KR100881843B1 - 트리거 신호 생성 방법 및 전압 파형 표현 생성 방법 - Google Patents

트리거 신호 생성 방법 및 전압 파형 표현 생성 방법 Download PDF

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Publication number
KR100881843B1
KR100881843B1 KR1020020021258A KR20020021258A KR100881843B1 KR 100881843 B1 KR100881843 B1 KR 100881843B1 KR 1020020021258 A KR1020020021258 A KR 1020020021258A KR 20020021258 A KR20020021258 A KR 20020021258A KR 100881843 B1 KR100881843 B1 KR 100881843B1
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South Korea
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trigger
test
memory
test program
dut
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Korean (ko)
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KR20020081673A (ko
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크레치알렌에스2세
리크브레드디
베일리랜디엘
프리즈맨존엠
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베리지 (싱가포르) 피티이. 엘티디.
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Assigned to 어드밴테스트 (싱가포르) 피티이. 엘티디. reassignment 어드밴테스트 (싱가포르) 피티이. 엘티디. 권리의 전부이전등록 Assignors: 베리지 (싱가포르) 피티이. 엘티디.
Assigned to 주식회사 아도반테스토 reassignment 주식회사 아도반테스토 권리의 전부이전등록 Assignors: 어드밴테스트 (싱가포르) 피티이. 엘티디.
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

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  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
KR1020020021258A 2001-04-19 2002-04-18 트리거 신호 생성 방법 및 전압 파형 표현 생성 방법 Expired - Lifetime KR100881843B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/838,766 2001-04-19
US09/838,766 US6834364B2 (en) 2001-04-19 2001-04-19 Algorithmically programmable memory tester with breakpoint trigger, error jamming and 'scope mode that memorizes target sequences

Publications (2)

Publication Number Publication Date
KR20020081673A KR20020081673A (ko) 2002-10-30
KR100881843B1 true KR100881843B1 (ko) 2009-02-03

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KR1020020021258A Expired - Lifetime KR100881843B1 (ko) 2001-04-19 2002-04-18 트리거 신호 생성 방법 및 전압 파형 표현 생성 방법

Country Status (4)

Country Link
US (1) US6834364B2 (https=)
JP (1) JP4298960B2 (https=)
KR (1) KR100881843B1 (https=)
DE (1) DE10217303A1 (https=)

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US7793191B2 (en) * 2002-04-05 2010-09-07 Sony Corporation Interleave device, interleaving method, deinterleave device, and deinterleave method
US7178135B2 (en) * 2002-05-16 2007-02-13 International Business Machines Corporation Scope-based breakpoint selection and operation
US20040019828A1 (en) * 2002-07-25 2004-01-29 Gergen Joseph P. Method and apparatus for debugging a data processing system
US20040025083A1 (en) * 2002-07-31 2004-02-05 Murthi Nanja Generating test code for software
US7509533B1 (en) * 2003-06-30 2009-03-24 Sun Microsystems, Inc. Methods and apparatus for testing functionality of processing devices by isolation and testing
JP4737929B2 (ja) * 2003-12-12 2011-08-03 株式会社東芝 半導体記憶装置
US7216256B2 (en) * 2004-03-30 2007-05-08 Bellsouth Intellectual Property Corporation Methods, systems, and products for verifying integrity of web-server served content
US7426556B2 (en) * 2004-03-30 2008-09-16 At&T Intellectual Property I, L.P. Methods, systems, and products for verifying integrity of web-server served content
US7363364B2 (en) * 2004-03-30 2008-04-22 At&T Delaware Intellectual Property, Inc. Methods, systems, and products for verifying integrity of web-server served content
US7353437B2 (en) 2004-10-29 2008-04-01 Micron Technology, Inc. System and method for testing a memory for a memory failure exhibited by a failing memory
JPWO2007043144A1 (ja) * 2005-10-05 2009-04-16 ヒューレット−パッカード デベロップメント カンパニー エル．ピー． 負荷試験装置およびその方法
DE102005048872A1 (de) * 2005-10-12 2007-04-26 Mühlbauer Ag Testkopfeinrichtung
US7650555B2 (en) * 2006-07-27 2010-01-19 International Business Machines Corporation Method and apparatus for characterizing components of a device under test using on-chip trace logic analyzer
KR100764052B1 (ko) * 2006-08-03 2007-10-08 삼성전자주식회사 유동적 어드레스 바운더리를 갖는 플래시 메모리 장치 및그것의 프로그램 방법
US7680621B2 (en) * 2007-08-15 2010-03-16 Keithley Instruments, Inc. Test instrument network
JP2009300248A (ja) * 2008-06-13 2009-12-24 Mitsubishi Electric Corp 並列試験装置
KR20100103212A (ko) * 2009-03-13 2010-09-27 삼성전자주식회사 복수개의 테스트 모듈을 구비하는 테스트 보드 및 이를 구비하는 테스트 시스템
US8683456B2 (en) 2009-07-13 2014-03-25 Apple Inc. Test partitioning for a non-volatile memory
US8650446B2 (en) * 2010-03-24 2014-02-11 Apple Inc. Management of a non-volatile memory based on test quality
US8645776B2 (en) * 2010-03-24 2014-02-04 Apple Inc. Run-time testing of memory locations in a non-volatile memory
US8751903B2 (en) 2010-07-26 2014-06-10 Apple Inc. Methods and systems for monitoring write operations of non-volatile memory
US9397500B2 (en) * 2013-06-28 2016-07-19 Solantro Semiconductor Corp. Inverter with extended endurance memory
CN110502439B (zh) * 2019-08-07 2024-01-12 Oppo广东移动通信有限公司 调试方法、装置、电子设备以及存储介质
CN114218032B (zh) * 2021-11-30 2026-01-23 山东云海国创云计算装备产业创新中心有限公司 一种硬件设计验证方法、装置及电子设备和存储介质
CN114218879B (zh) * 2021-12-13 2026-02-06 海光信息技术股份有限公司 用于验证的寄存器随机方法、系统、设备以及存储介质
CN114444537B (zh) * 2021-12-20 2025-06-10 北京电子工程总体研究所 一种测试数据自动判读系统和方法
CN114546822A (zh) * 2021-12-27 2022-05-27 芯华章科技股份有限公司 测试设计的方法、电子设备及存储介质
US11914500B2 (en) 2022-02-03 2024-02-27 Apple Inc. Debugging of accelerator circuit for mathematical operations using packet limit breakpoint
US12205660B2 (en) * 2022-11-08 2025-01-21 SanDisk Technologies, Inc. Test controller enabling a snapshot restore and resume operation within a device under test
US12374417B2 (en) 2022-11-10 2025-07-29 Intelligent Memory Limited Apparatus, systems, and methods for dynamically reconfigured semiconductor tester for volatile and non-volatile memories
US20250308578A1 (en) * 2024-04-02 2025-10-02 Nanya Technology Corporation Data verification device and data verification method

