KR100265660B1 - 반도체재료의중간층평탄화장치에사용되는폴리싱패트 - Google Patents
반도체재료의중간층평탄화장치에사용되는폴리싱패트 Download PDFInfo
- Publication number
- KR100265660B1 KR100265660B1 KR1019930001293A KR930001293A KR100265660B1 KR 100265660 B1 KR100265660 B1 KR 100265660B1 KR 1019930001293 A KR1019930001293 A KR 1019930001293A KR 930001293 A KR930001293 A KR 930001293A KR 100265660 B1 KR100265660 B1 KR 100265660B1
- Authority
- KR
- South Korea
- Prior art keywords
- pad
- layer
- planarization
- volume
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/829,736 | 1992-01-31 | ||
| US07/829,736 US5257478A (en) | 1990-03-22 | 1992-01-31 | Apparatus for interlayer planarization of semiconductor material |
| US07/829/736 | 1992-01-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR930017105A KR930017105A (ko) | 1993-08-30 |
| KR100265660B1 true KR100265660B1 (ko) | 2000-11-01 |
Family
ID=25255407
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019930001293A Expired - Lifetime KR100265660B1 (ko) | 1992-01-31 | 1993-01-30 | 반도체재료의중간층평탄화장치에사용되는폴리싱패트 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5257478A (https=) |
| EP (1) | EP0555660B1 (https=) |
| JP (1) | JP3455556B2 (https=) |
| KR (1) | KR100265660B1 (https=) |
| CN (1) | CN1076152A (https=) |
| DE (1) | DE69308915T2 (https=) |
| TW (1) | TW222033B (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008137033A1 (en) * | 2007-05-03 | 2008-11-13 | Cabot Microelectronics Corporation | Stacked polishing pad for high temperature applications |
Families Citing this family (163)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0697132A (ja) * | 1992-07-10 | 1994-04-08 | Lsi Logic Corp | 半導体ウェハの化学機械的研磨装置、同装置のプラテンへの半導体ウェハ研磨用パッドの取付け方法、および同装置の研磨用複合パッド |
| US7037403B1 (en) * | 1992-12-28 | 2006-05-02 | Applied Materials Inc. | In-situ real-time monitoring technique and apparatus for detection of thin films during chemical/mechanical polishing planarization |
| US6614529B1 (en) * | 1992-12-28 | 2003-09-02 | Applied Materials, Inc. | In-situ real-time monitoring technique and apparatus for endpoint detection of thin films during chemical/mechanical polishing planarization |
| US5564965A (en) * | 1993-12-14 | 1996-10-15 | Shin-Etsu Handotai Co., Ltd. | Polishing member and wafer polishing apparatus |
| US5489233A (en) * | 1994-04-08 | 1996-02-06 | Rodel, Inc. | Polishing pads and methods for their use |
| US5534106A (en) * | 1994-07-26 | 1996-07-09 | Kabushiki Kaisha Toshiba | Apparatus for processing semiconductor wafers |
| US5562530A (en) * | 1994-08-02 | 1996-10-08 | Sematech, Inc. | Pulsed-force chemical mechanical polishing |
| US5783497A (en) * | 1994-08-02 | 1998-07-21 | Sematech, Inc. | Forced-flow wafer polisher |
| US5607341A (en) | 1994-08-08 | 1997-03-04 | Leach; Michael A. | Method and structure for polishing a wafer during manufacture of integrated circuits |
| US5679610A (en) * | 1994-12-15 | 1997-10-21 | Kabushiki Kaisha Toshiba | Method of planarizing a semiconductor workpiece surface |
| US6676717B1 (en) | 1995-03-28 | 2004-01-13 | Applied Materials Inc | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
| US6537133B1 (en) * | 1995-03-28 | 2003-03-25 | Applied Materials, Inc. | Method for in-situ endpoint detection for chemical mechanical polishing operations |
| JP3431115B2 (ja) * | 1995-03-28 | 2003-07-28 | アプライド マテリアルズ インコーポレイテッド | ケミカルメカニカルポリシングの操作をインシチュウでモニタするための装置及び方法 |
