KR100291316B1 - Lcd 검사장치 - Google Patents

Lcd 검사장치 Download PDF

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Publication number
KR100291316B1
KR100291316B1 KR1019960028180A KR19960028180A KR100291316B1 KR 100291316 B1 KR100291316 B1 KR 100291316B1 KR 1019960028180 A KR1019960028180 A KR 1019960028180A KR 19960028180 A KR19960028180 A KR 19960028180A KR 100291316 B1 KR100291316 B1 KR 100291316B1
Authority
KR
South Korea
Prior art keywords
lcd assembly
lcd
arm
assembly
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1019960028180A
Other languages
English (en)
Korean (ko)
Other versions
KR970007388A (ko
Inventor
기요시 다케코시
데츠지 오노
히로미치 후지하라
Original Assignee
히가시 데쓰로
동경 엘렉트론주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP20140295A external-priority patent/JPH0933877A/ja
Priority claimed from JP20140395A external-priority patent/JPH0936208A/ja
Priority claimed from JP7201401A external-priority patent/JPH0933589A/ja
Application filed by 히가시 데쓰로, 동경 엘렉트론주식회사 filed Critical 히가시 데쓰로
Publication of KR970007388A publication Critical patent/KR970007388A/ko
Application granted granted Critical
Publication of KR100291316B1 publication Critical patent/KR100291316B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
KR1019960028180A 1995-07-14 1996-07-12 Lcd 검사장치 Expired - Fee Related KR100291316B1 (ko)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP95-201403 1995-07-14
JP20140295A JPH0933877A (ja) 1995-07-14 1995-07-14 検査装置
JP20140395A JPH0936208A (ja) 1995-07-14 1995-07-14 検査装置
JP95-201401 1995-07-14
JP95-201402 1995-07-14
JP7201401A JPH0933589A (ja) 1995-07-14 1995-07-14 検査装置

Publications (2)

Publication Number Publication Date
KR970007388A KR970007388A (ko) 1997-02-21
KR100291316B1 true KR100291316B1 (ko) 2001-06-01

Family

ID=27327942

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019960028180A Expired - Fee Related KR100291316B1 (ko) 1995-07-14 1996-07-12 Lcd 검사장치

Country Status (3)

Country Link
US (1) US5801545A (enExample)
KR (1) KR100291316B1 (enExample)
TW (1) TW301099B (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100588366B1 (ko) * 2003-01-31 2006-06-09 가부시키가이샤 시마즈세이사쿠쇼 기판 검사 장치를 위한 팔레트 어셈블리 및 기판 검사 장치
KR101074264B1 (ko) 2009-10-12 2011-10-17 주식회사 엔씨비네트웍스 상하 이동 및 회전이 가능한 얼라인먼트 장치
WO2011145877A3 (ko) * 2010-05-19 2012-03-08 Woo Gwan-Je 터치 센서용 검사장치

