KR100402665B1 - 수분발생용 반응로 - Google Patents
수분발생용 반응로 Download PDFInfo
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- KR100402665B1 KR100402665B1 KR10-2001-7002513A KR20017002513A KR100402665B1 KR 100402665 B1 KR100402665 B1 KR 100402665B1 KR 20017002513 A KR20017002513 A KR 20017002513A KR 100402665 B1 KR100402665 B1 KR 100402665B1
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- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims abstract description 140
- 239000007789 gas Substances 0.000 claims abstract description 106
- 238000000576 coating method Methods 0.000 claims abstract description 92
- 239000011248 coating agent Substances 0.000 claims abstract description 88
- 229910052697 platinum Inorganic materials 0.000 claims abstract description 70
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 62
- 239000003054 catalyst Substances 0.000 claims abstract description 55
- 238000006243 chemical reaction Methods 0.000 claims abstract description 28
- 239000001257 hydrogen Substances 0.000 claims abstract description 26
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 26
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 24
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 23
- 239000001301 oxygen Substances 0.000 claims abstract description 23
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 23
- 238000003466 welding Methods 0.000 claims abstract description 11
- 230000009257 reactivity Effects 0.000 claims abstract description 6
- 239000010408 film Substances 0.000 claims description 51
- 230000004888 barrier function Effects 0.000 claims description 44
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 16
- 230000003197 catalytic effect Effects 0.000 claims description 10
- 238000007086 side reaction Methods 0.000 claims description 10
- 238000001816 cooling Methods 0.000 claims description 9
- 230000002093 peripheral effect Effects 0.000 claims description 9
- 238000002485 combustion reaction Methods 0.000 claims description 8
- 238000002156 mixing Methods 0.000 claims description 8
- 238000010438 heat treatment Methods 0.000 claims description 6
- 150000002431 hydrogen Chemical class 0.000 claims description 4
- 229910010037 TiAlN Inorganic materials 0.000 claims description 3
- 230000017525 heat dissipation Effects 0.000 claims description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 2
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 2
- 239000002994 raw material Substances 0.000 claims description 2
- 239000010409 thin film Substances 0.000 claims description 2
- 229910052751 metal Inorganic materials 0.000 description 20
- 239000002184 metal Substances 0.000 description 20
- 238000000034 method Methods 0.000 description 8
- 229910001220 stainless steel Inorganic materials 0.000 description 8
- 239000010935 stainless steel Substances 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 238000007733 ion plating Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 230000001603 reducing effect Effects 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 239000002360 explosive Substances 0.000 description 3
- 230000020169 heat generation Effects 0.000 description 3
- 238000002161 passivation Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000003213 activating effect Effects 0.000 description 2
- 238000010668 complexation reaction Methods 0.000 description 2
- 238000010790 dilution Methods 0.000 description 2
- 239000012895 dilution Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- 241000283973 Oryctolagus cuniculus Species 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007888 film coating Substances 0.000 description 1