| US5893796A (en) * | 1995-03-28 | 1999-04-13 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
| US6876454B1 (en) | 1995-03-28 | 2005-04-05 | Applied Materials, Inc. | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
| US5945347A (en) * | 1995-06-02 | 1999-08-31 | Micron Technology, Inc. | Apparatus and method for polishing a semiconductor wafer in an overhanging position |
| JP3329644B2 (ja) * | 1995-07-21 | 2002-09-30 | 株式会社東芝 | 研磨パッド、研磨装置及び研磨方法 |
| TW334379B (en) * | 1995-08-24 | 1998-06-21 | Matsushita Electric Industrial Co Ltd | Compression mechanism for grinding machine of semiconductor substrate |
| US6135856A (en) * | 1996-01-19 | 2000-10-24 | Micron Technology, Inc. | Apparatus and method for semiconductor planarization |
| US5899799A (en) * | 1996-01-19 | 1999-05-04 | Micron Display Technology, Inc. | Method and system to increase delivery of slurry to the surface of large substrates during polishing operations |
| US6081959A (en) * | 1996-07-01 | 2000-07-04 | Umbrell; Richard | Buffer centering system |
| US5692950A (en) * | 1996-08-08 | 1997-12-02 | Minnesota Mining And Manufacturing Company | Abrasive construction for semiconductor wafer modification |
| US5785584A (en) * | 1996-08-30 | 1998-07-28 | International Business Machines Corporation | Planarizing apparatus with deflectable polishing pad |
| JP2738392B1 (ja) * | 1996-11-05 | 1998-04-08 | 日本電気株式会社 | 半導体装置の研磨装置及び研磨方法 |
| JPH10156705A (ja) * | 1996-11-29 | 1998-06-16 | Sumitomo Metal Ind Ltd | 研磨装置および研磨方法 |
| US6379221B1 (en) | 1996-12-31 | 2002-04-30 | Applied Materials, Inc. | Method and apparatus for automatically changing a polishing pad in a chemical mechanical polishing system |
| US6328642B1 (en) | 1997-02-14 | 2001-12-11 | Lam Research Corporation | Integrated pad and belt for chemical mechanical polishing |
| US5968851A (en) * | 1997-03-19 | 1999-10-19 | Cypress Semiconductor Corp. | Controlled isotropic etch process and method of forming an opening in a dielectric layer |
| US6244946B1 (en) | 1997-04-08 | 2001-06-12 | Lam Research Corporation | Polishing head with removable subcarrier |
| US6425812B1 (en) | 1997-04-08 | 2002-07-30 | Lam Research Corporation | Polishing head for chemical mechanical polishing using linear planarization technology |
| US6126532A (en) * | 1997-04-18 | 2000-10-03 | Cabot Corporation | Polishing pads for a semiconductor substrate |
| EP1011922B1 (en) * | 1997-04-18 | 2002-11-06 | Cabot Microelectronics Corporation | Polishing pad for a semiconductor substrate |
| US5885135A (en) * | 1997-04-23 | 1999-03-23 | International Business Machines Corporation | CMP wafer carrier for preferential polishing of a wafer |
| US8092707B2 (en) | 1997-04-30 | 2012-01-10 | 3M Innovative Properties Company | Compositions and methods for modifying a surface suited for semiconductor fabrication |
| US6108091A (en) | 1997-05-28 | 2000-08-22 | Lam Research Corporation | Method and apparatus for in-situ monitoring of thickness during chemical-mechanical polishing |
| TW375550B (en) * | 1997-06-19 | 1999-12-01 | Komatsu Denshi Kinzoku Kk | Polishing apparatus for semiconductor wafer |
| US6736714B2 (en) | 1997-07-30 | 2004-05-18 | Praxair S.T. Technology, Inc. | Polishing silicon wafers |
| US5913713A (en) * | 1997-07-31 | 1999-06-22 | International Business Machines Corporation | CMP polishing pad backside modifications for advantageous polishing results |
