KR100480628B1 - 에어 블로잉을 이용한 칩 픽업 방법 및 장치 - Google Patents
에어 블로잉을 이용한 칩 픽업 방법 및 장치 Download PDFInfo
- Publication number
- KR100480628B1 KR100480628B1 KR10-2002-0069666A KR20020069666A KR100480628B1 KR 100480628 B1 KR100480628 B1 KR 100480628B1 KR 20020069666 A KR20020069666 A KR 20020069666A KR 100480628 B1 KR100480628 B1 KR 100480628B1
- Authority
- KR
- South Korea
- Prior art keywords
- chip
- dicing tape
- air
- pick
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W95/00—Packaging processes not covered by the other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0442—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7402—Wafer tapes, e.g. grinding or dicing support tapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7412—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
- H10P72/7414—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support the auxiliary support including means facilitating the selective separation of some of a plurality of devices from the auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Dicing (AREA)
Abstract
Description
Claims (14)
- (a)에어 홀(air hole)이 다수개 형성되어 있는 다이싱 테이프(dicing tape)를 준비하여 그 위에 웨이퍼를 접착하는 단계;(b)상기 웨이퍼를 개개의 칩으로 분할하는 단계;(c)상기 다이싱 테이프 하부에서 상기 에어 홀을 제외한 상기 다이싱 테이프면에 대해 진공 흡입으로 상기 다이싱 테이프를 잡아 준 상태에서 상기 에어 홀을 향해 에어를 분사하여 상기 칩 중의 어느 하나를 상기 다이싱 테이프로부터 분리하는 단계; 및(d)상기 분리된 칩을 그 상부에서 픽업(pick-up)하는 단계를 포함하는 것을 특징으로 하는 칩 픽업 방법.
- 제 1 항에 있어서, 상기 (a) 단계에서 상기 에어 홀은 분할될 칩 하부에 한 개 이상이 놓일 수 있도록 하는 것을 특징으로 하는 칩 픽업 방법.
- 제 1 항에 있어서, 상기 칩 중의 어느 하나를 분리하기 위하여 상기 하나의 칩을 향해서만 에어를 분사하는 것을 특징으로 하는 칩 픽업 방법.
- 제 1 항에 있어서, 상기 (d) 단계에서 픽업한 칩은 다이 접착(die attach) 공정에 투입하고, 다른 칩을 픽업하기 위하여 상기 (c) 및 (d) 단계를 반복하여 수행하는 것을 특징으로 하는 칩 픽업 방법.
- 제 1 항에 있어서, 상기 (c) 및 (d) 단계를 수행하는 동안, 픽업하지 않을 다른 칩에 대해서는 그 하부에서 진공 흡입하여 움직이지 않게 고정하는 것을 특징으로 하는 칩 픽업 방법.
- 에어 홀(air hole)이 형성되어 있는 다이싱 테이프(dicing tape);상기 다이싱 테이프에 대하여 수평 및 수직으로 이동할 수 있으며, 상기 다이싱 테이프 위의 칩을 상기 다이싱 테이프에서 떼어내는 픽업(pick-up)용 진공 홀더(vacuum holder); 및상기 다이싱 테이프에 대하여 수평 및 수직으로 이동할 수 있으며, 상기 다이싱 테이프 아래에서 진공 흡입으로 상기 다이싱 테이프와 상기 칩을 지지하면서 상기 에어 홀을 통해 에어 블로잉(air blowing)을 담당하여, 상기 다이싱 테이프로부터 상기 칩을 분리하는 진공 및 에어 블로잉 지지대를 포함하며,상기 진공 및 에어 블로잉 지지대는 구멍이 다수개 형성되어 있어서, 상기 에어 홀에 대응되는 구멍으로는 에어를 분사하고 상기 에어 홀에 대응되지 않는 구멍으로는 진공 흡입하는 것을 특징으로 하는 칩 픽업 장치.
- 삭제
- 제 6 항에 있어서, 상기 다이싱 테이프는 상기 에어 홀이 상기 칩 하부에 한 개 이상이 놓일 수 있도록 형성된 것을 특징으로 하는 칩 픽업 장치.
- 제 6 항에 있어서, 상기 칩은 상기 진공 홀더에 의하여 휘지 않고 평평한 상태로 들어 올려지는 것을 특징으로 하는 칩 픽업 장치.
- 제 6 항에 있어서, 상기 에어 홀은 다수개가 상기 칩 면적에 대하여 균일하게 분포하고 있는 것을 특징으로 하는 칩 픽업 장치.
