KR100721196B1 - 연마패드 및 이를 이용한 화학적기계적연마장치 - Google Patents
연마패드 및 이를 이용한 화학적기계적연마장치 Download PDFInfo
- Publication number
- KR100721196B1 KR100721196B1 KR1020050043716A KR20050043716A KR100721196B1 KR 100721196 B1 KR100721196 B1 KR 100721196B1 KR 1020050043716 A KR1020050043716 A KR 1020050043716A KR 20050043716 A KR20050043716 A KR 20050043716A KR 100721196 B1 KR100721196 B1 KR 100721196B1
- Authority
- KR
- South Korea
- Prior art keywords
- polishing pad
- groove pattern
- polishing
- chemical mechanical
- slurry
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020050043716A KR100721196B1 (ko) | 2005-05-24 | 2005-05-24 | 연마패드 및 이를 이용한 화학적기계적연마장치 |
| US11/289,942 US7357698B2 (en) | 2005-05-24 | 2005-11-29 | Polishing pad and chemical mechanical polishing apparatus using the same |
| TW094141816A TWI291911B (en) | 2005-05-24 | 2005-11-29 | Polishing pad and chemical mechanical polishing apparatus using the same |
| JP2005366162A JP4920965B2 (ja) | 2005-05-24 | 2005-12-20 | 研磨パッド及びこれを採用した化学的機械的研磨装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020050043716A KR100721196B1 (ko) | 2005-05-24 | 2005-05-24 | 연마패드 및 이를 이용한 화학적기계적연마장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20060121497A KR20060121497A (ko) | 2006-11-29 |
| KR100721196B1 true KR100721196B1 (ko) | 2007-05-23 |
Family
ID=37464076
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020050043716A Expired - Fee Related KR100721196B1 (ko) | 2005-05-24 | 2005-05-24 | 연마패드 및 이를 이용한 화학적기계적연마장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7357698B2 (https=) |
| JP (1) | JP4920965B2 (https=) |
| KR (1) | KR100721196B1 (https=) |
| TW (1) | TWI291911B (https=) |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8002611B2 (en) * | 2006-12-27 | 2011-08-23 | Texas Instruments Incorporated | Chemical mechanical polishing pad having improved groove pattern |
| JP2008290197A (ja) * | 2007-05-25 | 2008-12-04 | Nihon Micro Coating Co Ltd | 研磨パッド及び方法 |
| TWI409868B (zh) * | 2008-01-30 | 2013-09-21 | Iv Technologies Co Ltd | 研磨方法、研磨墊及研磨系統 |
| US9180570B2 (en) | 2008-03-14 | 2015-11-10 | Nexplanar Corporation | Grooved CMP pad |
| DE102011082777A1 (de) * | 2011-09-15 | 2012-02-09 | Siltronic Ag | Verfahren zum beidseitigen Polieren einer Halbleiterscheibe |
| WO2013106602A1 (en) * | 2012-01-10 | 2013-07-18 | Saint-Gobain Ceramics & Plastics, Inc. | Abrasive particles having particular shapes and methods of forming such particles |
| JP5936921B2 (ja) * | 2012-05-31 | 2016-06-22 | 富士紡ホールディングス株式会社 | 研磨パッド |
| TWI599447B (zh) | 2013-10-18 | 2017-09-21 | 卡博特微電子公司 | 具有偏移同心溝槽圖樣之邊緣排除區的cmp拋光墊 |
| CN103615982B (zh) * | 2013-11-19 | 2016-04-20 | 华中科技大学 | 一种光斑大小的测量装置和方法 |
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
| SG11201703114QA (en) | 2014-10-17 | 2017-06-29 | Applied Materials Inc | Cmp pad construction with composite material properties using additive manufacturing processes |
| TWI549781B (zh) * | 2015-08-07 | 2016-09-21 | 智勝科技股份有限公司 | 研磨墊、研磨系統及研磨方法 |