| US6121143A (en) * | 1997-09-19 | 2000-09-19 | 3M Innovative Properties Company | Abrasive articles comprising a fluorochemical agent for wafer surface modification |
| US6234883B1 (en) | 1997-10-01 | 2001-05-22 | Lsi Logic Corporation | Method and apparatus for concurrent pad conditioning and wafer buff in chemical mechanical polishing |
| US6336845B1 (en) | 1997-11-12 | 2002-01-08 | Lam Research Corporation | Method and apparatus for polishing semiconductor wafers |
| JPH11156699A (ja) * | 1997-11-25 | 1999-06-15 | Speedfam Co Ltd | 平面研磨用パッド |
| US6096230A (en) * | 1997-12-29 | 2000-08-01 | Intel Corporation | Method of planarizing by polishing a structure which is formed to promote planarization |
| WO1999048645A1 (en) * | 1998-03-23 | 1999-09-30 | Speedfam-Ipec Corporation | Backing pad for workpiece carrier |
| JP3618541B2 (ja) * | 1998-03-23 | 2005-02-09 | 信越半導体株式会社 | 研磨布、研磨布処理方法及び研磨方法 |
| US6105197A (en) * | 1998-04-14 | 2000-08-22 | Umbrell; Richard T. | Centering system for buffing pad |
| US6298518B1 (en) | 1998-04-14 | 2001-10-09 | Richard T. Umbrell | Heat dissipating buffing pad |
| US7718102B2 (en) * | 1998-06-02 | 2010-05-18 | Praxair S.T. Technology, Inc. | Froth and method of producing froth |
| US6514301B1 (en) | 1998-06-02 | 2003-02-04 | Peripheral Products Inc. | Foam semiconductor polishing belts and pads |
| US6117000A (en) * | 1998-07-10 | 2000-09-12 | Cabot Corporation | Polishing pad for a semiconductor substrate |
| US6315857B1 (en) | 1998-07-10 | 2001-11-13 | Mosel Vitelic, Inc. | Polishing pad shaping and patterning |
| US6126512A (en) * | 1998-07-10 | 2000-10-03 | Aplex Inc. | Robust belt tracking and control system for hostile environment |
| US6439967B2 (en) * | 1998-09-01 | 2002-08-27 | Micron Technology, Inc. | Microelectronic substrate assembly planarizing machines and methods of mechanical and chemical-mechanical planarization of microelectronic substrate assemblies |
| US6254463B1 (en) | 1998-10-09 | 2001-07-03 | International Business Machines Corporation | Chemical planar head dampening system |
| WO2000027589A1 (en) * | 1998-11-09 | 2000-05-18 | Toray Industries, Inc. | Polishing pad and polishing device |
| US6190234B1 (en) * | 1999-01-25 | 2001-02-20 | Applied Materials, Inc. | Endpoint detection with light beams of different wavelengths |
| US6716085B2 (en) | 2001-12-28 | 2004-04-06 | Applied Materials Inc. | Polishing pad with transparent window |
| US6994607B2 (en) * | 2001-12-28 | 2006-02-07 | Applied Materials, Inc. | Polishing pad with window |
| US6179709B1 (en) * | 1999-02-04 | 2001-01-30 | Applied Materials, Inc. | In-situ monitoring of linear substrate polishing operations |
| US6238592B1 (en) | 1999-03-10 | 2001-05-29 | 3M Innovative Properties Company | Working liquids and methods for modifying structured wafers suited for semiconductor fabrication |
| US6217426B1 (en) | 1999-04-06 | 2001-04-17 | Applied Materials, Inc. | CMP polishing pad |
| US20040072518A1 (en) * | 1999-04-02 | 2004-04-15 | Applied Materials, Inc. | Platen with patterned surface for chemical mechanical polishing |
| KR20010020807A (ko) | 1999-05-03 | 2001-03-15 | 조셉 제이. 스위니 | 고정 연마재 제품을 사전-조절하는 방법 |
| US6406363B1 (en) | 1999-08-31 | 2002-06-18 | Lam Research Corporation | Unsupported chemical mechanical polishing belt |
| US6524164B1 (en) | 1999-09-14 | 2003-02-25 | Applied Materials, Inc. | Polishing pad with transparent window having reduced window leakage for a chemical mechanical polishing apparatus |
