TW251382B - - Google Patents

Info

Publication number
TW251382B
TW251382B TW082108342A TW82108342A TW251382B TW 251382 B TW251382 B TW 251382B TW 082108342 A TW082108342 A TW 082108342A TW 82108342 A TW82108342 A TW 82108342A TW 251382 B TW251382 B TW 251382B
Authority
TW
Taiwan
Application number
TW082108342A
Other languages
Chinese (zh)
Original Assignee
Sony Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Co Ltd filed Critical Sony Co Ltd
Application granted granted Critical
Publication of TW251382B publication Critical patent/TW251382B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Lead Frames For Integrated Circuits (AREA)
TW082108342A 1992-10-14 1993-10-08 TW251382B (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30068192A JP3348299B2 (ja) 1992-10-14 1992-10-14 リード位置検査方法及び検査装置

Publications (1)

Publication Number Publication Date
TW251382B true TW251382B (enrdf_load_stackoverflow) 1995-07-11

Family

ID=17887799

Family Applications (1)

Application Number Title Priority Date Filing Date
TW082108342A TW251382B (enrdf_load_stackoverflow) 1992-10-14 1993-10-08

Country Status (3)

Country Link
JP (1) JP3348299B2 (enrdf_load_stackoverflow)
KR (1) KR100229245B1 (enrdf_load_stackoverflow)
TW (1) TW251382B (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4495473B2 (ja) * 2004-01-21 2010-07-07 Ｈｏｙａ株式会社 検査システム
CN109737887A (zh) * 2018-12-17 2019-05-10 电子科技大学 基于机器视觉的智能检测选配平台

Also Published As

Publication number Publication date
JPH06129824A (ja) 1994-05-13
KR100229245B1 (ko) 1999-12-01
JP3348299B2 (ja) 2002-11-20
KR940009664A (ko) 1994-05-20

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