KR100544970B1 - 포토레지스트 애시 잔류물의 제거 방법 - Google Patents

포토레지스트 애시 잔류물의 제거 방법

Info

Publication number
KR100544970B1
KR100544970B1 KR1020000007834A KR20000007834A KR100544970B1 KR 100544970 B1 KR100544970 B1 KR 100544970B1 KR 1020000007834 A KR1020000007834 A KR 1020000007834A KR 20000007834 A KR20000007834 A KR 20000007834A KR 100544970 B1 KR100544970 B1 KR 100544970B1
Authority
KR
South Korea
Prior art keywords
residue
gas
photoresist
ammonia
vapor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
KR1020000007834A
Other languages
English (en)
Korean (ko)
Other versions
KR20000058107A (ko
Inventor
베리3세이반루이스
라운드스스튜어트나단
오운스마이클숀
할록크존스코트
다이멘머하모드
Original Assignee
액셀리스 테크놀로지스, 인크.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 액셀리스 테크놀로지스, 인크. filed Critical 액셀리스 테크놀로지스, 인크.
Publication of KR20000058107A publication Critical patent/KR20000058107A/ko
Application granted granted Critical
Publication of KR100544970B1 publication Critical patent/KR100544970B1/ko
Assigned to 램 리써치 코포레이션 reassignment 램 리써치 코포레이션 권리의 전부이전등록 Assignors: 액셀리스 테크놀로지스, 인크.
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00—Cleaning of wafers, substrates or parts of devices
    • H10P70/20—Cleaning during device manufacture
    • H10P70/23—Cleaning during device manufacture during, before or after processing of insulating materials
    • H10P70/234—Cleaning during device manufacture during, before or after processing of insulating materials the processing being the formation of vias or contact holes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D17/00—Rigid or semi-rigid containers specially constructed to be opened by cutting or piercing, or by tearing of frangible members or portions
    • B65D17/28—Rigid or semi-rigid containers specially constructed to be opened by cutting or piercing, or by tearing of frangible members or portions at lines or points of weakness
    • B65D17/401—Rigid or semi-rigid containers specially constructed to be opened by cutting or piercing, or by tearing of frangible members or portions at lines or points of weakness characterised by having the line of weakness provided in an end wall
    • B65D17/4011—Rigid or semi-rigid containers specially constructed to be opened by cutting or piercing, or by tearing of frangible members or portions at lines or points of weakness characterised by having the line of weakness provided in an end wall for opening completely by means of a tearing tab
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D1/00—Rigid or semi-rigid containers having bodies formed in one piece, e.g. by casting metallic material, by moulding plastics, by blowing vitreous material, by throwing ceramic material, by moulding pulped fibrous material or by deep-drawing operations performed on sheet material
    • B65D1/12—Cans, casks, barrels, or drums
    • B65D1/14—Cans, casks, barrels, or drums characterised by shape
    • B65D1/16—Cans, casks, barrels, or drums characterised by shape of curved cross-section, e.g. cylindrical
    • B65D1/165—Cylindrical cans
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D43/00—Lids or covers for rigid or semi-rigid containers
    • B65D43/02—Removable lids or covers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D51/00—Closures not otherwise provided for
    • B65D51/002—Closures to be pierced by an extracting-device for the contents and fixed on the container by separate retaining means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D85/00—Containers, packaging elements or packages, specially adapted for particular articles or materials
    • B65D85/70—Containers, packaging elements or packages, specially adapted for particular articles or materials for materials not otherwise provided for
    • B65D85/72—Containers, packaging elements or packages, specially adapted for particular articles or materials for materials not otherwise provided for for edible or potable liquids, semiliquids, or plastic or pasty materials
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/42—Stripping or agents therefor
    • G03F7/427—Stripping or agents therefor using plasma means only
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00—Etching of wafers, substrates or parts of devices
    • H10P50/20—Dry etching; Plasma etching; Reactive-ion etching
    • H10P50/28—Dry etching; Plasma etching; Reactive-ion etching of insulating materials
    • H10P50/286—Dry etching; Plasma etching; Reactive-ion etching of insulating materials of organic materials
    • H10P50/287—Dry etching; Plasma etching; Reactive-ion etching of insulating materials of organic materials by chemical means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D2313/00—Connecting or fastening means
    • B65D2313/08—Double sided adhesive tape, e.g. for suspension of the container
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D2517/00—Containers specially constructed to be opened by cutting, piercing or tearing of wall portions, e.g. preserving cans or tins
    • B65D2517/0001—Details
    • B65D2517/0031—Reclosable openings
    • B65D2517/004—Reclosable openings by means of an additional element
    • B65D2517/0041—Reclosable openings by means of an additional element in the form of a cover