| US6299516B1 (en) | 1999-09-28 | 2001-10-09 | Applied Materials, Inc. | Substrate polishing article |
| US6431959B1 (en) | 1999-12-20 | 2002-08-13 | Lam Research Corporation | System and method of defect optimization for chemical mechanical planarization of polysilicon |
| US6533645B2 (en) | 2000-01-18 | 2003-03-18 | Applied Materials, Inc. | Substrate polishing article |
| US6607428B2 (en) | 2000-01-18 | 2003-08-19 | Applied Materials, Inc. | Material for use in carrier and polishing pads |
| US6623341B2 (en) | 2000-01-18 | 2003-09-23 | Applied Materials, Inc. | Substrate polishing apparatus |
| US7125477B2 (en) | 2000-02-17 | 2006-10-24 | Applied Materials, Inc. | Contacts for electrochemical processing |
| US6962524B2 (en) | 2000-02-17 | 2005-11-08 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| US7303462B2 (en) | 2000-02-17 | 2007-12-04 | Applied Materials, Inc. | Edge bead removal by an electro polishing process |
| US7678245B2 (en) | 2000-02-17 | 2010-03-16 | Applied Materials, Inc. | Method and apparatus for electrochemical mechanical processing |
| US7077721B2 (en) | 2000-02-17 | 2006-07-18 | Applied Materials, Inc. | Pad assembly for electrochemical mechanical processing |
| US6991528B2 (en) | 2000-02-17 | 2006-01-31 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| US7029365B2 (en) | 2000-02-17 | 2006-04-18 | Applied Materials Inc. | Pad assembly for electrochemical mechanical processing |
| US7059948B2 (en) | 2000-12-22 | 2006-06-13 | Applied Materials | Articles for polishing semiconductor substrates |
| US7374644B2 (en) | 2000-02-17 | 2008-05-20 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| US7670468B2 (en) | 2000-02-17 | 2010-03-02 | Applied Materials, Inc. | Contact assembly and method for electrochemical mechanical processing |
| US7303662B2 (en) | 2000-02-17 | 2007-12-04 | Applied Materials, Inc. | Contacts for electrochemical processing |
| US6979248B2 (en) | 2002-05-07 | 2005-12-27 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| US7066800B2 (en) | 2000-02-17 | 2006-06-27 | Applied Materials Inc. | Conductive polishing article for electrochemical mechanical polishing |
| US6666756B1 (en) | 2000-03-31 | 2003-12-23 | Lam Research Corporation | Wafer carrier head assembly |
| US6616801B1 (en) | 2000-03-31 | 2003-09-09 | Lam Research Corporation | Method and apparatus for fixed-abrasive substrate manufacturing and wafer polishing in a single process path |
| WO2001078125A1 (en) * | 2000-04-12 | 2001-10-18 | Shin-Etsu Handotai Co.,Ltd. | Method for producing semiconductor wafer and semiconductor wafer |
| US6267659B1 (en) * | 2000-05-04 | 2001-07-31 | International Business Machines Corporation | Stacked polish pad |
| US8485862B2 (en) * | 2000-05-19 | 2013-07-16 | Applied Materials, Inc. | Polishing pad for endpoint detection and related methods |
| US7374477B2 (en) * | 2002-02-06 | 2008-05-20 | Applied Materials, Inc. | Polishing pads useful for endpoint detection in chemical mechanical polishing |
| US6495464B1 (en) * | 2000-06-30 | 2002-12-17 | Lam Research Corporation | Method and apparatus for fixed abrasive substrate preparation and use in a cluster CMP tool |
| WO2002002274A2 (en) * | 2000-06-30 | 2002-01-10 | Rodel Holdings, Inc. | Base-pad for a polishing pad |
| US6666751B1 (en) * | 2000-07-17 | 2003-12-23 | Micron Technology, Inc. | Deformable pad for chemical mechanical polishing |