- 제 6 항에 있어서, 상기 진공 및 에어 블로잉 지지대는 상기 칩 중의 어느 하나를 분리하기 위하여 상기 하나의 칩을 향해서만 에어를 분사하는 것을 특징으로 하는 칩 픽업 장치.
- 제 11 항에 있어서, 상기 진공 및 에어 블로잉 지지대는 다른 칩에 대해서는 그 하부에서 진공 흡입하여 움직이지 않게 하는 것을 특징으로 하는 칩 픽업 장치.
- 삭제
- 삭제
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2002-0069666A KR100480628B1 (ko) | 2002-11-11 | 2002-11-11 | 에어 블로잉을 이용한 칩 픽업 방법 및 장치 |
| US10/435,202 US6869264B2 (en) | 2002-11-11 | 2003-05-12 | Method and apparatus for picking up a semiconductor chip, method and apparatus for removing a semiconductor chip from a dicing tape, and a method of forming a perforated dicing tape |
| US10/981,443 US7284941B2 (en) | 2002-11-11 | 2004-11-05 | Method and apparatus for picking up a semiconductor chip, method and apparatus for removing a semiconductor chip from a dicing tape, and a method of forming a perforated dicing tape |
| US10/981,468 US7465142B2 (en) | 2002-11-11 | 2004-11-05 | Method and apparatus for picking up a semiconductor chip, method and apparatus for removing a semiconductor chip from a dicing tape, and a method of forming a perforated dicing tape |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2002-0069666A KR100480628B1 (ko) | 2002-11-11 | 2002-11-11 | 에어 블로잉을 이용한 칩 픽업 방법 및 장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20040041789A KR20040041789A (ko) | 2004-05-20 |
| KR100480628B1 true KR100480628B1 (ko) | 2005-03-31 |
Family
ID=32226286
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR10-2002-0069666A Expired - Fee Related KR100480628B1 (ko) | 2002-11-11 | 2002-11-11 | 에어 블로잉을 이용한 칩 픽업 방법 및 장치 |
Country Status (2)
| Country | Link |
|---|---|
| US (3) | US6869264B2 (ko) |
| KR (1) | KR100480628B1 (ko) |
Families Citing this family (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100480628B1 (ko) * | 2002-11-11 | 2005-03-31 | 삼성전자주식회사 | 에어 블로잉을 이용한 칩 픽업 방법 및 장치 |
| JP4130167B2 (ja) * | 2003-10-06 | 2008-08-06 | 日東電工株式会社 | 半導体ウエハの剥離方法 |
| JP2006080337A (ja) * | 2004-09-10 | 2006-03-23 | Seiwa Electric Mfg Co Ltd | 部品移送装置 |
| EP1803531B1 (en) * | 2004-10-15 | 2014-07-23 | Musashi Chemicals Industry Co., Ltd. | Method for processing lens using pressure-sensitive adhesive tape |
| KR100604098B1 (ko) * | 2005-04-20 | 2006-07-24 | 한미반도체 주식회사 | 반도체 패키지 픽업장치 |
| KR101234473B1 (ko) * | 2005-06-20 | 2013-02-18 | 엘지디스플레이 주식회사 | 비접촉 반송 장치에서의 지지플랫폼 |
| US7608523B2 (en) * | 2005-08-26 | 2009-10-27 | Disco Corporation | Wafer processing method and adhesive tape used in the wafer processing method |
| US8137050B2 (en) * | 2005-09-29 | 2012-03-20 | Semiconductor Energy Laboratory Co., Ltd. | Pickup device and pickup method |
| US7763145B2 (en) * | 2006-03-17 | 2010-07-27 | Stats Chippac Ltd. | System for removal of an integrated circuit from a mount material |
| KR100817068B1 (ko) * | 2006-10-24 | 2008-03-27 | 삼성전자주식회사 | 박형의 반도체 칩 픽업 장치 및 방법 |
| US8143719B2 (en) * | 2007-06-07 | 2012-03-27 | United Test And Assembly Center Ltd. | Vented die and package |
| US7836583B2 (en) * | 2007-12-28 | 2010-11-23 | Hitachi Global Storage Technologies, Netherlands, B.V. | Integrated circuit dismounter |
| WO2010024678A1 (en) * | 2008-09-01 | 2010-03-04 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Chip die clamping device and transfer method |
