KR100675640B1 - 자기장결정화방법에 의한 액정표시소자 제조방법 - Google Patents
자기장결정화방법에 의한 액정표시소자 제조방법 Download PDFInfo
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- KR100675640B1 KR100675640B1 KR1020040089937A KR20040089937A KR100675640B1 KR 100675640 B1 KR100675640 B1 KR 100675640B1 KR 1020040089937 A KR1020040089937 A KR 1020040089937A KR 20040089937 A KR20040089937 A KR 20040089937A KR 100675640 B1 KR100675640 B1 KR 100675640B1
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- 238000000034 method Methods 0.000 title claims abstract description 84
- 238000002425 crystallisation Methods 0.000 title claims abstract description 76
- 230000008025 crystallization Effects 0.000 title claims abstract description 60
- 239000004973 liquid crystal related substance Substances 0.000 title description 32
- 239000000758 substrate Substances 0.000 claims abstract description 49
- 238000001816 cooling Methods 0.000 claims abstract description 32
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 30
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 26
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 26
- 239000010703 silicon Substances 0.000 claims abstract description 26
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 18
- 239000001257 hydrogen Substances 0.000 claims abstract description 18
- -1 hydrogen ions Chemical class 0.000 claims abstract description 18
- 238000005984 hydrogenation reaction Methods 0.000 claims abstract description 17
- 229910021419 crystalline silicon Inorganic materials 0.000 claims description 4
- 238000000059 patterning Methods 0.000 claims description 4
- GPRLSGONYQIRFK-UHFFFAOYSA-N hydron Chemical compound [H+] GPRLSGONYQIRFK-UHFFFAOYSA-N 0.000 claims description 3
- 238000005468 ion implantation Methods 0.000 claims 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract description 45
- 229920005591 polysilicon Polymers 0.000 abstract description 45
- 239000010410 layer Substances 0.000 description 68
- 238000004519 manufacturing process Methods 0.000 description 20
- 239000010408 film Substances 0.000 description 12
- 239000010409 thin film Substances 0.000 description 10
- 238000010438 heat treatment Methods 0.000 description 8
- 230000006641 stabilisation Effects 0.000 description 7
- 238000011105 stabilization Methods 0.000 description 7
- 239000012535 impurity Substances 0.000 description 6
- 229910052581 Si3N4 Inorganic materials 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 5
- 229910052814 silicon oxide Inorganic materials 0.000 description 5
- 239000011229 interlayer Substances 0.000 description 4
- 238000002161 passivation Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 229910004205 SiNX Inorganic materials 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000003054 catalyst Substances 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000005499 laser crystallization Methods 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000009477 glass transition Effects 0.000 description 1
- 229910021478 group 5 element Inorganic materials 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66742—Thin film unipolar transistors
- H01L29/6675—Amorphous silicon or polysilicon transistors
- H01L29/66757—Lateral single gate single channel transistors with non-inverted structure, i.e. the channel layer is formed before the gate
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B30/00—Production of single crystals or homogeneous polycrystalline material with defined structure characterised by the action of electric or magnetic fields, wave energy or other specific physical conditions
- C30B30/04—Production of single crystals or homogeneous polycrystalline material with defined structure characterised by the action of electric or magnetic fields, wave energy or other specific physical conditions using magnetic fields
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/326—Application of electric currents or fields, e.g. for electroforming
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- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
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- Optics & Photonics (AREA)
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- Thin Film Transistor (AREA)
Abstract
Description
그러나 도 1을 참조하면 AMFC결정화된 실리콘을 사용하는 박막트랜지스터는 문턱전압이 많이 음의 값으로 이동하였으며 포화전류전압(Vs) 또한 약 40볼트에 이르러 소자에 적용하기 어렵다는 문제가 있다.
도 2는 본 발명의 자기장결정화 단계를 나타내는 순서도이다.
