KR0148415B1 - 국부적인 청정실의 취급면 내의 판형 물체를 처리하기 위한 장치 - Google Patents

국부적인 청정실의 취급면 내의 판형 물체를 처리하기 위한 장치 Download PDF

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Publication number
KR0148415B1
KR0148415B1 KR1019940704141A KR19940704141A KR0148415B1 KR 0148415 B1 KR0148415 B1 KR 0148415B1 KR 1019940704141 A KR1019940704141 A KR 1019940704141A KR 19940704141 A KR19940704141 A KR 19940704141A KR 0148415 B1 KR0148415 B1 KR 0148415B1
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KR
South Korea
Prior art keywords
magazine
air
compartment
disc
handling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1019940704141A
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English (en)
Korean (ko)
Other versions
KR950701766A (ko
Inventor
라아네 베른트
슐쯔 클라우스
쉘러 베르너
하이트만 미카엘
가글린 악셀
Original Assignee
훨커 욈케
예놉틱 게엠베하
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Publication of KR950701766A publication Critical patent/KR950701766A/ko
Application granted granted Critical
Publication of KR0148415B1 publication Critical patent/KR0148415B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • H10P72/0608—
    • H10P95/00—
    • H10P72/0402—
    • H10P72/3402—

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Warehouses Or Storage Devices (AREA)
KR1019940704141A 1993-03-29 1994-03-25 국부적인 청정실의 취급면 내의 판형 물체를 처리하기 위한 장치 Expired - Fee Related KR0148415B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE4310149A DE4310149C2 (de) 1993-03-29 1993-03-29 Einrichtung zur Handhabung von scheibenförmigen Objekten in einer Handhabungsebene eines lokalen Reinraumes
DEP4310149.6 1993-03-29
PCT/EP1994/000959 WO1994023443A1 (de) 1993-03-29 1994-03-25 Einrichtung zum handeln von scheibenförmigen objekten in einer handlingebene eines lokalen reinraumes

Publications (2)

Publication Number Publication Date
KR950701766A KR950701766A (ko) 1995-04-28
KR0148415B1 true KR0148415B1 (ko) 1998-12-01

Family

ID=6484131

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940704141A Expired - Fee Related KR0148415B1 (ko) 1993-03-29 1994-03-25 국부적인 청정실의 취급면 내의 판형 물체를 처리하기 위한 장치

Country Status (8)

Country Link
EP (1) EP0642697B1 (OSRAM)
JP (1) JP2846957B2 (OSRAM)
KR (1) KR0148415B1 (OSRAM)
AT (1) ATE167001T1 (OSRAM)
DE (2) DE4310149C2 (OSRAM)
SG (1) SG47081A1 (OSRAM)
TW (1) TW248613B (OSRAM)
WO (1) WO1994023443A1 (OSRAM)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19535871C2 (de) * 1995-09-27 2000-02-10 Jenoptik Jena Gmbh Indexer für Magazinfächer eines Magazins und darin enthaltene scheibenförmige Objekte
DE19549045C1 (de) * 1995-12-28 1997-06-05 Jenoptik Jena Gmbh Einrichtung zur Handhabung von scheibenförmigen Objekten
US5674039A (en) * 1996-07-12 1997-10-07 Fusion Systems Corporation System for transferring articles between controlled environments
JPH1058367A (ja) * 1996-08-23 1998-03-03 Advantest Corp Ｉｃ搬送装置
DE19729525A1 (de) * 1997-03-11 1998-09-17 Leybold Systems Gmbh Vorrichtung für den Transport von Substraten
DE19813684C2 (de) * 1998-03-27 2001-08-16 Brooks Automation Gmbh Einrichtung zur Aufnahme von Transportbehältern an einer Be- und Entladestation
DE19913628A1 (de) * 1999-03-25 2000-10-05 Siemens Ag Anlage zur Fertigung von Halbleiterprodukten
DE19958082A1 (de) * 1999-12-02 2001-06-07 Logitex Reinstmedientechnik Gm Überwachungssystem für eine Transportvorrichtung von Flachteilen, insbesondere Wafer-Scheiben
DE10104555B4 (de) * 2001-02-01 2007-11-08 Krauss Maffei Gmbh Lagervorrichtung zum Einsatz in Reinumgebungen
DE10351848A1 (de) 2003-11-06 2005-06-09 Leica Microsystems Semiconductor Gmbh System zur Detektion von Makrodefekten
DE10359722A1 (de) 2003-12-19 2005-07-14 Leica Microsystems Semiconductor Gmbh Verfahren zur Inspektion eines Wafers
DE102004062592B3 (de) * 2004-12-24 2006-06-08 Leica Microsystems Jena Gmbh System zur Untersuchung eines scheibenförmigen Substrats
JP5615218B2 (ja) * 2010-03-26 2014-10-29 テソン エンジニアリング カンパニー リミテッド エア供給装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3972424A (en) * 1973-03-12 1976-08-03 The Computervision Corporation Automatic wafer loading and pre-alignment system
US3923342A (en) * 1974-06-10 1975-12-02 Motorola Inc Apparatus and method for handling frangible objects
JPS5969324A (ja) * 1982-10-12 1984-04-19 Toshiba Seiki Kk マガジンのピツチ送り方法
JPS6083245U (ja) * 1983-11-15 1985-06-08 大日本スクリーン製造株式会社 カセツト式薄片搬出入用薄片検知装置
JPS60120520A (ja) * 1983-12-02 1985-06-28 Canon Inc 半導体製造用搬送装置
JPS61129340U (OSRAM) * 1985-01-31 1986-08-13
FR2590879A1 (fr) * 1985-11-27 1987-06-05 American Telephone & Telegraph Procede et appareil pour le chargement et le dechargement automatiques de tranches de semi-conducteur
US4746256A (en) * 1986-03-13 1988-05-24 Roboptek, Inc. Apparatus for handling sensitive material such as semiconductor wafers
JPS62222625A (ja) * 1986-03-25 1987-09-30 Shimizu Constr Co Ltd 半導体製造装置
EP0244202B1 (en) * 1986-04-28 1994-09-21 Varian Associates, Inc. Wafer transfer system
JPH0736418B2 (ja) * 1986-05-19 1995-04-19 富士通株式会社 ウエーハキャリア
JPS6382248A (ja) * 1986-09-26 1988-04-13 Canon Inc 薄板状物品の搬出または搬入装置
US4895486A (en) * 1987-05-15 1990-01-23 Roboptek, Inc. Wafer monitoring device
JP3075561B2 (ja) * 1989-01-27 2000-08-14 日立電子エンジニアリング株式会社 カセット内のウェハ取出し制御方式
US5181819A (en) * 1990-10-09 1993-01-26 Tokyo Electron Sagami Limited Apparatus for processing semiconductors
JPH0536809A (ja) * 1991-07-31 1993-02-12 Mitsubishi Electric Corp 半導体基板処理装置に於ける半導体基板搬送アーム

Also Published As

Publication number Publication date
DE4310149C2 (de) 1996-05-02
TW248613B (OSRAM) 1995-06-01
KR950701766A (ko) 1995-04-28
DE4310149A1 (de) 1994-10-06
SG47081A1 (en) 1998-03-20
WO1994023443A1 (de) 1994-10-13
JPH07503584A (ja) 1995-04-13
EP0642697A1 (de) 1995-03-15
JP2846957B2 (ja) 1999-01-13
DE59406121D1 (de) 1998-07-09
EP0642697B1 (de) 1998-06-03
ATE167001T1 (de) 1998-06-15

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