| CN101882586B (zh) * | 2010-07-21 | 2013-03-20 | 中山市汉仁电子有限公司 | 一种集成电路芯片的贴装方法 |
| WO2012116482A1 (en) * | 2011-02-28 | 2012-09-07 | Sandisk Semiconductor (Shanghai) Co., Ltd. | Non-uniform vacuum profile die attach tip |
| US8801352B2 (en) * | 2011-08-11 | 2014-08-12 | International Business Machines Corporation | Pick and place tape release for thin semiconductor dies |
| CN103199047B (zh) * | 2012-01-05 | 2015-08-19 | 沈阳新松机器人自动化股份有限公司 | 晶圆中心预对准方法 |
| JP5981154B2 (ja) | 2012-02-02 | 2016-08-31 | 三菱電機株式会社 | 半導体装置の製造方法 |
| KR101397750B1 (ko) * | 2012-07-25 | 2014-05-21 | 삼성전기주식회사 | 칩 이젝터 및 이를 이용한 칩 탈착 방법 |
| TWI471990B (zh) * | 2012-11-05 | 2015-02-01 | 矽品精密工業股份有限公司 | 用於固定半導體封裝件之承載件與半導體封裝件之製法 |
| JP6081868B2 (ja) * | 2013-06-18 | 2017-02-15 | 株式会社ディスコ | 切削装置 |
| KR101515752B1 (ko) * | 2014-03-19 | 2015-04-28 | 세메스 주식회사 | 다이 픽업 장치 |
| US9196520B1 (en) * | 2014-08-01 | 2015-11-24 | Freescale Semiconductor, Inc. | Tape release systems and methods for semiconductor dies |
| KR101704124B1 (ko) * | 2014-10-24 | 2017-02-07 | 세메스 주식회사 | 반도체 패키지 핸들링 장치 및 이를 이용하여 반도체 패키지들의 위치 정보를 획득하는 방법 |
| CN107406202B (zh) * | 2015-03-06 | 2019-12-03 | 仓敷纺绩株式会社 | 物品供应装置 |
| US11478567B2 (en) | 2015-11-24 | 2022-10-25 | University Of Washington | Photosensitive medical tape |
| CN107221510B (zh) * | 2016-03-22 | 2020-09-15 | 晟碟信息科技(上海)有限公司 | 从裸芯附接膜带分离半导体裸芯的系统和方法 |
| JP7143019B2 (ja) * | 2018-06-06 | 2022-09-28 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7154686B2 (ja) * | 2018-06-06 | 2022-10-18 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7143023B2 (ja) | 2018-08-06 | 2022-09-28 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7191458B2 (ja) | 2018-08-06 | 2022-12-19 | 株式会社ディスコ | ウェーハの加工方法 |
| KR102594542B1 (ko) * | 2018-10-31 | 2023-10-26 | 세메스 주식회사 | 다이 이젝팅 장치 |
| JP7199786B2 (ja) | 2018-11-06 | 2023-01-06 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7503886B2 (ja) * | 2018-11-06 | 2024-06-21 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7246825B2 (ja) | 2018-12-06 | 2023-03-28 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7251898B2 (ja) | 2018-12-06 | 2023-04-04 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7229636B2 (ja) | 2019-01-17 | 2023-02-28 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7224719B2 (ja) | 2019-01-17 | 2023-02-20 | 株式会社ディスコ | ウェーハの加工方法 |
| KR102700207B1 (ko) * | 2019-03-12 | 2024-08-28 | 삼성전자주식회사 | 칩 이젝팅 장치 |
| JP7313767B2 (ja) | 2019-04-10 | 2023-07-25 | 株式会社ディスコ | ウェーハの加工方法 |
| JP2020174100A (ja) | 2019-04-10 | 2020-10-22 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7286247B2 (ja) | 2019-06-07 | 2023-06-05 | 株式会社ディスコ | ウェーハの加工方法 |
| JP7286245B2 (ja) | 2019-06-07 | 2023-06-05 | 株式会社ディスコ | ウェーハの加工方法 |
| TWI715150B (zh) * | 2019-08-14 | 2021-01-01 | 錼創顯示科技股份有限公司 | 噴射元件、微型發光二極體檢修設備及檢修方法 |
| CN110697183A (zh) * | 2019-10-28 | 2020-01-17 | 深南电路股份有限公司 | 移除板件表面隔膜的方法及其装置 |
| US11791212B2 (en) * | 2019-12-13 | 2023-10-17 | Micron Technology, Inc. | Thin die release for semiconductor device assembly |
| CN111554598B (zh) * | 2020-05-22 | 2023-01-20 | 深圳市耀芯微电子有限公司 | 一种可筛选的便捷式芯片去除装置 |
