KR100229245B1 - 리드위치검사방법 및 검사장치 - Google Patents

리드위치검사방법 및 검사장치 Download PDF

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Publication number
KR100229245B1
KR100229245B1 KR1019930021151A KR930021151A KR100229245B1 KR 100229245 B1 KR100229245 B1 KR 100229245B1 KR 1019930021151 A KR1019930021151 A KR 1019930021151A KR 930021151 A KR930021151 A KR 930021151A KR 100229245 B1 KR100229245 B1 KR 100229245B1
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KR
South Korea
Prior art keywords
package
lead
semiconductor
coordinate
coordinates
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Expired - Fee Related
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KR1019930021151A
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English (en)
Korean (ko)
Other versions
KR940009664A (ko
Inventor
다까시 사이또
히로시 도미야
Original Assignee
이데이 노부유끼
소니 가부시키가이샤
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Publication of KR940009664A publication Critical patent/KR940009664A/ko
Application granted granted Critical
Publication of KR100229245B1 publication Critical patent/KR100229245B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
KR1019930021151A 1992-10-14 1993-10-13 리드위치검사방법 및 검사장치 Expired - Fee Related KR100229245B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP30068192A JP3348299B2 (ja) 1992-10-14 1992-10-14 リード位置検査方法及び検査装置
JP92-300,681 1992-10-14

Publications (2)

Publication Number Publication Date
KR940009664A KR940009664A (ko) 1994-05-20
KR100229245B1 true KR100229245B1 (ko) 1999-12-01

Family

ID=17887799

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019930021151A Expired - Fee Related KR100229245B1 (ko) 1992-10-14 1993-10-13 리드위치검사방법 및 검사장치

Country Status (3)

Country Link
JP (1) JP3348299B2 (enrdf_load_stackoverflow)
KR (1) KR100229245B1 (enrdf_load_stackoverflow)
TW (1) TW251382B (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4495473B2 (ja) * 2004-01-21 2010-07-07 Ｈｏｙａ株式会社 検査システム
CN109737887A (zh) * 2018-12-17 2019-05-10 电子科技大学 基于机器视觉的智能检测选配平台

Also Published As

Publication number Publication date
JPH06129824A (ja) 1994-05-13
TW251382B (enrdf_load_stackoverflow) 1995-07-11
KR940009664A (ko) 1994-05-20
JP3348299B2 (ja) 2002-11-20

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