KR100698560B1 - 집적회로에 유일한 식별 기능을 제공하는 시스템 - Google Patents
집적회로에 유일한 식별 기능을 제공하는 시스템 Download PDFInfo
- Publication number
- KR100698560B1 KR100698560B1 KR1020017010496A KR20017010496A KR100698560B1 KR 100698560 B1 KR100698560 B1 KR 100698560B1 KR 1020017010496 A KR1020017010496 A KR 1020017010496A KR 20017010496 A KR20017010496 A KR 20017010496A KR 100698560 B1 KR100698560 B1 KR 100698560B1
- Authority
- KR
- South Korea
- Prior art keywords
- identification
- output
- integrated circuit
- cells
- cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L9/00—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols
- H04L9/08—Key distribution or management, e.g. generation, sharing or updating, of cryptographic keys or passwords
- H04L9/0861—Generation of secret information including derivation or calculation of cryptographic keys or passwords
- H04L9/0866—Generation of secret information including derivation or calculation of cryptographic keys or passwords involving user or device identifiers, e.g. serial number, physical or biometrical information, DNA, hand-signature or measurable physical characteristics
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
- H10W46/401—Marks applied to devices, e.g. for alignment or identification for identification or tracking
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
- H10W46/401—Marks applied to devices, e.g. for alignment or identification for identification or tracking
- H10W46/403—Marks applied to devices, e.g. for alignment or identification for identification or tracking for non-wireless electrical read out
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
- H10W46/601—Marks applied to devices, e.g. for alignment or identification for use after dicing
Landscapes
- Engineering & Computer Science (AREA)
- Computer Security & Cryptography (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Collating Specific Patterns (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/251,692 | 1999-02-17 | ||
| US09/251,692 US6161213A (en) | 1999-02-17 | 1999-02-17 | System for providing an integrated circuit with a unique identification |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20010104710A KR20010104710A (ko) | 2001-11-26 |
| KR100698560B1 true KR100698560B1 (ko) | 2007-03-21 |
Family
ID=22953011
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020017010496A Expired - Fee Related KR100698560B1 (ko) | 1999-02-17 | 2000-02-11 | 집적회로에 유일한 식별 기능을 제공하는 시스템 |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US6161213A (https=) |
| EP (1) | EP1203329A4 (https=) |
| JP (1) | JP3787070B2 (https=) |
| KR (1) | KR100698560B1 (https=) |
| CN (1) | CN1155909C (https=) |
| CA (1) | CA2362962C (https=) |
| HK (1) | HK1047981A1 (https=) |
| TW (1) | TW449846B (https=) |
| WO (1) | WO2000049538A1 (https=) |
Families Citing this family (189)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7017043B1 (en) * | 1999-03-19 | 2006-03-21 | The Regents Of The University Of California | Methods and systems for the identification of circuits and circuit designs |
| KR100610175B1 (ko) | 1999-03-24 | 2006-08-09 | 후지쯔 가부시끼가이샤 | 반도체 장치의 제조 방법 및 칩 식별 정보의 기록 방법 |
| US6674993B1 (en) * | 1999-04-30 | 2004-01-06 | Microvision, Inc. | Method and system for identifying data locations associated with real world observations |
| US6289455B1 (en) * | 1999-09-02 | 2001-09-11 | Crypotography Research, Inc. | Method and apparatus for preventing piracy of digital content |
| US6968303B1 (en) * | 2000-04-13 | 2005-11-22 | Advanced Micro Devices, Inc. | Automated system for extracting and combining tool trace data and wafer electrical test (WET) data for semiconductor processing |
| US7565541B1 (en) * | 2000-06-21 | 2009-07-21 | Microvision, Inc. | Digital fingerprint identification system |
| JP2002073424A (ja) * | 2000-08-31 | 2002-03-12 | Mitsubishi Electric Corp | 半導体装置、端末装置および通信方法 |
| US6772025B1 (en) * | 2000-09-28 | 2004-08-03 | Intel Corporation | Device “ID” encoding with use of protection devices |
| WO2002050910A1 (en) * | 2000-12-01 | 2002-06-27 | Hitachi, Ltd | Semiconductor integrated circuit device identifying method, semiconductor integrated circuit device producing method, and semiconductor integrated circuit device |
