KR100933125B1 - 기판 처리 장치 - Google Patents

기판 처리 장치 Download PDF

Info

Publication number
KR100933125B1
KR100933125B1 KR1020080059490A KR20080059490A KR100933125B1 KR 100933125 B1 KR100933125 B1 KR 100933125B1 KR 1020080059490 A KR1020080059490 A KR 1020080059490A KR 20080059490 A KR20080059490 A KR 20080059490A KR 100933125 B1 KR100933125 B1 KR 100933125B1
Authority
KR
South Korea
Prior art keywords
opening
chamber
substrate
processing
shutter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020080059490A
Other languages
English (en)
Korean (ko)
Other versions
KR20090023057A (ko
Inventor
가즈오 조다이
히사아키 마츠이
Original Assignee
다이니폰 스크린 세이조우 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2008046223A external-priority patent/JP2009202088A/ja
Application filed by 다이니폰 스크린 세이조우 가부시키가이샤 filed Critical 다이니폰 스크린 세이조우 가부시키가이샤
Publication of KR20090023057A publication Critical patent/KR20090023057A/ko
Application granted granted Critical
Publication of KR100933125B1 publication Critical patent/KR100933125B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0414Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0418Apparatus for fluid treatment for etching
    • H10P72/0422Apparatus for fluid treatment for etching for wet etching
    • H10P72/0424Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles

Landscapes

  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Weting (AREA)
KR1020080059490A 2007-08-28 2008-06-24 기판 처리 장치 Expired - Fee Related KR100933125B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007221246 2007-08-28
JPJP-P-2007-00221246 2007-08-28
JP2008046223A JP2009202088A (ja) 2008-02-27 2008-02-27 基板処理装置
JPJP-P-2008-00046223 2008-02-27

Publications (2)

Publication Number Publication Date
KR20090023057A KR20090023057A (ko) 2009-03-04
KR100933125B1 true KR100933125B1 (ko) 2009-12-21

Family

ID=40692804

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020080059490A Expired - Fee Related KR100933125B1 (ko) 2007-08-28 2008-06-24 기판 처리 장치

Country Status (2)

Country Link
KR (1) KR100933125B1 (https=)
TW (1) TW200916199A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4407665A3 (en) * 2023-01-27 2024-11-06 SCREEN Holdings Co., Ltd. Substrate processing system

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013191779A (ja) * 2012-03-14 2013-09-26 Toshiba Corp 処理装置および処理方法
JP7458267B2 (ja) * 2020-08-19 2024-03-29 東京エレクトロン株式会社 基板処理装置及び基板搬送方法
KR102618629B1 (ko) * 2021-08-24 2023-12-27 세메스 주식회사 기판 처리 장치 및 방법

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001156035A (ja) 1999-11-25 2001-06-08 Hitachi Ltd 基板処理装置及びその隣接処理槽への飛沫の浸入防止方法
JP2007073649A (ja) 2005-09-06 2007-03-22 Sharp Corp レジスト剥離洗浄装置、レジスト剥離洗浄方法および基板製造方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001156035A (ja) 1999-11-25 2001-06-08 Hitachi Ltd 基板処理装置及びその隣接処理槽への飛沫の浸入防止方法
JP2007073649A (ja) 2005-09-06 2007-03-22 Sharp Corp レジスト剥離洗浄装置、レジスト剥離洗浄方法および基板製造方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4407665A3 (en) * 2023-01-27 2024-11-06 SCREEN Holdings Co., Ltd. Substrate processing system

Also Published As

Publication number Publication date
TWI344392B (https=) 2011-07-01
TW200916199A (en) 2009-04-16
KR20090023057A (ko) 2009-03-04

Similar Documents

Publication Publication Date Title
CN101378001B (zh) 基板处理装置
JP5290081B2 (ja) 基板処理装置
KR101073340B1 (ko) 기판 세정 처리 장치
CN1947871B (zh) 基板处理装置
KR101302927B1 (ko) 표면 처리 장치
CN100350555C (zh) 基板处理装置
KR100933125B1 (ko) 기판 처리 장치
TWI424517B (zh) Substrate processing device
CN101372001A (zh) 基板清洗用双流体喷嘴
JP2009178672A (ja) 基板処理装置及び基板処理方法
JP2009202088A (ja) 基板処理装置
JP2009213958A (ja) 基板処理装置
JP2006278606A (ja) 基板処理装置および基板処理方法
KR101086517B1 (ko) 기판 처리 장치
KR20200113113A (ko) 기판의 비접촉식 수직 처리시스템
JP4997080B2 (ja) 基板処理装置
TWI622431B (zh) 塗布裝置及塗布方法
JP4861970B2 (ja) 基板処理装置
KR20070057482A (ko) 습식 식각 장치
JP4488965B2 (ja) 基板処理装置
KR101109528B1 (ko) 처리액에 의한 기판 처리 장치 및 기판 처리 방법
JP2004016997A (ja) 基板の処理装置及び処理方法
JP2011129758A (ja) 基板処理装置
JP2007005665A (ja) 基板処理装置
KR102414501B1 (ko) 유리 기판의 제조 장치 및 제조 방법

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

FPAY Annual fee payment

Payment date: 20121121

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

FPAY Annual fee payment

Payment date: 20131119

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

FPAY Annual fee payment

Payment date: 20141120

Year of fee payment: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20151212

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20151212

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000