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100279260B1 (ko) * 1998-06-18 2001-01-15 김영환 액정 셀의 액정 주입 및 액정 주입구 봉입검사 시스템
JP3553460B2 (ja) * 1999-04-23 2004-08-11 ディーイー、エンド、ティー 株式会社 Ｌｃｄテスト装置
KR100352384B1 (ko) * 1999-11-19 2002-09-11 주식회사 디이엔티 엘시디 검사시스템
US6486927B1 (en) * 1999-11-19 2002-11-26 De & T Co., Ltd. Liquid crystal display test system
US20020135395A1 (en) * 2001-02-08 2002-09-26 Pete Smith System and method for testing a display device
WO2003025896A2 (en) * 2001-09-14 2003-03-27 American Panel Corporation Visual display testing, optimization and harmonization method and system
US20030168175A1 (en) * 2002-03-08 2003-09-11 Kim Kyung-Tae Substrate alignment apparatus
US20030219986A1 (en) * 2002-05-22 2003-11-27 Applied Materials, Inc. Substrate carrier for processing substrates
US20030217693A1 (en) * 2002-05-22 2003-11-27 Applied Materials, Inc. Substrate support assembly having an edge protector
DE10227332A1 (de) * 2002-06-19 2004-01-15 Akt Electron Beam Technology Gmbh Ansteuervorrichtung mit verbesserten Testeneigenschaften
DE10253717B4 (de) * 2002-11-18 2011-05-19 Applied Materials Gmbh Vorrichtung zum Kontaktieren für den Test mindestens eines Testobjekts, Testsystem und Verfahren zum Testen von Testobjekten
TWI243258B (en) * 2002-11-29 2005-11-11 Hon Hai Prec Ind Co Ltd Measurement apparatus of light guide plate
US20060038554A1 (en) * 2004-02-12 2006-02-23 Applied Materials, Inc. Electron beam test system stage
US6833717B1 (en) * 2004-02-12 2004-12-21 Applied Materials, Inc. Electron beam test system with integrated substrate transfer module
US7355418B2 (en) * 2004-02-12 2008-04-08 Applied Materials, Inc. Configurable prober for TFT LCD array test
US7319335B2 (en) * 2004-02-12 2008-01-15 Applied Materials, Inc. Configurable prober for TFT LCD array testing
JP2006273141A (ja) * 2005-03-29 2006-10-12 Nec Lcd Technologies Ltd 液晶モジュール用台車及び液晶表示装置の製造方法
US7535238B2 (en) * 2005-04-29 2009-05-19 Applied Materials, Inc. In-line electron beam test system
DE102006023968B4 (de) * 2005-12-29 2009-12-10 Lg Display Co., Ltd. Inspektionsvorrichtung für Flüssigkristallanzeigepaneel
TWI323788B (en) * 2006-03-14 2010-04-21 Applied Materials Inc Method to reduce cross talk in a multi column e-beam test system
US7786742B2 (en) 2006-05-31 2010-08-31 Applied Materials, Inc. Prober for electronic device testing on large area substrates
US7602199B2 (en) 2006-05-31 2009-10-13 Applied Materials, Inc. Mini-prober for TFT-LCD testing
KR101232157B1 (ko) * 2006-06-09 2013-02-12 엘지디스플레이 주식회사 Ｌｃｄ 검사 장비
JP2008008779A (ja) * 2006-06-29 2008-01-17 Fujitsu Hitachi Plasma Display Ltd ディスプレイパネルの点灯検査装置
KR100799168B1 (ko) * 2006-08-11 2008-02-01 주식회사 이엔씨 테크놀로지 액정 디스플레이 모듈 성능 측정장치.
TWI379116B (en) * 2008-05-30 2012-12-11 Chimei Innolux Corp Liquid crystal display high-voltage testing circuit and method of testing liquid crystal display
US8436632B2 (en) * 2008-06-27 2013-05-07 American Panel Corporation System and method for optimizing LCD displays
US8400177B2 (en) * 2008-09-01 2013-03-19 Chimei Innolux Corporation Device and method for testing display panel
CN102230866A (zh) * 2011-06-08 2011-11-02 深圳市华星光电技术有限公司 局部应压能力测试平台及测试装置
CN103674496B (zh) * 2013-12-23 2016-05-25 京东方科技集团股份有限公司 光源发光特性检测装置
CN105093574B (zh) * 2015-06-05 2018-06-08 京东方科技集团股份有限公司 显示面板检测台

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62146591A (ja) * 1985-12-19 1987-06-30 Daicel Chem Ind Ltd 発酵の管理方法
US4827212A (en) * 1988-01-20 1989-05-02 Semitest, Inc. Noninvasive method and apparatus for characterization of semiconductors
JPH03117836A (ja) * 1989-09-29 1991-05-20 Toshiba Corp 空気調和機
US5003254A (en) * 1989-11-02 1991-03-26 Huntron, Inc. Multi-axis universal circuit board test fixture
US5254939A (en) * 1992-03-20 1993-10-19 Xandex, Inc. Probe card system
JPH0685739A (ja) * 1992-09-04 1994-03-25 Fujitsu Ltd 移動無線通信制御方式
US5479108A (en) * 1992-11-25 1995-12-26 David Cheng Method and apparatus for handling wafers

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100588366B1 (ko) * 2003-01-31 2006-06-09 가부시키가이샤 시마즈세이사쿠쇼 기판 검사 장치를 위한 팔레트 어셈블리 및 기판 검사 장치
KR101074264B1 (ko) 2009-10-12 2011-10-17 주식회사 엔씨비네트웍스 상하 이동 및 회전이 가능한 얼라인먼트 장치
WO2011145877A3 (ko) * 2010-05-19 2012-03-08 Woo Gwan-Je 터치 센서용 검사장치

Also Published As

Publication number Publication date
KR970007388A (ko) 1997-02-21
TW301099B (enExample) 1997-03-21
US5801545A (en) 1998-09-01

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