| US7380131B1 (en) | 2001-01-19 | 2008-05-27 | Xilinx, Inc. | Copy protection without non-volatile memory |
| US6960753B2 (en) * | 2001-01-24 | 2005-11-01 | Hewlett-Packard Development Company, L.P. | Photosensor arrays with encoded permanent information |
| KR100393214B1 (ko) * | 2001-02-07 | 2003-07-31 | 삼성전자주식회사 | 패드의 수를 최소화하기 위한 칩 식별 부호 인식 장치 및이를 내장한 반도체 장치 |
| FR2823398B1 (fr) * | 2001-04-04 | 2003-08-15 | St Microelectronics Sa | Extraction d'une donnee privee pour authentification d'un circuit integre |
| US6480136B1 (en) * | 2001-05-08 | 2002-11-12 | Analog Devices, Inc. | Modified repetitive cell matching technique for integrated circuits |
| FR2825873A1 (fr) * | 2001-06-11 | 2002-12-13 | St Microelectronics Sa | Stockage protege d'une donnee dans un circuit integre |
| US6601008B1 (en) | 2001-08-02 | 2003-07-29 | Lsi Logic Corporation | Parametric device signature |
| FR2829855A1 (fr) * | 2001-09-14 | 2003-03-21 | St Microelectronics Sa | Identification securisee par donnees biometriques |
| US20030075746A1 (en) * | 2001-10-22 | 2003-04-24 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device for determining identification code and application thereof |
| EP1359550A1 (fr) * | 2001-11-30 | 2003-11-05 | STMicroelectronics S.A. | Régéneration d'une quantité secrète à partir d'un identifiant d'un circuit intégré |
| EP1391853A1 (fr) | 2001-11-30 | 2004-02-25 | STMicroelectronics S.A. | Diversification d'un identifiant unique d'un circuit intégré |
| FR2833119A1 (fr) | 2001-11-30 | 2003-06-06 | St Microelectronics Sa | Generation de quantites secretes d'identification d'un circuit integre |
| JP4159779B2 (ja) * | 2001-12-28 | 2008-10-01 | 株式会社半導体エネルギー研究所 | 半導体装置、電子機器 |
| DE10201645B4 (de) * | 2002-01-17 | 2007-04-26 | Infineon Technologies Ag | Verfahren zur Codierung und Authentifizierung von Halbleiterschaltungen |
| DE10203435A1 (de) * | 2002-01-28 | 2003-07-31 | Kostal Leopold Gmbh & Co Kg | Schaltungsanordnung sowie Verfahren zum Zuordnen eines Mikrocontrollers zu einer Leiterstruktur |
| FR2835947A1 (fr) * | 2002-02-11 | 2003-08-15 | St Microelectronics Sa | Extraction d'un code binaire a partir de parametres physiques d'un circuit integre |
| US6727710B1 (en) * | 2002-03-28 | 2004-04-27 | Xilinx, Inc. | Structures and methods for determining the effects of high stress currents on conducting layers and contacts in integrated circuits |
| US7840803B2 (en) * | 2002-04-16 | 2010-11-23 | Massachusetts Institute Of Technology | Authentication of integrated circuits |
| US6738788B1 (en) * | 2002-04-17 | 2004-05-18 | Icid, Llc | Database system using a record key having some randomly positioned, non-deterministic bits |
| US7131033B1 (en) * | 2002-06-21 | 2006-10-31 | Cypress Semiconductor Corp. | Substrate configurable JTAG ID scheme |
| US6952623B2 (en) * | 2002-07-02 | 2005-10-04 | Texas Instruments, Inc. | Permanent chip ID using FeRAM |
| WO2004017408A2 (en) * | 2002-08-15 | 2004-02-26 | Koninklijke Philips Electronics N.V. | Integrated circuit with id code and method of manufacturing same |
| JP2004078717A (ja) * | 2002-08-21 | 2004-03-11 | Matsushita Electric Ind Co Ltd | セルライブラリデータベース、並びにこれを用いた集積回路のタイミング検証システム及び耐電圧検証システム |
| US6802447B2 (en) * | 2002-08-26 | 2004-10-12 | Icid, Llc | Method of authenticating an object or entity using a random binary ID code subject to bit drift |
| DE10241141B4 (de) * | 2002-09-05 | 2015-07-16 | Infineon Technologies Ag | Halbleiter-Bauelement-Test-Verfahren für ein Halbleiter-Bauelement-Test-System mit reduzierter Anzahl an Test-Kanälen |
| JP2004134882A (ja) * | 2002-10-08 | 2004-04-30 | Pioneer Electronic Corp | 電子装置並びにその仕様識別方法及び製造方法 |
| US7231552B2 (en) * | 2002-10-24 | 2007-06-12 | Intel Corporation | Method and apparatus for independent control of devices under test connected in parallel |
| US6889305B2 (en) | 2003-02-14 | 2005-05-03 | Hewlett-Packard Development Company, L.P. | Device identification using a memory profile |
| US7558969B1 (en) | 2003-03-06 | 2009-07-07 | National Semiconductor Corporation | Anti-pirate circuit for protection against commercial integrated circuit pirates |
| EP1631987A2 (en) * | 2003-05-26 | 2006-03-08 | Koninklijke Philips Electronics N.V. | Semiconductor device, method of authentifying and system |
