KR100858921B1 - 반도체 집적 회로 시험 장치 및 방법 - Google Patents
반도체 집적 회로 시험 장치 및 방법 Download PDFInfo
- Publication number
- KR100858921B1 KR100858921B1 KR1020070028160A KR20070028160A KR100858921B1 KR 100858921 B1 KR100858921 B1 KR 100858921B1 KR 1020070028160 A KR1020070028160 A KR 1020070028160A KR 20070028160 A KR20070028160 A KR 20070028160A KR 100858921 B1 KR100858921 B1 KR 100858921B1
- Authority
- KR
- South Korea
- Prior art keywords
- fail
- under test
- device under
- output
- address
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5602—Interface to device under test
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006149509A JP2007322141A (ja) | 2006-05-30 | 2006-05-30 | 半導体集積回路試験装置及び方法 |
JPJP-P-2006-00149509 | 2006-05-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20070115593A KR20070115593A (ko) | 2007-12-06 |
KR100858921B1 true KR100858921B1 (ko) | 2008-09-17 |
Family
ID=38855109
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070028160A KR100858921B1 (ko) | 2006-05-30 | 2007-03-22 | 반도체 집적 회로 시험 장치 및 방법 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2007322141A (ja) |
KR (1) | KR100858921B1 (ja) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR0148621B1 (ko) * | 1993-09-03 | 1998-12-01 | 오오우라 히로시 | 반도체 메모리 시험장치 |
KR20030032815A (ko) * | 2001-10-16 | 2003-04-26 | 미쓰비시덴키 가부시키가이샤 | 반도체 시험장치 |
KR20030036028A (ko) * | 2001-10-31 | 2003-05-09 | 휴렛-팩커드 컴퍼니(델라웨어주법인) | 메모리 평면 및 메모리 장치 |
KR20040023486A (ko) * | 2002-09-11 | 2004-03-18 | 가부시키가이샤 히타치세이사쿠쇼 | 메모리 시스템 |
JP2005276317A (ja) * | 2004-03-24 | 2005-10-06 | Advantest Corp | 試験装置及び試験方法 |
-
2006
- 2006-05-30 JP JP2006149509A patent/JP2007322141A/ja not_active Withdrawn
-
2007
- 2007-03-22 KR KR1020070028160A patent/KR100858921B1/ko not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR0148621B1 (ko) * | 1993-09-03 | 1998-12-01 | 오오우라 히로시 | 반도체 메모리 시험장치 |
KR20030032815A (ko) * | 2001-10-16 | 2003-04-26 | 미쓰비시덴키 가부시키가이샤 | 반도체 시험장치 |
KR20030036028A (ko) * | 2001-10-31 | 2003-05-09 | 휴렛-팩커드 컴퍼니(델라웨어주법인) | 메모리 평면 및 메모리 장치 |
KR20040023486A (ko) * | 2002-09-11 | 2004-03-18 | 가부시키가이샤 히타치세이사쿠쇼 | 메모리 시스템 |
JP2005276317A (ja) * | 2004-03-24 | 2005-10-06 | Advantest Corp | 試験装置及び試験方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20070115593A (ko) | 2007-12-06 |
JP2007322141A (ja) | 2007-12-13 |
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A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
LAPS | Lapse due to unpaid annual fee |