B1 (ko) | 2010-08-30 |
Family
ID=8160957
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020047010609A KR100978699B1 (ko) | 2002-01-07 | 2003-01-07 | 전기적 피드백 검출 시스템 및 멀티 포인트 테스팅 장치 |
Country Status (9)
Country | Link |
---|---|
US (2) | US7135876B2 (ko) |
EP (1) | EP1466182B1 (ko) |
JP (1) | JP4500546B2 (ko) |
KR (1) | KR100978699B1 (ko) |
CN (1) | CN1628251B (ko) |
AT (1) | ATE519119T1 (ko) |
AU (1) | AU2003206667A1 (ko) |
IL (1) | IL162847A0 (ko) |
WO (1) | WO2003058260A1 (ko) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ATE519119T1 (de) | 2002-01-07 | 2011-08-15 | Capres As | Elektrisches rückkopplungs-detektionssystem für mehrpunktsonden |
CN102305896B (zh) * | 2004-06-21 | 2015-05-13 | 卡普雷斯股份有限公司 | 一种用于提供探头对准的方法 |
US7541219B2 (en) * | 2004-07-02 | 2009-06-02 | Seagate Technology Llc | Integrated metallic contact probe storage device |
JP4665704B2 (ja) * | 2005-10-17 | 2011-04-06 | セイコーインスツル株式会社 | 計測プローブ及び表面特性計測装置並びに表面特性計測方法 |
US7268571B1 (en) * | 2006-03-20 | 2007-09-11 | Texas Instruments Incorporated | Method for validating and monitoring automatic test equipment contactor |
EP2016433A1 (en) * | 2006-04-24 | 2009-01-21 | Capres A/S | Method for sheet resistance and leakage current density measurements on shallow semiconductor implants |
KR100868071B1 (ko) * | 2006-09-27 | 2008-11-10 | 연세대학교 산학협력단 | 차동 전극 임피던스의 상대적인 측정을 이용한 전극의 접촉모니터링 방법 |
US8113038B2 (en) * | 2006-12-20 | 2012-02-14 | International Business Machines Corporation | Systems and methods for detecting a coating on an item such as a magnetic head |
EP1970714A1 (en) * | 2007-03-12 | 2008-09-17 | Capres Aps | Device including a contact detector |
EP2237052A1 (en) | 2009-03-31 | 2010-10-06 | Capres A/S | Automated multi-point probe manipulation |
CN102436334A (zh) * | 2011-10-27 | 2012-05-02 | 苏州瀚瑞微电子有限公司 | 电容触摸屏系统测试机 |
EP2677324A1 (en) | 2012-06-20 | 2013-12-25 | Capres A/S | Deep-etched multipoint probe |
US9194888B2 (en) | 2012-10-11 | 2015-11-24 | Tektronix, Inc. | Automatic probe ground connection checking techniques |
US9170273B2 (en) * | 2013-12-09 | 2015-10-27 | Globalfoundries U.S. 2 Llc | High frequency capacitance-voltage nanoprobing characterization |
CN105445557A (zh) * | 2015-01-04 | 2016-03-30 | 宁波英飞迈材料科技有限公司 | 一种高通量电阻率测试装置 |
DE102015105075A1 (de) * | 2015-04-01 | 2016-10-06 | Infineon Technologies Ag | Stromsensor |
US20170220026A1 (en) * | 2016-02-01 | 2017-08-03 | Bio-Rad Laboratories, Inc. | Direct contact instrument calibration system |
CN107656146B (zh) * | 2016-07-25 | 2019-10-18 | 中核建中核燃料元件有限公司 | 一种预防测头触碰格架的测量装置的测量方法 |
KR102660769B1 (ko) * | 2017-11-15 | 2024-04-24 | 카프레스 에이/에스 | 테스트 샘플의 전기적 특성을 테스트하기 위한 프로브 및 연관된 근접성 검출기 |
CN108982950B (zh) * | 2018-07-02 | 2021-10-22 | 东北大学 | 测试ybco膜超导环流电压信号的传感器及其制作方法 |
CN110850126B (zh) * | 2018-08-03 | 2022-12-27 | 均豪精密工业股份有限公司 | 检测系统、探针装置及面板检测方法 |
TWI827809B (zh) * | 2019-04-04 | 2024-01-01 | 丹麥商卡普雷斯股份有限公司 | 測量測試樣本之電性的方法,以及多層測試樣本 |
KR102512651B1 (ko) * | 2021-03-25 | 2023-03-23 | 연세대학교 산학협력단 | 주사탐침 현미경용 프로브 및 이를 포함하는 이진 상태 주사탐침 현미경 |
EP4332558A1 (en) * | 2022-09-05 | 2024-03-06 | Stichting IMEC Nederland | Methods and devices for liquid impedance measurement using a four-electrode device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5627522A (en) * | 1992-03-27 | 1997-05-06 | Abbott Laboratories | Automated liquid level sensing system |
