KR0146273B1 - 프로브카드의 클리닝장치 및 클리닝장치를 구비한 프로브장치 - Google Patents
프로브카드의 클리닝장치 및 클리닝장치를 구비한 프로브장치Info
- Publication number
- KR0146273B1 KR0146273B1 KR1019940033554A KR19940033554A KR0146273B1 KR 0146273 B1 KR0146273 B1 KR 0146273B1 KR 1019940033554 A KR1019940033554 A KR 1019940033554A KR 19940033554 A KR19940033554 A KR 19940033554A KR 0146273 B1 KR0146273 B1 KR 0146273B1
- Authority
- KR
- South Korea
- Prior art keywords
- probe
- cleaning
- brush
- probe card
- under test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP05341383A JP3094052B2 (ja) | 1993-12-10 | 1993-12-10 | クリーニング装置及びこの装置を用いたプローブ装置 |
JP93-341383 | 1993-12-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950021325A KR950021325A (ko) | 1995-07-26 |
KR0146273B1 true KR0146273B1 (ko) | 1998-11-02 |
Family
ID=18345640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940033554A KR0146273B1 (ko) | 1993-12-10 | 1994-12-09 | 프로브카드의 클리닝장치 및 클리닝장치를 구비한 프로브장치 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP3094052B2 (ja) |
KR (1) | KR0146273B1 (ja) |
TW (1) | TW288178B (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101115988B1 (ko) * | 2011-11-07 | 2012-02-13 | 전형민 | 칩 패드의 먼지제거시스템 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6118290A (en) * | 1997-06-07 | 2000-09-12 | Tokyo Electron Limited | Prober and method for cleaning probes provided therein |
KR100850692B1 (ko) * | 2008-01-11 | 2008-08-07 | 뉴센트 주식회사 | 프로브카드의 세척 및 검사 시스템 |
JP5094554B2 (ja) * | 2008-05-23 | 2012-12-12 | 株式会社東京精密 | 搬送パッドのクリーニング機構 |
JP5594535B2 (ja) * | 2008-07-18 | 2014-09-24 | 日本電産リード株式会社 | ピン先端部のクリーニング機構を有する基板検査装置 |
JP5615572B2 (ja) * | 2009-12-22 | 2014-10-29 | 株式会社日本マイクロニクス | プローブ清掃ユニット及びそれを備えたパネル検査装置並びにプローブ清掃方法 |
TWI572863B (zh) * | 2014-12-23 | 2017-03-01 | Imt有限公司 | 包含雷射清理功能的晶圓測試機 |
JP7129261B2 (ja) * | 2018-07-27 | 2022-09-01 | キオクシア株式会社 | 試験装置 |
CN111318070B (zh) * | 2018-12-13 | 2022-10-04 | 夏泰鑫半导体(青岛)有限公司 | 过滤装置及过滤设备 |
-
1993
- 1993-12-10 JP JP05341383A patent/JP3094052B2/ja not_active Expired - Fee Related
-
1994
- 1994-12-08 TW TW083111430A patent/TW288178B/zh not_active IP Right Cessation
- 1994-12-09 KR KR1019940033554A patent/KR0146273B1/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101115988B1 (ko) * | 2011-11-07 | 2012-02-13 | 전형민 | 칩 패드의 먼지제거시스템 |
Also Published As
Publication number | Publication date |
---|---|
JP3094052B2 (ja) | 2000-10-03 |
KR950021325A (ko) | 1995-07-26 |
TW288178B (ja) | 1996-10-11 |
JPH07161784A (ja) | 1995-06-23 |
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Legal Events
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A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20090424 Year of fee payment: 12 |
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LAPS | Lapse due to unpaid annual fee |