상기 자기장결정화에 의해 본 발명은 첫째 균질한 실리콘 결정질을 얻을 수 있다. 액정표시장치의 구동소자로 특히 화소부의 구동소자로 폴리실리콘을 적용할 경우, 균일한 화질을 얻기 위해 특성의 균일한 구동소자의 사용이 필수적이다. 비록 구동소자의 동작속도가 빠르더라도 균일성이 나쁘면, 화면에 얼룩이 발생하는 등 화질저하를 초래한다. 그러므로 본 발명에 의해 형성되는 액정표시소자는 균일한 동작특성을 가지는 장점이 있다.
Claims (10)
- 기판상에 비정질실리콘층을 형성하는 단계;상기 기판을 예열하는 단계;교번 자기장을 상기 기판상에 인가하면서 비정질실리콘층을 결정화하는 단계;상기 결정화된 실리콘층을 냉각하면서 수소이온을 주입하는 단계;상기 결정화된 실리콘층을 패터닝하여 액티브층을 형성하는 단계;상기 액티브층상에 게이트절연층을 형성하는 단계;상기 게이트절연층상에 게이트전극을 형성하는 단계;상기 액티브층의 소스 및 드레인영역과 각각 연결되는 소스 및 드레인전극을 형성하는 단계;상기 드레인전극과 연결되는 화소전극을 형성하는 단계를 포함하는 것을 특징으로 하는 액정표시소자 제조방법.
- 제 1 항에 있어서, 상기 결정화된 실리콘층의 냉각은 약 300℃~600℃사이에서 이루어지는 것을 특징으로 하는 액정표시소자 제조방법.
- 제 1 항에 있어서, 상기 냉각과정중에 주입된 수소이온에 의해 상기 결정화된 실리콘층이 수소화처리되는 것을 특징으로 하는 액정표시소자 제조방법.
- 제 1 항에 있어서, 상기 냉각과정과 수소이온의 주입공정은 동시에 이루어지 는 것을 특징으로 하는 액정표시소자 제조방법.
- 제 3 항에 있어서, 상기 수소화처리에 의해 결정화된 실리콘층의 문턱전압이 낮아지는 것을 특징으로 하는 액정표시소자 제조방법.
- 제 1 항에 있어서, 상기 자기장결정화 단계와 수소이온을 주입하는 단계는 인라인(in line)으로 구성된 자기장결정화 프로세스 챔버내에서 이루어지는 것을 특징으로 하는 액정표시소자 제조방법.
- 기판상에 비정질실리콘층을 형성하는 단계;상기 기판을 예열하는 단계;교번자기장을 상기 기판상에 인가하면서 상기 비정질실리콘층을 결정화하는 단계;상기 결정화된 실리콘층을 냉각하면서 수소이온을 주입하는 단계를 포함하는 결정화방법을 이용하는 것을 특징으로 하는 액정표시소자 제조방법.
- 제 7 항에 있어서, 상기 결정질실리콘층이 냉각과정에서 주입되는 수소이온에의해 수소화처리되는 것을 특징으로 하는 액정표시소자 제조방법.
- 제 8 항에 있어서, 상기 결정화된 실리콘층의 냉각과 수소화처리는 동시에 이루어지는 것을 특징으로 하는 액정표시소자 제조방법.
- 제 7 항에 있어서, 상기 자기장 결정화단계와 수소화처리단계는 인라인(in-line)으로 구성된 자기장결정화 프로세스 챔버내에서 이루어지는 것을 특징으로 하는 액정표시소자 제조방법.
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JP4806030B2 (ja) | 2006-01-05 | 2011-11-02 | エルジー エレクトロニクス インコーポレイティド | 移動通信システムで信号を転送する方法 |
KR101002667B1 (ko) | 2008-07-02 | 2010-12-21 | 삼성모바일디스플레이주식회사 | 박막트랜지스터, 그의 제조방법 및 그를 포함하는유기전계발광표시장치 |
CN108281350B (zh) * | 2018-01-23 | 2020-09-01 | 武汉华星光电半导体显示技术有限公司 | 固相结晶方法与低温多晶硅tft基板的制作方法 |
US10515800B2 (en) | 2018-01-23 | 2019-12-24 | Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | Solid phase crystallization method and manufacturing method of low-temperature poly-silicon TFT substrate |
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