KR100647216B1 - 고체 촬상 장치 및 그 제조 방법 - Google Patents
고체 촬상 장치 및 그 제조 방법 Download PDFInfo
- Publication number
- KR100647216B1 KR100647216B1 KR1020030067842A KR20030067842A KR100647216B1 KR 100647216 B1 KR100647216 B1 KR 100647216B1 KR 1020030067842 A KR1020030067842 A KR 1020030067842A KR 20030067842 A KR20030067842 A KR 20030067842A KR 100647216 B1 KR100647216 B1 KR 100647216B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- imaging device
- rib
- solid
- state imaging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/804—Containers or encapsulations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Camera Bodies And Camera Details Or Accessories (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2003-00123843 | 2003-04-28 | ||
| JP2003123843A JP3898666B2 (ja) | 2003-04-28 | 2003-04-28 | 固体撮像装置およびその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20040093362A KR20040093362A (ko) | 2004-11-05 |
| KR100647216B1 true KR100647216B1 (ko) | 2006-11-17 |
Family
ID=32985562
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020030067842A Expired - Fee Related KR100647216B1 (ko) | 2003-04-28 | 2003-09-30 | 고체 촬상 장치 및 그 제조 방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7273765B2 (enExample) |
| EP (1) | EP1473776A3 (enExample) |
| JP (1) | JP3898666B2 (enExample) |
| KR (1) | KR100647216B1 (enExample) |
| CN (1) | CN100490162C (enExample) |
| TW (1) | TWI253750B (enExample) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3782405B2 (ja) * | 2003-07-01 | 2006-06-07 | 松下電器産業株式会社 | 固体撮像装置およびその製造方法 |
| US20060001761A1 (en) * | 2003-12-23 | 2006-01-05 | Tessera, Inc. | Hermetically sealed image sensor module and method of fabricating same |
| TWI324829B (en) * | 2004-02-06 | 2010-05-11 | Advanced Semiconductor Eng | Optical semiconductor package and method for manufacturing the same |
| KR100673950B1 (ko) * | 2004-02-20 | 2007-01-24 | 삼성테크윈 주식회사 | 이미지 센서 모듈과 이를 구비하는 카메라 모듈 패키지 |
| KR100652375B1 (ko) * | 2004-06-29 | 2006-12-01 | 삼성전자주식회사 | 와이어 본딩 패키지를 포함하는 이미지 센서 모듈 구조물및 그 제조방법 |
| DE102006005419B4 (de) | 2006-02-03 | 2019-05-02 | Infineon Technologies Ag | Mikroelektromechanisches Halbleiterbauelement mit Hohlraumstruktur und Verfahren zur Herstellung desselben |
| US7807506B2 (en) * | 2006-02-03 | 2010-10-05 | Infineon Technologies Ag | Microelectromechanical semiconductor component with cavity structure and method for producing the same |
| KR100766505B1 (ko) * | 2006-10-03 | 2007-10-15 | 삼성전자주식회사 | 카메라 모듈 및 그 제조 방법 |
| TWI313943B (en) * | 2006-10-24 | 2009-08-21 | Chipmos Technologies Inc | Light emitting chip package and manufacturing thereof |
| US20080197375A1 (en) * | 2007-02-15 | 2008-08-21 | Wen-Kung Sung | Lateral-type light-emitting diode and method of manufacture thereof |
| US7528420B2 (en) * | 2007-05-23 | 2009-05-05 | Visera Technologies Company Limited | Image sensing devices and methods for fabricating the same |
| TW200941598A (en) * | 2008-03-18 | 2009-10-01 | Lingsen Precision Ind Ltd | Method for packaging semi-conductor chamber |
| US8551814B2 (en) * | 2010-03-11 | 2013-10-08 | Freescale Semiconductor, Inc. | Method of fabricating a semiconductor device that limits damage to elements of the semiconductor device that are exposed during processing |
| CN103095972A (zh) * | 2011-11-08 | 2013-05-08 | 闳乔光学股份有限公司 | 具有液晶组件的摄像单元及其制作方法 |
| USD668659S1 (en) * | 2011-11-15 | 2012-10-09 | Connectblue Ab | Module |
| USD680545S1 (en) * | 2011-11-15 | 2013-04-23 | Connectblue Ab | Module |
| USD680119S1 (en) * | 2011-11-15 | 2013-04-16 | Connectblue Ab | Module |
| USD668658S1 (en) * | 2011-11-15 | 2012-10-09 | Connectblue Ab | Module |
| USD689053S1 (en) * | 2011-11-15 | 2013-09-03 | Connectblue Ab | Module |
| USD692896S1 (en) * | 2011-11-15 | 2013-11-05 | Connectblue Ab | Module |
| US9197796B2 (en) * | 2011-11-23 | 2015-11-24 | Lg Innotek Co., Ltd. | Camera module |
| TWI626395B (zh) | 2013-06-11 | 2018-06-11 | 晶元光電股份有限公司 | 發光裝置 |
| US10211179B2 (en) * | 2016-04-20 | 2019-02-19 | Rohm Co., Ltd. | Semiconductor device |
| JP6899244B2 (ja) * | 2016-04-20 | 2021-07-07 | ローム株式会社 | 半導体装置 |
| JP7218126B2 (ja) | 2018-08-30 | 2023-02-06 | キヤノン株式会社 | 配線板を備えるユニット、モジュールおよび機器 |
| JP2020129629A (ja) * | 2019-02-12 | 2020-08-27 | エイブリック株式会社 | 光センサ装置およびその製造方法 |
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| JPH05267629A (ja) | 1992-03-19 | 1993-10-15 | Sony Corp | 固体撮像装置 |
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| JP4125112B2 (ja) | 2002-12-20 | 2008-07-30 | キヤノン株式会社 | 受光センサの製造方法 |
| JP3782405B2 (ja) * | 2003-07-01 | 2006-06-07 | 松下電器産業株式会社 | 固体撮像装置およびその製造方法 |
-
2003
- 2003-04-28 JP JP2003123843A patent/JP3898666B2/ja not_active Expired - Fee Related
- 2003-09-30 TW TW092126929A patent/TWI253750B/zh not_active IP Right Cessation
- 2003-09-30 US US10/676,186 patent/US7273765B2/en not_active Expired - Fee Related
- 2003-09-30 CN CNB031326870A patent/CN100490162C/zh not_active Expired - Fee Related
- 2003-09-30 EP EP03022003A patent/EP1473776A3/en not_active Withdrawn
- 2003-09-30 KR KR1020030067842A patent/KR100647216B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| TW200406912A (en) | 2004-05-01 |
| EP1473776A2 (en) | 2004-11-03 |
| JP3898666B2 (ja) | 2007-03-28 |
| US7273765B2 (en) | 2007-09-25 |
| CN1542982A (zh) | 2004-11-03 |
| EP1473776A3 (en) | 2006-04-05 |
| US20040212717A1 (en) | 2004-10-28 |
| KR20040093362A (ko) | 2004-11-05 |
| TWI253750B (en) | 2006-04-21 |
| CN100490162C (zh) | 2009-05-20 |
| JP2004327918A (ja) | 2004-11-18 |
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