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US5771240A (en) * 1996-11-14 1998-06-23 Hewlett-Packard Company Test systems for obtaining a sample-on-the-fly event trace for an integrated circuit with an integrated debug trigger apparatus and an external pulse pin
JP2000310653A (ja) * 1999-03-01 2000-11-07 Agilent Technol Inc 信号測定システムにおけるトリガ定義の自動記憶システム
US6253338B1 (en) * 1998-12-21 2001-06-26 International Business Machines Corporation System for tracing hardware counters utilizing programmed performance monitor to generate trace interrupt after each branch instruction or at the end of each code basic block
KR100439781B1 (ko) * 1995-08-30 2004-10-06 모토로라 인코포레이티드 데이터프로세서와그동작방법,그디버깅동작실행방법및그중단점값수정방법

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JP2577120Y2 (ja) * 1993-04-15 1998-07-23 株式会社アドバンテスト 過剰パルス印加の禁止回路
JP3237473B2 (ja) * 1995-06-29 2001-12-10 安藤電気株式会社 マスク制御装置
US6360340B1 (en) * 1996-11-19 2002-03-19 Teradyne, Inc. Memory tester with data compression
DE69940061D1 (de) * 1999-09-30 2009-01-22 St Microelectronics Srl Speicherprüfverfahren und nicht-fluchtiger Speicher mit niedriger Fehlerverdeckungswahrscheinlichkeit
US6615369B1 (en) * 2000-01-31 2003-09-02 Agilent Technologies, Inc. Logic analyzer with trigger specification defined by waveform exemplar

Patent Citations (4)

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Publication number Priority date Publication date Assignee Title
KR100439781B1 (ko) * 1995-08-30 2004-10-06 모토로라 인코포레이티드 데이터프로세서와그동작방법,그디버깅동작실행방법및그중단점값수정방법
US5771240A (en) * 1996-11-14 1998-06-23 Hewlett-Packard Company Test systems for obtaining a sample-on-the-fly event trace for an integrated circuit with an integrated debug trigger apparatus and an external pulse pin
US6253338B1 (en) * 1998-12-21 2001-06-26 International Business Machines Corporation System for tracing hardware counters utilizing programmed performance monitor to generate trace interrupt after each branch instruction or at the end of each code basic block
JP2000310653A (ja) * 1999-03-01 2000-11-07 Agilent Technol Inc 信号測定システムにおけるトリガ定義の自動記憶システム

Also Published As

Publication number Publication date
US6834364B2 (en) 2004-12-21
JP4298960B2 (ja) 2009-07-22
DE10217303A1 (de) 2002-10-31
JP2003050269A (ja) 2003-02-21
US20020157042A1 (en) 2002-10-24
KR20020081673A (ko) 2002-10-30

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