| USRE43922E1 (en) | 2003-06-13 | 2013-01-15 | National Semiconductor Corporation | Balanced cells with fabrication mismatches that produce a unique number generator |
| US7482657B1 (en) | 2003-06-13 | 2009-01-27 | National Semiconductor Corporation | Balanced cells with fabrication mismatches that produce a unique number generator |
| NZ560223A (en) | 2003-06-23 | 2008-12-24 | Sony Pictures Entertainment | Fingerprinting of data |
| WO2004114122A2 (en) * | 2003-06-26 | 2004-12-29 | Koninklijke Philips Electronics N.V. | Secure number generator and content distribution network employing the same |
| US7356627B2 (en) * | 2003-07-10 | 2008-04-08 | Nokia Corporation | Device identification |
| US8214169B2 (en) * | 2003-08-18 | 2012-07-03 | International Business Machines Corporation | Circuits and methods for characterizing random variations in device characteristics in semiconductor integrated circuits |
| US6939727B1 (en) | 2003-11-03 | 2005-09-06 | Lsi Logic Corporation | Method for performing statistical post processing in semiconductor manufacturing using ID cells |
| US7461037B2 (en) * | 2003-12-31 | 2008-12-02 | Nokia Siemens Networks Oy | Clustering technique for cyclic phenomena |
| US7210634B2 (en) * | 2004-02-12 | 2007-05-01 | Icid, Llc | Circuit for generating an identification code for an IC |
| US8358815B2 (en) | 2004-04-16 | 2013-01-22 | Validity Sensors, Inc. | Method and apparatus for two-dimensional finger motion tracking and control |
| US8229184B2 (en) | 2004-04-16 | 2012-07-24 | Validity Sensors, Inc. | Method and algorithm for accurate finger motion tracking |
| US8077935B2 (en) | 2004-04-23 | 2011-12-13 | Validity Sensors, Inc. | Methods and apparatus for acquiring a swiped fingerprint image |
| US8131026B2 (en) | 2004-04-16 | 2012-03-06 | Validity Sensors, Inc. | Method and apparatus for fingerprint image reconstruction |
| US8175345B2 (en) | 2004-04-16 | 2012-05-08 | Validity Sensors, Inc. | Unitized ergonomic two-dimensional fingerprint motion tracking device and method |
| US8165355B2 (en) | 2006-09-11 | 2012-04-24 | Validity Sensors, Inc. | Method and apparatus for fingerprint motion tracking using an in-line array for use in navigation applications |
| US8447077B2 (en) | 2006-09-11 | 2013-05-21 | Validity Sensors, Inc. | Method and apparatus for fingerprint motion tracking using an in-line array |
| US7102358B2 (en) * | 2004-06-29 | 2006-09-05 | Intel Corporation | Overvoltage detection apparatus, method, and system |
| US7589362B1 (en) * | 2004-07-01 | 2009-09-15 | Netlogic Microsystems, Inc. | Configurable non-volatile logic structure for characterizing an integrated circuit device |
| JP4530229B2 (ja) * | 2004-07-05 | 2010-08-25 | 株式会社日立超エル・エス・アイ・システムズ | カード認証システム |
| FR2875949A1 (fr) * | 2004-09-28 | 2006-03-31 | St Microelectronics Sa | Verrouillage d'un circuit integre |
| WO2006041780A1 (en) | 2004-10-04 | 2006-04-20 | Validity Sensors, Inc. | Fingerprint sensing assemblies comprising a substrate |
| US7818640B1 (en) | 2004-10-22 | 2010-10-19 | Cypress Semiconductor Corporation | Test system having a master/slave JTAG controller |
| WO2006053304A2 (en) | 2004-11-12 | 2006-05-18 | Pufco, Inc. | Volatile device keys and applications thereof |
| JP4524176B2 (ja) * | 2004-12-17 | 2010-08-11 | パナソニック株式会社 | 電子デバイスの製造方法 |
| US20060133607A1 (en) * | 2004-12-22 | 2006-06-22 | Seagate Technology Llc | Apparatus and method for generating a secret key |
| US7370190B2 (en) * | 2005-03-03 | 2008-05-06 | Digimarc Corporation | Data processing systems and methods with enhanced bios functionality |
| US7577850B2 (en) * | 2005-04-15 | 2009-08-18 | Lsi Corporation | Security application using silicon fingerprint identification |
| US7813507B2 (en) * | 2005-04-21 | 2010-10-12 | Intel Corporation | Method and system for creating random cryptographic keys in hardware |
| DE102005024379A1 (de) * | 2005-05-27 | 2006-11-30 | Universität Mannheim | Verfahren zur Erzeugung und/oder Einprägung eines wiedergewinnbaren kryptographischen Schlüssels bei der Herstellung einer topographischen Struktur |
| US7265567B2 (en) * | 2005-05-31 | 2007-09-04 | Delphi Technologies, Inc. | First die indicator for integrated circuit wafer |
