KR100786878B1 - 단결정 육성장치, 그 장치를 이용한 단결정 제조방법 및단결정 - Google Patents
단결정 육성장치, 그 장치를 이용한 단결정 제조방법 및단결정 Download PDFInfo
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- KR100786878B1 KR100786878B1 KR1020017012396A KR20017012396A KR100786878B1 KR 100786878 B1 KR100786878 B1 KR 100786878B1 KR 1020017012396 A KR1020017012396 A KR 1020017012396A KR 20017012396 A KR20017012396 A KR 20017012396A KR 100786878 B1 KR100786878 B1 KR 100786878B1
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- Prior art keywords
- single crystal
- cooling
- cooling cylinder
- growing apparatus
- crystal growing
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- 239000013078 crystal Substances 0.000 title claims abstract description 191
- 238000004519 manufacturing process Methods 0.000 title description 7
- 238000001816 cooling Methods 0.000 claims abstract description 185
- 239000002994 raw material Substances 0.000 claims abstract description 39
- 230000012010 growth Effects 0.000 claims abstract description 33
- 239000002826 coolant Substances 0.000 claims abstract description 21
- 238000010438 heat treatment Methods 0.000 claims abstract description 6
- 238000000034 method Methods 0.000 claims description 21
- 229910052751 metal Inorganic materials 0.000 claims description 19
- 239000002184 metal Substances 0.000 claims description 19
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 15
- 229910002804 graphite Inorganic materials 0.000 claims description 15
- 239000010439 graphite Substances 0.000 claims description 15
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 10
- 229910052750 molybdenum Inorganic materials 0.000 claims description 10
- 239000011733 molybdenum Substances 0.000 claims description 10
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 10
- 229910052721 tungsten Inorganic materials 0.000 claims description 10
- 239000010937 tungsten Substances 0.000 claims description 10
- 229910045601 alloy Inorganic materials 0.000 claims description 7
- 239000000956 alloy Substances 0.000 claims description 7
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 6
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 6
- 150000002739 metals Chemical class 0.000 claims description 6
- 230000001681 protective effect Effects 0.000 claims description 6
- 239000010936 titanium Substances 0.000 claims description 6
- 229910052719 titanium Inorganic materials 0.000 claims description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 239000010949 copper Substances 0.000 claims description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- 239000011651 chromium Substances 0.000 claims description 3
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 229910052742 iron Inorganic materials 0.000 claims description 3
- 229910052759 nickel Inorganic materials 0.000 claims description 3
- -1 platinum group metals Chemical class 0.000 claims description 3
- 230000000694 effects Effects 0.000 abstract description 25
- 239000000155 melt Substances 0.000 description 50
- 239000000463 material Substances 0.000 description 13
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 10
- 229910052710 silicon Inorganic materials 0.000 description 10
- 239000010703 silicon Substances 0.000 description 10
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- 230000007246 mechanism Effects 0.000 description 6
- 238000002844 melting Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 239000007789 gas Substances 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 238000007711 solidification Methods 0.000 description 4
- 230000008023 solidification Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 239000011261 inert gas Substances 0.000 description 3
- 238000010791 quenching Methods 0.000 description 3
- 230000000171 quenching effect Effects 0.000 description 3
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 3
- 229910010271 silicon carbide Inorganic materials 0.000 description 3
- 238000004088 simulation Methods 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 235000013372 meat Nutrition 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 239000003507 refrigerant Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 239000007770 graphite material Substances 0.000 description 1
- 239000012943 hotmelt Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000010583 slow cooling Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/206—Controlling or regulating the thermal history of growing the ingot
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1068—Seed pulling including heating or cooling details [e.g., shield configuration]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1072—Seed pulling including details of means providing product movement [e.g., shaft guides, servo means]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1076—Apparatus for crystallization from liquid or supercritical state having means for producing a moving solid-liquid-solid zone
- Y10T117/1088—Apparatus for crystallization from liquid or supercritical state having means for producing a moving solid-liquid-solid zone including heating or cooling details
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (15)
- 원료융액을 수용하는 도가니와 원료융액을 가열하는 히터를 격납하는 메인챔버와, 상기 메인챔버 상부에 연결설치되고 성장한 단결정이 인상되어 수납되는 인상챔버를 구비한 단결정 육성장치에 있어서,인상 중의 단결정을 둘러싸도록 상기 메인챔버의 천정부에서 원료융액 표면으로 연신되고 냉각매체로 강제냉각되는 냉각통과, 상기 냉각통보다 아래로 연신되고 원통 또는 아래로 테이퍼진(직경이 감소되는) 형상의 냉각보조부재를 갖고, 그리고 상기 냉각통이 철, 니켈, 크롬, 구리, 티탄, 몰리브덴, 텅스텐 또는 이들 금속을 포함한 합금, 또는 상기 금속 또는 합금을 티탄, 몰리브덴, 텅스텐 또는 백금족금속으로 피복하여 이루어지는 것을 특징으로 하는 단결정 육성장치
- 삭제
- 제1항에 있어서,상기 냉각보조부재가 흑연, 몰리브덴 또는 텅스텐으로 이루어지는 것을 특징으로 하는 단결정 육성장치.