EP1085327A1 (en) * | 1999-09-15 | 2001-03-21 | Christian Leth Petersen | Multi-point probe |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA665756A (en) * | 1959-06-08 | 1963-06-25 | Western Electric Company, Incorporated | Resistivity measuring circuit |
US3611125A (en) * | 1969-06-04 | 1971-10-05 | Sylvania Electric Prod | Apparatus for measuring electrical resistance |
NL7008274A (ko) * | 1970-06-06 | 1971-12-08 | ||
US3995213A (en) * | 1975-10-02 | 1976-11-30 | The United States Of America As Represented By The Secretary Of The Air Force | Surface impedance tester |
DE3246669A1 (de) | 1982-12-16 | 1984-06-20 | Siemens AG, 1000 Berlin und 8000 München | Leckwaechter |
JPS59103288U (ja) * | 1982-12-27 | 1984-07-11 | 富士通株式会社 | 抵抗測定回路 |
JPS59119276A (ja) * | 1982-12-27 | 1984-07-10 | Hitachi Ltd | 絶縁抵抗測定装置 |
IT1206837B (it) * | 1987-01-09 | 1989-05-11 | Fiat Auto Spa | Procedimento e dispositivo per il controllo non distruttivo di puntidi saldatura di lamiera realizzati mediante saldatura elettrica |
US5136252A (en) * | 1990-12-17 | 1992-08-04 | At&T Bell Laboratories | Apparatus and methods for evaluating resistive bodies |
US5214389A (en) * | 1992-01-06 | 1993-05-25 | Motorola, Inc. | Multi-dimensional high-resolution probe for semiconductor measurements including piezoelectric transducer arrangement for controlling probe position |
WO1994011745A1 (en) | 1992-11-10 | 1994-05-26 | David Cheng | Method and apparatus for measuring film thickness |
US5691648A (en) * | 1992-11-10 | 1997-11-25 | Cheng; David | Method and apparatus for measuring sheet resistance and thickness of thin films and substrates |
DE69433974T2 (de) * | 1993-04-13 | 2005-09-01 | Agilent Technologies, Inc., Palo Alto | Elektro-optisches instrument |
KR0138618B1 (ko) * | 1993-08-04 | 1998-06-15 | 이노우에 아끼라 | 프로브카드, 프로브카드용 동축 프로브빔 및 그 제조방법 |
US6091248A (en) * | 1994-08-29 | 2000-07-18 | Imec Vzw | Method for measuring the electrical potential in a semiconductor element |
JP3577839B2 (ja) * | 1996-06-04 | 2004-10-20 | 株式会社日立製作所 | 不良検査方法および装置 |
EP0974845A1 (en) | 1998-07-08 | 2000-01-26 | Christian Leth Petersen | Apparatus for testing electric properties using a multi-point probe |
WO2000003252A2 (en) | 1998-07-08 | 2000-01-20 | Capres Aps | Multi-point probe |
JP2000214181A (ja) * | 1999-01-21 | 2000-08-04 | Hioki Ee Corp | コンタクトプロ―ブおよび回路基板検査装置 |
CA2309412A1 (en) * | 2000-05-24 | 2001-11-24 | Michael Thompson | Scanning of biochemical microassays by kelvin microprobe |
JP3638865B2 (ja) * | 2000-07-13 | 2005-04-13 | 喜萬 中山 | ナノチューブ端子を用いた四端子測定装置 |
ATE519119T1 (de) | 2002-01-07 | 2011-08-15 | Capres As | Elektrisches rückkopplungs-detektionssystem für mehrpunktsonden |
-
2003
- 2003-01-07 AT AT03704319T patent/ATE519119T1/de not_active IP Right Cessation
- 2003-01-07 AU AU2003206667A patent/AU2003206667A1/en not_active Abandoned
- 2003-01-07 EP EP03704319A patent/EP1466182B1/en not_active Expired - Lifetime
- 2003-01-07 WO PCT/DK2003/000006 patent/WO2003058260A1/en active Application Filing
- 2003-01-07 JP JP2003558517A patent/JP4500546B2/ja not_active Expired - Lifetime
- 2003-01-07 US US10/500,768 patent/US7135876B2/en not_active Expired - Lifetime