- 238000009501 film coating Methods 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000007348 radical reaction Methods 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 239000012498 ultrapure water Substances 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J12/00—Chemical processes in general for reacting gaseous media with gaseous media; Apparatus specially adapted therefor
- B01J12/007—Chemical processes in general for reacting gaseous media with gaseous media; Apparatus specially adapted therefor in the presence of catalytically active bodies, e.g. porous plates
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B5/00—Water
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2219/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J2219/00049—Controlling or regulating processes
- B01J2219/00051—Controlling the temperature
- B01J2219/00054—Controlling or regulating the heat exchange system
- B01J2219/00056—Controlling or regulating the heat exchange system involving measured parameters
- B01J2219/00058—Temperature measurement
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2219/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J2219/00049—Controlling or regulating processes
- B01J2219/00051—Controlling the temperature
- B01J2219/00074—Controlling the temperature by indirect heating or cooling employing heat exchange fluids
- B01J2219/00087—Controlling the temperature by indirect heating or cooling employing heat exchange fluids with heat exchange elements outside the reactor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2219/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J2219/00049—Controlling or regulating processes
- B01J2219/00051—Controlling the temperature
- B01J2219/00074—Controlling the temperature by indirect heating or cooling employing heat exchange fluids
- B01J2219/00087—Controlling the temperature by indirect heating or cooling employing heat exchange fluids with heat exchange elements outside the reactor
- B01J2219/00096—Plates
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Catalysts (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Exhaust Gas Treatment By Means Of Catalyst (AREA)
- Gas Burners (AREA)
Abstract
Description
Claims (13)
- 가스공급구를 보유하는 입구측 반응로 본체부재와 수분가스취출구를 보유하는 출구측 반응로 본체부재를 대향시켜서 조합하고, 양자를 용접함으로써 형성한 내부공간을 갖는 반응로본체와, 상기 반응로본체의 내부공간 내에 가스공급구와 대향형상으로 설치한 입구측 반사체와, 상기 내부공간 내에 수분가스취출구와 대향형상으로 설치한 출구측 반사체와, 상기 출구측 반응로 본체부재의 내벽면에 형성한 백금코팅 촉매층으로 형성되고, 가스공급구로부터 반응로본체의 내부공간 안으로 공급한 수소와 산소를 상기 백금코팅 촉매층에 접촉시켜서 그 반응성을 활성화시킴으로써, 수소와 산소를 비연소 상태 하에서 반응시켜 물을 발생시키는 구성의 수분발생용 반응로로서,상기 입구측 반응로 본체부재 및 출구측 반응로 본체부재의 내벽면에 바닥면이 평면형상인 원형의 오목부를 형성하고, 또한, 상기 입구측 반사체 및 출구측 반사체의 외주단 가장자리부의 반응로 본체부재의 바닥면과 대향하는 측에 테이퍼부를 형성하고, 또한, 입구측 반사체 및 출구측 반사체를 입구측 반응로 본체부재 및 출구측 반응로 본체부재에 각각의 바닥면과 간극을 유지한 상태로 고정하도록 한 것을 특징으로 하는 수분발생용 반응로.
- 삭제
- 가스공급구를 보유하는 입구측 반응로 본체부재와 수분가스취출구를 보유하는 출구측 반응로 본체부재를 대향시켜서 조합하고, 양자를 용접함으로써 형성한 내부공간을 보유하는 반응로본체와, 상기 반응로본체의 내부공간 내에 가스공급구 및 수분가스취출구와 대향형상으로 설치한 반사체와, 상기 출구측 반응로본체부재의 내벽면에 형성한 백금코팅 촉매층으로 형성되고, 가스공급구로부터 반응로본체의 내부공간 안으로 공급한 수소와 산소를 상기 백금코팅 촉매층에 접촉시켜 그 반응성을 활성화시킴으로써, 수소와 산소를 비연소 상태 하에서 반응시키는 구성의 수분 발생용 반응로로서,입구측 반응로 본체부재 및 출구측 반응로 본체부재의 내벽면에 바닥면이 평면형상의 원형의 오목부를 형성하고, 또한, 상기 반사체의 외경을 상기 원형의 오목부의 내경보다 조금 작게 하고, 또한 반사체의 외주단 가장자리부의 출구측 반응로본체부재의 바닥면과 대향하는 측에 테이퍼부를 형성하고, 또한, 상기 반사체를 출구측 반응로 본체부재에 그 바닥면과 간극을 유지한 상태로 고정하도록 한 것을 특징으로 하는 수분발생용 반응로.
- 삭제
- 제 1항 또는 제 3항에 있어서, 백금코팅 촉매층을 배리어 피막과 그 위에 고착한 백금코팅피막으로 형성하도록 한 것을 특징으로 하는 수분발생용 반응로.
- 제 1항 또는 제 3항에 있어서, 반응로본체의 내부공간 내의 백금코팅 촉매층을 설치한 부분을 제외한 그 외의 부분 및 반사체에, 비촉매성 배리어 피막을 형성하도록 한 것을 특징으로 하는 수분발생용 반응로.