| US12142499B2 (en) * | 2021-06-18 | 2024-11-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Pickup apparatus and method of using the same |
| CN114639628B (zh) * | 2022-05-17 | 2022-08-19 | 深圳中科四合科技有限公司 | 一种基于莱洛多边形的封装成品切割后取料装置 |
| WO2025023120A1 (ja) * | 2023-07-26 | 2025-01-30 | 日東電工株式会社 | 部材の分離方法および粘着シート |
| CN118073264A (zh) * | 2024-04-25 | 2024-05-24 | 常州九天未来微电子有限公司 | 一种半导体封装芯片拾取装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04354352A (ja) * | 1991-05-31 | 1992-12-08 | Oki Electric Ind Co Ltd | チップの剥離方法 |
| KR19990031770A (ko) * | 1997-10-14 | 1999-05-06 | 김규현 | 반도체패키지용 반도체칩 이젝션방법 및 그 장치 |
| KR20000031043A (ko) * | 1998-11-02 | 2000-06-05 | 김규현 | 반도체패키지의 제조방법 및 그 장치 |
| JP2003068832A (ja) * | 2001-08-22 | 2003-03-07 | Sony Corp | ダイシングテープおよびその使用方法 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3785507A (en) * | 1968-12-19 | 1974-01-15 | Teledyne Inc | Die sorting system |
| US3937386A (en) * | 1973-11-09 | 1976-02-10 | General Motors Corporation | Flip chip cartridge loader |
| US3906614A (en) * | 1974-07-18 | 1975-09-23 | Illinois Tool Works | Method of loading radial lead components on plastic carrier |
| US4260310A (en) * | 1979-07-11 | 1981-04-07 | American Can Company | Strip feed elevator |
| US4915565A (en) * | 1984-03-22 | 1990-04-10 | Sgs-Thomson Microelectronics, Inc. | Manipulation and handling of integrated circuit dice |
| US4859369A (en) * | 1984-09-24 | 1989-08-22 | American Cyanamid Company | Use of water-soluble polymers in aqueous chemical light formulations |
| US4776744A (en) * | 1985-09-09 | 1988-10-11 | Applied Materials, Inc. | Systems and methods for wafer handling in semiconductor process equipment |
| GB8530561D0 (en) * | 1985-12-12 | 1986-01-22 | Schlaepfer & Co Ag | Transferring & placing decorative articles |
| US4850780A (en) * | 1987-09-28 | 1989-07-25 | Kulicke And Soffa Industries Inc. | Pre-peel die ejector apparatus |
| US5098501A (en) * | 1989-12-08 | 1992-03-24 | Sumitomo Electric Industries, Ltd. | Pickup method and the pickup apparatus for chip-type part |
| US6019564A (en) * | 1995-10-27 | 2000-02-01 | Advantest Corporation | Semiconductor device transporting and handling apparatus |
| FR2743792B1 (fr) * | 1996-01-19 | 1998-03-13 | Saint Gobain Emballage | Procede et dispositif pour la manutention d'articles |
| US6202292B1 (en) * | 1998-08-26 | 2001-03-20 | Micron Technology, Inc. | Apparatus for removing carrier film from a semiconductor die |
| JP4021614B2 (ja) * | 2000-12-11 | 2007-12-12 | 株式会社東芝 | 半導体素子のピックアップ用治具、半導体素子のピックアップ装置、半導体素子のピックアップ方法、半導体装置の製造方法及び半導体装置の製造装置 |
| US6752896B2 (en) * | 2001-07-10 | 2004-06-22 | Asm Technology Singapore Pte Ltd | Method of detaching a film of material from a substrate |
| JP3976541B2 (ja) * | 2001-10-23 | 2007-09-19 | 富士通株式会社 | 半導体チップの剥離方法及び装置 |
| KR100480628B1 (ko) * | 2002-11-11 | 2005-03-31 | 삼성전자주식회사 | 에어 블로잉을 이용한 칩 픽업 방법 및 장치 |
| US7306695B2 (en) * | 2003-04-10 | 2007-12-11 | Matsushita Electric Industrial Co., Ltd. | Apparatus and method for picking up semiconductor chip |
| JP4090416B2 (ja) * | 2003-09-30 | 2008-05-28 | 日東電工株式会社 | 粘着テープ付ワークの離脱方法及び離脱装置 |
| US7238258B2 (en) * | 2005-04-22 | 2007-07-03 | Stats Chippac Ltd. | System for peeling semiconductor chips from tape |
-
2002
- 2002-11-11 KR KR10-2002-0069666A patent/KR100480628B1/ko not_active Expired - Fee Related
-
2003
- 2003-05-12 US US10/435,202 patent/US6869264B2/en not_active Expired - Fee Related
-
2004
- 2004-11-05 US US10/981,468 patent/US7465142B2/en not_active Expired - Fee Related
- 2004-11-05 US US10/981,443 patent/US7284941B2/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04354352A (ja) * | 1991-05-31 | 1992-12-08 | Oki Electric Ind Co Ltd | チップの剥離方法 |
| KR19990031770A (ko) * | 1997-10-14 | 1999-05-06 | 김규현 | 반도체패키지용 반도체칩 이젝션방법 및 그 장치 |
| KR20000031043A (ko) * | 1998-11-02 | 2000-06-05 | 김규현 | 반도체패키지의 제조방법 및 그 장치 |
| JP2003068832A (ja) * | 2001-08-22 | 2003-03-07 | Sony Corp | ダイシングテープおよびその使用方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20040089515A1 (en) | 2004-05-13 |
| US7465142B2 (en) | 2008-12-16 |
| US20050095100A1 (en) | 2005-05-05 |
| US20050062301A1 (en) | 2005-03-24 |
| US6869264B2 (en) | 2005-03-22 |
| US7284941B2 (en) | 2007-10-23 |
| KR20040041789A (ko) | 2004-05-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR20040041789A (ko) | 에어 블로잉을 이용한 칩 픽업 방법 및 장치 | |
| JP4266106B2 (ja) | 粘着性テープの剥離装置、粘着性テープの剥離方法、半導体チップのピックアップ装置、半導体チップのピックアップ方法及び半導体装置の製造方法 | |
| TWI419213B (zh) | 通用晶粒分離裝置 | |
| KR101135903B1 (ko) | 박형 다이 분리 및 픽업 장치 | |
| JP2000138277A (ja) | 半導体チップユニットのウェ―ハからのピックアップ方法及びピックアップシステム | |
| JP2002270542A (ja) | ダイのピックアップ方法及びピックアップ装置 | |
| JP2010010207A (ja) | 剥離装置および剥離方法 | |
| CN102044404A (zh) | 用于使经切分的半导体裸片与裸片贴胶带分离的系统 | |
| CN1707750A (zh) | 用于晶片分离的剥离装置 | |
| JP2000208447A (ja) | 半導体製造装置及び半導体装置の製造方法 | |
| KR20180112489A (ko) | 기판 지지 부재 및 이의 기판 디척킹 방법 | |
| JP2002280330A (ja) | チップ状部品のピックアップ方法 | |
| US20130039733A1 (en) | Pick and place tape release for thin semiconductor dies | |
| KR100817068B1 (ko) | 박형의 반도체 칩 픽업 장치 및 방법 | |
| US7771560B2 (en) | Methods to prevent ECC (edge chipping and cracking) damage during die picking process | |
| JP2004031672A (ja) | チップのピックアップ装置 | |
| JPH0376139A (ja) | 半導体素子突上げ方法 | |
| KR20090085262A (ko) | 역피라미드 방식의 반도체 칩 접착 장비 및 그 작동방법 | |
| KR101046381B1 (ko) | 다이 픽업 장치 및 이를 이용한 반도체 칩 분리 방법 | |
| JP2000091403A (ja) | ダイピックアップ方法およびそれを用いた半導体製造装置ならびに半導体装置の製造方法 | |
| JP2003086540A (ja) | 半導体装置の製造方法及びその製造装置 | |
| JP2004039865A (ja) | 半導体チップ剥離装置およびその方法 | |
| KR20090026611A (ko) | 반도체 칩 픽업 장치 및 이를 이용한 반도체 칩 픽업 방법 | |
| JP2002124525A (ja) | 半導体チップ剥離装置及び方法 | |
| KR101033771B1 (ko) | 순차적 진공흡착 방식에 의한 다이 접착 장비 및 픽업 방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| D13-X000 | Search requested |
St.27 status event code: A-1-2-D10-D13-srh-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| D14-X000 | Search report completed |
St.27 status event code: A-1-2-D10-D14-srh-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| FPAY | Annual fee payment |
Payment date: 20130228 Year of fee payment: 9 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| FPAY | Annual fee payment |
Payment date: 20140228 Year of fee payment: 10 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20150325 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20150325 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |