KR100671630B1 - 자기 탐상 장치의 누설 자기 검출 센서 및 스트립의온라인 탐상 방법 - Google Patents

자기 탐상 장치의 누설 자기 검출 센서 및 스트립의온라인 탐상 방법 Download PDF

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KR100671630B1
KR100671630B1 KR1020027007763A KR20027007763A KR100671630B1 KR 100671630 B1 KR100671630 B1 KR 100671630B1 KR 1020027007763 A KR1020027007763 A KR 1020027007763A KR 20027007763 A KR20027007763 A KR 20027007763A KR 100671630 B1 KR100671630 B1 KR 100671630B1
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South Korea
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magnetic
magnetic sensing
sensing element
strip
sensor
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KR20020077359A (ko
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요코타히로유키
도무라야스오
운자키히데아키
츠루오카시게토시
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제이에프이 스틸 가부시키가이샤
가부시키가이샤 시스템 하이텍
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • Electrochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
KR1020027007763A 2000-10-18 2001-10-18 자기 탐상 장치의 누설 자기 검출 센서 및 스트립의온라인 탐상 방법 Expired - Fee Related KR100671630B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2000317711 2000-10-18
JPJP-P-2000-00317711 2000-10-18
JP2001299768A JP3811039B2 (ja) 2000-10-18 2001-09-28 磁気探傷装置の漏洩磁気検出センサ
JPJP-P-2001-00299768 2001-09-28
PCT/JP2001/009159 WO2002033398A1 (en) 2000-10-18 2001-10-18 Leakage magnetism detecting sensor of magnetic penetration apparatus

Publications (2)

Publication Number Publication Date
KR20020077359A KR20020077359A (ko) 2002-10-11
KR100671630B1 true KR100671630B1 (ko) 2007-01-18

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US (1) US6774627B2 (enExample)
EP (1) EP1327882B1 (enExample)
JP (1) JP3811039B2 (enExample)
KR (1) KR100671630B1 (enExample)
CN (1) CN1225655C (enExample)
CA (1) CA2396205C (enExample)
WO (1) WO2002033398A1 (enExample)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3811039B2 (ja) 2000-10-18 2006-08-16 Ｊｆｅスチール株式会社 磁気探傷装置の漏洩磁気検出センサ
US6911826B2 (en) * 2001-06-12 2005-06-28 General Electric Company Pulsed eddy current sensor probes and inspection methods
US7007371B1 (en) * 2003-09-24 2006-03-07 Sauer-Danfoss Inc. Method of manufacturing a magnetic strip magnet speed ring
DE102004035174B4 (de) * 2004-07-16 2006-08-10 V&M Deutschland Gmbh Verfahren und Vorrichtung zur zerstörungsfreien Prüfung von Rohren
KR20070072500A (ko) * 2004-10-28 2007-07-04 도요 고한 가부시키가이샤 전지 외장 케이스의 흠집의 검사 장치 및 검사 방법
CN100432665C (zh) * 2005-08-05 2008-11-12 营口市北方检测设备有限公司 钢制品表层缺陷的双场漏磁通的在线检测装置和检测方法
JP4825525B2 (ja) * 2006-02-01 2011-11-30 株式会社日立ビルシステム ワイヤロープの探傷装置
CN100427947C (zh) * 2006-06-16 2008-10-22 清华大学 大面积钢板缺陷漏磁检测方法
JP4295774B2 (ja) * 2006-07-20 2009-07-15 株式会社日立ビルシステム ワイヤーロープの探傷装置
US9170234B2 (en) * 2006-11-01 2015-10-27 Industry-Academic Cooperation Foundation, Chosun University Magnetic sensor array and apparatus for detecting defect using the magnetic sensor array
CN101595383B (zh) * 2007-01-31 2012-10-24 三菱电机株式会社 钢丝绳探伤装置
JP5186837B2 (ja) * 2007-08-23 2013-04-24 Ｊｆｅスチール株式会社 微小凹凸表面欠陥の検出方法及び装置
CN100588965C (zh) * 2007-09-25 2010-02-10 王祥国 铁道微磁探伤仪及其探伤方法
JP2010014701A (ja) * 2008-06-04 2010-01-21 Toshiba Corp アレイ型磁気センサ基板
JP5791279B2 (ja) * 2011-01-06 2015-10-07 三菱重工業株式会社 付着物計測装置及び付着物計測方法並びに付着物計測プログラム
CN102590328B (zh) * 2012-02-14 2015-01-21 厦门大学 一种永磁与交直流复合的漏磁检测方法
CN103197264B (zh) * 2013-03-25 2015-07-08 中国石油天然气股份有限公司 漏磁检测传感器的聚磁装置及漏磁检测装置
CN103760223B (zh) * 2014-02-19 2015-04-15 华中科技大学 一种基于体表反向场的内外伤漏磁检测区分方法与装置
CN104502442B (zh) * 2014-08-28 2017-06-23 西红柿科技（武汉）有限公司 一种具有磁罩的漏磁检测仪
CN104777216B (zh) * 2015-04-29 2017-06-27 华中科技大学 一种适用于点型缺陷的磁轭式局部微磁化检测装置
CN105699481B (zh) * 2016-03-18 2019-03-26 中国计量学院 一种承压设备近表面微小裂纹检测装置
DE102016124522A1 (de) * 2016-12-15 2018-06-21 Thyssenkrupp Ag Verfahren zur Inspektion eines Stahlbands
JP2018189388A (ja) * 2017-04-28 2018-11-29 Tdk株式会社 磁界センサ
JP6978913B2 (ja) 2017-12-01 2021-12-08 住友化学株式会社 欠陥測定装置、欠陥測定方法および検査プローブ
EP3961203B1 (en) * 2019-04-24 2022-11-30 JFE Steel Corporation Leakage magnetic flux flaw inspection device
CN114829922B (zh) 2019-12-20 2024-10-01 杰富意钢铁株式会社 漏磁检查装置及缺陷检查方法
CN114829921B (zh) 2019-12-20 2025-08-15 杰富意钢铁株式会社 漏磁检查装置及缺陷检查方法
JP7637574B2 (ja) * 2021-06-15 2025-02-28 株式会社日立ビルシステム ワイヤーロープ探傷装置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4087749A (en) * 1977-01-25 1978-05-02 The United States Of America As Represented By The Secretary Of The Army Method and apparatus for normalizing the outputs of sequentially scanned magnetic flaw detectors
DE2906436C2 (de) * 1979-02-20 1983-11-24 Institut Dr. Friedrich Förster Prüfgerätebau GmbH & Co KG, 7410 Reutlingen Anordnung zum Abtasten der Oberfläche eines magnetisierten ferromagnetischen Prüfgutes
JPS58153157A (ja) * 1982-03-05 1983-09-12 Shimadzu Corp 磁気探傷装置の磁気検出器
JPS6323670A (ja) * 1986-04-25 1988-01-30 バイオ−ポリマ−ズ　インコ−ポレ−テツド 接着・被覆組成物とその使用方法
US5030230A (en) * 1986-05-16 1991-07-09 Great Plains Eye Clinic, Ltd. Corneal implant
JPH0339466A (ja) * 1989-07-06 1991-02-20 Kawasaki Steel Corp 磁気シールド機能を有する真空蒸着装置
JPH0357952A (ja) * 1989-07-26 1991-03-13 Suzukou Shoji Kk 表面傷の探傷装置
US5089776A (en) * 1989-09-25 1992-02-18 Nkk Corporation Apparatus for detecting defects in a moving steel strip with a magnetizing yoke and a sensor placed on opposite sides of the strip
WO1992014145A1 (en) 1991-02-04 1992-08-20 Nkk Corporation Magnetic inspecting method and device therefor
JPH04296648A (ja) * 1991-03-27 1992-10-21 Nippon Steel Corp 磁気探傷方法および装置
US5351555A (en) * 1991-07-29 1994-10-04 Magnetoelastic Devices, Inc. Circularly magnetized non-contact torque sensor and method for measuring torque using same
DE69306914T2 (de) * 1992-10-29 1997-05-07 Rolls-Royce And Associates Ltd., Derby, Derbyshire Verbesserung in Weggebern
JPH0738956U (ja) * 1993-12-24 1995-07-14 住友金属工業株式会社 漏洩磁気検出センサ
JPH07260745A (ja) * 1994-03-22 1995-10-13 Tokyo Gas Co Ltd 磁気センサの磁気シールド構造
JP3339762B2 (ja) * 1995-06-02 2002-10-28 新日本製鐵株式会社 鋼帯欠陥検出装置
FR2736719B1 (fr) * 1995-07-10 1997-09-05 Coflexip Procede et dispositif de controle magnetique de produits dont la paroi comporte au moins une couche en materiau magnetique
KR100246244B1 (ko) * 1995-10-31 2000-04-01 야마오카 요지로 자기탐상장치
JPH10293121A (ja) * 1997-04-17 1998-11-04 Sumitomo Metal Ind Ltd 微小きずの検出性能に優れた磁気探傷センサ
US6266983B1 (en) * 1998-12-09 2001-07-31 Kawasaki Steel Corporation Method and apparatus for detecting flaws in strip, method of manufacturing cold-rolled steel sheet and pickling equipment for hot-rolled steel strip
JP3811039B2 (ja) 2000-10-18 2006-08-16 Ｊｆｅスチール株式会社 磁気探傷装置の漏洩磁気検出センサ
JP2003107056A (ja) * 2001-09-28 2003-04-09 Nippon Steel Corp 漏洩磁束検出用磁界センサモジュール

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Publication number Publication date
CN1394279A (zh) 2003-01-29
CA2396205C (en) 2005-06-28
CA2396205A1 (en) 2002-04-25
EP1327882A1 (en) 2003-07-16
US6774627B2 (en) 2004-08-10
US20030038629A1 (en) 2003-02-27
CN1225655C (zh) 2005-11-02
JP3811039B2 (ja) 2006-08-16
EP1327882A4 (en) 2005-04-13
EP1327882B1 (en) 2013-03-13
WO2002033398A1 (en) 2002-04-25
KR20020077359A (ko) 2002-10-11
JP2002195984A (ja) 2002-07-10

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