| CN100496896C (zh) * | 2000-12-01 | 2009-06-10 | 东洋橡膠工业株式会社 | 研磨垫 |
| CN100537147C (zh) | 2000-12-01 | 2009-09-09 | 东洋橡膠工业株式会社 | 研磨垫及其制造方法和研磨垫用缓冲层 |
| US6896776B2 (en) | 2000-12-18 | 2005-05-24 | Applied Materials Inc. | Method and apparatus for electro-chemical processing |
| US6609961B2 (en) | 2001-01-09 | 2003-08-26 | Lam Research Corporation | Chemical mechanical planarization belt assembly and method of assembly |
| US6544107B2 (en) | 2001-02-16 | 2003-04-08 | Agere Systems Inc. | Composite polishing pads for chemical-mechanical polishing |
| US6863774B2 (en) * | 2001-03-08 | 2005-03-08 | Raytech Innovative Solutions, Inc. | Polishing pad for use in chemical-mechanical planarization of semiconductor wafers and method of making same |
| US7344432B2 (en) | 2001-04-24 | 2008-03-18 | Applied Materials, Inc. | Conductive pad with ion exchange membrane for electrochemical mechanical polishing |
| US7137879B2 (en) | 2001-04-24 | 2006-11-21 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| JP2003100682A (ja) * | 2001-09-25 | 2003-04-04 | Jsr Corp | 半導体ウエハ用研磨パッド |
| US7097549B2 (en) * | 2001-12-20 | 2006-08-29 | Ppg Industries Ohio, Inc. | Polishing pad |
| US7037184B2 (en) * | 2003-01-22 | 2006-05-02 | Raytech Innovation Solutions, Llc | Polishing pad for use in chemical-mechanical planarization of semiconductor wafers and method of making same |
| US6852020B2 (en) * | 2003-01-22 | 2005-02-08 | Raytech Innovative Solutions, Inc. | Polishing pad for use in chemical—mechanical planarization of semiconductor wafers and method of making same |
| US20030194959A1 (en) * | 2002-04-15 | 2003-10-16 | Cabot Microelectronics Corporation | Sintered polishing pad with regions of contrasting density |
| US7025668B2 (en) * | 2002-06-18 | 2006-04-11 | Raytech Innovative Solutions, Llc | Gradient polishing pad made from paper-making fibers for use in chemical/mechanical planarization of wafers |
| KR100465649B1 (ko) * | 2002-09-17 | 2005-01-13 | 한국포리올 주식회사 | 일체형 연마 패드 및 그 제조 방법 |
| KR20050052513A (ko) * | 2002-09-25 | 2005-06-02 | 피피지 인더스트리즈 오하이오 인코포레이티드 | 평탄화를 위한 윈도를 가진 연마 패드 |
| US20070010169A1 (en) * | 2002-09-25 | 2007-01-11 | Ppg Industries Ohio, Inc. | Polishing pad with window for planarization |
| JP2004160573A (ja) * | 2002-11-11 | 2004-06-10 | Ebara Corp | 研磨装置 |
| TW592894B (en) * | 2002-11-19 | 2004-06-21 | Iv Technologies Co Ltd | Method of fabricating a polishing pad |
| WO2004073926A1 (en) | 2003-02-18 | 2004-09-02 | Parker-Hannifin Corporation | Polishing article for electro-chemical mechanical polishing |
| US6998166B2 (en) * | 2003-06-17 | 2006-02-14 | Cabot Microelectronics Corporation | Polishing pad with oriented pore structure |
| US7435161B2 (en) * | 2003-06-17 | 2008-10-14 | Cabot Microelectronics Corporation | Multi-layer polishing pad material for CMP |
| US6884156B2 (en) * | 2003-06-17 | 2005-04-26 | Cabot Microelectronics Corporation | Multi-layer polishing pad material for CMP |
| US7264536B2 (en) * | 2003-09-23 | 2007-09-04 | Applied Materials, Inc. | Polishing pad with window |
| US7101275B2 (en) * | 2003-09-26 | 2006-09-05 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Resilient polishing pad for chemical mechanical polishing |
| US7654885B2 (en) * | 2003-10-03 | 2010-02-02 | Applied Materials, Inc. | Multi-layer polishing pad |
