KR100859400B1 - 광 조사 장치 - Google Patents
광 조사 장치 Download PDFInfo
- Publication number
- KR100859400B1 KR100859400B1 KR1020070118210A KR20070118210A KR100859400B1 KR 100859400 B1 KR100859400 B1 KR 100859400B1 KR 1020070118210 A KR1020070118210 A KR 1020070118210A KR 20070118210 A KR20070118210 A KR 20070118210A KR 100859400 B1 KR100859400 B1 KR 100859400B1
- Authority
- KR
- South Korea
- Prior art keywords
- light
- lens
- integrator
- lens group
- angle
- Prior art date
Links
Images
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70941—Stray fields and charges, e.g. stray light, scattered light, flare, transmission loss
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- Epidemiology (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Public Health (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Non-Portable Lighting Devices Or Systems Thereof (AREA)
- Microscoopes, Condenser (AREA)
Abstract
Description
Claims (1)
- 광원으로부터 출사된 광을, 광 입사측의 렌즈군과 광 출사측의 렌즈군을 광축 방향으로 이간하여 배치한 인테그레이터 렌즈를 통해서, 피조사물에 조사하는 광 조사 장치에 있어서,광이 조사되는 조사 영역의 크기가 상이한 2개의 인테그레이터 렌즈와,상기 2개의 인테그레이터 렌즈를, 상기 광 조사 장치의 광로 중에 선택적으로 삽입하는 인테그레이터 렌즈 교환 수단과,상기 2개의 인테그레이터 렌즈 중, 조사 영역이 좁은 인테그레이터 렌즈의 광 입사측의 렌즈군과 광 출사측의 렌즈군의 사이에, 광출사측의 렌즈의 경계면을 따른 차광 부재가 광출사측 렌즈군의 경계면과 수직방향으로 설치되어, 광출사측 렌즈군에 있어서 이웃의 렌즈에 입사하는 성분을 차단하는 것을 특징으로 하는 광 조사 장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004104902A JP4470558B2 (ja) | 2004-03-31 | 2004-03-31 | 光照射装置 |
JPJP-P-2004-00104902 | 2004-03-31 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020040111993A Division KR100828259B1 (ko) | 2004-03-31 | 2004-12-24 | 광 조사 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20080005156A KR20080005156A (ko) | 2008-01-10 |
KR100859400B1 true KR100859400B1 (ko) | 2008-09-22 |
Family
ID=35325336
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020040111993A KR100828259B1 (ko) | 2004-03-31 | 2004-12-24 | 광 조사 장치 |
KR1020070118210A KR100859400B1 (ko) | 2004-03-31 | 2007-11-20 | 광 조사 장치 |
KR1020070118209A KR100843914B1 (ko) | 2004-03-31 | 2007-11-20 | 광 조사 장치 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020040111993A KR100828259B1 (ko) | 2004-03-31 | 2004-12-24 | 광 조사 장치 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070118209A KR100843914B1 (ko) | 2004-03-31 | 2007-11-20 | 광 조사 장치 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4470558B2 (ko) |
KR (3) | KR100828259B1 (ko) |
TW (1) | TWI276926B (ko) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4879085B2 (ja) * | 2007-05-17 | 2012-02-15 | 株式会社日立ハイテクノロジーズ | 露光装置 |
JP5057382B2 (ja) * | 2007-12-18 | 2012-10-24 | Nskテクノロジー株式会社 | 露光装置及び基板の製造方法 |
US8908151B2 (en) | 2008-02-14 | 2014-12-09 | Nikon Corporation | Illumination optical system, exposure apparatus, device manufacturing method, compensation filter, and exposure optical system |
JP5180677B2 (ja) * | 2008-05-14 | 2013-04-10 | 三洋電機株式会社 | 照明装置及びこれを用いた投写型映像表示装置 |
JP5604813B2 (ja) * | 2009-06-15 | 2014-10-15 | 株式会社ニコン | 照明光学系、露光装置、およびデバイス製造方法 |
JP5644101B2 (ja) * | 2009-12-22 | 2014-12-24 | 株式会社ブイ・テクノロジー | 露光装置 |
WO2012011497A1 (ja) * | 2010-07-22 | 2012-01-26 | Nskテクノロジー株式会社 | 露光装置用光照射装置、光照射装置の制御方法、露光装置及び露光方法 |
JP5799306B2 (ja) * | 2010-07-22 | 2015-10-21 | 株式会社ブイ・テクノロジー | 露光装置用光照射装置の制御方法、及び露光方法 |
KR101712299B1 (ko) * | 2012-10-27 | 2017-03-13 | 칼 짜이스 에스엠티 게엠베하 | 마이크로리소그래피 투영 노광 장치의 조명 시스템 |
JP6362095B2 (ja) * | 2014-06-17 | 2018-07-25 | キヤノン株式会社 | 照明装置、露光装置、調整方法、及び、物品の製造方法 |
JP5756242B1 (ja) * | 2015-02-16 | 2015-07-29 | フェニックス電機株式会社 | 露光装置の設計方法 |
CN107807494B (zh) * | 2016-09-09 | 2021-05-11 | 佳能株式会社 | 照明光学系统、曝光装置以及物品制造方法 |
JP2018045060A (ja) * | 2016-09-13 | 2018-03-22 | キヤノン株式会社 | 照明装置、露光装置及び物品の製造方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2759890B2 (ja) * | 1989-11-24 | 1998-05-28 | ウシオ電機株式会社 | 露光装置 |
KR20030077388A (ko) * | 2002-03-25 | 2003-10-01 | 우시오덴키 가부시키가이샤 | 광 조사 장치 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08305035A (ja) * | 1995-03-08 | 1996-11-22 | Matsushita Electric Ind Co Ltd | 照明装置およびこれを用いた露光方法 |
JP2001174910A (ja) | 1999-12-20 | 2001-06-29 | Fujitsu General Ltd | 液晶プロジェクタ装置 |
JP2003076030A (ja) | 2001-09-06 | 2003-03-14 | Hitachi Electronics Eng Co Ltd | 露光装置における光照射装置 |
US6577429B1 (en) | 2002-01-15 | 2003-06-10 | Eastman Kodak Company | Laser projection display system |
-
2004
- 2004-03-31 JP JP2004104902A patent/JP4470558B2/ja not_active Expired - Fee Related
- 2004-11-24 TW TW093136167A patent/TWI276926B/zh not_active IP Right Cessation
- 2004-12-24 KR KR1020040111993A patent/KR100828259B1/ko active IP Right Grant
-
2007
- 2007-11-20 KR KR1020070118210A patent/KR100859400B1/ko active IP Right Grant
- 2007-11-20 KR KR1020070118209A patent/KR100843914B1/ko active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2759890B2 (ja) * | 1989-11-24 | 1998-05-28 | ウシオ電機株式会社 | 露光装置 |
KR20030077388A (ko) * | 2002-03-25 | 2003-10-01 | 우시오덴키 가부시키가이샤 | 광 조사 장치 |
Also Published As
Publication number | Publication date |
---|---|
KR20080005156A (ko) | 2008-01-10 |
JP2005292316A (ja) | 2005-10-20 |
TWI276926B (en) | 2007-03-21 |
KR20050096832A (ko) | 2005-10-06 |
KR20080005155A (ko) | 2008-01-10 |
KR100828259B1 (ko) | 2008-05-07 |
JP4470558B2 (ja) | 2010-06-02 |
KR100843914B1 (ko) | 2008-07-03 |
TW200532255A (en) | 2005-10-01 |
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