KR100205733B1 - 검사 결과 출력 장치 및 검사 결과 출력 방법,및이검사결과출력장치를이용한기판검사시스템및이검사결과출력방법을이용한기판검사방법 - Google Patents

검사 결과 출력 장치 및 검사 결과 출력 방법,및이검사결과출력장치를이용한기판검사시스템및이검사결과출력방법을이용한기판검사방법 Download PDF

Info

Publication number
KR100205733B1
KR100205733B1 KR1019960011705A KR19960011705A KR100205733B1 KR 100205733 B1 KR100205733 B1 KR 100205733B1 KR 1019960011705 A KR1019960011705 A KR 1019960011705A KR 19960011705 A KR19960011705 A KR 19960011705A KR 100205733 B1 KR100205733 B1 KR 100205733B1
Authority
KR
South Korea
Prior art keywords
layout diagram
defective
substrate
component mounting
inspection result
Prior art date
Application number
KR1019960011705A
Other languages
English (en)
Korean (ko)
Other versions
KR960040114A (ko
Inventor
이시바 마사토
Original Assignee
타테이시 요시오
오무론 가부시기가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 타테이시 요시오, 오무론 가부시기가이샤 filed Critical 타테이시 요시오
Publication of KR960040114A publication Critical patent/KR960040114A/ko
Application granted granted Critical
Publication of KR100205733B1 publication Critical patent/KR100205733B1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects

Landscapes

  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Supply And Installment Of Electrical Components (AREA)
KR1019960011705A 1995-04-20 1996-04-18 검사 결과 출력 장치 및 검사 결과 출력 방법,및이검사결과출력장치를이용한기판검사시스템및이검사결과출력방법을이용한기판검사방법 KR100205733B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP11763995A JP3216033B2 (ja) 1995-04-20 1995-04-20 検査結果出力装置および検査結果出力方法、ならびにこの検査結果出力装置を用いた基板検査システムおよびこの検査結果出力方法を用いた基板検査方法
JP95-117639 1995-04-20

Publications (2)

Publication Number Publication Date
KR960040114A KR960040114A (ko) 1996-11-25
KR100205733B1 true KR100205733B1 (ko) 1999-07-01

Family

ID=14716681

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019960011705A KR100205733B1 (ko) 1995-04-20 1996-04-18 검사 결과 출력 장치 및 검사 결과 출력 방법,및이검사결과출력장치를이용한기판검사시스템및이검사결과출력방법을이용한기판검사방법

Country Status (4)

Country Link
JP (1) JP3216033B2 (ja)
KR (1) KR100205733B1 (ja)
CN (2) CN1059740C (ja)
TW (1) TW304230B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101619721B1 (ko) * 2015-11-25 2016-05-11 주식회사 케이엔케이 Pcb 검사 장치

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19940584A1 (de) * 1999-08-26 2001-03-22 Siemens Ag Verfahren und System zum Bestücken von in einer Bestückungseinheit angeordneten Schaltungsträgern
JP4045838B2 (ja) * 2002-04-12 2008-02-13 松下電器産業株式会社 部品装着管理方法
JP3733094B2 (ja) * 2002-08-22 2006-01-11 トヨタ自動車株式会社 良否判定装置、良否判定プログラムおよび良否判定方法
JP2005227882A (ja) * 2004-02-10 2005-08-25 Mazda Motor Corp 整備情報提供システム
JP4493421B2 (ja) * 2004-06-30 2010-06-30 株式会社リコー プリント回路基板検査装置とプリント回路基板組み立て検査ラインシステムおよびプログラム
JP4541172B2 (ja) * 2005-01-28 2010-09-08 ヤマハ発動機株式会社 部品実装ラインにおける情報管理システム
JP4552749B2 (ja) * 2005-05-12 2010-09-29 オムロン株式会社 検査基準設定装置及び方法、並びに、工程検査装置
JP2007081318A (ja) * 2005-09-16 2007-03-29 Omron Corp 検査結果出力方法、検査結果出力装置、検査結果出力用プログラム、および検査結果出力用プログラムを記録した記録媒体
KR20090008185A (ko) * 2006-05-15 2009-01-21 가부시키가이샤 니콘 표면 검사 장치
JP2008186879A (ja) * 2007-01-29 2008-08-14 Omron Corp 基板検査方法
JP2009036736A (ja) * 2007-08-04 2009-02-19 Djtech Co Ltd 印刷半田検査方法及び装置
US8285028B2 (en) * 2007-09-28 2012-10-09 Panasonic Corporation Inspection apparatus and inspection method
DE102007049702A1 (de) * 2007-10-17 2009-04-23 Robert Bosch Gmbh Pickerstrasse
JP5400342B2 (ja) 2008-10-01 2014-01-29 キヤノン株式会社 情報処理装置、その表示方法及びプログラム
JP5284767B2 (ja) * 2008-12-03 2013-09-11 東海旅客鉄道株式会社 車両台車油量検査システム
CN101477063B (zh) * 2009-01-22 2011-02-16 北京星河泰视特科技有限公司 印刷电路板的检测方法及光学检测仪
JP5065329B2 (ja) * 2009-05-12 2012-10-31 ヴィスコ・テクノロジーズ株式会社 形状検査装置および形状検査プログラム
US10260996B2 (en) * 2014-02-03 2019-04-16 Fuji Corporation Board production monitoring device and board production monitoring method
JP6652327B2 (ja) * 2015-04-17 2020-02-19 株式会社フジタ 検査対象物の状態評価装置
JP6673268B2 (ja) * 2017-03-14 2020-03-25 オムロン株式会社 管理装置、管理装置の制御方法、情報処理プログラム、および記録媒体