- 2003-01-07 IL IL16284703A patent/IL162847A0/xx unknown
- 2003-01-07 KR KR1020047010609A patent/KR100978699B1/ko active IP Right Grant
- 2003-01-07 CN CN03803462XA patent/CN1628251B/zh not_active Expired - Fee Related
-
2006
- 2006-08-24 US US11/509,208 patent/US7307436B2/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5627522A (en) * | 1992-03-27 | 1997-05-06 | Abbott Laboratories | Automated liquid level sensing system |
EP1085327A1 (en) * | 1999-09-15 | 2001-03-21 | Christian Leth Petersen | Multi-point probe |
Also Published As
Publication number | Publication date |
---|---|
IL162847A0 (en) | 2005-11-20 |
US20070024301A1 (en) | 2007-02-01 |
EP1466182B1 (en) | 2011-08-03 |
JP4500546B2 (ja) | 2010-07-14 |
ATE519119T1 (de) | 2011-08-15 |
KR20040085146A (ko) | 2004-10-07 |
AU2003206667A1 (en) | 2003-07-24 |
US7135876B2 (en) | 2006-11-14 |
JP2005514625A (ja) | 2005-05-19 |
CN1628251B (zh) | 2010-08-18 |
EP1466182A1 (en) | 2004-10-13 |
US7307436B2 (en) | 2007-12-11 |
WO2003058260A1 (en) | 2003-07-17 |
CN1628251A (zh) | 2005-06-15 |
US20050127929A1 (en) | 2005-06-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100978699B1 (ko) | 전기적 피드백 검출 시스템 및 멀티 포인트 테스팅 장치 | |
EP0433604B1 (en) | Electrical probe incorporating scanning proximity microscope | |
Hochwitz et al. | Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes | |
JP4200147B2 (ja) | 微細構造体、カンチレバー、走査型プローブ顕微鏡及び微細構造体の変形量測定方法 | |
JP3638865B2 (ja) | ナノチューブ端子を用いた四端子測定装置 | |
Tran et al. | “Zeptofarad”(10− 21 F) resolution capacitance sensor for scanning capacitance microscopy | |
JP4245951B2 (ja) | 電気特性評価装置 | |
US6930502B2 (en) | Method using conductive atomic force microscopy to measure contact leakage current | |
US20030200798A1 (en) | Atomic force microscope | |
Zou et al. | Conductivity-based contact sensing for probe arrays in dip-pen nanolithography | |
JPH0854403A (ja) | 複合顕微鏡の導電性カンチレバ−構造 | |
US6208151B1 (en) | Method and apparatus for measurement of microscopic electrical characteristics | |
JP2001520751A (ja) | 多プローブ形試験用ヘッド | |
JP3240309B2 (ja) | 原子間力顕微鏡用プローバ及び原子間力顕微鏡 | |
JP6531975B2 (ja) | 微小物電気特性計測装置及び微小物電気特性計測方法 | |
US11693028B2 (en) | Probe for testing an electrical property of a test sample | |
EP0485202A2 (en) | Use of STM-like system to measure node voltage on integrated circuits | |
JPH04137615A (ja) | 導通確認方法 | |
JPH06291171A (ja) | 界面特性測定装置 | |
JP2000162219A (ja) | チューブ型アクチュエータ | |
Dupeyrat et al. | Studying Functional Electrode Structures with Combined Scanning Probe Techniques | |
Muz et al. | Local probe measurements of current filamentation in p‐germanium | |
JPH06273110A (ja) | 走査型トンネル顕微鏡 | |
JP2000097838A (ja) | 表面観察装置及び表面観察方法 | |
JPH0735773A (ja) | 電気計測装置のプローブ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20130801 Year of fee payment: 4 |
|
FPAY | Annual fee payment |
Payment date: 20140807 Year of fee payment: 5 |
|
FPAY | Annual fee payment |
Payment date: 20150803 Year of fee payment: 6 |
|
FPAY | Annual fee payment |
Payment date: 20160809 Year of fee payment: 7 |
|
FPAY | Annual fee payment |
Payment date: 20170811 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20180716 Year of fee payment: 9 |
|
FPAY | Annual fee payment |
Payment date: 20190805 Year of fee payment: 10 |