DE10217303A1 - Algorithmisch programmierbarer Speichertester mit Unterbrechungspunktauslöser, Fehlerblockierung und Oszilloskop-Modus, der Zielsequenzen speichert - Google Patents
Algorithmisch programmierbarer Speichertester mit Unterbrechungspunktauslöser, Fehlerblockierung und Oszilloskop-Modus, der Zielsequenzen speichertInfo
- Publication number
- DE10217303A1 DE10217303A1 DE10217303A DE10217303A DE10217303A1 DE 10217303 A1 DE10217303 A1 DE 10217303A1 DE 10217303 A DE10217303 A DE 10217303A DE 10217303 A DE10217303 A DE 10217303A DE 10217303 A1 DE10217303 A1 DE 10217303A1
- Authority
- DE
- Germany
- Prior art keywords
- trigger
- test
- dut
- register
- test program
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Landscapes
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/838,766 US6834364B2 (en) | 2001-04-19 | 2001-04-19 | Algorithmically programmable memory tester with breakpoint trigger, error jamming and 'scope mode that memorizes target sequences |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE10217303A1 true DE10217303A1 (de) | 2002-10-31 |
Family
ID=25277994
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE10217303A Withdrawn DE10217303A1 (de) | 2001-04-19 | 2002-04-18 | Algorithmisch programmierbarer Speichertester mit Unterbrechungspunktauslöser, Fehlerblockierung und Oszilloskop-Modus, der Zielsequenzen speichert |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6834364B2 (https=) |
| JP (1) | JP4298960B2 (https=) |
| KR (1) | KR100881843B1 (https=) |
| DE (1) | DE10217303A1 (https=) |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6763490B1 (en) * | 2000-09-25 | 2004-07-13 | Agilent Technologies, Inc. | Method and apparatus for coordinating program execution in a site controller with pattern execution in a tester |
| US20020199179A1 (en) * | 2001-06-21 | 2002-12-26 | Lavery Daniel M. | Method and apparatus for compiler-generated triggering of auxiliary codes |
| US7793191B2 (en) * | 2002-04-05 | 2010-09-07 | Sony Corporation | Interleave device, interleaving method, deinterleave device, and deinterleave method |
| US7178135B2 (en) * | 2002-05-16 | 2007-02-13 | International Business Machines Corporation | Scope-based breakpoint selection and operation |
| US20040019828A1 (en) * | 2002-07-25 | 2004-01-29 | Gergen Joseph P. | Method and apparatus for debugging a data processing system |
| US20040025083A1 (en) * | 2002-07-31 | 2004-02-05 | Murthi Nanja | Generating test code for software |
| US7509533B1 (en) * | 2003-06-30 | 2009-03-24 | Sun Microsystems, Inc. | Methods and apparatus for testing functionality of processing devices by isolation and testing |
| JP4737929B2 (ja) * | 2003-12-12 | 2011-08-03 | 株式会社東芝 | 半導体記憶装置 |
| US7216256B2 (en) * | 2004-03-30 | 2007-05-08 | Bellsouth Intellectual Property Corporation | Methods, systems, and products for verifying integrity of web-server served content |
| US7426556B2 (en) * | 2004-03-30 | 2008-09-16 | At&T Intellectual Property I, L.P. | Methods, systems, and products for verifying integrity of web-server served content |
| US7363364B2 (en) * | 2004-03-30 | 2008-04-22 | At&T Delaware Intellectual Property, Inc. | Methods, systems, and products for verifying integrity of web-server served content |
| US7353437B2 (en) | 2004-10-29 | 2008-04-01 | Micron Technology, Inc. | System and method for testing a memory for a memory failure exhibited by a failing memory |
| JPWO2007043144A1 (ja) * | 2005-10-05 | 2009-04-16 | ヒューレット−パッカード デベロップメント カンパニー エル．ピー． | 負荷試験装置およびその方法 |
| DE102005048872A1 (de) * | 2005-10-12 | 2007-04-26 | Mühlbauer Ag | Testkopfeinrichtung |
| US7650555B2 (en) * | 2006-07-27 | 2010-01-19 | International Business Machines Corporation | Method and apparatus for characterizing components of a device under test using on-chip trace logic analyzer |
| KR100764052B1 (ko) * | 2006-08-03 | 2007-10-08 | 삼성전자주식회사 | 유동적 어드레스 바운더리를 갖는 플래시 메모리 장치 및그것의 프로그램 방법 |
| US7680621B2 (en) * | 2007-08-15 | 2010-03-16 | Keithley Instruments, Inc. | Test instrument network |
| JP2009300248A (ja) * | 2008-06-13 | 2009-12-24 | Mitsubishi Electric Corp | 並列試験装置 |
| KR20100103212A (ko) * | 2009-03-13 | 2010-09-27 | 삼성전자주식회사 | 복수개의 테스트 모듈을 구비하는 테스트 보드 및 이를 구비하는 테스트 시스템 |
| US8683456B2 (en) | 2009-07-13 | 2014-03-25 | Apple Inc. | Test partitioning for a non-volatile memory |
| US8650446B2 (en) * | 2010-03-24 | 2014-02-11 | Apple Inc. | Management of a non-volatile memory based on test quality |
| US8645776B2 (en) * | 2010-03-24 | 2014-02-04 | Apple Inc. | Run-time testing of memory locations in a non-volatile memory |
| US8751903B2 (en) | 2010-07-26 | 2014-06-10 | Apple Inc. | Methods and systems for monitoring write operations of non-volatile memory |
| US9397500B2 (en) * | 2013-06-28 | 2016-07-19 | Solantro Semiconductor Corp. | Inverter with extended endurance memory |
| CN110502439B (zh) * | 2019-08-07 | 2024-01-12 | Oppo广东移动通信有限公司 | 调试方法、装置、电子设备以及存储介质 |
| CN114218032B (zh) * | 2021-11-30 | 2026-01-23 | 山东云海国创云计算装备产业创新中心有限公司 | 一种硬件设计验证方法、装置及电子设备和存储介质 |
| CN114218879B (zh) * | 2021-12-13 | 2026-02-06 | 海光信息技术股份有限公司 | 用于验证的寄存器随机方法、系统、设备以及存储介质 |
| CN114444537B (zh) * | 2021-12-20 | 2025-06-10 | 北京电子工程总体研究所 | 一种测试数据自动判读系统和方法 |
| CN114546822A (zh) * | 2021-12-27 | 2022-05-27 | 芯华章科技股份有限公司 | 测试设计的方法、电子设备及存储介质 |
| US11914500B2 (en) | 2022-02-03 | 2024-02-27 | Apple Inc. | Debugging of accelerator circuit for mathematical operations using packet limit breakpoint |
| US12205660B2 (en) * | 2022-11-08 | 2025-01-21 | SanDisk Technologies, Inc. | Test controller enabling a snapshot restore and resume operation within a device under test |
| US12374417B2 (en) | 2022-11-10 | 2025-07-29 | Intelligent Memory Limited | Apparatus, systems, and methods for dynamically reconfigured semiconductor tester for volatile and non-volatile memories |
| US20250308578A1 (en) * | 2024-04-02 | 2025-10-02 | Nanya Technology Corporation | Data verification device and data verification method |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2577120Y2 (ja) * | 1993-04-15 | 1998-07-23 | 株式会社アドバンテスト | 過剰パルス印加の禁止回路 |
| JP3237473B2 (ja) * | 1995-06-29 | 2001-12-10 | 安藤電気株式会社 | マスク制御装置 |
| JP3846939B2 (ja) * | 1995-08-30 | 2006-11-15 | フリースケール セミコンダクター インコーポレイテッド | データプロセッサ |
| US5771240A (en) * | 1996-11-14 | 1998-06-23 | Hewlett-Packard Company | Test systems for obtaining a sample-on-the-fly event trace for an integrated circuit with an integrated debug trigger apparatus and an external pulse pin |
| US6360340B1 (en) * | 1996-11-19 | 2002-03-19 | Teradyne, Inc. | Memory tester with data compression |
| US6253338B1 (en) * | 1998-12-21 | 2001-06-26 | International Business Machines Corporation | System for tracing hardware counters utilizing programmed performance monitor to generate trace interrupt after each branch instruction or at the end of each code basic block |
| US6327544B1 (en) * | 1999-03-01 | 2001-12-04 | Agilent Technologies, Inc. | Automatic storage of a trigger definition in a signal measurement system |
| DE69940061D1 (de) * | 1999-09-30 | 2009-01-22 | St Microelectronics Srl | Speicherprüfverfahren und nicht-fluchtiger Speicher mit niedriger Fehlerverdeckungswahrscheinlichkeit |
| US6615369B1 (en) * | 2000-01-31 | 2003-09-02 | Agilent Technologies, Inc. | Logic analyzer with trigger specification defined by waveform exemplar |
-
2001
- 2001-04-19 US US09/838,766 patent/US6834364B2/en not_active Expired - Lifetime
-
2002
- 2002-04-18 KR KR1020020021258A patent/KR100881843B1/ko not_active Expired - Lifetime
- 2002-04-18 DE DE10217303A patent/DE10217303A1/de not_active Withdrawn
- 2002-04-19 JP JP2002117030A patent/JP4298960B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR100881843B1 (ko) | 2009-02-03 |
| US6834364B2 (en) | 2004-12-21 |
| JP4298960B2 (ja) | 2009-07-22 |
| JP2003050269A (ja) | 2003-02-21 |
| US20020157042A1 (en) | 2002-10-24 |
| KR20020081673A (ko) | 2002-10-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| 8127 | New person/name/address of the applicant |
Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG |
|
| 8139 | Disposal/non-payment of the annual fee |