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101619721B1 (ko) * 2015-11-25 2016-05-11 주식회사 케이엔케이 Pcb 검사 장치

Also Published As

Publication number Publication date
TW304230B (ja) 1997-05-01
CN1282865A (zh) 2001-02-07
JP3216033B2 (ja) 2001-10-09
KR960040114A (ko) 1996-11-25
CN1156673C (zh) 2004-07-07
CN1151519A (zh) 1997-06-11
CN1059740C (zh) 2000-12-20
JPH08292018A (ja) 1996-11-05

Similar Documents

Publication Publication Date Title
KR100205733B1 (ko) 검사 결과 출력 장치 및 검사 결과 출력 방법,및이검사결과출력장치를이용한기판검사시스템및이검사결과출력방법을이용한기판검사방법
US5039868A (en) Method of and apparatus for inspecting printed circuit boards and the like
EP0526080B1 (en) Teaching method and system for mounted component inspection
JPH02231510A (ja) 基板検査装置
KR20130084617A (ko) 솔더 검사를 위한 검사 기준 등록 방법 및 그 방법을 이용한 기판 검사 장치
JPH061173B2 (ja) 曲面性状検査装置
US5764536A (en) Method and device to establish viewing zones and to inspect products using viewing zones
JP2782759B2 (ja) ハンダ付け外観検査装置
JP3173050B2 (ja) 教示データ作成方法およびその方法を用いた教示データ作成装置
JP3381129B2 (ja) 観測領域設定方法およびその装置、ならびにこの観測領域設定方法を用いた外観検査方法およびその装置
EP0370527A1 (en) Method of and apparatus for inspecting substrate
JP2005017234A (ja) 外観検査方法、外観検査装置及び電子回路基板の製造装置
JP3279121B2 (ja) ハンダ状態出力装置およびこれを用いたハンダ検査システム
EP0718623B1 (en) Method and device to establish viewing zones and to inspect products using viewing zones
JPH11271234A (ja) 検査装置および方法ならびに検査用基準データ作成装置
EP0435326A2 (en) Circuit board inspection device
JP4672313B2 (ja) 印刷はんだ検査装置
JPH02213711A (ja) 部品検査装置
JP3185430B2 (ja) 基板検査方法およびその装置
JPH02216408A (ja) 基板検査装置
JP3146644B2 (ja) 実装部品検査用データの教示方法
JP3189308B2 (ja) はんだ付検査結果の表示方法およびその装置，はんだ付不良の修正方法，ならびにはんだ付検査装置
JPH0526815A (ja) 実装部品検査用データの教示方法
JP3035574B2 (ja) 実装部品検査装置の教示方法
JP3557993B2 (ja) クリームはんだ印刷目視検査装置および検査方法

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20120322

Year of fee payment: 14

LAPS Lapse due to unpaid annual fee