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Plasma & Fusion (AREA)
  • General Physics & Mathematics (AREA)
  • Drying Of Semiconductors (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
KR1020000007834A 1999-02-19 2000-02-18 포토레지스트 애시 잔류물의 제거 방법 Expired - Lifetime KR100544970B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12086699P 1999-02-19 1999-02-19
US60/120,866 1999-02-19

Publications (2)

Publication Number Publication Date
KR20000058107A KR20000058107A (ko) 2000-09-25
KR100544970B1 true KR100544970B1 (ko) 2006-01-24

Family

ID=22393001

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020000007834A Expired - Lifetime KR100544970B1 (ko) 1999-02-19 2000-02-18 포토레지스트 애시 잔류물의 제거 방법

Country Status (4)

Country Link
EP (1) EP1032026B1 (https=)
JP (1) JP2000241992A (https=)
KR (1) KR100544970B1 (https=)
DE (1) DE60040252D1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003092287A (ja) * 2001-09-19 2003-03-28 Nec Corp アッシング方法
KR100772125B1 (ko) * 2002-06-26 2007-10-31 이유브이 리미티드 라이어빌러티 코포레이션 방사 주입된 표면 오염을 감소시키는 공정
KR100474594B1 (ko) * 2002-08-28 2005-03-10 주식회사 하이닉스반도체 반도체 소자의 세정방법
US7875419B2 (en) 2002-10-29 2011-01-25 Semiconductor Energy Laboratory Co., Ltd. Method for removing resist pattern and method for manufacturing semiconductor device
JP2005159294A (ja) 2003-09-18 2005-06-16 Nec Kagoshima Ltd 基板処理方法及びそれに用いる薬液
JP5207728B2 (ja) * 2006-12-21 2013-06-12 富士フイルム株式会社 導電膜およびその製造方法
JP2013030625A (ja) * 2011-07-28 2013-02-07 Fujitsu Semiconductor Ltd 半導体装置の製造方法及び処理装置
CN111009459B (zh) * 2019-12-26 2022-08-16 北京北方华创微电子装备有限公司 含氟残留物去除方法、刻蚀方法和氧化层清洗方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01274426A (ja) * 1988-04-26 1989-11-02 Mitsubishi Electric Corp 半導体装置製造のポジレジスト除去方法
JPH0475323A (ja) * 1990-07-17 1992-03-10 Seiko Epson Corp レジスト除去法
KR19980068184A (ko) * 1997-02-17 1998-10-15 김광호 반도체장치 제조공정의 포토레지스트 제거방법
US5849639A (en) * 1997-11-26 1998-12-15 Lucent Technologies Inc. Method for removing etching residues and contaminants
KR20000004232A (ko) * 1998-06-30 2000-01-25 김영환 반도체 소자의 콘택 홀 형성 방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2853211B2 (ja) * 1989-11-01 1999-02-03 富士通株式会社 半導体装置の製造方法
JPH0410622A (ja) * 1990-04-27 1992-01-14 Tokyo Electron Ltd ドライ洗浄装置
AU7682594A (en) * 1993-09-08 1995-03-27 Uvtech Systems, Inc. Surface processing
US5814156A (en) * 1993-09-08 1998-09-29 Uvtech Systems Inc. Photoreactive surface cleaning
JPH10289891A (ja) * 1997-04-11 1998-10-27 Mitsubishi Gas Chem Co Inc 半導体回路用洗浄剤及びそれを用いた半導体回路の製造方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01274426A (ja) * 1988-04-26 1989-11-02 Mitsubishi Electric Corp 半導体装置製造のポジレジスト除去方法
JPH0475323A (ja) * 1990-07-17 1992-03-10 Seiko Epson Corp レジスト除去法
KR19980068184A (ko) * 1997-02-17 1998-10-15 김광호 반도체장치 제조공정의 포토레지스트 제거방법
US5849639A (en) * 1997-11-26 1998-12-15 Lucent Technologies Inc. Method for removing etching residues and contaminants
KR20000004232A (ko) * 1998-06-30 2000-01-25 김영환 반도체 소자의 콘택 홀 형성 방법