| EP1926138A4 (en) * | 2005-08-18 | 2011-06-22 | Advantest Corp | METHOD FOR IDENTIFYING FACILITIES, METHOD FOR PRODUCING FACILITIES AND ELECTRONIC EQUIPMENT |
| KR100618051B1 (ko) * | 2005-09-08 | 2006-08-30 | 삼성전자주식회사 | 전압 글리치를 검출하기 위한 장치와 검출방법 |
| KR101366376B1 (ko) * | 2006-01-24 | 2014-02-24 | 베라요, 인크. | 신호 제너레이터에 기반한 장치 보안 |
| EP2011123B1 (en) | 2006-04-13 | 2015-03-04 | Nxp B.V. | Semiconductor device identifier generation method and semiconductor device |
| US7787034B2 (en) * | 2006-04-27 | 2010-08-31 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Identification of integrated circuits using pixel or memory cell characteristics |
| US7802156B2 (en) * | 2006-05-31 | 2010-09-21 | Lsi Corporation | Identification circuit with repeatable output code |
| US20080052029A1 (en) * | 2006-08-24 | 2008-02-28 | Lsi Logic Corporation | Unique binary identifier using existing state elements |
| US7603637B2 (en) * | 2006-08-24 | 2009-10-13 | Lsi Corporation | Secure, stable on chip silicon identification |
| US7676726B2 (en) * | 2006-08-24 | 2010-03-09 | Lsi Corporation | Stabilization for random chip identifier circuit |
| US8165291B2 (en) * | 2006-08-24 | 2012-04-24 | Lsi Corporation | Random seed stability with fuses |
| WO2008056612A1 (en) * | 2006-11-06 | 2008-05-15 | Panasonic Corporation | Information security apparatus |
| US8347091B2 (en) * | 2006-11-06 | 2013-01-01 | Panasonic Corporation | Authenticator apparatus |
| US7516426B2 (en) * | 2006-11-20 | 2009-04-07 | International Business Machines Corporation | Methods of improving operational parameters of pair of matched transistors and set of transistors |
| JP2008130856A (ja) * | 2006-11-22 | 2008-06-05 | Hitachi Ulsi Systems Co Ltd | 半導体装置と検証方法 |
| CN101009215A (zh) * | 2007-01-26 | 2007-08-01 | 四川登巅微电子有限公司 | 一种集成电路随机序列号产生的方法 |
| US8107212B2 (en) | 2007-04-30 | 2012-01-31 | Validity Sensors, Inc. | Apparatus and method for protecting fingerprint sensing circuitry from electrostatic discharge |
| US7877712B2 (en) | 2007-05-07 | 2011-01-25 | International Business Machines Corporation | System for and method of verifying IC authenticity |
| US8290150B2 (en) | 2007-05-11 | 2012-10-16 | Validity Sensors, Inc. | Method and system for electronically securing an electronic device using physically unclonable functions |
| US8690065B2 (en) | 2007-08-15 | 2014-04-08 | Nxp B.V. | Secure storage of a codeword within an integrated circuit |
| US8782396B2 (en) * | 2007-09-19 | 2014-07-15 | Verayo, Inc. | Authentication with physical unclonable functions |
| US7893699B2 (en) * | 2007-12-03 | 2011-02-22 | Infineon Technologies Ag | Method for identifying electronic circuits and identification device |
| US8276816B2 (en) | 2007-12-14 | 2012-10-02 | Validity Sensors, Inc. | Smart card system with ergonomic fingerprint sensor and method of using |
| US8204281B2 (en) | 2007-12-14 | 2012-06-19 | Validity Sensors, Inc. | System and method to remove artifacts from fingerprint sensor scans |
| US8432250B2 (en) * | 2008-03-31 | 2013-04-30 | Lsi Corporation | Process variation based microchip identification |
| US8116540B2 (en) | 2008-04-04 | 2012-02-14 | Validity Sensors, Inc. | Apparatus and method for reducing noise in fingerprint sensing circuits |
| GB2474999B (en) | 2008-07-22 | 2013-02-20 | Validity Sensors Inc | System and method for securing a device component |
| US8966660B2 (en) * | 2008-08-07 | 2015-02-24 | William Marsh Rice University | Methods and systems of digital rights management for integrated circuits |
| US8391568B2 (en) | 2008-11-10 | 2013-03-05 | Validity Sensors, Inc. | System and method for improved scanning of fingerprint edges |
| TWI498827B (zh) * | 2008-11-21 | 2015-09-01 | Verayo Inc | 非連網射頻辨識裝置物理不可複製功能之鑑認技術 |
| US8015514B2 (en) * | 2008-12-29 | 2011-09-06 | International Business Machines Corporation | Random personalization of chips during fabrication |
| US8278946B2 (en) | 2009-01-15 | 2012-10-02 | Validity Sensors, Inc. | Apparatus and method for detecting finger activity on a fingerprint sensor |
| US8600122B2 (en) | 2009-01-15 | 2013-12-03 | Validity Sensors, Inc. | Apparatus and method for culling substantially redundant data in fingerprint sensing circuits |