- 제1항에 있어서,상기 냉각보조부재에 차열부재가 설치되는 것을 특징으로 하는 단결정 육성장치.
- 제3항에 있어서,상기 냉각보조부재에 차열부재가 설치되는 것을 특징으로 하는 단결정 육성장치.
- 제1항에 있어서,상기 냉각통의 선단이 도가니내에 채워진 원료융액의 표면에서 10㎝ 이상 떨어져 있는 것을 특징으로 하는 단결정 육성장치.
- 삭제
- 제1항에 있어서,상기 냉각통의 외측에 흑연 또는 금속으로 이루어진 보호부재가 설치되는 것을 특징으로 하는 단결정 육성장치.
- 삭제
- 제1항에 있어서,상기 냉각통의 내측표면을 흑화처리한 것을 특징으로 하는 단결정 육성장치.
- 삭제
- 제8항에 있어서,상기 냉각통의 내측표면을 흑화처리한 것을 특징으로 하는 단결정 육성장치.
- 삭제
- 삭제
- 삭제
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000021241 | 2000-01-31 | ||
JPJP-P-2000-00021241 | 2000-01-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20010108424A KR20010108424A (ko) | 2001-12-07 |
KR100786878B1 true KR100786878B1 (ko) | 2007-12-20 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020017012396A KR100786878B1 (ko) | 2000-01-31 | 2001-01-25 | 단결정 육성장치, 그 장치를 이용한 단결정 제조방법 및단결정 |
Country Status (5)
Country | Link |
---|---|
US (1) | US6632280B2 (ko) |
EP (1) | EP1182281A4 (ko) |
KR (1) | KR100786878B1 (ko) |
TW (1) | TWI242610B (ko) |
WO (1) | WO2001057293A1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200043688A (ko) | 2018-10-18 | 2020-04-28 | 한국기초과학지원연구원 | 화합물 반도체용 금속소재의 고순도화 장치 |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW588127B (en) * | 2000-02-01 | 2004-05-21 | Komatsu Denshi Kinzoku Kk | Apparatus for pulling single crystal by CZ method |
JP4569090B2 (ja) * | 2003-10-10 | 2010-10-27 | 信越半導体株式会社 | 単結晶の製造方法及び単結晶、並びに単結晶の製造装置 |
JP4857517B2 (ja) * | 2003-11-26 | 2012-01-18 | 信越半導体株式会社 | アニールウエーハ及びアニールウエーハの製造方法 |
KR101229067B1 (ko) * | 2004-02-02 | 2013-02-04 | 신에쯔 한도타이 가부시키가이샤 | 실리콘 단결정, 실리콘 웨이퍼, 그 제조장치 및 제조방법 |
JP4606753B2 (ja) * | 2004-03-04 | 2011-01-05 | Sumco Techxiv株式会社 | クーラー及びインゴット製造装置 |
DE102004020656A1 (de) * | 2004-04-23 | 2005-11-17 | Forschungsverbund Berlin E.V. | Vorrichtung zur Züchtung an einkristallinen Verbindungshalbleiter-Kristallstäben nach dem dampfdruckkontrollierten Czochralski-Verfahren |
KR100831044B1 (ko) * | 2005-09-21 | 2008-05-21 | 주식회사 실트론 | 고품질 실리콘 단결정 잉곳의 성장장치, 그 장치를 이용한성장방법 |
JP2007261846A (ja) * | 2006-03-28 | 2007-10-11 | Sumco Techxiv株式会社 | 無欠陥のシリコン単結晶を製造する方法 |
JP4513798B2 (ja) | 2006-10-24 | 2010-07-28 | 信越半導体株式会社 | 単結晶製造装置及び単結晶の製造方法 |
JP5240191B2 (ja) | 2007-05-30 | 2013-07-17 | 株式会社Sumco | シリコン単結晶引上装置 |
JP4829176B2 (ja) * | 2007-06-08 | 2011-12-07 | シルトロニック・ジャパン株式会社 | 単結晶の製造方法 |
ATE539036T1 (de) * | 2007-08-03 | 2012-01-15 | Teoss Co Ltd | Siliciumtragvorrichtung und vorrichtung zum erhitzen und schnellen abkühlen von silicium damit |
KR100983195B1 (ko) * | 2007-12-28 | 2010-09-20 | 주식회사 실트론 | 2차원 선결함이 제어된 실리콘 잉곳, 웨이퍼, 에피택셜웨이퍼와, 그 제조방법 및 제조장치 |
JP4582149B2 (ja) * | 2008-01-10 | 2010-11-17 | 信越半導体株式会社 | 単結晶製造装置 |
JP5186970B2 (ja) | 2008-03-24 | 2013-04-24 | 信越半導体株式会社 | 単結晶製造装置及びその方法 |
KR101266701B1 (ko) * | 2010-02-12 | 2013-05-22 | 주식회사 엘지실트론 | 단결정 냉각장치 및 이를 포함하는 단결정 성장장치 |
JP5724400B2 (ja) | 2011-01-19 | 2015-05-27 | 信越半導体株式会社 | 単結晶製造装置及び単結晶製造方法 |
KR101281033B1 (ko) * | 2011-05-19 | 2013-07-09 | 한국에너지기술연구원 | 온도 조절이 용이한 연속주조법을 이용한 태양전지용 실리콘 기판 제조 장치 및 이를 이용한 실리콘 기판 제조 방법 |
CN102268741A (zh) * | 2011-07-13 | 2011-12-07 | 协鑫光电科技(张家港)有限公司 | 一种晶体生长用热交换系统 |
JP5733245B2 (ja) | 2012-03-16 | 2015-06-10 | 信越半導体株式会社 | シリコン単結晶ウェーハの製造方法 |
JP5880353B2 (ja) | 2012-08-28 | 2016-03-09 | 信越半導体株式会社 | シリコン単結晶の育成方法 |
WO2016021843A1 (ko) * | 2014-08-05 | 2016-02-11 | 주식회사 엘지실트론 | 실리콘 단결정 성장 장치 및 이를 이용한 실리콘 단결정 성장 방법 |
KR101680217B1 (ko) * | 2014-08-05 | 2016-11-28 | 주식회사 엘지실트론 | 실리콘 단결정 성장 장치 및 이를 이용한 실리콘 단결정 성장 방법 |
DE102016001729A1 (de) * | 2016-02-16 | 2017-08-17 | Krasimir Kosev | Einkristallzüchtungsvorrichtung |
CN110735179A (zh) * | 2018-07-20 | 2020-01-31 | 上海新昇半导体科技有限公司 | 一种应用于单晶炉的冷却装置及单晶炉 |
CN111321457A (zh) * | 2018-12-13 | 2020-06-23 | 上海新昇半导体科技有限公司 | 分体式导流筒 |
CN111519241B (zh) * | 2019-02-01 | 2021-12-17 | 上海新昇半导体科技有限公司 | 一种半导体晶体生长装置 |
JP7059967B2 (ja) * | 2019-02-28 | 2022-04-26 | 信越半導体株式会社 | 単結晶育成装置及び単結晶育成方法 |
JP6614380B1 (ja) | 2019-03-20 | 2019-12-04 | 信越半導体株式会社 | 単結晶製造装置 |
JP6825728B1 (ja) * | 2020-01-10 | 2021-02-03 | 信越半導体株式会社 | 単結晶製造装置 |
JP7420060B2 (ja) | 2020-12-10 | 2024-01-23 | 信越半導体株式会社 | 単結晶製造装置 |
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JP4166316B2 (ja) * | 1998-02-27 | 2008-10-15 | Sumco Techxiv株式会社 | 単結晶製造装置 |
US6287382B1 (en) * | 1998-10-13 | 2001-09-11 | Memc Electronic Materials, Inc. | Electrode assembly for electrical resistance heater used in crystal growing apparatus |
JP2000263165A (ja) * | 1999-03-19 | 2000-09-26 | Aida Eng Ltd | ブランク分離装置 |
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2001
- 2001-01-25 WO PCT/JP2001/000494 patent/WO2001057293A1/ja active Application Filing
- 2001-01-25 EP EP01949010A patent/EP1182281A4/en not_active Ceased
- 2001-01-25 US US09/937,132 patent/US6632280B2/en not_active Expired - Lifetime
- 2001-01-25 KR KR1020017012396A patent/KR100786878B1/ko active IP Right Grant
- 2001-01-30 TW TW090101819A patent/TWI242610B/zh not_active IP Right Cessation
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JPS6168389A (ja) * | 1984-09-06 | 1986-04-08 | Sony Corp | 単結晶成長装置 |
JPH01145391A (ja) * | 1987-12-02 | 1989-06-07 | Mitsubishi Metal Corp | 単結晶引上装置 |
KR19990006721A (ko) * | 1997-06-06 | 1999-01-25 | 후지이 아키히로 | 실리콘결정과 그 제조장치, 제조방법 |
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Also Published As
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TWI242610B (en) | 2005-11-01 |
WO2001057293A1 (en) | 2001-08-09 |
EP1182281A4 (en) | 2009-03-04 |
WO2001057293A9 (fr) | 2001-10-25 |
US20030070605A1 (en) | 2003-04-17 |
EP1182281A1 (en) | 2002-02-27 |
KR20010108424A (ko) | 2001-12-07 |
US6632280B2 (en) | 2003-10-14 |
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