Also Published As

Publication number Publication date
KR20000058107A (ko) 2000-09-25
JP2000241992A (ja) 2000-09-08
EP1032026B1 (en) 2008-09-17
DE60040252D1 (de) 2008-10-30
EP1032026A3 (en) 2001-01-03
EP1032026A2 (en) 2000-08-30

Similar Documents

Publication Publication Date Title
US6734120B1 (en) Method of photoresist ash residue removal
JP3879027B2 (ja) イオン注入後にフォトレジストを除去するための処理方法
CN102540761B (zh) 浸润式光刻的方法及其处理系统
CN1495861A (zh) 水蒸汽作为处理气，用于离子植入后抗蚀剂剥离中硬壳、抗蚀剂和残渣的去除
US20060019178A1 (en) Method of repairing phase shift mask
KR100544970B1 (ko) 포토레지스트 애시 잔류물의 제거 방법
US6465356B2 (en) Method for forming fine patterns by thinning developed photoresist patterns using oxygen radicals
US20050003310A1 (en) Etching process including plasma pretreatment for generating fluorine-free carbon-containing polymer on a photoresist pattern
US20060281320A1 (en) Method for forming an anti-etching shielding layer of resist patterns in semiconductor fabrication
JP2002231696A (ja) レジスト除去方法とその装置
JPH10172960A (ja) アッシング方法
US6489590B2 (en) Laser removal of foreign materials from surfaces
US6649525B1 (en) Methods and systems for controlling resist residue defects at gate layer in a semiconductor device manufacturing process
US5472826A (en) Semiconductor device fabrication method
JP4730533B2 (ja) 基材処理方法
JP2011014696A (ja) 有機質物除去方法
JPH09502646A (ja) 残留物を除去するために励起させたハロゲンを含有するガスでのコーティングした基板の後処理
KR100712991B1 (ko) 포토마스크의 성장성 이물질 제거방법
KR20020007589A (ko) Ｃｆ４가스를 이용한 에싱 방법
JP3139718B2 (ja) レジストの除去方法
US6759179B1 (en) Methods and systems for controlling resist residue defects at gate layer in a semiconductor device manufacturing process
JPH10270424A (ja) 半導体素子パターンの形成方法
US8470519B2 (en) Method for removing photoresist pattern
JPH10209132A (ja) 有機物の除去方法
JPH10150018A (ja) 洗浄乾燥方法および洗浄乾燥装置

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

N231 Notification of change of applicant
PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

A201 Request for examination
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

R17-X000 Change to representative recorded

St.27 status event code: A-5-5-R10-R17-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

FPAY Annual fee payment

Payment date: 20130108

Year of fee payment: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

FPAY Annual fee payment

Payment date: 20131226

Year of fee payment: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R14-asn-PN2301

FPAY Annual fee payment

Payment date: 20141226

Year of fee payment: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

FPAY Annual fee payment

Payment date: 20151228

Year of fee payment: 11

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

FPAY Annual fee payment

Payment date: 20170103

Year of fee payment: 12

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 12

FPAY Annual fee payment

Payment date: 20171229

Year of fee payment: 13

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 13

FPAY Annual fee payment

Payment date: 20181226

Year of fee payment: 14

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 14

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 15

PC1801 Expiration of term

St.27 status event code: N-4-6-H10-H14-oth-PC1801

Not in force date: 20200219

Ip right cessation event data comment text: Termination Category : EXPIRATION_OF_DURATION

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000