- 제 5항에 있어서, 배리어 피막을 TiN, TiC, TiCN, TiAlN, Al2O3, Cr2O3, SiO2, CrN 중 어느 하나로 이루어지는 배리어 피막박막으로 한 것을 특징으로 하는 수분발생용 반응로.
- 제 1항 또는 제 3항에 있어서, 입구측 반응로 본체부재의 가스공급구에, 수소와 산소의 혼합가스인 원료가스를 공급하는 원료가스 혼합공급장치를 설치하도록 한 것을 특징으로 하는 수분발생용 반응로.
- 제 8항에 있어서, 원료가스 혼합공급장치는 수소를 공급하는 수소공급관과, 산소를 공급하는 산소공급관과, 양 공급관의 하류단부를 합류하여 원료가스공급구에 접속하는 접속기로 형성되고, 또한 접속기는 가스의 유동방향으로 복수의 소경관 부분과 대경관 부분이 교대로 늘어서는 구조로 되도록 한 것을 특징으로 하는 수분발생용 반응로.
- 제 1항 또는 제 3항에 있어서, 반응로본체를 소정의 온도로 가열유지하는 온도제어장치를 입구측 반응로 본체부재 및 출구측 반응로 본체부재의 외벽면에 설치하도록 한 것을 특징으로 하는 수분발생용 반응로.
- 제 10항에 있어서, 온도제어장치는 반응로본체를 냉각하는 냉각기를 구비하는 것을 특징으로 하는 수분발생용 반응로.
- 제 11항에 있어서, 냉각기는 반응로본체의 외면부에 설치된 방열핀으로 구성된 것을 특징으로 하는 수분발생용 반응로.
- 삭제
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2000/003659 WO2001094254A1 (fr) | 2000-06-05 | 2000-06-05 | Reacteur de production d'humidite |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020041324A KR20020041324A (ko) | 2002-06-01 |
KR100402665B1 true KR100402665B1 (ko) | 2003-10-22 |
Family
ID=11736122
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-7002513A KR100402665B1 (ko) | 2000-06-05 | 2000-06-05 | 수분발생용 반응로 |
Country Status (7)
Country | Link |
---|---|
US (2) | US6919056B2 (ko) |
EP (1) | EP1238942A4 (ko) |
KR (1) | KR100402665B1 (ko) |
CN (1) | CN1202987C (ko) |
CA (1) | CA2369047C (ko) |
IL (1) | IL144024A0 (ko) |
WO (1) | WO2001094254A1 (ko) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0398417B1 (en) * | 1989-05-18 | 1992-09-23 | Quest International B.V. | Hydroxyfuranone preparation |
SG94873A1 (en) * | 1999-08-06 | 2003-03-18 | Fujikin Kk | Reactor for generating high purity moisture |
IL144024A0 (en) * | 2000-06-05 | 2002-04-21 | Fujikin Kk | Reactor for generating moisture |
JP2002274812A (ja) * | 2001-03-23 | 2002-09-25 | Fujikin Inc | 水分発生用反応炉 |
JP4119218B2 (ja) * | 2002-10-16 | 2008-07-16 | 忠弘 大見 | 水分発生用反応炉の白金コーティング触媒層の形成方法 |
US20050252449A1 (en) * | 2004-05-12 | 2005-11-17 | Nguyen Son T | Control of gas flow and delivery to suppress the formation of particles in an MOCVD/ALD system |
US8323754B2 (en) | 2004-05-21 | 2012-12-04 | Applied Materials, Inc. | Stabilization of high-k dielectric materials |
JP4399326B2 (ja) * | 2004-07-20 | 2010-01-13 | 株式会社フジキン | 水分発生用反応炉とこれを用いた水分発生供給装置 |
US7786880B2 (en) * | 2007-06-01 | 2010-08-31 | Honeywell International Inc. | Smoke detector |
JP5837733B2 (ja) * | 2009-04-24 | 2015-12-24 | 国立大学法人東北大学 | 水分発生用反応炉 |
KR20240052957A (ko) * | 2022-03-14 | 2024-04-23 | 가부시키가이샤 후지킨 | 수분 발생용 반응로 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0987217A1 (en) * | 1997-04-28 | 2000-03-22 | Fujikin Incorporated | Reactor for generation of moisture |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06147420A (ja) * | 1992-11-12 | 1994-05-27 | Matsushita Electric Ind Co Ltd | 触媒燃焼装置 |