| US8374407B2 (en) | 2009-01-28 | 2013-02-12 | Validity Sensors, Inc. | Live finger detection |
| US8417754B2 (en) * | 2009-05-11 | 2013-04-09 | Empire Technology Development, Llc | Identification of integrated circuits |
| JP5550897B2 (ja) * | 2009-05-28 | 2014-07-16 | シャープ株式会社 | 半導体集積回路の識別子生成方法および識別子生成装置 |
| EP2264759B1 (fr) * | 2009-06-17 | 2012-07-04 | STMicroelectronics (Rousset) SAS | Elément d'identification d'une puce de circuit intégré |
| SG177597A1 (en) * | 2009-07-10 | 2012-03-29 | Certicom Corp | System and method for performing serialization of devices |
| US8811615B2 (en) * | 2009-08-05 | 2014-08-19 | Verayo, Inc. | Index-based coding with a pseudo-random source |
| US8468186B2 (en) * | 2009-08-05 | 2013-06-18 | Verayo, Inc. | Combination of values from a pseudo-random source |
| US8028924B2 (en) * | 2009-09-15 | 2011-10-04 | International Business Machines Corporation | Device and method for providing an integrated circuit with a unique identification |
| US9400911B2 (en) | 2009-10-30 | 2016-07-26 | Synaptics Incorporated | Fingerprint sensor and integratable electronic display |
| US9336428B2 (en) | 2009-10-30 | 2016-05-10 | Synaptics Incorporated | Integrated fingerprint sensor and display |
| US9274553B2 (en) | 2009-10-30 | 2016-03-01 | Synaptics Incorporated | Fingerprint sensor and integratable electronic display |
| US8610454B2 (en) * | 2010-01-12 | 2013-12-17 | Stc.Unm | System and methods for generating unclonable security keys in integrated circuits |
| US8421890B2 (en) | 2010-01-15 | 2013-04-16 | Picofield Technologies, Inc. | Electronic imager using an impedance sensor grid array and method of making |
| US8866347B2 (en) | 2010-01-15 | 2014-10-21 | Idex Asa | Biometric image sensing |
| US8791792B2 (en) | 2010-01-15 | 2014-07-29 | Idex Asa | Electronic imager using an impedance sensor grid array mounted on or about a switch and method of making |
| US9666635B2 (en) | 2010-02-19 | 2017-05-30 | Synaptics Incorporated | Fingerprint sensing circuit |
| US8645286B2 (en) * | 2010-02-23 | 2014-02-04 | Prior Knowledge, Inc. | Configurable circuitry for solving stochastic problems |
| US8716613B2 (en) | 2010-03-02 | 2014-05-06 | Synaptics Incoporated | Apparatus and method for electrostatic discharge protection |
| US7928762B1 (en) * | 2010-05-14 | 2011-04-19 | Raytheon Company | Systems and methods for digitally decoding integrated circuit blocks |
| US9001040B2 (en) | 2010-06-02 | 2015-04-07 | Synaptics Incorporated | Integrated fingerprint sensor and navigation device |
| US8619979B2 (en) | 2010-06-25 | 2013-12-31 | International Business Machines Corporation | Physically unclonable function implemented through threshold voltage comparison |
| JP5354611B2 (ja) * | 2010-07-29 | 2013-11-27 | 独立行政法人産業技術総合研究所 | 電子回路部品の真贋判定方法 |
| US8331096B2 (en) | 2010-08-20 | 2012-12-11 | Validity Sensors, Inc. | Fingerprint acquisition expansion card apparatus |
| US8583710B2 (en) * | 2010-09-17 | 2013-11-12 | Infineon Technologies Ag | Identification circuit and method for generating an identification bit using physical unclonable functions |
| KR101575831B1 (ko) * | 2010-10-04 | 2015-12-08 | 샌디스크 세미컨덕터 (상하이) 컴퍼니, 리미티드 | 개별 소자의 역방향 트레이서빌리티 및 반도체 디바이스의 순방향 트레이서빌리티 |
| US8427193B1 (en) | 2010-12-07 | 2013-04-23 | Xilinx, Inc. | Intellectual property core protection for integrated circuits |
| US8418006B1 (en) * | 2010-12-07 | 2013-04-09 | Xilinx, Inc. | Protecting a design for an integrated circuit using a unique identifier |
| US8386990B1 (en) * | 2010-12-07 | 2013-02-26 | Xilinx, Inc. | Unique identifier derived from an intrinsic characteristic of an integrated circuit |
| US8538097B2 (en) | 2011-01-26 | 2013-09-17 | Validity Sensors, Inc. | User input utilizing dual line scanner apparatus and method |
| US8594393B2 (en) | 2011-01-26 | 2013-11-26 | Validity Sensors | System for and method of image reconstruction with dual line scanner using line counts |
| WO2012122994A1 (en) | 2011-03-11 | 2012-09-20 | Kreft Heinz | Off-line transfer of electronic tokens between peer-devices |
| US9406580B2 (en) | 2011-03-16 | 2016-08-02 | Synaptics Incorporated | Packaging for fingerprint sensors and methods of manufacture |
| WO2012133965A1 (ko) * | 2011-03-31 | 2012-10-04 | 한양대학교 산학협력단 | 공정편차를 이용한 식별 키 생성 장치 및 방법 |
| US9105432B2 (en) | 2011-03-31 | 2015-08-11 | Ictk Co., Ltd | Apparatus and method for generating digital value |
| US8407656B2 (en) | 2011-06-24 | 2013-03-26 | International Business Machines Corporation | Method and structure for a transistor having a relatively large threshold voltage variation range and for a random number generator incorporating multiple essentially identical transistors having such a large threshold voltage variation range |
| US10043052B2 (en) | 2011-10-27 | 2018-08-07 | Synaptics Incorporated | Electronic device packages and methods |
| DE102011085487A1 (de) | 2011-10-31 | 2013-05-02 | Rohde & Schwarz Gmbh & Co. Kg | Integrierte Schaltung mit schlüsselbasierter Freischaltung von technischen Funktionen |
| US8590010B2 (en) * | 2011-11-22 | 2013-11-19 | International Business Machines Corporation | Retention based intrinsic fingerprint identification featuring a fuzzy algorithm and a dynamic key |
| US9195877B2 (en) | 2011-12-23 | 2015-11-24 | Synaptics Incorporated | Methods and devices for capacitive image sensing |
| US9785299B2 (en) | 2012-01-03 | 2017-10-10 | Synaptics Incorporated | Structures and manufacturing methods for glass covered electronic devices |
| US9069989B2 (en) | 2012-01-27 | 2015-06-30 | International Business Machines Corporation | Chip authentication using scan chains |
| US8618839B2 (en) * | 2012-03-13 | 2013-12-31 | International Business Machines Corporation | Utilizing a sense amplifier to select a suitable circuit |
| US9268991B2 (en) | 2012-03-27 | 2016-02-23 | Synaptics Incorporated | Method of and system for enrolling and matching biometric data |
| US9137438B2 (en) | 2012-03-27 | 2015-09-15 | Synaptics Incorporated | Biometric object sensor and method |
| US9251329B2 (en) | 2012-03-27 | 2016-02-02 | Synaptics Incorporated | Button depress wakeup and wakeup strategy |
| US9600709B2 (en) | 2012-03-28 | 2017-03-21 | Synaptics Incorporated | Methods and systems for enrolling biometric data |
| US9152838B2 (en) | 2012-03-29 | 2015-10-06 | Synaptics Incorporated | Fingerprint sensor packagings and methods |
| EP2836960B1 (en) | 2012-04-10 | 2018-09-26 | Idex Asa | Biometric sensing |
| US8950008B2 (en) | 2012-07-30 | 2015-02-03 | International Business Machines Corporation | Undiscoverable physical chip identification |
| US8741713B2 (en) * | 2012-08-10 | 2014-06-03 | International Business Machines Corporation | Reliable physical unclonable function for device authentication |
| FR2982975A1 (fr) * | 2012-12-11 | 2013-05-24 | Continental Automotive France | Procede de tracabilite de circuits integres de calculateurs, tels que des calculateurs de vehicules automobiles |
| US9449153B2 (en) * | 2012-12-20 | 2016-09-20 | Qualcomm Incorporated | Unique and unclonable platform identifiers using data-dependent circuit path responses |
| US9665762B2 (en) | 2013-01-11 | 2017-05-30 | Synaptics Incorporated | Tiered wakeup strategy |
| EP2833287B1 (en) * | 2013-07-29 | 2017-07-19 | Nxp B.V. | A puf method using and circuit having an array of bipolar transistors |
| WO2015031685A1 (en) | 2013-08-28 | 2015-03-05 | Stc.Unm | Systems and methods for analyzing stability using metal resistance variations |
| US10044513B2 (en) | 2013-09-02 | 2018-08-07 | Samsung Electronics Co., Ltd. | Security device having physical unclonable function |
| US11303461B2 (en) | 2013-09-02 | 2022-04-12 | Samsung Electronics Co., Ltd. | Security device having physical unclonable function |
| KR101489088B1 (ko) | 2013-09-03 | 2015-02-04 | (주) 아이씨티케이 | 식별키 생성 장치 및 방법 |
| FR3013175B1 (fr) * | 2013-11-08 | 2015-11-06 | Trixell | Circuit integre presentant plusieurs blocs identiques identifies |
| WO2015089346A1 (en) | 2013-12-13 | 2015-06-18 | Battelle Memorial Institute | Electronic component classification |
| EP2911086A1 (en) * | 2014-02-19 | 2015-08-26 | Renesas Electronics Europe GmbH | Integrated circuit with parts activated based on intrinsic features |
| US9568540B2 (en) | 2014-02-28 | 2017-02-14 | International Business Machines Corporation | Method for the characterization and monitoring of integrated circuits |
| WO2015134037A1 (en) * | 2014-03-07 | 2015-09-11 | Intel Corporation | Physically unclonable function circuit using resistive memory device |