| KR20230169424A (ko) | 2015-10-30 | 2023-12-15 | 어플라이드 머티어리얼스, 인코포레이티드 | 원하는 제타 전위를 가진 연마 제품을 형성하는 장치 및 방법 |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| CN106564004B (zh) * | 2016-11-17 | 2018-10-19 | 湖北鼎龙控股股份有限公司 | 一种抛光垫 |
| US10777418B2 (en) * | 2017-06-14 | 2020-09-15 | Rohm And Haas Electronic Materials Cmp Holdings, I | Biased pulse CMP groove pattern |
| US10857647B2 (en) * | 2017-06-14 | 2020-12-08 | Rohm And Haas Electronic Materials Cmp Holdings | High-rate CMP polishing method |
| US10857648B2 (en) * | 2017-06-14 | 2020-12-08 | Rohm And Haas Electronic Materials Cmp Holdings | Trapezoidal CMP groove pattern |
| US10586708B2 (en) * | 2017-06-14 | 2020-03-10 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Uniform CMP polishing method |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
| CN108381371B (zh) * | 2018-03-16 | 2020-05-08 | 阜阳市战千里知识产权运营有限公司 | 一种用于加工圆柱形工件的双层研磨机 |
| CN108500757A (zh) * | 2018-03-16 | 2018-09-07 | 蚌埠市鸿鹄精工机械有限公司 | 一种圆盘式研磨机 |
| CN108481153B (zh) * | 2018-03-16 | 2020-05-08 | 阜阳市战千里知识产权运营有限公司 | 一种双层研磨机 |
| CN108621025B (zh) * | 2018-05-14 | 2020-05-08 | 阜阳市战千里知识产权运营有限公司 | 一种研磨机 |
| KR20210042171A (ko) | 2018-09-04 | 2021-04-16 | 어플라이드 머티어리얼스, 인코포레이티드 | 진보한 폴리싱 패드들을 위한 제형들 |
| US11685015B2 (en) * | 2019-01-28 | 2023-06-27 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and system for performing chemical mechanical polishing |
| US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
| CN113910101B (zh) * | 2021-09-03 | 2023-01-31 | 广东粤港澳大湾区黄埔材料研究院 | 一种抛光垫 |
| CN115106931B (zh) * | 2022-06-23 | 2024-08-20 | 万华化学集团电子材料有限公司 | 具有迷宫形凹槽的化学机械抛光垫及其应用 |
| CN119282915A (zh) * | 2024-12-12 | 2025-01-10 | 荣芯半导体(宁波)有限公司 | 一种研磨垫、研磨设备及研磨方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001071256A (ja) | 1999-08-31 | 2001-03-21 | Shinozaki Seisakusho:Kk | 研磨パッドの溝形成方法及び装置並びに研磨パッド |
| KR20040070767A (ko) * | 2003-02-04 | 2004-08-11 | 아남반도체 주식회사 | 반도체 기판 연마장치의 패드 컨디셔너 |
Family Cites Families (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1925346A (en) * | 1931-02-11 | 1933-09-05 | Newall Eng | Screw-thread caliper gauge |
| US2429923A (en) * | 1943-02-22 | 1947-10-28 | Joseph V Cavicchi | Precision height gage |
| US2519942A (en) * | 1945-02-26 | 1950-08-22 | Curtiss Wright Corp | Adjustable stop attachment for height gauges |
| US2827707A (en) * | 1957-03-15 | 1958-03-25 | Standard Gage Co Inc | Height comparator gage |
| US3008240A (en) * | 1958-08-20 | 1961-11-14 | Johnson Gage Dev Company | Comparator gage with test part aligner |
| US3319339A (en) * | 1965-04-05 | 1967-05-16 | Endicott Machine And Tool Comp | Multi-height comparator and gauge |
| US3864834A (en) * | 1974-03-04 | 1975-02-11 | Herbert C Horton | Automatic centering height gauge attachment |
| GB2110371B (en) * | 1981-08-10 | 1985-01-30 | Mitutoyo Mfg Co Ltd | Height gauge |
| JPS58195101A (ja) * | 1982-05-08 | 1983-11-14 | Mitsutoyo Mfg Co Ltd | ハイトゲ−ジ |
| US4571838A (en) * | 1984-04-18 | 1986-02-25 | Stout Iii Wesley | Direct readout centerline measuring device and process |
| US5036596A (en) * | 1990-03-02 | 1991-08-06 | Gyoury Christopher J | Machine tool pre-setting tool |
| JPH07321076A (ja) * | 1994-05-24 | 1995-12-08 | Toshiba Corp | 半導体装置の製造方法と研磨装置 |
| US5547416A (en) * | 1994-08-26 | 1996-08-20 | Timms; Alfred R. | Skate sharpening gauge |
| US5921855A (en) * | 1997-05-15 | 1999-07-13 | Applied Materials, Inc. | Polishing pad having a grooved pattern for use in a chemical mechanical polishing system |
| JPH11333699A (ja) * | 1998-03-24 | 1999-12-07 | Sony Corp | 研磨パッド、研磨装置および研磨方法 |
| GB2345255B (en) * | 1998-12-29 | 2000-12-27 | United Microelectronics Corp | Chemical-Mechanical Polishing Pad |
| TW479000B (en) | 2000-02-24 | 2002-03-11 | United Microelectronics Corp | Polish pad for polishing semiconductor wafer |
| JP2002200555A (ja) * | 2000-12-28 | 2002-07-16 | Ebara Corp | 研磨工具および該研磨工具を具備したポリッシング装置 |
| US7121938B2 (en) * | 2002-04-03 | 2006-10-17 | Toho Engineering Kabushiki Kaisha | Polishing pad and method of fabricating semiconductor substrate using the pad |
| JP3849582B2 (ja) * | 2002-06-03 | 2006-11-22 | Jsr株式会社 | 研磨パッド及び複層型研磨パッド |
| US20040014413A1 (en) * | 2002-06-03 | 2004-01-22 | Jsr Corporation | Polishing pad and multi-layer polishing pad |
| US7377840B2 (en) * | 2004-07-21 | 2008-05-27 | Neopad Technologies Corporation | Methods for producing in-situ grooves in chemical mechanical planarization (CMP) pads, and novel CMP pad designs |
| JP2006527483A (ja) * | 2003-06-06 | 2006-11-30 | アプライド マテリアルズ インコーポレイテッド | 電気化学機械的研磨用の導電性研磨機器 |
| TWI227521B (en) | 2003-11-12 | 2005-02-01 | United Microelectronics Corp | Polishing element |
| US7125318B2 (en) | 2003-11-13 | 2006-10-24 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad having a groove arrangement for reducing slurry consumption |
| US6986705B2 (en) | 2004-04-05 | 2006-01-17 | Rimpad Tech Ltd. | Polishing pad and method of making same |
| KR20060046093A (ko) * | 2004-05-20 | 2006-05-17 | 제이에스알 가부시끼가이샤 | 화학 기계 연마 패드 및 화학 기계 연마 방법 |
| US6974372B1 (en) * | 2004-06-16 | 2005-12-13 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad having grooves configured to promote mixing wakes during polishing |
| JP4695386B2 (ja) * | 2004-12-01 | 2011-06-08 | 東洋ゴム工業株式会社 | 研磨パッド、研磨方法ならびに半導体デバイスの製造方法および半導体デバイス |
-
2005
- 2005-05-24 KR KR1020050043716A patent/KR100721196B1/ko not_active Expired - Fee Related
- 2005-11-29 US US11/289,942 patent/US7357698B2/en not_active Expired - Fee Related
- 2005-11-29 TW TW094141816A patent/TWI291911B/zh not_active IP Right Cessation
- 2005-12-20 JP JP2005366162A patent/JP4920965B2/ja not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001071256A (ja) | 1999-08-31 | 2001-03-21 | Shinozaki Seisakusho:Kk | 研磨パッドの溝形成方法及び装置並びに研磨パッド |
| KR20040070767A (ko) * | 2003-02-04 | 2004-08-11 | 아남반도체 주식회사 | 반도체 기판 연마장치의 패드 컨디셔너 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20060121497A (ko) | 2006-11-29 |
| TW200640616A (en) | 2006-12-01 |
| JP4920965B2 (ja) | 2012-04-18 |
| JP2006332585A (ja) | 2006-12-07 |
| US7357698B2 (en) | 2008-04-15 |
| US20060270325A1 (en) | 2006-11-30 |
| TWI291911B (en) | 2008-01-01 |
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