| US20050173259A1 (en) * | 2004-02-06 | 2005-08-11 | Applied Materials, Inc. | Endpoint system for electro-chemical mechanical polishing |
| US8066552B2 (en) * | 2003-10-03 | 2011-11-29 | Applied Materials, Inc. | Multi-layer polishing pad for low-pressure polishing |
| WO2005035194A2 (en) * | 2003-10-09 | 2005-04-21 | Thomas West, Inc. | Stacked pad and method of use |
| US7186651B2 (en) * | 2003-10-30 | 2007-03-06 | Texas Instruments Incorporated | Chemical mechanical polishing method and apparatus |
| US7186164B2 (en) | 2003-12-03 | 2007-03-06 | Applied Materials, Inc. | Processing pad assembly with zone control |
| JP3754436B2 (ja) * | 2004-02-23 | 2006-03-15 | 東洋ゴム工業株式会社 | 研磨パッドおよびそれを使用する半導体デバイスの製造方法 |
| TWI293266B (en) * | 2004-05-05 | 2008-02-11 | Iv Technologies Co Ltd | A single-layer polishing pad and a method of producing the same |
| US7198549B2 (en) * | 2004-06-16 | 2007-04-03 | Cabot Microelectronics Corporation | Continuous contour polishing of a multi-material surface |
| TWI254354B (en) * | 2004-06-29 | 2006-05-01 | Iv Technologies Co Ltd | An inlaid polishing pad and a method of producing the same |
| US7189156B2 (en) * | 2004-08-25 | 2007-03-13 | Jh Rhodes Company, Inc. | Stacked polyurethane polishing pad and method of producing the same |
| US8075372B2 (en) * | 2004-09-01 | 2011-12-13 | Cabot Microelectronics Corporation | Polishing pad with microporous regions |
| US7084064B2 (en) | 2004-09-14 | 2006-08-01 | Applied Materials, Inc. | Full sequence metal and barrier layer electrochemical mechanical processing |
| US7520968B2 (en) | 2004-10-05 | 2009-04-21 | Applied Materials, Inc. | Conductive pad design modification for better wafer-pad contact |
| US20060089095A1 (en) | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| US7182677B2 (en) * | 2005-01-14 | 2007-02-27 | Applied Materials, Inc. | Chemical mechanical polishing pad for controlling polishing slurry distribution |
| US7427340B2 (en) | 2005-04-08 | 2008-09-23 | Applied Materials, Inc. | Conductive pad |
| US20070049169A1 (en) * | 2005-08-02 | 2007-03-01 | Vaidya Neha P | Nonwoven polishing pads for chemical mechanical polishing |
| US7226345B1 (en) | 2005-12-09 | 2007-06-05 | The Regents Of The University Of California | CMP pad with designed surface features |
| KR100882045B1 (ko) * | 2006-02-15 | 2009-02-09 | 어플라이드 머티어리얼스, 인코포레이티드 | 그루브형 서브패드를 구비한 폴리싱 장치 |
| WO2009086557A1 (en) * | 2007-12-31 | 2009-07-09 | Innopad, Inc. | Chemical-mechanical planarization pad |
| WO2009140622A2 (en) * | 2008-05-15 | 2009-11-19 | 3M Innovative Properties Company | Polishing pad with endpoint window and systems and method using the same |
| TWI409137B (zh) * | 2008-06-19 | 2013-09-21 | Bestac Advanced Material Co Ltd | 研磨墊及其微型結構形成方法 |
| KR20110019442A (ko) * | 2008-06-26 | 2011-02-25 | 쓰리엠 이노베이티브 프로퍼티즈 캄파니 | 다공성 요소를 구비한 연마 패드 및 이 연마 패드의 제작 방법 및 이용 방법 |
| US7645186B1 (en) | 2008-07-18 | 2010-01-12 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad manufacturing assembly |
| US7820005B2 (en) * | 2008-07-18 | 2010-10-26 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Multilayer chemical mechanical polishing pad manufacturing process |
| US20110183583A1 (en) * | 2008-07-18 | 2011-07-28 | Joseph William D | Polishing Pad with Floating Elements and Method of Making and Using the Same |
| TWM352127U (en) * | 2008-08-29 | 2009-03-01 | Bestac Advanced Material Co Ltd | Polishing pad |
| TWM352126U (en) * | 2008-10-23 | 2009-03-01 | Bestac Advanced Material Co Ltd | Polishing pad |