EP1911722A2 (en) * | 1996-01-29 | 2008-04-16 | FUJIKIN Inc. | Method for generating moisture, reactor for generating moisture, method for controlling temperature of reactor for generating moisture, and method for forming platinum-coated catalyst layer |
WO1997048640A1 (fr) * | 1996-06-20 | 1997-12-24 | Ultraclean Technology Research Institute | Procede de generation d'humidite et generateur d'humidite |
JP3808975B2 (ja) * | 1997-06-17 | 2006-08-16 | 忠弘 大見 | 半導体製造用水分の発生方法 |
JP3644810B2 (ja) * | 1997-12-10 | 2005-05-11 | 株式会社フジキン | 少流量の水分供給方法 |
JP3563950B2 (ja) * | 1998-01-06 | 2004-09-08 | 株式会社ルネサステクノロジ | 水素含有排ガス処理装置 |
JP3639440B2 (ja) * | 1998-09-02 | 2005-04-20 | 忠弘 大見 | 水分発生用反応炉 |
JP4121197B2 (ja) | 1998-10-20 | 2008-07-23 | 三洋電機株式会社 | 冷凍庫 |
JP3686762B2 (ja) * | 1998-12-04 | 2005-08-24 | 株式会社フジキン | 水分発生用反応炉 |
JP3679636B2 (ja) * | 1998-12-04 | 2005-08-03 | 株式会社フジキン | 水分発生用反応炉 |
SG94873A1 (en) * | 1999-08-06 | 2003-03-18 | Fujikin Kk | Reactor for generating high purity moisture |
IL144024A0 (en) * | 2000-06-05 | 2002-04-21 | Fujikin Kk | Reactor for generating moisture |
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2000
- 2000-06-05 IL IL14402400A patent/IL144024A0/xx not_active IP Right Cessation
- 2000-06-05 CN CNB008012059A patent/CN1202987C/zh not_active Expired - Lifetime
- 2000-06-05 EP EP00931707A patent/EP1238942A4/en not_active Withdrawn
- 2000-06-05 CA CA002369047A patent/CA2369047C/en not_active Expired - Fee Related
- 2000-06-05 WO PCT/JP2000/003659 patent/WO2001094254A1/ja active IP Right Grant
- 2000-06-05 KR KR10-2001-7002513A patent/KR100402665B1/ko active IP Right Grant
-
2001
- 2001-07-12 US US09/905,209 patent/US6919056B2/en not_active Expired - Lifetime
-
2004
- 2004-07-07 US US10/884,917 patent/US7008598B2/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0987217A1 (en) * | 1997-04-28 | 2000-03-22 | Fujikin Incorporated | Reactor for generation of moisture |
Also Published As
Publication number | Publication date |
---|---|
CA2369047A1 (en) | 2001-12-13 |
US20010048907A1 (en) | 2001-12-06 |
CN1202987C (zh) | 2005-05-25 |
CA2369047C (en) | 2006-12-19 |
CN1356961A (zh) | 2002-07-03 |
KR20020041324A (ko) | 2002-06-01 |
EP1238942A4 (en) | 2005-07-06 |
US6919056B2 (en) | 2005-07-19 |
WO2001094254A1 (fr) | 2001-12-13 |
EP1238942A1 (en) | 2002-09-11 |
US20040247502A1 (en) | 2004-12-09 |
US7008598B2 (en) | 2006-03-07 |
IL144024A0 (en) | 2002-04-21 |
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