KR100820615B1 - 플라즈마 처리 장치, 플라즈마 처리 방법, 플라즈마 막형성장치 및 플라즈마 막형성 방법 - Google Patents

플라즈마 처리 장치, 플라즈마 처리 방법, 플라즈마 막형성장치 및 플라즈마 막형성 방법 Download PDF

Info

Publication number
KR100820615B1
KR100820615B1 KR1020077026433A KR20077026433A KR100820615B1 KR 100820615 B1 KR100820615 B1 KR 100820615B1 KR 1020077026433 A KR1020077026433 A KR 1020077026433A KR 20077026433 A KR20077026433 A KR 20077026433A KR 100820615 B1 KR100820615 B1 KR 100820615B1
Authority
KR
South Korea
Prior art keywords
plasma
antenna
substrate
high frequency
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020077026433A
Other languages
English (en)
Korean (ko)
Other versions
KR20070116184A (ko
Inventor
류이치 마츠다
다다시 시마즈
마사히코 이노우에
Original Assignee
미츠비시 쥬고교 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 미츠비시 쥬고교 가부시키가이샤 filed Critical 미츠비시 쥬고교 가부시키가이샤
Publication of KR20070116184A publication Critical patent/KR20070116184A/ko
Application granted granted Critical
Publication of KR100820615B1 publication Critical patent/KR100820615B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • C23C16/507Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using external electrodes, e.g. in tunnel type reactors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
  • Plasma Technology (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Formation Of Insulating Films (AREA)
KR1020077026433A 2002-06-19 2003-06-17 플라즈마 처리 장치, 플라즈마 처리 방법, 플라즈마 막형성장치 및 플라즈마 막형성 방법 Expired - Fee Related KR100820615B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JPJP-P-2002-00178129 2002-06-19
JP2002178129A JP3820188B2 (ja) 2002-06-19 2002-06-19 プラズマ処理装置及びプラズマ処理方法
JP2002351250A JP4052454B2 (ja) 2002-06-19 2002-12-03 酸化シリコン膜又は窒化シリコン膜の製造方法
JPJP-P-2002-00351250 2002-12-03

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020067012843A Division KR100806550B1 (ko) 2002-06-19 2003-06-17 플라즈마 처리 장치, 플라즈마 처리 방법, 플라즈마 막형성장치 및 플라즈마 막형성 방법

Publications (2)

Publication Number Publication Date
KR20070116184A KR20070116184A (ko) 2007-12-06
KR100820615B1 true KR100820615B1 (ko) 2008-04-08

Family

ID=30002232

Family Applications (3)

Application Number Title Priority Date Filing Date
KR1020067012843A Expired - Fee Related KR100806550B1 (ko) 2002-06-19 2003-06-17 플라즈마 처리 장치, 플라즈마 처리 방법, 플라즈마 막형성장치 및 플라즈마 막형성 방법
KR1020077026433A Expired - Fee Related KR100820615B1 (ko) 2002-06-19 2003-06-17 플라즈마 처리 장치, 플라즈마 처리 방법, 플라즈마 막형성장치 및 플라즈마 막형성 방법
KR1020047020686A Expired - Fee Related KR100661781B1 (ko) 2002-06-19 2003-06-17 플라즈마 처리 장치, 플라즈마 처리 방법, 플라즈마막형성 장치 및 플라즈마 막형성 방법

Family Applications Before (1)

Application Number Title Priority Date Filing Date
KR1020067012843A Expired - Fee Related KR100806550B1 (ko) 2002-06-19 2003-06-17 플라즈마 처리 장치, 플라즈마 처리 방법, 플라즈마 막형성장치 및 플라즈마 막형성 방법

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020047020686A Expired - Fee Related KR100661781B1 (ko) 2002-06-19 2003-06-17 플라즈마 처리 장치, 플라즈마 처리 방법, 플라즈마막형성 장치 및 플라즈마 막형성 방법

Country Status (6)

Country Link
US (2) US20050202183A1 (enExample)
EP (2) EP2224468B1 (enExample)
JP (2) JP3820188B2 (enExample)
KR (3) KR100806550B1 (enExample)
TW (2) TW200625417A (enExample)
WO (1) WO2004001822A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI408734B (zh) * 2005-04-28 2013-09-11 Semiconductor Energy Lab 半導體裝置及其製造方法
JP5162108B2 (ja) * 2005-10-28 2013-03-13 日新電機株式会社 プラズマ生成方法及び装置並びにプラズマ処理装置
US8895388B2 (en) * 2006-07-21 2014-11-25 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a semiconductor device and a non-volatile semiconductor storage device including the formation of an insulating layer using a plasma treatment
KR100808862B1 (ko) * 2006-07-24 2008-03-03 삼성전자주식회사 기판처리장치
US7972471B2 (en) * 2007-06-29 2011-07-05 Lam Research Corporation Inductively coupled dual zone processing chamber with single planar antenna
JP5330747B2 (ja) * 2008-06-30 2013-10-30 三菱重工業株式会社 半導体装置用絶縁膜、半導体装置用絶縁膜の製造方法及び製造装置、半導体装置及びその製造方法
JP5723130B2 (ja) * 2010-09-28 2015-05-27 東京エレクトロン株式会社 プラズマ処理装置
JP5800532B2 (ja) * 2011-03-03 2015-10-28 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ処理方法
US10541183B2 (en) * 2012-07-19 2020-01-21 Texas Instruments Incorporated Spectral reflectometry window heater
JP6232953B2 (ja) * 2013-11-11 2017-11-22 富士通セミコンダクター株式会社 半導体装置の製造装置および半導体装置の製造方法
KR101965992B1 (ko) 2014-12-25 2019-04-04 가부시키가이샤 코쿠사이 엘렉트릭 반도체 장치의 제조 방법, 기록 매체 및 기판 처리 장치
CN205741208U (zh) * 2015-09-16 2016-11-30 应用材料公司 用于改进的等离子体处理腔室的系统和设备
US10544505B2 (en) 2017-03-24 2020-01-28 Applied Materials, Inc. Deposition or treatment of diamond-like carbon in a plasma reactor
US20180277340A1 (en) * 2017-03-24 2018-09-27 Yang Yang Plasma reactor with electron beam of secondary electrons
KR101914902B1 (ko) * 2018-02-14 2019-01-14 성균관대학교산학협력단 플라즈마 발생장치 및 이를 포함하는 기판 처리 장치

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5824158A (en) 1993-06-30 1998-10-20 Kabushiki Kaisha Kobe Seiko Sho Chemical vapor deposition using inductively coupled plasma and system therefor

Family Cites Families (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4948458A (en) 1989-08-14 1990-08-14 Lam Research Corporation Method and apparatus for producing magnetically-coupled planar plasma
JP3005006B2 (ja) 1989-09-29 2000-01-31 三菱製紙株式会社 インクジェット記録媒体
EP0489407A3 (en) * 1990-12-03 1992-07-22 Applied Materials, Inc. Plasma reactor using uhf/vhf resonant antenna source, and processes
US6165311A (en) * 1991-06-27 2000-12-26 Applied Materials, Inc. Inductively coupled RF plasma reactor having an overhead solenoidal antenna
JP3249193B2 (ja) 1992-09-09 2002-01-21 株式会社ダイヘン プラズマ処理装置
KR100238627B1 (ko) * 1993-01-12 2000-01-15 히가시 데쓰로 플라즈마 처리장치
JP3172757B2 (ja) 1993-05-01 2001-06-04 東京エレクトロン株式会社 プラズマ処理装置
JP3172340B2 (ja) * 1993-08-12 2001-06-04 東京エレクトロン株式会社 プラズマ処理装置
US5571366A (en) * 1993-10-20 1996-11-05 Tokyo Electron Limited Plasma processing apparatus
JPH07201813A (ja) 1993-12-28 1995-08-04 Fujitsu Ltd 半導体装置の製造方法およびその製造装置
JPH07245195A (ja) * 1994-03-07 1995-09-19 Matsushita Electric Ind Co Ltd プラズマ処理方法及び装置
JP3140934B2 (ja) * 1994-08-23 2001-03-05 東京エレクトロン株式会社 プラズマ装置
JPH08279493A (ja) * 1995-04-04 1996-10-22 Anelva Corp プラズマ処理装置
JP3192352B2 (ja) 1995-06-16 2001-07-23 東京エレクトロン株式会社 プラズマ処理装置
US5874704A (en) 1995-06-30 1999-02-23 Lam Research Corporation Low inductance large area coil for an inductively coupled plasma source
US5907221A (en) * 1995-08-16 1999-05-25 Applied Materials, Inc. Inductively coupled plasma reactor with an inductive coil antenna having independent loops
US5716451A (en) * 1995-08-17 1998-02-10 Tokyo Electron Limited Plasma processing apparatus
US5936352A (en) * 1995-11-28 1999-08-10 Nec Corporation Plasma processing apparatus for producing plasma at low electron temperatures
JP2937907B2 (ja) * 1995-11-28 1999-08-23 日本電気株式会社 プラズマ発生装置
JP3501910B2 (ja) 1996-04-23 2004-03-02 東京エレクトロン株式会社 プラズマ処理装置
DE69719108D1 (de) 1996-05-02 2003-03-27 Tokyo Electron Ltd Plasmabehandlungsgerät
US6170428B1 (en) 1996-07-15 2001-01-09 Applied Materials, Inc. Symmetric tunable inductively coupled HDP-CVD reactor
US5897712A (en) 1996-07-16 1999-04-27 Applied Materials, Inc. Plasma uniformity control for an inductive plasma source
TW376547B (en) * 1997-03-27 1999-12-11 Matsushita Electric Industrial Co Ltd Method and apparatus for plasma processing
JP3736016B2 (ja) 1997-03-27 2006-01-18 松下電器産業株式会社 プラズマ処理方法及び装置
JP3726477B2 (ja) * 1998-03-16 2005-12-14 株式会社日立製作所 プラズマ処理装置及びプラズマ処理方法
US6085688A (en) * 1998-03-27 2000-07-11 Applied Materials, Inc. Method and apparatus for improving processing and reducing charge damage in an inductively coupled plasma reactor
US6164241A (en) * 1998-06-30 2000-12-26 Lam Research Corporation Multiple coil antenna for inductively-coupled plasma generation systems
JP2000068254A (ja) * 1998-08-25 2000-03-03 Matsushita Electronics Industry Corp プラズマ処理方法とプラズマ処理装置
JP3764594B2 (ja) 1998-10-12 2006-04-12 株式会社日立製作所 プラズマ処理方法
KR100311234B1 (ko) 1999-01-18 2001-11-02 학교법인 인하학원 고품위 유도결합 플라즈마 리액터
TW469534B (en) 1999-02-23 2001-12-21 Matsushita Electric Industrial Co Ltd Plasma processing method and apparatus
KR100338057B1 (ko) 1999-08-26 2002-05-24 황 철 주 유도 결합형 플라즈마 발생용 안테나 장치
JP2001284340A (ja) * 2000-03-30 2001-10-12 Hitachi Kokusai Electric Inc 半導体製造装置および半導体装置の製造方法
US6401652B1 (en) * 2000-05-04 2002-06-11 Applied Materials, Inc. Plasma reactor inductive coil antenna with flat surface facing the plasma
ATE452219T1 (de) * 2000-05-17 2010-01-15 Ihi Corp Plasma-cvd-vorrichtung und verfahren
KR20010108968A (ko) * 2000-06-01 2001-12-08 황 철 주 플라즈마 공정장치
JP2002008996A (ja) * 2000-06-23 2002-01-11 Mitsubishi Heavy Ind Ltd 給電アンテナ及び給電方法
EP1301938A2 (en) * 2000-07-06 2003-04-16 Applied Materials, Inc. A plasma reactor having a symmetric parallel conductor coil antenna
JP2002110565A (ja) 2000-10-02 2002-04-12 Sony Corp プラズマ処理装置及び処理方法、並びに半導体装置の製造方法
US6721655B1 (en) 2001-03-14 2004-04-13 Mitsubishi Denki Kabushiki Kaisha Vehicle travel guide device and vehicle travel guide method
US6660659B1 (en) * 2002-06-12 2003-12-09 Applied Materials, Inc. Plasma method and apparatus for processing a substrate

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5824158A (en) 1993-06-30 1998-10-20 Kabushiki Kaisha Kobe Seiko Sho Chemical vapor deposition using inductively coupled plasma and system therefor

Also Published As

Publication number Publication date
US20050202183A1 (en) 2005-09-15
KR20050012818A (ko) 2005-02-02
JP4052454B2 (ja) 2008-02-27
KR20070116184A (ko) 2007-12-06
US8662010B2 (en) 2014-03-04
EP2224468B1 (en) 2013-08-14
JP2004022935A (ja) 2004-01-22
EP1515362A1 (en) 2005-03-16
JP3820188B2 (ja) 2006-09-13
KR100806550B1 (ko) 2008-02-27
EP2224468A1 (en) 2010-09-01
TW200415710A (en) 2004-08-16
TWI305375B (enExample) 2009-01-11
KR100661781B1 (ko) 2006-12-28
US20070224364A1 (en) 2007-09-27
EP1515362B1 (en) 2012-07-04
JP2004186402A (ja) 2004-07-02
KR20060084067A (ko) 2006-07-21
EP1515362A4 (en) 2009-07-15
TWI276163B (en) 2007-03-11
WO2004001822A1 (ja) 2003-12-31
TW200625417A (en) 2006-07-16

Similar Documents

Publication Publication Date Title
US8662010B2 (en) Plasma processing apparatus, plasma processing method, plasma film deposition apparatus, and plasma film deposition method
TWI679674B (zh) 蝕刻基板的方法
US5429070A (en) High density plasma deposition and etching apparatus
KR100554116B1 (ko) 멀티슬롯 안테나를 이용한 표면파 플라즈마 처리장치
US6652709B1 (en) Plasma processing apparatus having circular waveguide, and plasma processing method
CN100364035C (zh) 产生等离子体的方法和装置
JP2003243378A (ja) 解離及びイオン化の空間的制御のためのプラズマ処理装置
WO2019139761A1 (en) Argon addition to remote plasma oxidation
WO2012049943A1 (ja) 窒化珪素膜形成装置及び方法
KR100455350B1 (ko) 유도 결합형 플라즈마 발생 장치 및 방법
JP3907444B2 (ja) プラズマ処理装置及び構造体の製造方法
TWI787239B (zh) 有機材料的蝕刻方法及設備
JP3790410B2 (ja) パーティクル低減方法
JP3530788B2 (ja) マイクロ波供給器及びプラズマ処理装置並びに処理方法
JP2001342567A (ja) プラズマ処理装置
JPH07153741A (ja) プラズマ処理システム
JP2004031718A (ja) プラズマ成膜装置及びプラズマ成膜方法
KR20090043863A (ko) 플라즈마 기판 처리 장치

Legal Events

Date Code Title Description
A107 Divisional application of patent
A201 Request for examination
PA0104 Divisional application for international application

St.27 status event code: A-0-1-A10-A16-div-PA0104

St.27 status event code: A-0-1-A10-A18-div-PA0104

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

Fee payment year number: 1

St.27 status event code: A-2-2-U10-U12-oth-PR1002

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PR1001 Payment of annual fee

Fee payment year number: 4

St.27 status event code: A-4-4-U10-U11-oth-PR1001

PR1001 Payment of annual fee

Fee payment year number: 5

St.27 status event code: A-4-4-U10-U11-oth-PR1001

FPAY Annual fee payment

Payment date: 20130321

Year of fee payment: 6

PR1001 Payment of annual fee

Fee payment year number: 6

St.27 status event code: A-4-4-U10-U11-oth-PR1001

FPAY Annual fee payment

Payment date: 20140319

Year of fee payment: 7

PR1001 Payment of annual fee

Fee payment year number: 7

St.27 status event code: A-4-4-U10-U11-oth-PR1001

PR1001 Payment of annual fee

Fee payment year number: 8

St.27 status event code: A-4-4-U10-U11-oth-PR1001

FPAY Annual fee payment

Payment date: 20160318

Year of fee payment: 9

PR1001 Payment of annual fee

Fee payment year number: 9

St.27 status event code: A-4-4-U10-U11-oth-PR1001

FPAY Annual fee payment

Payment date: 20170302

Year of fee payment: 10

PR1001 Payment of annual fee

Fee payment year number: 10

St.27 status event code: A-4-4-U10-U11-oth-PR1001

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

Not in force date: 20180403

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

St.27 status event code: A-4-4-U10-U13-oth-PC1903

PC1903 Unpaid annual fee

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20180403

St.27 status event code: N-4-6-H10-H13-oth-PC1903

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000