KR100590131B1 - 열처리 장치 및 열처리 방법 - Google Patents
열처리 장치 및 열처리 방법 Download PDFInfo
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- KR100590131B1 KR100590131B1 KR1020037011124A KR20037011124A KR100590131B1 KR 100590131 B1 KR100590131 B1 KR 100590131B1 KR 1020037011124 A KR1020037011124 A KR 1020037011124A KR 20037011124 A KR20037011124 A KR 20037011124A KR 100590131 B1 KR100590131 B1 KR 100590131B1
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- 238000000034 method Methods 0.000 title claims abstract description 89
- 238000006243 chemical reaction Methods 0.000 claims abstract description 134
- 238000012545 processing Methods 0.000 claims abstract description 92
- 238000010438 heat treatment Methods 0.000 claims abstract description 53
- 238000006467 substitution reaction Methods 0.000 claims abstract description 17
- 238000007599 discharging Methods 0.000 claims abstract description 12
- 238000011144 upstream manufacturing Methods 0.000 claims description 16
- 239000007789 gas Substances 0.000 description 240
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 35
- 229910001873 dinitrogen Inorganic materials 0.000 description 35
- 235000012431 wafers Nutrition 0.000 description 20
- 239000010408 film Substances 0.000 description 15
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 10
- 238000010790 dilution Methods 0.000 description 8
- 239000012895 dilution Substances 0.000 description 8
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 230000001276 controlling effect Effects 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- MROCJMGDEKINLD-UHFFFAOYSA-N dichlorosilane Chemical compound Cl[SiH2]Cl MROCJMGDEKINLD-UHFFFAOYSA-N 0.000 description 3
- 239000012212 insulator Substances 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 229910021529 ammonia Inorganic materials 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- BUMGIEFFCMBQDG-UHFFFAOYSA-N dichlorosilicon Chemical compound Cl[Si]Cl BUMGIEFFCMBQDG-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000010926 purge Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 238000011946 reduction process Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 231100000331 toxic Toxicity 0.000 description 2
- 230000002588 toxic effect Effects 0.000 description 2
- 238000009530 blood pressure measurement Methods 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000003113 dilution method Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000012495 reaction gas Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
- F27D19/00—Arrangements of controlling devices
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- H01L21/67005—Apparatus not specifically provided for elsewhere
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- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/34—Nitrides
- C23C16/345—Silicon nitride
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C16/4408—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber by purging residual gases from the reaction chamber or gas lines
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C16/45519—Inert gas curtains
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45568—Porous nozzles
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27B—FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
- F27B17/00—Furnaces of a kind not covered by any preceding group
- F27B17/0016—Chamber type furnaces
- F27B17/0025—Especially adapted for treating semiconductor wafers
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
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- F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
- F27D21/00—Arrangements of monitoring devices; Arrangements of safety devices
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
- F27D7/00—Forming, maintaining, or circulating atmospheres in heating chambers
- F27D7/06—Forming or maintaining special atmospheres or vacuum within heating chambers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/314—Inorganic layers
- H01L21/318—Inorganic layers composed of nitrides
- H01L21/3185—Inorganic layers composed of nitrides of siliconnitrides
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- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
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- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/0217—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
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- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
- H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
- H01L21/02211—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound being a silane, e.g. disilane, methylsilane or chlorosilane
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- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
Abstract
Description
Claims (9)
- 피처리체가 반입 및 반출되는 반응 용기와,상기 반응 용기 내에 처리 가스를 도입하기 위한 처리 가스 도입부와,상기 처리 가스 도입부와는 별개로 설치되고 상기 반응 용기 내에 치환용 가스를 도입하기 위한 치환용 가스 도입부와,상기 반응 용기 내의 가스를 배출하기 위한 배기부와,상기 처리 가스 도입부, 상기 치환용 가스 도입부 및 상기 배기부에 접속되고, 상기 배기부를 제어하여 상기 반응 용기 내의 압력을 열처리시 보다도 낮게 하고, 다음에 상기 처리 가스 도입부 및 상기 치환용 가스 도입부를 제어하여 상기 처리 가스의 도입을 정지하여 상기 반응 용기 내에 치환용 가스를 도입하는 동시에 상기 배기부를 제어하여 상기 반응 용기 내의 압력을 열처리시 보다도 높게 하고, 다음에 상기 배기부를 제어하여 상기 반응 용기 내의 압력을 열처리시 보다도 낮게 하도록 되어 있는 제어부를 구비한 것을 특징으로 하는 열처리 장치.
- 제1항에 있어서, 상기 처리 가스 도입부는,상기 반응 용기 내에 처리 가스를 도입하기 위한 처리 가스 유로와,상기 반응 용기의 근방에 설치되고 상기 처리 가스 유로의 개폐를 행하는 제1 개폐 수단을 갖고 있으며,상기 제어부는 상기 제1 개폐 수단을 제어하도록 되어 있는 것을 특징으로 하는 열처리 장치.
