KR100721196B1 - 연마패드 및 이를 이용한 화학적기계적연마장치 - Google Patents

연마패드 및 이를 이용한 화학적기계적연마장치 Download PDF

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Publication number
KR100721196B1
KR100721196B1 KR1020050043716A KR20050043716A KR100721196B1 KR 100721196 B1 KR100721196 B1 KR 100721196B1 KR 1020050043716 A KR1020050043716 A KR 1020050043716A KR 20050043716 A KR20050043716 A KR 20050043716A KR 100721196 B1 KR100721196 B1 KR 100721196B1
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KR
South Korea
Prior art keywords
polishing pad
groove pattern
polishing
chemical mechanical
slurry
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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KR1020050043716A
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English (en)
Korean (ko)
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KR20060121497A (ko
Inventor
최용수
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주식회사 하이닉스반도체
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Priority to KR1020050043716A priority Critical patent/KR100721196B1/ko
Priority to US11/289,942 priority patent/US7357698B2/en
Priority to TW094141816A priority patent/TWI291911B/zh
Priority to JP2005366162A priority patent/JP4920965B2/ja
Publication of KR20060121497A publication Critical patent/KR20060121497A/ko
Application granted granted Critical
Publication of KR100721196B1 publication Critical patent/KR100721196B1/ko
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
KR1020050043716A 2005-05-24 2005-05-24 연마패드 및 이를 이용한 화학적기계적연마장치 Expired - Fee Related KR100721196B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020050043716A KR100721196B1 (ko) 2005-05-24 2005-05-24 연마패드 및 이를 이용한 화학적기계적연마장치
US11/289,942 US7357698B2 (en) 2005-05-24 2005-11-29 Polishing pad and chemical mechanical polishing apparatus using the same
TW094141816A TWI291911B (en) 2005-05-24 2005-11-29 Polishing pad and chemical mechanical polishing apparatus using the same
JP2005366162A JP4920965B2 (ja) 2005-05-24 2005-12-20 研磨パッド及びこれを採用した化学的機械的研磨装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050043716A KR100721196B1 (ko) 2005-05-24 2005-05-24 연마패드 및 이를 이용한 화학적기계적연마장치

Publications (2)

Publication Number Publication Date
KR20060121497A KR20060121497A (ko) 2006-11-29
KR100721196B1 true KR100721196B1 (ko) 2007-05-23

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KR1020050043716A Expired - Fee Related KR100721196B1 (ko) 2005-05-24 2005-05-24 연마패드 및 이를 이용한 화학적기계적연마장치

Country Status (4)

Country Link
US (1) US7357698B2 (https=)
JP (1) JP4920965B2 (https=)
KR (1) KR100721196B1 (https=)
TW (1) TWI291911B (https=)

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SG11201703114QA (en) 2014-10-17 2017-06-29 Applied Materials Inc Cmp pad construction with composite material properties using additive manufacturing processes
TWI549781B (zh) * 2015-08-07 2016-09-21 智勝科技股份有限公司 研磨墊、研磨系統及研磨方法
KR20230169424A (ko) 2015-10-30 2023-12-15 어플라이드 머티어리얼스, 인코포레이티드 원하는 제타 전위를 가진 연마 제품을 형성하는 장치 및 방법
US10593574B2 (en) 2015-11-06 2020-03-17 Applied Materials, Inc. Techniques for combining CMP process tracking data with 3D printed CMP consumables
US10391605B2 (en) 2016-01-19 2019-08-27 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
CN106564004B (zh) * 2016-11-17 2018-10-19 湖北鼎龙控股股份有限公司 一种抛光垫
US10777418B2 (en) * 2017-06-14 2020-09-15 Rohm And Haas Electronic Materials Cmp Holdings, I Biased pulse CMP groove pattern
US10857647B2 (en) * 2017-06-14 2020-12-08 Rohm And Haas Electronic Materials Cmp Holdings High-rate CMP polishing method
US10857648B2 (en) * 2017-06-14 2020-12-08 Rohm And Haas Electronic Materials Cmp Holdings Trapezoidal CMP groove pattern
US10586708B2 (en) * 2017-06-14 2020-03-10 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Uniform CMP polishing method
US11471999B2 (en) 2017-07-26 2022-10-18 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
WO2019032286A1 (en) 2017-08-07 2019-02-14 Applied Materials, Inc. ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME
CN108381371B (zh) * 2018-03-16 2020-05-08 阜阳市战千里知识产权运营有限公司 一种用于加工圆柱形工件的双层研磨机
CN108500757A (zh) * 2018-03-16 2018-09-07 蚌埠市鸿鹄精工机械有限公司 一种圆盘式研磨机
CN108481153B (zh) * 2018-03-16 2020-05-08 阜阳市战千里知识产权运营有限公司 一种双层研磨机
CN108621025B (zh) * 2018-05-14 2020-05-08 阜阳市战千里知识产权运营有限公司 一种研磨机
KR20210042171A (ko) 2018-09-04 2021-04-16 어플라이드 머티어리얼스, 인코포레이티드 진보한 폴리싱 패드들을 위한 제형들
US11685015B2 (en) * 2019-01-28 2023-06-27 Taiwan Semiconductor Manufacturing Co., Ltd. Method and system for performing chemical mechanical polishing
US11878389B2 (en) 2021-02-10 2024-01-23 Applied Materials, Inc. Structures formed using an additive manufacturing process for regenerating surface texture in situ
CN113910101B (zh) * 2021-09-03 2023-01-31 广东粤港澳大湾区黄埔材料研究院 一种抛光垫
CN115106931B (zh) * 2022-06-23 2024-08-20 万华化学集团电子材料有限公司 具有迷宫形凹槽的化学机械抛光垫及其应用
CN119282915A (zh) * 2024-12-12 2025-01-10 荣芯半导体(宁波)有限公司 一种研磨垫、研磨设备及研磨方法

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Also Published As

Publication number Publication date
KR20060121497A (ko) 2006-11-29
TW200640616A (en) 2006-12-01
JP4920965B2 (ja) 2012-04-18
JP2006332585A (ja) 2006-12-07
US7357698B2 (en) 2008-04-15
US20060270325A1 (en) 2006-11-30
TWI291911B (en) 2008-01-01

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