| WO2011082155A2 (en) | 2009-12-30 | 2011-07-07 | 3M Innovative Properties Company | Polishing pads including phase-separated polymer blend and method of making and using the same |
| TWI510328B (zh) * | 2010-05-03 | 2015-12-01 | Iv Technologies Co Ltd | 基底層、包括此基底層的研磨墊及研磨方法 |
| WO2012071243A2 (en) | 2010-11-22 | 2012-05-31 | 3M Innovative Properties Company | Assembly and electronic devices including the same |
| US9067299B2 (en) | 2012-04-25 | 2015-06-30 | Applied Materials, Inc. | Printed chemical mechanical polishing pad |
| JP5789634B2 (ja) * | 2012-05-14 | 2015-10-07 | 株式会社荏原製作所 | ワークピースを研磨するための研磨パッド並びに化学機械研磨装置、および該化学機械研磨装置を用いてワークピースを研磨する方法 |
| JP6016301B2 (ja) | 2013-02-13 | 2016-10-26 | 昭和電工株式会社 | 単結晶SiC基板の表面加工方法、その製造方法及び単結晶SiC基板の表面加工用研削プレート |
| US9233451B2 (en) | 2013-05-31 | 2016-01-12 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Soft and conditionable chemical mechanical polishing pad stack |
| US9238295B2 (en) | 2013-05-31 | 2016-01-19 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Soft and conditionable chemical mechanical window polishing pad |
| US9238296B2 (en) | 2013-05-31 | 2016-01-19 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Multilayer chemical mechanical polishing pad stack with soft and conditionable polishing layer |
| US9102034B2 (en) | 2013-08-30 | 2015-08-11 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Method of chemical mechanical polishing a substrate |
| KR102440303B1 (ko) | 2014-05-07 | 2022-09-05 | 씨엠씨 머티리얼즈, 인코포레이티드 | Cmp용 다층 연마 패드 |
| US10537973B2 (en) | 2016-03-09 | 2020-01-21 | Applied Materials, Inc. | Correction of fabricated shapes in additive manufacturing |
| US20180079153A1 (en) | 2016-09-20 | 2018-03-22 | Applied Materials, Inc. | Control of dispensing operations for additive manufacturing of a polishing pad |
| US20180304539A1 (en) | 2017-04-21 | 2018-10-25 | Applied Materials, Inc. | Energy delivery system with array of energy sources for an additive manufacturing apparatus |
| US11059149B2 (en) | 2017-05-25 | 2021-07-13 | Applied Materials, Inc. | Correction of fabricated shapes in additive manufacturing using initial layer |
| US10967482B2 (en) | 2017-05-25 | 2021-04-06 | Applied Materials, Inc. | Fabrication of polishing pad by additive manufacturing onto mold |
| CN112338820B (zh) * | 2020-10-27 | 2021-10-29 | 湖北鼎汇微电子材料有限公司 | 一种抛光垫及其制备方法、应用 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3504457A (en) * | 1966-07-05 | 1970-04-07 | Geoscience Instr Corp | Polishing apparatus |
| US3499250A (en) * | 1967-04-07 | 1970-03-10 | Geoscience Instr Corp | Polishing apparatus |
| DE2710916B2 (de) * | 1977-03-12 | 1979-04-26 | Continental Gummi-Werke Ag, 3000 Hannover | Elastischer, zelliger Gummikörper und Verfahren zu seiner Herstellung |
| US4512113A (en) * | 1982-09-23 | 1985-04-23 | Budinger William D | Workpiece holder for polishing operation |
| US4879258A (en) * | 1988-08-31 | 1989-11-07 | Texas Instruments Incorporated | Integrated circuit planarization by mechanical polishing |
| WO1991014538A1 (en) * | 1990-03-22 | 1991-10-03 | Westech Systems, Inc. | Apparatus for interlayer planarization of semiconductor material |
| EP0465868B1 (en) * | 1990-06-29 | 1996-10-02 | National Semiconductor Corporation | Controlled compliance polishing pad |
-
1992
- 1992-01-31 US US07/829,736 patent/US5257478A/en not_active Expired - Lifetime
-
1993