- 제2항에 있어서, 상기 배기부는,상기 반응 용기 내의 가스를 배출하기 위한 배기로와,상기 배기로 중에 설치되고 상기 배기로의 개폐를 조정하여 상기 반응 용기 내의 압력을 조정하기 위한 압력 조정 수단을 갖고 있으며,상기 제어부는 상기 압력 조정 수단을 제어하도록 되어 있는 것을 특징으로 하는 열처리 장치.
- 제3항에 있어서, 상기 처리 가스 유로에 있어서의 상기 제1 개폐 수단에 대한 상류측 부분과 상기 배기로를, 상기 반응 용기를 우회하여 접속하는 바이패스로와,상기 바이패스로의 개폐를 행하는 제2 개폐 수단을 더 구비하는 것을 특징으로 하는 열처리 장치.
- 제4항에 있어서, 상기 처리 가스 유로에 있어서의 상기 바이패스로의 접속부에 대한 상류측 부분에, 상기 처리 가스 유로 내에 치환용 가스를 도입하기 위한 부치환용 가스 도입부가 설치되어 있는 것을 특징으로 하는 열처리 장치.
- 제5항에 있어서, 상기 부치환용 가스 도입부는,상기 처리 가스 유로 내에 치환용 가스를 도입하기 위한 부치환용 가스 유로와,상기 부치환용 가스 유로의 개폐를 행하는 제3 개폐 수단을 갖고 있는 것을 특징으로 하는 열처리 장치.
- 제6항에 있어서, 상기 제어부는, 상기 제2 개폐 수단 및 상기 제3 개폐 수단에도 접속되고, 상기 제1 개폐 수단 및 상기 제3 개폐 수단을 제어하여 상기 처리 가스의 도입을 정지하여 상기 처리 가스 유로 내에 치환용 가스를 도입하여 상기 처리 가스 유로 내부를 승압 상태로 하고, 다음에 상기 제2 개폐 수단을 제어하여 상기 처리 가스 유로 내의 가스를 상기 바이패스로를 거쳐서 배기하도록 되어 있는 것을 특징으로 하는 열처리 장치.
- 피처리체가 반입 및 반출되는 반응 용기와,상기 반응 용기 내에 처리 가스를 도입하기 위한 처리 가스 도입부와,상기 처리 가스 도입부와는 별개로 설치되고, 상기 반응 용기 내에 치환용 가스를 도입하기 위한 치환용 가스 도입부와,상기 반응 용기 내의 가스를 배출하기 위한 배기부를 구비한 열처리 장치를 사용하여 피처리체를 열처리하는 방법이며,열처리 종료 후에 실시되고, 상기 배기부를 제어하여 상기 반응 용기 내의 압력을 열처리시 보다도 낮게 하는 제1 감압 공정과,상기 제1 감압 공정 후에 실시되고, 상기 처리 가스 도입부 및 상기 치환용 가스 도입부를 제어하여 상기 처리 가스의 도입을 정지하여 상기 반응 용기 내에 치환용 가스를 도입하는 동시에 상기 배기부를 제어하여 상기 반응 용기 내의 압력을 열처리시 보다도 높게 하는 승압 공정과,상기 승압 공정 후에 실시되고, 상기 배기부를 제어하여 상기 반응 용기 내의 압력을 열처리시 보다도 낮게 하는 제2 감압 공정을 구비한 것을 특징으로 하는 열처리 방법.
- 피처리체가 반입 및 반출되는 반응 용기와,상기 반응 용기 내에 처리 가스를 도입하기 위한 처리 가스 도입부와,상기 처리 가스 도입부와는 별개로 설치되고, 상기 반응 용기 내에 치환용 가스를 도입하기 위한 치환용 가스 도입부와,상기 반응 용기 내의 가스를 배출하기 위한 배기부를 구비하고,상기 처리 가스 도입부는,상기 반응 용기 내에 처리 가스를 도입하기 위한 처리 가스 유로와,상기 반응 용기의 근방에 설치되고, 상기 처리 가스 유로의 개폐를 행하는 제1 개폐 수단을 갖고 있으며,상기 제어부는 상기 제1 개폐 수단을 제어하도록 되어 있으며,상기 배기부는, 상기 반응 용기 내의 가스를 배출하기 위한 배기로와, 상기 배기로 중에 설치되고, 상기 배기로의 개폐를 조정하여 상기 반응 용기 내의 압력 을 조정하기 위한 압력 조정 수단을 갖고 있으며,상기 제어부는 상기 압력 조정 수단을 제어하도록 되어 있으며,상기 처리 가스 유로에 있어서의 상기 제1 개폐 수단에 대한 상류측 부분과 상기 배기로를, 상기 반응 용기를 우회하여 접속하는 바이패스로와,상기 바이패스로의 개폐를 행하는 제2 개폐 수단을 더 구비하고,상기 처리 가스 유로에 있어서의 상기 바이패스로의 접속부에 대한 상류측 부분에, 상기 처리 가스 유로 내에 치환용 가스를 도입하기 위한 부치환용 가스 도입부가 설치되어 있으며,상기 부치환용 가스 도입부는, 상기 처리 가스 유로 내에 치환용 가스를 도입하기 위한 부치환용 가스 유로와, 상기 부치환용 가스 유로의 개폐를 행하는 제3 개폐 수단을 갖고 있는, 열처리 장치를 사용하여 피처리체를 열처리하는 방법이며,상기 제1 개폐 수단 및 상기 제3 개폐 수단을 제어하여 상기 처리 가스의 도입을 정지하여 상기 처리 가스 유로 내에 치환용 가스를 도입하여 상기 처리 가스 유로 내를 승압 상태로 하는 승압 공정과,상기 승압 공정 후에 실시되고, 상기 제2 개폐 수단을 제어하여 상기 처리 가스 유로 내의 가스를 상기 바이패스로를 거쳐서 배기하는 공정을 구비한 것을 특징으로 하는 열처리 방법.
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JP3985899B2 (ja) * | 2002-03-28 | 2007-10-03 | 株式会社日立国際電気 | 基板処理装置 |
JP4421393B2 (ja) * | 2004-06-22 | 2010-02-24 | 東京エレクトロン株式会社 | 基板処理装置 |
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KR100609065B1 (ko) * | 2004-08-04 | 2006-08-10 | 삼성전자주식회사 | 산화막 형성 장치 및 방법 |
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US20060156980A1 (en) | 2005-01-19 | 2006-07-20 | Samsung Electronics Co., Ltd. | Apparatus including 4-way valve for fabricating semiconductor device, method of controlling valve, and method of fabricating semiconductor device using the apparatus |
JP4506677B2 (ja) * | 2005-03-11 | 2010-07-21 | 東京エレクトロン株式会社 | 成膜方法、成膜装置及び記憶媒体 |
JP4698354B2 (ja) * | 2005-09-15 | 2011-06-08 | 株式会社リコー | Cvd装置 |
US7691757B2 (en) | 2006-06-22 | 2010-04-06 | Asm International N.V. | Deposition of complex nitride films |
JP4273145B2 (ja) * | 2006-09-13 | 2009-06-03 | エスペック株式会社 | 熱処理装置 |
KR100872312B1 (ko) * | 2007-05-04 | 2008-12-05 | 주식회사 디엠에스 | 에칭가스 제어시스템 |
US20090197424A1 (en) * | 2008-01-31 | 2009-08-06 | Hitachi Kokusai Electric Inc. | Substrate processing apparatus and method for manufacturing semiconductor device |
US20090212014A1 (en) * | 2008-02-27 | 2009-08-27 | Tokyo Electron Limited | Method and system for performing multiple treatments in a dual-chamber batch processing system |
US7833906B2 (en) | 2008-12-11 | 2010-11-16 | Asm International N.V. | Titanium silicon nitride deposition |
JP5966649B2 (ja) * | 2012-06-18 | 2016-08-10 | 東京エレクトロン株式会社 | 熱処理装置 |
US20140038421A1 (en) * | 2012-08-01 | 2014-02-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Deposition Chamber and Injector |
JP6020227B2 (ja) * | 2013-02-12 | 2016-11-02 | 東京エレクトロン株式会社 | ガス供給系及び成膜装置 |
KR20160026572A (ko) * | 2014-09-01 | 2016-03-09 | 삼성전자주식회사 | 기판 처리 장치 |
JP6486160B2 (ja) * | 2015-03-23 | 2019-03-20 | 東京エレクトロン株式会社 | 熱処理装置 |
JP2018186235A (ja) * | 2017-04-27 | 2018-11-22 | 東京エレクトロン株式会社 | 基板処理装置、インジェクタ内のパーティクル除去方法及び基板処理方法 |
US11393703B2 (en) * | 2018-06-18 | 2022-07-19 | Applied Materials, Inc. | Apparatus and method for controlling a flow process material to a deposition chamber |
JP7027565B2 (ja) * | 2018-09-11 | 2022-03-01 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法およびプログラム |
JP6651591B1 (ja) * | 2018-09-27 | 2020-02-19 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法 |
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CN1215538C (zh) | 2005-08-17 |
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EP1381079B1 (en) | 2007-01-03 |
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