| US9970986B2 (en) * | 2014-03-11 | 2018-05-15 | Cryptography Research, Inc. | Integrated circuit authentication |
| US9214211B2 (en) * | 2014-05-15 | 2015-12-15 | Winbond Electronics Corporation | Methods of and apparatus for determining unique die identifiers for multiple memory die within a common package |
| KR101575810B1 (ko) * | 2014-09-30 | 2015-12-08 | 고려대학교 산학협력단 | 물리적 복제 방지 기능을 갖는 플래시 메모리 장치 및 그 구현 방법 |
| US9703989B1 (en) | 2014-12-23 | 2017-07-11 | Altera Corporation | Secure physically unclonable function (PUF) error correction |
| JP6429167B2 (ja) * | 2015-03-17 | 2018-11-28 | 渡辺 浩志 | 電子装置ネットワークにおける物理的チップ認証方式 |
| US10176094B2 (en) | 2015-06-30 | 2019-01-08 | Renesas Electronics America Inc. | Common MCU self-identification information |
| US9698151B2 (en) * | 2015-10-08 | 2017-07-04 | Samsung Electronics Co., Ltd. | Vertical memory devices |
| WO2017066194A1 (en) | 2015-10-11 | 2017-04-20 | Renesas Electronics America Inc. | Data driven embedded application building and configuration |
| FR3051600B1 (fr) * | 2016-05-20 | 2018-12-07 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Dispositif electronique a identification de type puf |
| GB201609781D0 (en) | 2016-06-03 | 2016-07-20 | Irdeto Bv | Secured chip |
| US9864006B1 (en) | 2016-11-30 | 2018-01-09 | International Business Machines Corporation | Generating a unique die identifier for an electronic chip |
| US10706177B2 (en) * | 2017-02-13 | 2020-07-07 | Hiroshi Watanabe | Apparatus and method for chip identification and preventing malicious manipulation of physical addresses by incorporating a physical network with a logical network |
| JPWO2018174112A1 (ja) * | 2017-03-21 | 2020-05-14 | 渡辺 浩志 | ネットワーク上の装置認証技術 |
| EP3382606A1 (en) * | 2017-03-27 | 2018-10-03 | ASML Netherlands B.V. | Optimizing an apparatus for multi-stage processing of product units |
| US10381088B2 (en) * | 2017-03-30 | 2019-08-13 | Silicon Storage Technology, Inc. | System and method for generating random numbers based on non-volatile memory cell array entropy |
| US10789550B2 (en) | 2017-04-13 | 2020-09-29 | Battelle Memorial Institute | System and method for generating test vectors |
| US10964648B2 (en) | 2017-04-24 | 2021-03-30 | International Business Machines Corporation | Chip security fingerprint |
| TWI639847B (zh) * | 2017-06-27 | 2018-11-01 | Powerchip Technology Corporation | 積體電路晶片及其檢查方法 |
| CN109427667B (zh) * | 2017-09-01 | 2021-11-30 | 中芯国际集成电路制造(上海)有限公司 | 具有物理不可克隆功能的器件及其制造方法、芯片 |
| US11245520B2 (en) * | 2018-02-14 | 2022-02-08 | Lucid Circuit, Inc. | Systems and methods for generating identifying information based on semiconductor manufacturing process variations |
| US11709656B2 (en) | 2018-07-13 | 2023-07-25 | Ememory Technology Inc. | Short channel effect based random bit generator |
| US10685918B2 (en) | 2018-08-28 | 2020-06-16 | Semiconductor Components Industries, Llc | Process variation as die level traceability |
| US12531752B1 (en) | 2022-02-25 | 2026-01-20 | Honeywell Federal Manufacturing & Technologies, Llc | Method of authenticating integrated circuits using electrical characteristics of physically unclonable functions |
| CN115442879A (zh) * | 2022-09-07 | 2022-12-06 | 上海科技大学 | 一种唤醒接收机 |
| US12549348B2 (en) | 2023-04-11 | 2026-02-10 | Samsung Electronics Co., Ltd. | Method for random number generator seed creation using uninitialized hardware |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4996647A (en) * | 1989-03-27 | 1991-02-26 | Sperry Marine Inc. | Digital statistical processing for signal parameter determination |
| US5051895A (en) * | 1987-09-17 | 1991-09-24 | Hewlett-Packard Company | Apparatus and method for tracking and identifying printed circuit assemblies |
| US5615126A (en) * | 1994-08-24 | 1997-03-25 | Lsi Logic Corporation | High-speed internal interconnection technique for integrated circuits that reduces the number of signal lines through multiplexing |
| US5742526A (en) * | 1996-01-03 | 1998-04-21 | Micron Technology, Inc. | Apparatus and method for identifying an integrated device |
| US5787174A (en) * | 1992-06-17 | 1998-07-28 | Micron Technology, Inc. | Remote identification of integrated circuit |
| US20050051895A1 (en) * | 2003-09-04 | 2005-03-10 | Samsung Electro-Mechanics Co., Ltd. | BGA package having semiconductor chip with edge-bonding metal patterns formed thereon and method of manufacturing the same |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4150331A (en) * | 1977-07-29 | 1979-04-17 | Burroughs Corporation | Signature encoding for integrated circuits |
| US4419747A (en) * | 1981-09-14 | 1983-12-06 | Seeq Technology, Inc. | Method and device for providing process and test information in semiconductors |
| US4510673A (en) * | 1983-06-23 | 1985-04-16 | International Business Machines Corporation | Laser written chip identification method |
| JPS61222137A (ja) * | 1985-03-06 | 1986-10-02 | Sharp Corp | チップ識別用凹凸パターン形成方法 |
| US4766516A (en) * | 1987-09-24 | 1988-08-23 | Hughes Aircraft Company | Method and apparatus for securing integrated circuits from unauthorized copying and use |
| DE3736882C2 (de) * | 1987-10-30 | 1997-04-30 | Gao Ges Automation Org | Verfahren zur Echtheitsprüfung eines Datenträgers mit integriertem Schaltkreis |
| US5079725A (en) * | 1989-11-17 | 1992-01-07 | Ibm Corporation | Chip identification method for use with scan design systems and scan testing techniques |
| US5056061A (en) * | 1989-12-20 | 1991-10-08 | N. A. Philips Corporation | Circuit for encoding identification information on circuit dice using fet capacitors |
| KR950000099B1 (ko) * | 1991-11-12 | 1995-01-09 | 삼성전자 주식회사 | 바이너리 코딩(Bianry Coding)법을 이용한 반도체소자의 위치인식방법 |
| JP3659981B2 (ja) * | 1992-07-09 | 2005-06-15 | アドバンスト・マイクロ・ディバイシズ・インコーポレイテッド | ダイ特定情報に特徴付けられるダイ上の集積回路を含む装置 |
| US5553022A (en) * | 1994-12-27 | 1996-09-03 | Motorola Inc. | Integrated circuit identification apparatus and method |
| US5984190A (en) * | 1997-05-15 | 1999-11-16 | Micron Technology, Inc. | Method and apparatus for identifying integrated circuits |
-
1999
- 1999-02-17 US US09/251,692 patent/US6161213A/en not_active Ceased
-
2000
- 2000-02-11 CA CA002362962A patent/CA2362962C/en not_active Expired - Fee Related
- 2000-02-11 JP JP2000600207A patent/JP3787070B2/ja not_active Expired - Fee Related
- 2000-02-11 WO PCT/US2000/003558 patent/WO2000049538A1/en not_active Ceased
- 2000-02-11 KR KR1020017010496A patent/KR100698560B1/ko not_active Expired - Fee Related
- 2000-02-11 HK HK02107830.7A patent/HK1047981A1/zh unknown
- 2000-02-11 EP EP00908602A patent/EP1203329A4/en not_active Withdrawn
- 2000-02-11 CN CNB008061173A patent/CN1155909C/zh not_active Expired - Fee Related
- 2000-02-15 TW TW089102474A patent/TW449846B/zh not_active IP Right Cessation
-
2002
- 2002-12-12 US US10/318,583 patent/USRE40188E1/en not_active Expired - Lifetime
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5051895A (en) * | 1987-09-17 | 1991-09-24 | Hewlett-Packard Company | Apparatus and method for tracking and identifying printed circuit assemblies |
| US4996647A (en) * | 1989-03-27 | 1991-02-26 | Sperry Marine Inc. | Digital statistical processing for signal parameter determination |
| US5787174A (en) * | 1992-06-17 | 1998-07-28 | Micron Technology, Inc. | Remote identification of integrated circuit |
| US5615126A (en) * | 1994-08-24 | 1997-03-25 | Lsi Logic Corporation | High-speed internal interconnection technique for integrated circuits that reduces the number of signal lines through multiplexing |
| US5742526A (en) * | 1996-01-03 | 1998-04-21 | Micron Technology, Inc. | Apparatus and method for identifying an integrated device |
| US20050051895A1 (en) * | 2003-09-04 | 2005-03-10 | Samsung Electro-Mechanics Co., Ltd. | BGA package having semiconductor chip with edge-bonding metal patterns formed thereon and method of manufacturing the same |
Also Published As
| Publication number | Publication date |
|---|---|
| USRE40188E1 (en) | 2008-03-25 |
| EP1203329A1 (en) | 2002-05-08 |
| US6161213A (en) | 2000-12-12 |
| WO2000049538A1 (en) | 2000-08-24 |
| HK1047981A1 (zh) | 2003-03-14 |
| CN1346473A (zh) | 2002-04-24 |
| KR20010104710A (ko) | 2001-11-26 |
| JP3787070B2 (ja) | 2006-06-21 |
| EP1203329A4 (en) | 2010-04-28 |
| CA2362962A1 (en) | 2000-08-24 |
| TW449846B (en) | 2001-08-11 |
| CN1155909C (zh) | 2004-06-30 |
| CA2362962C (en) | 2008-05-13 |
| JP2002537646A (ja) | 2002-11-05 |
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