- 1993-01-18 EP EP93100667A patent/EP0555660B1/en not_active Expired - Lifetime
- 1993-01-18 DE DE69308915T patent/DE69308915T2/de not_active Expired - Lifetime
- 1993-01-30 KR KR1019930001293A patent/KR100265660B1/ko not_active Expired - Lifetime
- 1993-01-30 CN CN93101447A patent/CN1076152A/zh active Pending
- 1993-02-01 JP JP01453993A patent/JP3455556B2/ja not_active Expired - Lifetime
- 1993-05-25 TW TW082104097A patent/TW222033B/zh not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008137033A1 (en) * | 2007-05-03 | 2008-11-13 | Cabot Microelectronics Corporation | Stacked polishing pad for high temperature applications |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3455556B2 (ja) | 2003-10-14 |
| EP0555660A2 (en) | 1993-08-18 |
| US5257478A (en) | 1993-11-02 |
| CN1076152A (zh) | 1993-09-15 |
| EP0555660B1 (en) | 1997-03-19 |
| DE69308915T2 (de) | 1997-09-04 |
| DE69308915D1 (de) | 1997-04-24 |
| TW222033B (https=) | 1994-04-01 |
| EP0555660A3 (https=) | 1994-03-23 |
| JPH0621028A (ja) | 1994-01-28 |
| KR930017105A (ko) | 1993-08-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100265660B1 (ko) | 반도체재료의중간층평탄화장치에사용되는폴리싱패트 | |
| US6203413B1 (en) | Apparatus and methods for conditioning polishing pads in mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies | |
| US6376381B1 (en) | Planarizing solutions, planarizing machines, and methods for mechanical and/or chemical-mechanical planarization of microelectronic substrate assemblies | |
| US5910043A (en) | Polishing pad for chemical-mechanical planarization of a semiconductor wafer | |
| US6589101B2 (en) | Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates with metal compound abrasives | |
| US6110820A (en) | Low scratch density chemical mechanical planarization process | |
| TWI288047B (en) | Polishing machines including under-pads and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces | |
| KR101027190B1 (ko) | 견실한 밀봉 모서리를 갖는 하위 패드 | |
| JP2006513571A (ja) | 化学的機械的研磨のための軟質サブパッドの使用方法 | |
| US20090298395A1 (en) | Apparatus and method for reducing removal forces for cmp pads | |
| US7101272B2 (en) | Carrier head for thermal drift compensation | |
| US6585572B1 (en) | Subaperture chemical mechanical polishing system | |
| JP3660933B2 (ja) | 半導体製造方法 | |
| KR100564125B1 (ko) | 연마체, 화학 기계적 연마 장치 및 반도체 디바이스의제조 방법 | |
| KR20200079533A (ko) | 기판 프로세싱 시스템을 위한 방법 및 평탄화된 멤브레인 | |
| US20040002291A1 (en) | Partial-membrane carrier head | |
| JPH0677185A (ja) | 半導体ウエハの研磨用パッド及び研磨方法 | |
| KR950001933A (ko) | 폴리싱 패드 및 폴리싱 방법 | |
| WO2004001829A1 (ja) | 研磨体、研磨装置、半導体デバイス及び半導体デバイスの製造方法 | |
| TWI314763B (en) | Carrier head with flexible membrane | |
| JP2001079755A (ja) | 研磨体及び研磨方法 | |
| KR100587057B1 (ko) | 화학적기계연마 장치 | |
| JP2000223447A (ja) | 研磨ヘッド及び研磨装置及び研磨方法 | |
| KR19990074921A (ko) | 웨이퍼 연마장치에 있어서의 연마패드 콘디셔너 | |
| KR100278998B1 (ko) | 화학기계적연마용 패드 및 그의 제조방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 11 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 12 |
|
| FPAY | Annual fee payment |
Payment date: 20120518 Year of fee payment: 13 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 13 |
|
| EXPY | Expiration of term | ||
| PC1801 | Expiration of term |
St.27 status event code: N-4-6-H10-H14-oth-PC1801 Not in force date: 20130131 Ip right cessation event data comment text: Termination Category : EXPIRATION_OF_DURATION |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |